1、 EIA SPECIFICATION Requirements Guide for Space Grade Electrical Connectors EIA-710-A (Revision of EIA-710) January 2017 Electronic Components Industry Association ANSI/EIA-710-A-2017 Approved: January 11, 2017 EIA-710-A NOTICE EIA Engineering Specifications and Publications are designed to serve th
2、e public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Specifica
3、tions and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Specifications and Publications, nor shall the existence of such Specifications and Publications preclude their voluntary use by those other than ECI
4、A members, whether the Specification is to be used either domestically or internationally. Specifications and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, no
5、r does it assume any obligation whatever to parties adopting the Specification or Publication. This EIA Specification is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison
6、between the EIA Specification and the IEC document can be made. This Specification does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Specification to establish appropriate safety and health
7、practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5341, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards, and previously published in EIA-710). Published by Electronic Components
8、Industry Association 2017 EIA Standards 25 milliohms maximum for contact size 26 and wire AWG 25. N Type: The contact resistance shall be 71 milliohms maximum for contact size 30 and NEMA HP3-ETXBBB (stranded) wire (AWG 30). EIA-710-A Page 18 P Type: A minimum of seven mated contact pairs shall be t
9、ested. Using a test current of 100 milliamperes maximum the contact resistance shall be as specified in Table 2, clause 3.18 of MIL-DTL-55302. 5.21 Crimp tensile strength (M, N and P type only) The crimp tensile strength shall be tested in accordance with EIA-364-08. The acceptance criteria are as f
10、ollows: M Type: The wire shall not break or pull out of the crimp contacts at less than 22 N (5 lb-f) and wire breakage other than at the crimp shall not be considered a failure. N Type: The wire shall not break or pull out of the crimp contacts at less than 4.4 N (1 lb-f) and wire breakage other th
11、an at the crimp shall not be considered a failure. P Type: The wire shall not break or pull out of the crimp contacts at less than 111 N (25 lb-f) for 20 AWG wire, 67 N (15 lb-f) for 22 AWG wire, 45 N (10 lb-f) for 24 AWG wire, 22 N (5 lb-f) for 26 AWG wire, 13 N (3 lb-f) for 28 AWG wire, 7 N (1.5 l
12、b-f) for 30 AWG wire. 5.22 Maintenance aging (non-hermetic C and D types) Circular and D-subminiature type connectors shall be tested in accordance with EIA-364-24 when required by the application. This test may not be relevant to all applications of space flight. C Type: The contact installation an
13、d removal forces shall not exceed the following: 45 N (10 lb-f) for size 22, 89 N (20 lb-f) for sizes 20 and 16, 133 N (30 lb-f) for size 12, 156 N (35 lb-f) for sizes 8 and 10. D Type: The mating/unmating forces as well as the contact insertion and removal forces shall meet the requirements listed
14、in 5.3 and Table 1. 5.23 Resistance to solder heat (D and M types only) This test is for solderable, non-removable contacts only on D-subminiature and micro-miniature connectors. The test shall be conducted in accordance with MIL-STD-202-210 (or EIA-364-56). D and M Type: Testing quantity shall be 2
15、0% or seven contacts minimum. A solder iron rated for 25 watts shall be used. The solder iron shall be heated to 360 C. It shall be applied to the termination for a period necessary to hold the solder in a liquid state for a time duration of 4 s to 5 s. After the EIA-710-A Page 19 test, a visual ins
16、pection shall be performed at a magnification of 10X. The contact shall meet the contact retention requirement and shall have no evidence of distortion or damage. 5.24 Solderability (D and M types) The test for solderability shall be conducted in accordance with J-STD-002. This test shall be conduct
17、ed on D-subminiature and microminiature connectors. 5.25 Impact (special cases C composite type only) The test for impact damage shall be conducted on circular type composite connectors that are considered environment resistant, have straight strain relief clamps and have either threaded coupling or
