1、 EIA STANDARD TP-364-36B Determination of Gas-Tight Characteristics Test Procedure for Electrical Connectors, and/or Contact Systems EIA-364-36B (Revision of EIA-364-36A) September 2006 EIA-364-36B ANSI/EIA-364-36B-2006(R2013) Approved: September 7, 2006 Reaffirmed: January 28, 2013 NOTICE EIA Engin
2、eering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper pr
3、oduct for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude
4、their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any
5、liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point whe
6、re a valid comparison between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and
7、health practices and to determine the applicability of regulatory limitations before its use. (Created under Standards Proposal No. 5084 formulated under the cognizance of the CE-2.0 National Connector Standards Committee and reaffirmed per Standards Proposal No. 5252.07). Published by Electronic Co
8、mponents Industry Association 2013 EIA Standards & Technology Department 2214 Rock Hill Road, Suite 170 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited nu
9、mber of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources . 1 2.1 Equipment . 1
10、2.2 Material . 1 3 Test specimen 2 3.1 Description 2 3.2 Preparation 2 4 Test procedure . 3 5 Details to be specified . 4 6 Test documentation . 4 Table 1 Test specimen classes . 2 Annex A Informative A-1 ii (This page left blank) EIA-364-36B Page 1 TEST PROCEDURE No. 36B DETERMINATION OF GAS-TIGHT
11、CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND/OR CONTACT SYSTEMS (From EIA Standards Proposal No. 5084 formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-364-36A.) 1 Introduction 1.1 Scope This procedure is to determin
12、e the integrity of contacting surfaces (at the mating and/or termination areas) by assessment of the gas tight characteristics of the contacting surfaces. The gas tight characteristic simulates the ability of the contacting surfaces to prevent harsh environments from penetrating between them and for
13、ming oxides and/or films that will degrade electrical performance. It is recommended for contacts and/or connector (socket) assemblies directly exposed to outside environments or those that are in uncontrolled environments (internal or external to electronic packaging). CAUTION The method, as descri
14、bed herein, utilizes nitric acid vapors. This procedure may involve hazardous materials, operations and equipment. This procedure does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of the standard to
15、 establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. 2 Test Resources 2.1 Equipment 2.1.1 Nonreactive material of applicable size having the capability of being sealed. 2.1.2 Test equipment as defined in EIA-364-23, low level
16、 contact resistance. 2.2 Material 2.2.1 Nitric acid, concentrated, AR grade EIA-364-36B Page 2 3 Test specimen 3.1 Description The test specimens to be evaluated shall be identified by the test specimen classes indicated in table 1. Table 1 Test specimen classes Class Description I Mated pair of con
17、tacts not assembled to their plastic housing (applies to removable type contacts only)II Mated pair of contacts assembled to their plastic housing. III Crimp terminations not assembled to their plastic housing, but with applicable conductors crimped in place.IV Press fit terminations (assembled to p
18、rinted circuit boards). V IDC (Insulation Displacement Contacts) or IPC (Insulation Piercing Contacts) terminations (assembled to housings and conductors).VI IDC or IPC terminations assembled to conductors, but not assembled to their plastic housings (applies to removable type contacts only). NOTES
19、1 For evaluation of mated connectors (sockets), class II shall be specified. 2 Class III, IV V, and VI shall be specified when terminations only are to be evaluated. 3 Class I shall be specified when unterminated contacts only are to be evaluated. 4 Nonremovable type contacts shall be tested as clas
20、s II or V only. 3.2 Preparation 3.2.1 Unless otherwise specified in the referencing document, the specimens shall be cleaned prior to exposure. In the event that lubricated contacts are to be tested, they shall be tested in the “as received” condition and cleaning shall not be performed. 3.2.2 Clean
21、ing shall be performed by using a solvent that will remove organic films such as lubricants, fingerprints, etc. 3.2.3 Material that absorbs vapors (e.g., paper tags, string, tape) shall be removed prior to cleaning and placing specimens into the test chamber 3.2.4 The specimens shall be prepared for
22、 monitoring of low level contact resistance in such a manner that the mating or termination surfaces being tested shall not be disturbed while measurements are being performed. EIA-364-36B Page 3 3.2.5 In the event of test lead attachment via soldering, all specimens shall be cleaned to remove resid
23、ual flux prior to exposure, see 3.2.2 and 3.2.3. 3.2.6 Test specimen may be placed on a suitable holding fixture material as long as the mating or inert portion of the specimen will be directly exposed to the test medium. 4 Test procedure 4.1 The initial low level contact resistance shall be measure
24、d and recorded in accordance with EIA-364-23. 4.2 Upon completion of 4.1. the specimens shall be handled in such a manner as not to disturb the mating or termination surfaces until completion of the final measurement. 4.3 Prior to and after each test exposure, test chambers and other equipment shall
25、 be thoroughly cleaned and dried to remove any contaminate or residue remaining from past use. 4.4 Concentrated nitric acid, AR grade, shall be placed in the test chamber of sufficient volume to result in saturation of the test chamber. The conditions shall be room ambient. CAUTION All exposure shal
26、l be performed under an exhaust hood. Chemical goggles completely protecting the eyes shall be worn. Normal precautions in handling corrosive chemicals shall be observed. It is recommended that the exhaust hood be of such a design as to minimize transverse air currents to prevent purging of the test
27、 chamber during the test. 4.5 Allow the solution to saturate the test chamber for a minimum of 15 minutes. 4.6 The test specimens shall be placed in the test chamber and exposed for 60 minutes 5 minutes. 4.7 The test specimens shall not be closer than 25 millimeters (1 inch) from the wall of the tes
28、t chamber and not closer than 76 millimeters (3 inches) from the solution surface. 4.8 After exposure, the specimens shall be removed from the test chamber and oven dried at 50 C for a minimum of 1 hour. 4.9 Within 60 minutes of drying, the final low level contact resistance shall be measured and re
29、corded in accordance with EIA-364-23 (test specimen temperature shall be at room ambient). EIA-364-36B Page 4 5 Details to be specified The following details shall be specified in the referencing document: 5.1 The number of specimens to be tested and description 5.2 Test current and open circuit vol
30、tage 5.3 Specimen class (see table 1) 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description and quantity 6.3 Test equipment used, and date of last and next calibration 6.4 If specimens ar
31、e cleaned or uncleaned 6.5 Results including defects and location 6.6 Room ambient temperature and humidity 6.7 Date of test and name of operator EIA-364-36B Page A-1 Annex A Informative A.1 Discoloration of contacts shall not be construed as failure. Determination of pass/fail conditions shall be e
32、stablished by an analysis of the resistance observations. A.2 The environment used should not be construed as typical of operating environments. It is considered an “overkill” environment that is indicative of the gas tight characteristics of contact systems and/or their terminations. A.3 Other test
33、 procedures are “under consideration” that evaluate connectors for long-term performance characterization under harsh environments. The tests described herein are indicative of how a connector or contact system may perform in a severe environment. A.4 It is recommended that a 50 millimeters (2 inche
34、s) to 76 millimeters (3 inches) length of bare copper wire be placed with the Specimens to serve as an indicator that proper reactions occur (bare copper wire will have a greenish or black discoloration). A.5 The test shall not be performed when room ambient conditions exceed 30 C and or the relativ
35、e humidity exceeds 60%. A.6 The test should be performed in a continuous and uninterrupted manner, within the time constraints as specified in the referencing document. ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health
36、or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.
37、: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org
