1、 EIA STANDARD Fixed Capacitors for Use in Electronic Equipment Part 1: Generic Specification EIA-60384-1 (IEC 60384-1:2008, IDT) March 2014 ANSI/EIA-60384-1-2014 Approved: March 3, 2014 EIA-60384-1 NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through el
2、iminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not
3、in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the standard is to be us
4、ed either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties a
5、dopting the Standard or Publication. This EIA Standard is identical (IDT) with the International Standard IEC Publication 60384-1:2008 Edition 4: Fixed Capacitors for use in Electronic Equipment Part 1: Generic Specification. This document is the EIA Standard EIA-60384-1-2014 Edition 1: Fixed Capaci
6、tors for use in Electronic Equipment Part 1: Generic Specification. The text, figures and tables of IEC 60384-1:2008 are used in this Standard with the consent of the IEC and the American National Standards Institute (ANSI). The IEC copyrighted material has been reproduced with permission from ANSI.
7、 The IEC Foreword and Introduction are not part of the requirements of this standard but are included for information purposes only. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user o
8、f this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5246, formulated under the cognizance of the Steering Committee for Passive Electronic Components Standards (S-1). Published
9、by Electronic Components Industry Association 2014 Engineering Department 2214 Rock Hill Road, Suite 265 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited n
10、umber of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) i CONTENTS FOREWORD 1 1 General . 3 1.1 Scope . 3 1.2 Normative references 3 2 Technical data
11、. 4 2.1 Units and symbols . 4 2.2 Terms and definitions 5 2.3 Preferred values 11 2.3.1 General . 11 2.3.2 Preferred values of nominal capacitance . 11 2.3.3 Preferred values of rated voltage 11 2.4 Marking . 11 2.4.1 General . 11 2.4.2 Coding. 11 3 Quality assessment procedures 11 4 Tests and measu
12、rement procedures 12 4.1 General . 13 4.2 Standard atmospheric conditions 13 4.2.1 Standard atmospheric conditions for testing 13 4.2.2 Recovery conditions . 13 4.2.3 Referee conditions . 14 4.2.4 Reference conditions 14 4.3 Drying . 14 4.4 Visual examination and check of dimensions. 14 4.4.1 Visual
13、 examination . 14 4.4.2 Dimensions (gauging) . 14 4.4.3 Dimensions (detail) 14 4.5 Insulation resistance 15 4.5.1 Preconditioning 15 4.5.2 Measuring conditions . 15 4.5.3 Test points . 15 4.5.4 Test methods . 15 4.5.5 Temperature compensation 16 4.5.6 The relevant specification shall prescribe: . 16
14、 4.6 Voltage proof 17 4.6.1 Test circuit (for the test between terminations) 17 4.6.2 Test . 18 4.6.3 Requirements 20 4.6.4 Conditions to be prescribed in the relevant specification 20 4.7 Capacitance 20 4.7.1 Measuring frequency and measuring voltage . 20 4.7.2 Measuring equipment . 20 4.7.3 Condit
15、ions to be prescribed in the relevant specification 20 4.8 Tangent of loss angle and equivalent series resistance (ESR) . 21 4.8.1 Tangent of loss angle . 21 4.8.2 Equivalent series resistance (ESR) . 21 ii 4.9 Leakage current 21 4.9.1 Preconditioning 21 4.9.2 Test method. 22 4.9.3 Power source . 22
16、 4.9.4 Measuring accuracy . 22 4.9.5 Test circuit . 22 4.9.6 Conditions to be prescribed in the relevant specification 22 4.10 Impedance 22 4.11 Self-resonant frequency and inductance . 23 4.11.1 Self-resonant frequency (fr) 23 4.11.2 Inductance . 26 4.11.3 Conditions to be prescribed in the relevan
17、t specification 26 4.12 Outer foil termination . 26 4.13 Robustness of terminations 27 4.13.1 Test Ua1 Tensile . 27 4.13.2 Test Ub Bending (half of the sample) . 27 4.13.3 Test Uc Torsion (remaining sample) . 27 4.13.4 Test Ud Torque (for terminations with threaded studs or screws and for integral m
