1、 STD-EIA ETA-BOS-ENGL 1999 3234b00 Ob242b7 TT4 EIA STANDARD Solid Tantalum Capacitor Application Guideline EIA-809 i:I,ECIiON I C i N DUST i,. Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not
2、 assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA St.nard is considered to have International Standardization implication. but the International Electrotechnical Commission activity has not progressed to th
3、e point where a valid comparison between the EL4 Standard and the iEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate
4、safety and health practices and to determine the applicability of replatory limitations before its use. (From Project Number 3938. formulated under the cognizance of the P-2.5 Electrolytic Dielectnc Capacitors Subcommittee.) Puhlishcd tJ OELECTRONIC INDLJSTKIES ALLIANCE I999 Enz1 riccri ng Dc pari m
5、cnt 2500 Niison Boiilc.ard Arlinyon. .+I 22201 STD-EIA EIA-BOS-ENGL 1999 = 3234600 Ob242b9 877 m CONTENTS Foreword Clause 1 2 2.1 2.1.1 2.1.1.1 2.1.1.2 2.1.2 2.1.2.1 2.1.2.2 2.1.2.3 2.1.2.4 2.1.2.5 2.1.3 2.1.3.1 2.1.3.2 2.1.3.3 2.1.3.4 2.1.4 2.1.4.1 2.1.4.2 2.1.4.3 2.1.5 2.1.5.1 2.1.5.2 2.1.5.3 2.1.
6、6. 2.1.6.1 2.1.6.3 2 1.63 2 1.7 2171 2.1.7.7 2.1.7.3 2.2 2 2.1 2 2.2 2 2.3 221 3 31 3.2 3.3 3.4 3.5 4 11 4.2 4.2.1 1.2.2 4.3 4.3.1 Introduction Characterization Primary parameters Temperature range Operating range Storage temperature range Rated capacitance Tolerances Method for measuring capacitanc
7、e Temperature characteristics of capacitance Voltage characteristics of capacitance Frequency charactenstics of capacitors Dissipation factor F) Measurement of dissipation factor Temperature characteristics of dissipation factor Voltage characteristics of dissipation factor Frequency characteristics
8、 of dissipation factor Equivalent series resistance (ESR) Method for determining ESR Temperature characteristics of ESR Frequency dependence of ESR Impedance (Z) Method for measuring impedance Temperature characteristics of impedance Frequency characteristics of impedance DC leakage current Method f
9、or mcasuring leakage current Temperature dcpcndcnce of DC leakage current Voltagc charactenstics of lcakage current Voltage Operational voltage Surge voltage Rcwsc voltage Second-, paramctcrs Self rcson,ant frcqucncy (SRF) inductnncc Diclcctnc absorption Scnsiuvity to clcctrosiatic dischnrgc (ESD) C
10、 i rcui t con ri gurni i o ns Configurcd in panllcl Nonpolar configuration Configurcd in scrics Parillcl and scnal combinations Fuscd applications Re1 iabi li ty Rcliability cli,mctcnstics and fiulurc rriodcs Reliability under stcad siatc conditions Derating guidclines Rclativc failurc ratc vs strcs
11、s Rcliability undcr dynamic conditions Effect of ripple currcntnpplc .oliagc Page . 111 1 3 3 3 3 3 3 3 4 4 4 5 5 5 5 6 6 7 7 7 8 8 8 8 8 8 8 9 9 IO 1 o 10 10 11 11 II II 12 13 12 13 I? 11 15 15 15 15 15 16 18 18 i STD-EIA EIA-809-ENGL 1779 3234b00 Ob24270 599 4.3.2 5 5.1 5.2 5.2.1 5.2.2 5.2.3 5.2.3
12、 5.3 5.4 5.5 Tables 1 2 3 4 Figures 1 2 3 1 5 6 7 8 9 10 Il 17 13 11 IS I6 17 18 19 20 21 22 2 7 Effect of surge voltage and surge current Mechanical properties and handling considerations Mechanical properties: overview Handling and process considerations Wave solder Gluing Solder immersion Cooling
13、 Infrared (IR) solder reflow Vapor phase solder reflow Resistance-to-boardcleaning Maximum surge voltage limits Maximum reverse voltage limits Voltage derating recommendations Component encapsulation styles Cross-section of a molded surface mount solid tantalum capacitor Cross-section of an ayial-mo