18、 breech coupling. This test is not for bayonet coupled connectors. The test for impact shall be performed in accordance with EIA-364-42. Connectors shall be dropped from a height of 1.2 m (4ft.) a total of 8 times. The plate shall be indexed at 36 intervals. The plugs shall have no caps or covers in
19、stalled. Connectors should function adequately mechanically and electrically, within specified limits of project engineering documentation. 5.26 Shell-to-shell conductance (C type only) The test for shell-to-shell conductance on circular connectors that have conductive plating only shall be performe
20、d in accordance with EIA-364-83. The maximum voltage potential drop across assemblies shall be: C type connectors with spring fingers or bayonet coupling: 2.5 mV for silver plating 50 mV for stainless steel plating 1 mV for space grade electroless nickel plating or corrosion resistant steel with ele
21、ctrodeposited nickel plating threaded or standard breech: 2.5 mV for corrosive resistant plating 10 mV for hermetic or non-hermetic connectors with corrosive resistant steel plating 1 mV for any hermetic or non-hermetic types with electrodeposited nickel For C Type connectors without spring fingers,
22、 bayonet or breech coupling, the maximum voltage drop across assemblies shall be 200 mV. For corrosive resistant composite types, 3 mV initial and 6 mV after conditioning. 5.27 EMI shielding (C Type only) To measure the EMI shielding effectiveness, circular connectors with spring fingers, conductive
23、 plating and multiple contacts shall be tested in accordance with or EIA-364-66. The EMI shielding capabilities of mated shells shall not be less than what is listed in Table 2 below for a given connector coupling type and a given frequency. EIA-710-A Page 20 Electroless nickel coated connectors: Ba
24、yonet, scoop-proof, shall have a minimum leakage attenuation of 50dB for the frequency range 100 MHz to 10 GHz Bayonet, non-scoop-proof, low silhouette, shall have a minimum leakage attenuation of 45 dB for the frequency range 100 MHz to 1 GHz Threaded or breech (electroless nickel over composite) s
25、hall have a minimum leakage attenuation of 65 dB for the frequency range 100 MHz to 10 GHz. Table 2 - Minimum allowable leakage attenuation versus operating frequency Frequency, MHz Minimum allowable leakage attenuation, dB Threaded or breech, steel or steel plating Threaded or breech, nickel platin
26、g (see Note) 100 80 90 200 75 88 300 73 88 400 71 87 800 66 85 1,000 65 85 1,500 59 76 2,000 55 70 3,000 52 69 4,000 50 68 6,000 48 68 10,000 45 65 NOTE Nickel plating over steel connectors are included in this category. The above is information extracted from MIL-DTL-38999. 5.28 Firewall protection
27、 (C Type only) Circular connectors with a firewall barrier (and steel or nickel plating) shall be tested in accordance with EIA-364-45. A mated connector pair shall prevent passing of a flame for 20 minutes. Current shall be applied for 5 minutes and in the 6th minute, the connector shall draw no mo
28、re than 2A at a potential of 100 V to 125 V at 60 Hz is being applied to adjacent contacts. Wire bundles shall be clamped to fixed points at least 20 cm behind the connector. 5.29 Ozone (C Type only) For circular connectors only, the wired and mated connectors shall be tested in accordance with EIA-
29、364-14. After ozone exposure, the connectors shall show no evidence of dielectric cracking or any other type of degradation or damage. EIA-710-A Page 21 5.30 Atomic oxygen (nonmetal shell D, M, P Types) All nonmetallic shell connectors shall be tested for atomic oxygen degradation. Fluence levels sh
30、all be approximately 1021atoms / cm2at an energy level of 5 eV and an exposure time of 40 hours. Atomic oxygen materials testing can be accomplished at Marshall Space Flight Center. Connectors shall show no signs of degradation or eroding. 5.31 Contact pin strength (D Type only) For D-subminiature c
31、onnectors with non-removable contacts, the contact pin strength shall be tested as follows: contacts shall be mounted in a suitable fixture and a gradual force shall be applied to the pin at a maximum rate not faster than what it takes to move the head of the machine by 2.5 cm per min (1 inch per mi
