1、 EIA STANDARD Method of Measurement of Non-Linearity in Resistors EIA-60440 (IEC 60440:2012, IDT) October 2014 ANSI/EIA-60440-2014 Approved: October 10, 2014 EIA-60384-11 EIA-60440NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunder
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5、rd or Publication. This EIA Standard is identical (IDT) with the International Standard IEC Publication 60440: Method of Measurement of Non-Linearity in Resistors. This document is the EIA Standard EIA-60440: 2014: Method of Measurement of Non-Linearity in Resistors. The text, figures and tables of
6、IEC 60440: 2012 are used in this Standard with the consent of the IEC and the American National Standards Institute (ANSI). The IEC copyrighted material has been reproduced with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included
7、 for information purposes only. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicabili
8、ty of regulatory limitations before its use. (From Standards Proposal No. 5316, formulated under the cognizance of the Steering Committee for Passive Electronic Components Standards (S-1). Published by Electronic Components Industry Association 2014 Standards any IEC National Committee interested in
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14、EC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of it
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16、er IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the
17、 subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60440 has been prepared by committee 40: Capacitors and resistors for electronic equipment. This International Standard cancels and replaces the Technical Report IEC
18、/TR 60440, published in 1973. The major changes with regard to the Technical Report are: change of the principle parameters term from “third harmonic attenuation” to “third harmonic ratio”; addition of advice on the prescription of requirements in a relevant component specification; addition of a se
19、t of recommended measuring conditions for a specimen with a rated dissipation of less than 100 mW; a complete editorial revision. EIA-60440 Page 2 The text of this standard is based on the following documents: FDIS Report on voting40/2155/FDIS 40/2167/RVD Full information on the voting for the appro
20、val of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the
21、 IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. EIA-60440 Page 3 METHOD OF MEASUREMENT OF NON-LINEARITY IN RESISTORS 1 Scope Non-linearity testing is
22、a method to evaluate the integrity of a resistive element. It may be applied as an effective inline screening method suitable to detect and eliminate potential infant mortality failures in passive components. The method is fairly rapid, convenient, and the associated equipment is relatively inexpens
23、ive. Typical effects causing non-linearity on resistors are e.g. inhomogeneous spots within a resistive film, traces of film left in the spiraling grooves, or contact instability between a connecting lead or termination and the resistive element. This International Standard specifies a method of mea
24、surement and associated test conditions to assess the magnitude of non-linear distortion generated in a resistor. This method is applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer. 2 Normative references The following documents, in whole o
25、r in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-1, Environmental testing Part 1:
26、 General and guidance 3 Terms and definitions For the puposes of this document the following terms and definitions apply. 3.1 electromotive force e.m.f. difference in potential that tends to give rise to an electric current 3.2 non-linearity deviation of a components impedance from Ohms law, resulti
27、ng in voltage of harmonic frequencies when subjected to sinusoidal current 3.3 third harmonic ratio A3ratio of the fundamental voltage over the e.m.f. of the third harmonic Note 1 to entry: The third harmonic ratio is expressed in dB. Note 2 to entry: The third harmonic ratio has been addressed befo
28、re as third harmonic attenuation. This historic convention is misleading as it wrongly suggests harmonic frequencies originating from the test equipment being attenuated or filtered by the components under test. The misleading term should therefore be avoided. EIA-60440 Page 4 4 Method of measuremen
29、t 4.1 Measurement principle A pure sinusoidal current is passed through the component under test. If the impedance of the component is not perfectly linear, the voltage across the component will be distorted and contain harmonics. One or more of these harmonics can be measured and the magnitude of t
30、hese distortions is a measure of the non-linearity in the component. It is recommended to measure the third harmonic, as it is the dominant one. The third harmonic voltage appearing across a component needs to be separated from the fundamental voltage and from any other harmonic voltage for the meas
31、urement. This is accomplished by a filter circuit letting the harmonic voltage pass through while featuring very high impedance at the fundamental frequency. Also, the generator of the fundamental frequency needs to feature very high impedance at the third harmonic frequency so as not to act as a lo
32、ad to the generated distortions. Hence, the equivalent circuit of the generator part operating at the fundamental frequency is quite simple, as shown in Figure 1. U1RTI1IEC 1432/12 Key I1Sinusoidal current U1Fundamental voltage across the resistor under test RTImpedance of the resistor under test at
