1、 EIA STANDARD TP-55A Current Cycling Test Procedure for Electrical Contacts, Connectors, and Sockets EIA-364-55A (Revision of EIA-364-55) May 2008 ANSI/EIA-364-55-A-2008(R2014) Approved: May 19, 2008 Reaffirmed: August 28, 2014 EIA-364-55A NOTICE EIA Engineering Standards and Publications are design
2、ed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of
3、such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA
4、 members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it a
5、ssume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standa
6、rd and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applic
7、ability of regulatory limitations before its use. (From Standards Proposal No. 5089-A, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards, and reaffirmed per Standards Proposal No. 5326.02). Published by Electronic Components Industry Association
8、2014 Engineering Department 2214 Rock Hill Road, Suite 265 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a licens
9、e agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources . 1 2.1 Equipment . 1 3 Test specimen 1 3.1 Description 1 3.2 Prepara
10、tion 1 4 Test procedure . 3 5 Details to be specified . 5 6 Test documentation . 6 Table 1 Measurement intervals 4 2 Test current conditions 4 3 Cycle conditions . 5 i (This page left blank) ii EIA-364-55A Page 1 TEST PROCEDURE No. 55A CURRENT CYCLING TEST PROCEDURE FOR ELECTRICAL CONTACTS, CONNECTO
11、RS AND SOCKETS (From EIA Standards Proposal No. 5089, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-RS-364-55.) 1 Introduction 1.1 Scope This standard establishes test methods to determine the current cycling characteristics of
12、mated electrical contacts, connectors and sockets using, but not limited to, crimp, press-fit contacts, insulation displacement contact (IDC) terminations, soldered or mechanically attached termination techniques. 2 Test resources 2.1 Equipment 2.1.1 Ammeter accurate to 1% full scale or equivalent.
13、2.1.2 Power supply (ac or dc) capable of delivering the required test current. 2.1.3 Timer capable of controlling test cycle periods with 1 minute. 3 Test specimen 3.1 Description A test specimen shall consist of, but not be limited to, a mating pair of contacts such as a pin and a socket, mating he
14、rmaphroditic contacts, or a printed circuit board (PCB) pad, applicable devices and its mating contacts. Unless otherwise specified in the referencing document, contacts shall be tested assembled to their connector housing. EIA-364-55A Page 2 3.2 Preparation 3.2.1 Unassembled and unmounted contacts
15、When specified in the referencing document, loose piece contacts or mated contact pairs with separable contact interfaces shall be mounted in a manner that avoids any physical disturbance during the current cycling or measurement routine. Support fixtures, if required, shall be arranged to avoid hea
16、t sinking the specimens. Mating orientation and depth, if applicable, shall be within the design limits. 3.2.2 Assembled connectors Assembled connectors or sockets shall be tested mounted to printed circuit boards or other support systems as applicable. Mounting shall be achieved by the normal featu
17、res provided by their design. Unless otherwise specified in the referencing document, all contacts within the connector configuration that are designated for power, shall be tested by creating a series circuit. 3.2.3 Crimp and IDC terminated contacts Crimp and IDC terminations shall be terminated to
18、 their applicable conductors for which they are designed by using appropriate tooling (crimp tools, cable assembly tools, etc.). If applicable, the contacts to be tested shall be crimped per applicable specifications on each end of appropriate test conductors. This enables the wiring of the test ass
19、embly into a series circuit without additional soldering or splicing. 3.2.4 Contacts with solder terminations Unless otherwise specified in the referencing document, contacts or connectors with solder terminations shall be prepared by use of one of the following methods: 3.2.4.1 Printed circuit boar
20、d applications Connectors or contacts shall be terminated to printed circuit boards. Traces on the boards shall interconnect appropriate contacts that in a mated state create a series circuit. 3.2.4.2 Discrete wire applications A jumper system shall be used to interconnect applicable contacts creati
21、ng a series circuit. 3.2.5 Press-fit contacts Unless otherwise specified in the referencing document, contacts or connectors with press fit contacts terminations shall be tested on a printed circuit board with interconnecting traces (see 3.2.4.1). Unless otherwise specified in the referencing docume
22、nt, no soldering on the termination, test board trace, or plated thru holes shall be allowed. EIA-364-55A Page 3 3.2.6 Terminations Unless otherwise specified in the referencing document, contacts or connectors mechanically attached shall be terminated in accordance with the test sponsors instructio