14、unted solid tantalum capacitor Cross-section of a radialdpped solid tantalum capacitor Typical variance of capacitance with temperature Frequency characteristics of capacitance Typical temperature variation of dissipation factor Frequency characteristics of dissipation factor Temperature characteris
15、tics of ESR Frequency characteristics of ESR and impedance Typical variation of leakage current with temperature Voltage characteristics of leakage current Typical dielectric absorption characteristics Parallel configuration Nonpolar configuration Series configuration Scrics and parallcl configurati
16、ons Typical fusing schcniatic Effect of ,oltagc on failure Effect of ternperaturc on failure ntc Effect of scncs Z on failure raie T!pical Ivavc solder temperature-time profile T!pical IR reflow temperature-iirnc profile Typical .:ipor p1x.c soldcr iciripcrature-tiiiic profile 18 19 19 19 19 20 20 2
17、0 20 21 22 10 11 16 19 2 2 3 3 5 6 6 7 8 9 10 12 12 13 14 14 15 17 17 18 20 21 21 11 STD-EIA EIA-809-ENGL 3999 = 3234b00 Ob24273 425 Foreword This applications guideline was prepared by the P-2.5, Committee on Electrolytic Capacitors of the Electronic Industries Alliances sector Electronic Component
18、s, Assemblies, Equipment is tlic product of absolute pemittivih and diclcctnc constnnt. is tiic dielectric Uiickness in meters (m). is iic surfacc arca in sqwc metcrs (In) o cicctrodcs The ncgativc plaic of the capacitor consists of solid clcctrolzc. usurill cn si,ils of nimpincsc dioyidc. tlui arc
19、grow b! ilicniial dccomposiiion over ail tlic inicml and cstcmil andc siirlxcs. dircctl) o11 iop of ttic diclcctnc la!m Final outer coats of ppluic and silttr arc usucill. npplicd ;it ihs singc to fmlii;iic subscqucnt diodc temunalion Welding to tlic cuiodc wirc and ciihcr soldcnng or bonding uiUi c
20、onductnc cp io tlic couiiicrclciirodc coriiriionly 1criiiiII;itcs lie finislicd capacitor clcnicnts Ai ilut singe. CC:ISLII.IIIW inio tlic fin;il bod! st! IC is coiiiplcicd Esmiplcs of rlic ii1;iin product styles arc sliown in figurcs 1-3 STD-EIA EIA-809-ENGL 1999 W 3234600 Ob211273 2TB W EIA-809 So
21、lid tantalum capacitor application guide Page 2 (AlMuril.OUMOp1 1, n) Pohrtty Bevel (+ I Sllver Paint cnim UYrr) Figure lAross section of tpical surface-mounted solid tantalum capacitor STD=EIA EIA-AOY-ENGL 1999 W 3234b00 Ob24274 134 E1A-809 Solid tantalum capacitor application guide Page 3 Lead Wlr
22、s TYPiCJ BQSOP? $0 wrp Figure 3-Cross section of typical radial-dipped solid tantalum capacitor 2 Characterization 2.1 Primary parameters 2.1.1 Temperature range 2.1.1.1 Operating range This is the temperature range over which the part !vil1 function when electrified. wihn the limits given in tiic s
23、ectionai specification - 55 “C to 85 “C at rated voltage: + 85 “C to 125 “C nith linear voltage derating (to U3 rated voltage at 125 “C. see 2.2.6.3 2.1.1.2 Storage temperature range This IS thc tcrnperature rangc at which the part can be subjected unbiased. and retains conformance lo spccificd clcc
24、tncril limits - 55 “C IO 125 “C NOTE-Liriiitcd cscursions to 150 “C totaling less than 4 hours arc allovablc, e.g for subsequent board IC CI cnc;ipsuiation. 2.1.2 Rated capacitance 2.1.2.1 Tolcranccs Tiic wpriciiancc of a tantaluni upxitor vancs with temperature This imation itself is depcndcnt to a
25、 sirisIl cucni on ilic nicd voltagc and capacitor size Masimum limits at high aid lo ternpcratures are pcn in cadi xiciioiul spccificrition, bpical characiensucs arc shown in figurc 4 bclow. hl i: 2098) and K (2 10%) have standard availability. with M tolerance being dic more usual for standard dcco