33、 the fundamental frequency Figure 1 Equivalent circuit at the fundamental frequency The equivalent circuit for the third harmonic frequency is built around the test specimen represented by a linear impedance with a zero-impedance harmonic generator in series. This signal source loads the measuring s
34、ystem represented by its impedance as seen from the test terminals, see Figure 2. EIA-60440 Page 5 U3RT3R3E3IEC 1433/12 Key E3e.m.f. of the third harmonic RT3Impedance of the resistor under test at the third harmonic frequency R3Impedance of the measuring circuit at the third harmonic frequency, see
35、n from the test terminals U3Third harmonic voltage Figure 2 Equivalent circuit at the third harmonic frequency In this circuit the e.m.f. of the third harmonic E3is divided into the measurable third harmonic voltage U3 33T333ERRRU (1)Hence, the e.m.f. of the third harmonic E3in the component can be
36、determined by 333T31 URRE (2) The corrective term for the reduction of U3to the origin E3is 33T101log20RR (3) In many cases it can be shown for a range of resistors under test that the impedance RT3at the third harmonic frequency is equal or very close to the impedance RTat the fundamental frequency
37、. Then the corrective term in decibels is 3T101log20RR (4)NOTE 1 For fixed film resistors this equality of RT3and RTcan generally be assumed with sufficient accuracy. Numeric values for the corrective term can be obtained from Figure 3 or for specific sets of impedance R3and specimen resistance RTfr
38、om Table 1. EIA-60440 Page 6 0,1 1 10 10001020304050RT/R3(dB)IEC 1434/12 Figure 3 Corrective term A suitable range for the fundamental frequency f1for measurements on resistors is between 10 kHz and 40 kHz. This frequency range enables the test circuit to be set up without too much difficulty. NOTE
39、2 Another method is using a bridge which is balanced at the fundamental frequency, where the harmonics appear across the bridge diagonal. This method requires individual balancing of the bridge for each specimen, which may be suitable for occasional use in a laboratory environment. 4.2 Measuring cir
40、cuit Figure 4 shows a block schematic of a suitable measuring circuit. A distortion-free impedance matching device may be used to switch R3in order to achieve good matching to the test specimen RT. Examples of suitable values of R3are 10 100 1 k; 10 k and 100 k; these values are used for specifying
41、the test conditions in Table 1. The suitability of the measuring circuit for measurements on resistors with resistance values covering a wide range depends on the lowest and highest available impedance R3 of the circuit. The range of values for R3proposed above grants suitability for measurements on
42、 specimen RTwith their resistance being in the range of 1 to at least 10 MHowever, there is an overriding influence of the correcting term depending on the ratio of resistance under test RTover impedance R3, see Table 1 and Figure 3. EIA-60440 Page 7 A VA LP BPGSVU1 VR3RTU3IEC 1435/12 Key G Oscillat
43、or, at the fundamental frequency f1S Switch for applying the test signal to the test specimen VA Variable attenuator A Power amplifier LP Low-pass filter U1r.m.s. voltage at the fundamental frequency f1BP Band-pass filter U3r.m.s. voltage at the third harmonic frequency f3RTResistor under test R3Imp
44、edance of the measuring circuit at the third harmonic frequency f3, seen from the test terminals. Figure 4 Block schematic of a suitable measuring system 4.3 Measurement system requirements 4.3.1 Measuring frequency The fundamental frequency f1shall be 10 kHz and thus the third harmonic frequency f3
45、shall be 30 kHz, unless otherwise specified in the relevant component specification. 4.3.2 Noise level of the measuring system The noise level referred to the test terminals shall not be higher than 0,2 V at R3= 1 k. 4.3.3 Third harmonic ratio of the measuring system The third harmonic ratio 3110log
46、20 EU shall be higher than 140 dB for most of the impedance range when the required dissipation P is applied to a virtually linear component. The required dissipation is 0,25 VA, as given in Table 1, or a value prescribed by the relevant component specification, e.g with reference to the rated dissi
47、pation. 4.3.4 Power amplifier The power amplifier shall be capable of delivering an apparent power of four times the required dissipation into a resistive component under test, in order to ensure sufficient linearity. Hence, the power amplifier shall be capable of delivering an apparent power of 1 V
48、A if the required dissipation is 0,25 VA as given in Table 1. EIA-60440 Page 8 4.3.5 Voltmeter The error of the voltmeter for measurement of the voltage U1at the fundamental frequency shall be less than 5 % of its full scale deflection. The error of the voltmeter for measurement of the voltage U3at
49、the third harmonic frequency shall be less than 10 % of its full scale deflection. 4.3.6 Filter The cut-off frequency of the low-pass filter shall be immediately above the fundamental freuqency f1. The band-pass filter shall permit the third-harmonic frequency f3to pass through, while it shall provide very high attenuation at the fundamental frequency f1. Precautions shall be taken to avoid non-linear distortion from the components near the test specimen in the low-pass and band-pass fil