23、ns. 3.2.7 Spacing 3.2.7.1 Unless otherwise specified in the referencing document, when multiple specimens are being tested, the interconnecting jumper, if used, shall not exceed a 30 C temperature rise or be greater than the test specimen temperature rise when measured at the midpoint of the jumper
24、interconnecting the specimens. 3.2.7.2 Spacing between all specimens shall not allow mutual heating from one specimen to the other. This shall be the minimum spacing. Maximum spacing shall be at the option of the testing agency. 3.2.8 Thermocouple and/or voltage drop connections When specified, plac
25、ement of the connections shall be in accordance with the referencing document or by agreement between qualifying agency and laboratory including any special instructions. 3.2.9 Cleaning Unless otherwise specified in the referencing document, contacts tested with lubricants shall not be cleaned. Loca
26、lized cleaning may be performed if the cleaning does not contact the lubricated areas. Cleaning unlubricated samples shall be allowed either locally or in total. 4 Test procedure 4.1 Voltage drop or resistance When specified in the referencing document, voltage drop or contact resistance measurement
27、s shall be performed in accordance with EIA-364-06. The voltage probes shall be placed as specified in the referencing document. EIA-364-55A Page 4 4.2 Temperature rise and/or resistance measurements Measurement intervals shall be selected from one of the interval conditions indicated in table 1, un
28、less otherwise specified in the referencing document. Table 1 Measurement intervals Interval condition Interval Number of measurements per day 1 Every 12 hours 2 hours 2 2 7 hours 1 hour 2 3 (See 4.2.2) As specified in the referencing document 4.2.1 Measurements may be performed with automatic measu
29、ring systems or manually at the discretion of the testing agency. 4.2.2 Interval condition 3 shall be at the option of the qualifying agency. 4.3 The wired specimens shall be mounted in a manner to allow free air circulation around each specimen, and to minimize conduction of heat from specimens and
30、 surrounding equipment. The distance between each specimen shall be constant. The test area shall be free of drafts or varying temperature gradients that could affect the temperature of the specimens. 4.4 The wired specimen(s) shall be connected to a power supply capable of supplying the test curren
31、t specified. Where series interconnections are not practical, individual power sources shall be used. 4.5 Determine the test current for the current cycling test from table 2, or as specified in the referencing document. Table 2 - Test current conditions Test condition Test current, % rated current
32、A 100B 125C 150D 200 E (See note) NOTE The test current for test condition E shall be 20%, 30%, etc of the rated current as specified in the referencing document. EIA-364-55A Page 5 4.6 Energize and subject the test specimens to a current cycling test of 500 cycles, unless otherwise specified in the
33、 referencing document. Each cycle shall consist of one of the test cycle conditions specified in table 3, unless otherwise specified in the referencing document. Table 3 Cycle conditions Cycle time, minutes Test method On Off 1 5 52 15 153 30 154 45 15 5 (See 4.7) (See 4.7) 4.7 Unless otherwise spec
34、ified in the referencing document, cycle condition 5 (power on / power off) shall be established when thermal stabilization is established plus 10 minutes minimum after achieving stabilization at the power on and power off steps. 4.8 Unless otherwise specified in the referencing document, the number
35、 of cycles shall be performed in a continuous manner. Power disruption that may interrupt the test shall be noted and recorded in the test report. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Test specimen preparation, if special preparation is
36、required 5.2 Number of specimens to be tested 5.3 Preconditioning or special environments 5.4 Initial or intervals and final measurements 5.5 Test current condition and actual test current value, see table 2 5.6 Cycle conditions 5.7 Number of cycles 5.8 Designation if contact is to be tested in or o
37、ut of the connector housing 5.9 Length of conductor between contacts, if other than specified 5.10 Voltage probe placement when voltage drop is specified 5.11 Thermocouple placement when temperature measurements are specified. EIA-364-55A Page 6 6 Test documentation Documentation shall contain the d
38、etails specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description and wiring configuration 6.3 Test equipment used, and date of last and next calibration 6.4 Values and observations 6.5 Name of operator and start/finish date of test Revision History Rev
39、ision letter Project number Additions, changes and deletions A SP-5089 Revised all paragraphs. ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and
40、 mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision
41、: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org