26、upling arid b!pass applicalions. It should be notcd that by definition. K tolerance parts meet M tolcrancc rcquircrnents and arc readily substitutable J (i 5%) toicrances ma) also be available in cenan scncs. consult suppiicr for details STD=EIA EIA-BOS-ENGL 1979 3234600 Ob24275 070 = EIA-809 Solid
27、tantalum capacitor application guide Page 4 2.1.2.2 Method for measuring capacitance For solid tantalum capacitors, the rated capacitance is measured as the capacitance of the equivalent senes circuit at 25 OC in a measuring bridge supplied by a 120 Hz source free of harmonics with maximum AC signal
28、 voltage of 1 V rms and forward-biased with 2.2 VDC m. 15- o 10- U s o, u (II o (II Q m o 0- 5- U .- -5 - Typical capacitance change with temperature High CV / Standard CV f /*- I I I l 5 NOTE-LO capacitance-voltage (CV) tatings show less variance than high CV ratings. Figure tTypical variance of ca
29、pacitance with temperature 2.1.2.3 Temperature characteristics of capacitance nic c;ipicitrincc of a trintalurn capacitor varies vith tcmperaturc. Tlus variation itself is dependent to a smll ctcrII on tlic ratcd voltage ;ind capacitor six. Maximum limits at high and low tcmperaturcs are gilcn in c;
30、icti scciioril spccificntion: t!pical Irnctcnscs arc SOH. in figurc J. 2.1.2.4 oltagc characterstics of capacitance C;ip.icii.inic stiotrs oiih siririll malions as a function of applicd oItagc The cffcct IS vinuall! unobwcnablc .it rundxd icrripcraturcs and oltrigcs. aldiougli ;1 1% io 2% c1i;inf.c
31、due to oltagc m?! bc secri ,II 1riainiuiii opcraing tcmpcrarurc if IOU bias oliagc is applicd 2.1.3 Frcqurnc! characteristics of capacitors Ttic ctTcciic cip.icii,incc dccrwscs as frcqucnc? incrcascs as shotrn in figurc 5 Bqond 100 kHt tlic wp.icii.iricc coriiiniics IO drop until rcsonancc is rcachc
32、d (t!picall? between 200 kHr - 500 kHz depending on r.itiiig1 Bcsoiid iliis dic dc ICC bccomcs inductic Tlic tcrnunation stlc (i c , chip or Icadcd) uill inlucricc ilic iridticti c cIi;mctcnstics STD=EIA EIA-809-ENGL L999 E 3234b00 Ob2427b TO7 E a 120- o e Cu EIA-809 Solid tantalum capacitor applica
33、uon gude Page 5 Typical curve characteristic vs frequency 6os 40 0.1 1 10 1 O0 Frequency, kHt Figure 5-Frequency cbaractenstics of capacitance 2.1.3 Dissipation factor (DF) 2.1.3.1 Measurement of dissipation factor Dissipation factor is the measurement of the tangent of the loss angle (tan 6) espres
34、sed as a percentage. The measurement of DF is carried out at + 25 “C, 120 Hz, and 2.2 VIX bias mas. with a maximum 1 VAC rms signai voltrigc free of harmonics. The value of DF is temperature and fiequenq dependent. The tangent of the loss angle is a measure of the energy loss in the capacitor. It is
35、 expressed as tan 6 and is tlic power loss of the capacitor divided by its reactive poner at a sinusoidal voltage of specified frcqucnq. Terms also used are power factor. loss factor. and diclectric loss: cos (90“ - 6) is the true polvcr factor 2.1.3.2 The dissipation factor vanes wth temperature. a
36、nd maximum limits arc givcn in cacti sectionil specification T!pical charactenstics are shoun in figure 6 Temperature characteristics of dissipation factor EIA-809 Solid tantalum capacitor application guide Page 6 Typical curves-Dissipation factor vs temperature s U- n 7.5- 5.0- 2.5- 0.0 1 I I I I I
37、 I l I -55-40 -20 O 20 40 60 80 100 1 Temperature, OC !5 Figure and this can be calculated by equation 2: tan S 27TfC ESR = - where f C tan 6 is the frequency in hertz (Hz); is the capacitance in farads (F); is the dissipation factor. NOTE-This equation requires that the values used for both tan 6 a
38、nd capacitance be measured at the same frequency for where the ESR value is required. The ESR is frequency and temperature dependent with the standard reference conditions being 100 kHz at 35 “C. ESR can be measured with a 2.2 V maximum DC bias with an AC signal (free of harmonics) in the millivolt
