1、c N N h STD-EIA IS-722-ENGL 1997 3234b00 0583575 by3 INTERIM STANDARD Low Voltage Supplemental Fuse Qualification Specification EIMS-722 MAY 1997 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT NOTICE EIA Engineering Standards and Publications are designed to serve the public interest throu
2、gh eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall
3、 not in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EL4 members, whether the standard is to be
4、 used either domestically or internationally. Standards and Publications are adopted by EL4 in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EL4 does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties
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6、ch is a procedural part of the development of an EIA Standard. EIA Inkrim Standards should be reviewed on an annual basis by the formulating Committee and a decision made on whether to proceed to develop an EIA Standard on this subject. EL4 Interim Standards must be cancelled by the Committee and re
7、moved from the EIA Standards Catalog before the end of their third year of existence. Publication of this EIA Interim Standard for trial use and comment has been approved by the Electronic Industries Association. Distribution of this EL4 Interim Standard for comment shall not continue beyond 36 mont
8、hs from the date of publication. It is expected that following this 36 month period, this EIA Interim Standard, revised as necessary, will be submitted to the American National Standards Institute for approval as an American National Standard. Suggestions for revision should be directed to: Bernie A
9、ronson, Engineering Department, Electronic Industries Association, 2500 Wilson Boulevard, Arlington, VA 2220 1. (From Project Number 3757, formulated under the cognizance of the P-14 Fuses and Circuit Protection Devices Committee.) Published by OELECTRONIC INDUSTRIES ASSOCIATION 1997 Engineering Dep
10、artment 2500 Wilson Boulevard Arlington, VA 2220 1 PRICE: Please refer to the current Catalog of EIA, JEDEC, and TIA STANDARDS and ENGINEERING PUBLICATIONS or call Global Engineering Documents, USA and Canada (1-800-854-71 79) International (303-397-7956) All rights reserved Printed in U.S.A. STDmEI
11、A IS-722-ENGL 1777 W 323Yb00 05811577 Lib4 Low Voltage Supplemental Fuse Qualification Specification EMS-722 Page 1 1.1 Description This specification defines the qualification program for low voltage, supplemental fuses. Fuses covered will be limited to axial-leaded, radial-leaded and surface mount
12、 configurations having a current rating of no greater than 60 A, maximum voltage rating of 600 VAC/DC and interrupting rating of 10, A maximum. The qualification program is defined in table 1, and the flow diagram. Specification sheets can be added, as required, to define specific products or to cov
13、er unique / specific requirements. This document does not relieve the suppliers of their responsibility to maintain their own companys internai qualification program and the fuses shall continue to meet all applicable requirements of UL 24-14 / CSA-C22.2 NO. 248.14. Three types of fuses are covered
14、in this specification. They include: Type I - The type I fuse is designed to operate (open) within a given time period at 200% overload. The remainder of this specification is written with the 200% overload test used as the standard. Type II - The type II fuse is designed to operate (open) within a
15、given time period at 250% overload. For a Type II fuse, the 250% overload shall be substituted throughout this specification where 200% overload is noted. All other requirements shall continue to be met. Type III - The type III fuse is designed to operate (open) within a given time period at 300% ov
16、erload. For a Type III fuse, the 300% overload shall be substituted throughout this specification where 200% overload is noted. All other requirements shall continue to be met. 1.2 Preconditioning This process is intended to simulate exposure to the thermal and cleaning environments of the assembly
17、process before qualification testing. The component assembly process simulation requirements for different types of processes are described in annex A. 1.3 Reference documents The current revision of the referenced documents will be that in effect at the date of agreement to the qualification plan.