18、ounting devices) 27 4.13.5 Visual examination . 28 4.14 Resistance to soldering heat 28 4.14.1 Preconditioning 28 4.14.2 Test procedure . 28 4.14.3 Recovery . 28 4.14.4 Final inspection, measurement and requirements 28 4.15 Solderability 28 4.15.1 Preconditioning 28 4.15.2 Test procedure . 29 4.15.3
19、 Final inspection, measurements and requirements . 29 4.16 Rapid change of temperature . 29 4.16.1 Initial measurement 29 4.16.2 Test procedure . 29 4.16.3 Final inspection, measurements and requirements . 29 4.17 Vibration . 30 4.17.1 Initial measurement 30 4.17.2 Test procedure . 30 4.17.3 Electri
20、cal test . 30 4.17.4 Final inspection, measurements and requirements . 30 4.18 Bump 30 4.18.1 Initial measurement 30 4.18.2 Test procedure . 30 4.18.3 Final inspection, measurements and requirements . 30 4.19 Shock . 30 4.19.1 Initial measurement 30 4.19.2 Test procedure . 30 4.19.3 Final inspection
21、, measurements and requirements . 31 4.20 Container sealing 31 4.21 Climatic sequence . 31 4.21.1 Initial measurements 31 iii 4.21.2 Dry heat 31 4.21.3 Damp heat, cyclic, test Db, first cycle 31 4.21.4 Cold 31 4.21.5 Low air pressure 32 4.21.6 Damp heat, cyclic, test Db, remaining cycles . 32 4.21.7
22、 Final measurements . 32 4.22 Damp heat, steady state 32 4.22.1 Initial measurement 32 4.22.2 Test procedure . 32 4.22.3 Final inspection, measurements and requirements . 33 4.23 Endurance 33 4.23.1 Initial measurements 33 4.23.2 Test procedure . 33 4.23.3 Conditions to be prescribed in the relevant
23、 specification 33 4.23.4 Test voltage . 33 4.23.5 Placement in the test chamber 34 4.23.6 Recovery . 34 4.23.7 Final inspection, measurements and requirements . 34 4.24 Variation of capacitance with temperature . 35 4.24.1 Static method . 35 4.24.2 Dynamic method 35 4.24.3 Methods of calculation 36
24、4.25 Storage . 37 4.25.1 Storage at high temperature . 37 4.25.2 Storage at low temperature . 37 4.26 Surge 37 4.26.1 Initial measurement 37 4.26.2 Test procedure . 38 4.26.3 Final inspection, measurements and requirements . 39 4.26.4 Information to be given in the relevant detail specification 39 4
25、.27 Charge and discharge tests and inrush current test . 39 4.27.1 Initial measurement 39 4.27.2 Test procedure . 39 4.27.3 Charge and discharge 41 4.27.4 Inrush current 41 4.27.5 Final inspection, measurements and requirements . 41 4.28 Pressure relief (for aluminium electrolytic capacitors) 41 4.2
26、8.1 a.c. test . 41 4.28.2 d.c. test . 41 4.28.3 Pneumatic test . 41 4.28.4 Final inspection, measurements and requirements . 42 4.29 Characteristics at high and low temperature 42 4.29.1 Test procedure . 42 4.29.2 Requirements 42 4.30 Thermal stability test . 42 4.31 Component solvent resistance . 4
27、2 4.31.1 Initial measurements 42 4.31.2 Test procedure . 42 4.31.3 Final inspection, measurements and requirements . 43 iv 4.32 Solvent resistance of marking 43 4.32.1 Test procedure . 43 4.32.2 Final inspection, measurements and requirements . 43 4.33 Mounting (for surface mount capacitors only) 43
28、 4.33.1 Substrate . 43 4.34 Shear test . 46 4.34.1 Test procedure . 46 4.34.2 Final inspection, measurements and requirements . 46 4.35 Substrate bending test . 46 4.35.1 Test procedure . 46 4.35.2 Recovery . 46 4.35.3 Final inspection and requirements . 46 4.36 Dielectric absorption 46 4.36.1 Test
29、procedure . 46 4.36.2 Requirement 47 4.37 Accelerated damp heat, steady state (for multilayer ceramic capacitors only) . 47 4.37.1 Mounting of capacitors . 47 4.37.2 Initial measurement 47 4.37.3 Test procedure . 47 4.37.4 Recovery . 48 4.37.5 Final inspection, measurements and requirements . 48 4.3