32、n). The maximum load shall be applied for no more than one minute. The maximum distance that the pin has moved permanently shall not exceed 0.13mm (0.005 in) given a force of 9 N (2 lb-f). For more details, refer to MIL-DTL-24308 clause “Contact pin strength”. 5.32 Cable retention (D type only) For
33、D-subminiature connectors attached to flat cables only, the unmated wired connector with strain relief shall be mounted by normal mounting means to a test fixture. An axial force of 2 N (8 oz-f) per contact shall be applied. The force shall be applied 15 cm (6 in) from the mating face of the connect
34、or in the direction that will put the maximum amount of stress on the contact-cable interface. The contact-cable interface shall withstand the force applied without mechanical damage. 5.33 Residual magnetism (D Type only) D-subminiature connectors without gold plating over copper shall be tested in
35、accordance with NASA Goddard specification S-311-P-10 for residual magnetism. The connector shall be fully assembled prior to testing and tested in a magnetically quiet area in which machines, electronic equipment, vehicles and personnel traffic are restricted. The flux meter shall be warmed up for
36、a minimum of fifteen minutes. The probe shall be mounted in a nonmagnetic stand and shall be in a horizontal position at full cable length from the meter. With the meter preset to the appropriate scale, align the probe in a magnetic east-west direction or orient to obtain a zero reading on the meter
37、. Pass the connector three times at no more than 30 cm 10 cm per second (12 in 4 in per second) between the poles of a magnet with field strength of approximately 5,000 gauss. The connector shall not contact the pole pieces of the magnet. Immediately after completing the first segment of the test, p
38、lace the connector within 3.18 mm (0. 125 in) of the probe tip and orient the specimen for a maximum magnetism reading. The measurement unit shall be in gamma where one gamma is equivalent to 10-9tesla (10-5gauss). 5.34 RF insertion loss (RF Type only) When required by the application, radio frequen
39、cy (RF) coaxial connectors shall be tested in EIA-710-A Page 22 accordance with MIL-PRF-39012, clause 3.27, using the testing apparatus and parameters specified. The insertion loss should meet the value stated in the product specification. 5.35 VSWR (RF Type only) When required by the application, r
40、adio frequency (RF) coaxial connectors shall be tested in accordance with MIL-PRF-39012, clause 3.14using the testing apparatus and parameters specified. The VSWR should meet the value stated in the product specification. 5.36 Coupling proof torque (RF Type only) For radio frequency coaxial connecto
41、rs only; the connectors shall be mated with the coupling nut tightened to the torque value quoted in the product specification sheet. After one minute the connectors shall be unmated. The coupling mechanism shall not be dislodged and dimensions of the connector shall remain as stated in the product
42、specification. 5.37 Corona (C and RF Type only) Radio frequency connectors shall be tested in accordance with EIA-364-44 and show no signs of corona discharge at altitudes of 21336 m (70,000 ft.). 5.38 Flammability (all nonmetallic shell types) SP2 - SP6 All nonmetallic shell connectors used in exte
43、rnal environments SP2 - SP6 shall be tested for flammability in accordance with ASTM-D635. It is important to note that some materials may sustain more burn damage in a vacuum environment due to the lack of convection heat transfer. It may be necessary to conduct flammability tests under vacuum cond
44、itions. Note that clause 5.12is for flammability of materials in inhabitable environments and is a flammability test in a 30 % oxygen environment. 5.39 UV weathering (all nonmetal shell types) SP2 - SP6 All non-metal shell connectors used in any external environments SP2 - SP6 shall be tested for to
45、tal mass loss as a result of ultraviolet exposure in a vacuum environment or shall be tested for degradation as a result of ultraviolet exposure only. The total exposure shall be adjusted by the operating environmental parameters stated under each environmental category. Testing in accordance with EIA-364-49can be conducted by Marshall Space Flight Center.