18、Subsequent qualification plans will automatically use the latest revisions of these referenced documents. Low Voltage Supplemental Fuse Qualincation Specification Page 2 EIA/IS-722 MIL-STD-202 MIL-STD-883 MIL-HDBK-H53 UL-94 UL-248-1/ UL-248-14 I IEC-695-2-2 Needie-Flame Test ASTM-2863 ANSUJ-STD-O02
19、EIA 554 Test Methods for Electronic and Electrical Component Parts Test Methods and Procedures for Microelectronics Military Handbook - Guide for Attribute Lot Sampling Inspection Tests for Flammability of Plastic Materials Low-Voltage Fuses, Part 1: General Requirements Low Voltage Fuses, Part 14:
20、Supplemental Fuses CSA-C22.2 NO. 248.1 CSA-C22.2 NO. 248.14 Flammability of Plastics Using the Oxygen Index Method Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires Method Selection for Assessment of non Conforming Levels in Parts Per Million (PPhI) 2 General requireme
21、nts This section includes requirements with the intention of developing a set of robust qualification tests that would enable a supplier to leverage test results to satis the requirements of multipie origina equipment mandacturer (OEM) customers. 2.1 Objective The objective of this qualitication pro
22、gram is to ensure that the device to be qualified meets a minimum set of stress test driven qualification requirements. 2.2 GenericData 2.2.1 The use of generic data to satisfy qualification requirements The use of generic data for qualification will be based on specific requirements associated with
23、 each characteristic of the fixe and manufacturing process. These requirements, listed in table 1, are the same for both new processes and re-qualification associated with a process change. A maximum negotiable set of qualification tests must be performed for the appropriate changes proposed for the
24、 component. 2.2.2 ?Qualification families?, defines the criteria by which components are grouped into a qualification family for the purpose of considering ail data from one component to another in the family and generically applicable for qualification. For each stress test, two or more qualificati
25、on familes can be combined ifreasoning for this is technically sound, supported by data and periodically reviewed for soundness of originai assumptions. With proper atention to these qualification guideiines, greater information applicable to other fses in the fmiiy can be accumuiated and used to de
26、monstrate their reliaiity so that quaiification testing STD-EIA IS-722-ENGL 1797 m 3234600 0583579 237 m Low Voltage Supplemental Fuse Qualification Specification Page 3 EMS-722 on new fuses entering a family can be minimized. For example, this can be achieved through extensive qualification and mon
27、itoring of the most complex fuse in the reliability family and applied to less complex fuses that subsequently join this family. Sources of generic data should come from supplier-certed test labs, and can include internal suppliers quaiification, user qualifications and suppliers in-process monitors
28、, as long as the test conditions and endpoint test temperatures address the worst case temperature extremes and designed product life for the application of the user requesting the qualification. 2.2.2 Qualification families The qualification samples must represent the same manufacturing process, ma
29、terials and formulation. The supplier wiil provide a complete description of each process and material of significance. Samples shali represent two different current values within the family and be separated by at least one week of manufacture. There must be valid and obvious links between the data
30、and the subject of qualification. 2.2.3 Manufacturing site (fabrication and assembly) Each manufacturing site, and line, is to be considered independently for site qualification, meaning that the site is proven to be capable (resources and equipment) ofrunning particdar processes with adequate yield
31、s (to be determined by the supplier). In other words, a site cannot be qualified based on the results from a different location. Qualification families do not apply across manufacturing sites. 2.3 Test samples 2.3.1 Lot requirements Test samples shall consist of representative fuses fiom the qualifi
32、cation family. Multiple lot samples are specified in table 1, and test samples must be composed of approximately equal numbers from three lots, with each assembly lot being mandactured at least one week apart. When applicable, the samples shall include fuses having current ratings representing at le
33、ast the lowest and highest values. The three lots may each be made up of one of these current ratings. 2.3.2 Production requirements All test samples shali be processed, production andor quaity control tested, screened and inspected at the same production site and with the same production process fo