30、8 Passive flammability 48 4.38.1 Test procedure . 48 4.38.2 Final inspection, measurements and requirements . 48 4.39 High surge current test 49 4.39.1 Initial measurements 49 4.39.2 Test procedure . 49 4.39.3 Requirements for the charging circuit 49 4.39.4 Nonconforming items 50 4.40 Voltage transi
31、ent overload (for aluminium electrolytic capacitors with non-solid electrolyte) 50 4.40.1 Initial measurement 50 4.40.2 Test procedure . 50 4.40.3 Final inspection, measurements and requirements . 51 4.40.4 Conditions to be prescribed in the relevant specification 51 Annex A (normative) Interpretati
32、on of sampling plans and procedures as described in IEC 60410 for use within the IECQ system . 52 Annex B (normative) Rules for the preparation of detail specifications for capacitors and resistors for electronic equipment for use within the IECQ system 53 Annex C (normative) Layout of the first pag
33、e of a PCP/CQC specification . 54 Annex D (normative) Requirements for capability approval test report . 55 Annex E (informative) Guide for pulse testing of capacitors 56 Annex F (informative) Guidance for the extension of endurance tests on fixed capacitors 59 Annex G (normative) Damp heat, steady
34、state with voltage applied, for metallized film capacitors only . 60 Annex Q (normative) Quality assessment procedures . 61 Figure 1 Reactive power against frequency . 7 v Figure 2 Relation between category temperature range and applied voltage . 10 Figure 3 Voltage-proof test circuit . 18 Figure 4
35、Schematic diagram of the impedance measuring circuit 22 Figure 5 Capacitor mounting arrangement 24 Figure 6 Capacitor mounting arrangement 24 Figure 7 Typical diagram of an absorption oscillator-wavemeter . 25 Figure 8 Schematic diagram of the measuring circuit . 25 Figure 9 Test circuit . 26 Figure
36、 10 Test circuit for electrolytic capacitors . 34 Figure 11 Relay circuit . 38 Figure 12 Thyristor circuit 38 Figure 13 Voltage waveform across capacitor . 39 Figure 14 Voltage and current waveform . 40 Figure 15 Suitable substrate for mechanical tests (may not be suitable for impedance measurements
37、) . 45 Figure 16 Suitable substrate for electrical tests . 45 Figure 17 High surge current test . 49 Figure 18 Voltage transient overload test circuit 50 Figure 19 Voltage waveform . 51 Figure Q.1 General scheme for capability approval . 64 Table 1 Referee conditions 14 Table 2 Measurement of insula
38、tion resistance . 15 Table 3 Measuring points . 17 Table 4 Tensile force . 27 Table 5 Torque 27 Table 6 Number of cycles. 32 Table 7 Severities and requirements . 48 EIA-60384-1 Page 1 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 1: Generic specif
39、ication FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardizatio
40、n in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is ent
41、rusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the Inter
42、national Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since
43、each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of
44、 IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in
45、their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment dec
46、lared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC Nation
47、al Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is
48、drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall
49、not be held responsible for identifying any or all such patent rights. International Standard IEC 60384-1 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment This fourth edition cancels and replaces the third edition issued in 1999 and constitutes a technical revision, including minor revisions related to tables, figures and references. This edition contains the following significant technical changes with respect to the previous edition: implementation of Annex