39、range at approximately 100 mA. ESR is one of the conuibumg factors to impedance, and at high frequencies (from about 100 kHz to self- resonance point) is the dominant factor so that both parameters are nearly identical in this range. 2.1.4.2 Temperature characteristics of ESR Ai 100 kHz. Impedance a
40、nd ESR behave identically and decrease with increasing temperature, as shown in figure 8: as temperature decreases the ESR value at 100 kHz increases to 1.5X to 2.0 X the 25 “C value. Temperature dependence of the impedance and ESR L 47/35 0.1 I , I I l 1 I 1 I 4 -55-40 -20 O 20 40 60 80 100 125 Tem
41、perature T, OC Figure %Tem pcrat u rc c haractenstics of ES R STDmEIA EIA-BOS-ENGL 1999 3234b00 Ob24279 71b EIA-809 Solid tantalum capacitor application guide Page 8 2.2.4.3 Frequency dependence of ESR ESR and Impedance both increase with decreasing frequencies. At lower frequencies, the values dive
42、rge as the contribution to Impedance due to capacitive reactance becomes more signrficant. Beyond 1 MHz, (or the self-resonant frequency) impedance again increases due to inductive contributions. Typical frequency characteristics for ESR and Impedance are shown in figure 9. Frequencydependenceof imp
43、edance and ESR lOOO, 0.1 i 10 1 O0 1t -. Impedance ESR - 0.1 pF 1N 10 pF 33 )LF 100 p 30 0.33 pF 330 pF Frequency f, kHz Figure %Frequency characteristics of ESR and impedance 2.1.5 Impedance (2) 2.1.5.1 Method for measuring impedance nie impcdancc is the ratio of voltage to current at a given frequ
44、ency. IO0 kHz vidi 2.2 V maximum DC bias itpith an AC signal (free of harmonics) in the millivolt range at ripprosini;itcl i 00 mA. itiiponant duc to die possibility of spurious reactance between lhe capacitor and measuring circuit. Impedance is measured at 25 “C at For high capacitance parts. 4 - t
45、erminal fisturing and bridge compatibility are 2.1.5.2 Temperature charactenstics of impedance Rcfcr 10 2 I 4.2 2.153 Frequent! characteristics of impedance nic frcqucnc! clmxtcnstics of impedance are dictated by the contributions froni capxiti e and inductivc rc.iitinccs and from rcsisw c losses in
46、 tlic solid elccuol-tc iiiipcdincc and ESR frcqucnc climctcnstics Rcfcr to 2 i 4 C for a coinpanson of typical 2.1.6 DC Icakagc currcnt 2.1.6.1 hlethod for measuring leakage current nic duc of lccikagc curreni is dcpendent on die voltage applied. dic charging period and capacitor lern pen 1 urc Lcak
47、:igc currcni is mcasurcd at 25 OC uitli tlic rated voltage applied. A protective resistance o 1000 ohms is corincctcd in scrics uith the capacitor in the measuring circuit. Three minutes VR is the rated voltage at 25 OC; T is the measured temperature in “C. 2.1.6.2 Temperature dependence of DC leaka
48、ge current Typical temperature characteristics are shown in figure 10. Leakage current vs temperature 0.1 , I I I I I l l -55-40 -20 O 20 40 60 80 100 1 (3 1 !5 Temperature, OC Figure 10-Typical variation of leakage current with temperature 7.1.6.3 The icrikage current value drops rapidly as the app
49、licd voltage decreases bclov the capacitor rating Tlie effect of oltagc dcrating on the leakage currcnt IS shown in figure 11 Voltage characteristics of leakage current STD-EIA EIA-809-ENGL 1999 3234b00 Ob2428L 374 EIA-809 Solid tantalum capacitor application guide Page 10 Variation of leakage current with applied voltage 7 Accepta bie -g 100 range 0.0001 0.001 0.01 0.1 1 Typical leakage x 0.01 CV Figure 11-Voltage characteristics of leakage current The practice of operating a s