34、r which the fuse in the qualication family to be quaiied will be manufactured for production. Low Voltage Supplemental Fuse Quaiication Specification Page 4 EINE-722 2.3.3 Reusability of test samples Fuses which have been used for nondestructive qualification tests may be used to populate other qual
35、ification tests. 2.3.4 Pre- and post-stress test requirements AU endpoint test temperatures (e.g., room, hot andor cold) are speczed in 4.2 to 4.14. The specific temperature must address the worst case temperature extremes and designed product life for the application of the user requesting the qual
36、ification. 2.4 Definition of electrical test failure after stressing Electrical test failures are defined as those fbses not meeting the individual fiise specification, criteria specific to the test, or the suppliers data sheet. 2.5 Criteria for passing qualification Passing all appropriate quacatio
37、n tests qualifies the fuse per this document. Any unique reliabiiity tests or conditions requested by the user and not specified in this document shall be negotiated between the supplier and user requesting the test. 2.6 Alternative testing requirements AU deviations fiom the qualification requireme
38、nts and conditions shall be approved by the user. Ali deviations shd be clearly reported when the results of the qualification are submitted to the user for approval. 2.7 Disqualification when the number of failures on the fse for any given test in table 1 exceeds the acceptance criteria using the p
39、rocedure in 2.5, the device shall be disquaiied until the root cause of the fdure(s) is (are) determined and corrective and preventive actions are confirmed to be effective. New samples or data may be requested to ve the above. 3 Qualification and requalification 3.1 Qualification of a new fuse Low
40、Voitage Supplemental Fuse Qualification Specification Page 5 EIA/IS-722 The stress test requirements and corresponding test conditions for the qualification of a new fse are listed in table 1. For each quaiification, the supplier must present data for ail of these tests, either specific to the fuse
41、to be qualified or acceptable reliability fdy data. Justification for the use of generic data must be demonstrated by the supplier and approved by the user. Electrical characteristics information (DC resistance, voltage drop, and current overload) shall be available from the supplier upon request. 3
42、.2 Changes requiring requalification Changes to a fuse, or the processes used in its fabrication, will require retesting as agreed upon between the supplier and the user. The supplier and the user shall agree upon the appropriate test plan prior to starting the requalification. 3.2.1 Criteria for pa
43、ssing requalification Passing all appropriate requaication tests specifled in this document as agreed to between the user and supplier qualifies the change per this document. AU requalification Mures shall be analyzed for root cause, and demonstration of corrective and preventative actions are requi
44、red. 4 Test methods and requirements 4.1 Sampling pian Sample size per lot in table 1 is selected from one manufacturing lot. Total sample size per family shall be fiom a minimum of three manufacturing lots separated by at least one week of mandacture. Any reduction in this sample size can only be a
45、uthorized by the user. See figure B.5, Test sequence flow chart. STD*EIA IS-722-ENGL 1777 323Lib00 0583582 823 W Test Method Low Voltage Supplemental Fuse Qualification Specification Page 6 EWIS-722 Sample Totai sample Defects size per lot per f=w Pee Fuse inspection Table 1 - Fuse qualification tes
46、t program approval levels and sampling plan 4.1 4.2 4.3 4.3.1 4.3.2 4.3.3 4.3.4 Sampling plan 2 10 630 NIA Vid and mechantcal 5 15 O Electrical characteristics - - - Dcresistance 175 525 O DC voltage drop 5 15 O Current carrying capacity 70 210 O Overload operation 110 3 30 O 4.8 4.8.1 4.8.2 4.8.3 4
47、.9 4.10 4.11 4.12 4.13 - - 1 COfC I 4.14 I Interrupting rating I I 5 15 O Solderability - - Solderability z n I d w IJ m W O s E n w ci z 5: O u W d II II t.i 4 O O cr( e VI d 3 o O O O v) rrl o 4 STD*EIA IS-722-ENGL 3777 m 323Lib00 0583579 025 m Low Voltage Supplemental Fuse Qualification Specifica
48、tion Page 23 ELVIS-722 W =! o d o 2- z O e ci z O u W d a U z 4 w LI u O 3 W 4 Ei crl n z 2 O u W d pi I i5 s Da 2 O o O O LA O O d O O rn 3 3 N O O H O h c m 51 O u vi i= M a a O Q) e d 2 3 M Lc .m Low Voltage Supplemental Fuse Qualification Specification Page 24 EIAlIS-722 o = copper layer, 35 pm
49、u = connection for voltage drop measurement n= 1, 2, 3,4 or 5 w = 5.0 mm e = 2.50 mm NOTES: 4) Not-to-scale Dimensions are in millimeters A mechanical device can be used as long as it is demonstrated that the results are the same. This test board design has been taken fiom IEC 127 - 4. Figure B.1- Test board for hru hole fuses STD-EIA IS-722-ENGL 1777 3234b00 058LbOL 503 H Low Voltage Supplemental Fuse Qualification Specification Page 25 EWIS-722 1.25T-k i- l ri REFLOW i -4 k4.2 , UP i, i / 0.5 u L20- I 10 P 2T-i - I L, WAVE i I_ 100 o = copper layer,
