1、BRITISH STANDARDBS EN 13036-6:2008Road and airfield surface characteristics Test methods Part 6: Measurement of transverse and longitudinal profiles in the evenness and megatexture wavelength rangesICS 93.080.10; 93.120g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g
2、54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 13036-6:2008This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 June 2008 BSI 2008ISBN 978 0 580 56378 2National forew
3、ordThis British Standard is the UK implementation of EN 13036-6:2008. The UK participation in its preparation was entrusted by Technical Committee B/510, Road materials, to Subcommittee B/510/5, Surface characteristics.A list of organizations represented on this committee can be obtained on request
4、to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.Amendments/corrigenda issued since publicationDate CommentsEURO
5、PEAN STANDARDNORME EUROPENNEEUROPISCHE NORMEN 13036-6March 2008ICS 93.080.10; 93.120English VersionRoad and airfield surface characteristics - Test methods - Part 6:Measurement of transverse and longitudinal profiles in theevenness and megatexture wavelength rangesCaractristiques de surface des rout
6、es et arodromes -Mthodes dessais - Partie 6 : Mesure de profilstransversaux et longitudinaux dans le domaine delongueurs donde correspondant luni et la mgatextureOberflcheneigenschaften von Straen und Flugpltzen -Prfverfahren - Teil 6: Bestimmung der Quer- undLngsprofile in den Wellenlngen der Ebenh
7、eit und derMegatexturThis European Standard was approved by CEN on 4 February 2008.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration. Up-to-date lists and
8、bibliographical references concerning such nationalstandards may be obtained on application to the CEN Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A version in any other language made by translationunder the responsibilit
9、y of a CEN member into its own language and notified to the CEN Management Centre has the same status as theofficial versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland,France, Germany, Greece, Hungary, Iceland, Irel
10、and, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal,Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.EUROPEAN COMMITTEE FOR STANDARDIZATIONCOMIT EUROPEN DE NORMALISATIONEUROPISCHES KOMITEE FR NORMUNGManagement Centre: rue de Stassart, 36
11、B-1050 Brussels 2008 CEN All rights of exploitation in any form and by any means reservedworldwide for CEN national Members.Ref. No. EN 13036-6:2008: EEN 13036-6:2008 (E) 2 Contents Page Foreword3 Introduction .4 1 Scope 5 2 Terms and definitions .5 3 Equipment performance classification .7 3.1 Gene
12、ral7 3.2 Travelled distance accuracy of longitudinal and/or transverse profiling8 3.3 Vertical sensor resolution of longitudinal profiling .8 3.4 Acquisition sampling interval of longitudinal profiling .8 3.5 Reporting sampling interval of longitudinal profiling9 3.6 Large wavelength cut-off (-3dB)
13、of longitudinal profiling .9 3.7 Vertical resolution of transverse profiling 9 3.8 Acquisition sampling interval of transverse profiling .9 3.9 Acquisition repetition interval of transverse profiling.9 3.10 Reporting repetition interval of transverse profiling .9 3.11 Transverse gradient measurement
14、 accuracy of transverse profiling9 4 Procedures of measurement 10 4.1 Methods for measurement of profiles .10 4.2 Operational guidelines 10 4.3 Field testing11 4.4 Equipment maintenance and repair.13 5 Report .14 5.1 Calibration report.14 5.2 Survey report14 6 Safety 15 Bibliography 16 BS EN 13036-6
15、:2008EN 13036-6:2008 (E) 3 Foreword This document (EN 13036-6:2008) has been prepared by Technical Committee CEN/TC 227 “Road materials”, the secretariat of which is held by DIN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by
16、 endorsement, at the latest by September 2008, and conflicting national standards shall be withdrawn at the latest by September 2008. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible
17、 for identifying any or all such patent rights. According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Ger
18、many, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 13036-6:2008EN 13036-6:2008 (E) 4 Introduction This European Standard details the criteri
19、a for classifying profilometers according to profiling capabilities as well as the procedures for measuring transverse and longitudinal profiles in the evenness and megatexture wavelength ranges, independent of the test method and the equipment used. The requirements regarding the performance of the
20、 measurement shall be independent of the measurement method used. This basic principle permits the development of new technologies and a variety of measurement devices without the need to modify this standard. This European Standard is restricted to requirements about measurement specifications (e.g
21、. accuracy, resolution, wavelength range). Compliance with the requirements and classifications outlined in this standard will result in a geometrical representation of a profile intended to be used for research purposes or for further analysis aiming at summary indices for transverse profiles and/o
22、r longitudinal profiles in the evenness and megatexture wavelength ranges. Evenness of pavements is important for reasons of safety, comfort and behaviour of vehicles, (pay)loads, road and bridge constructions, fuel consumption, etc. Evenness demands are related to the speed limits, the kind of traf
23、fic, the climatic conditions, the accepted comfort limits, etc. BS EN 13036-6:2008EN 13036-6:2008 (E) 5 1 Scope This European Standard establishes the minimum requirements and criteria for classification and measurement procedures with profiling devices, designed for the measurement of transverse an
24、d/or longitudinal profiles in the unevenness and megatexture wavelength ranges. Recommendations for verification and calibration are included. Profiling devices are equipment to measure evenness of pavements in the longitudinal and/or in the transverse direction of the pavement. Highway agencies, ai
25、rfield authorities, equipment manufacturers, and other organizations can use this standard to define the measuring capabilities of survey equipment that collects the data necessary to characterize surface conditions. Evenness measurements can be performed by means of static or dynamic devices. The s
26、tandard includes high-speed, low-speed, and stationary equipment. NOTE A dynamic measurement is a measurement executed out of a device running in the normal traffic flow at the accepted minimum speed or at higher speed (high-speed). 2 Terms and definitions For the purposes of this document, the foll
27、owing terms and definitions apply. 2.1 longitudinal profile intersection between the pavement surface and a conventional reference plane perpendicular to the pavement surface and parallel to the lane direction 2.2 transverse profile intersection between the pavement surface and a reference plane per
28、pendicular to the pavement surface and to the lane direction 2.3 wavelength distance between periodically repeated parts of a sinusoidal curve 2.4 unevenness deviation of a pavement surface from a true filtered planar surface in a wavelength range of 0,5 m to 50 m 2.5 megatexture deviation of a pave
29、ment surface from a filtered true planar surface in a wavelength range of 50 mm to 500 mm 2.6 profiling method in which a measurement of a pavement surface profile is recorded for subsequent analysis. The profile data are used for calculating certain mathematically defined parameters 2.7 crossfall t
30、ransverse gradient across a section or full width of a pavement measured perpendicular to the centre line BS EN 13036-6:2008EN 13036-6:2008 (E) 6 NOTE Crossfall can be expressed as a percentage, a ratio (e.g. 1 in 30) or as an angle to the horizontal. By convention, it is positive when the right end
31、 of the profile is lower than its left end. 2.8 surface line angle between the horizontal and a line touching the surface at a point to the left of the left wheel path and a point to the right of the right wheel path 2.9 regression line angle between the horizontal and the regression straight line t
32、hrough the transverse road profile defined by at least seven measurement points spaced across that profile 2.10 rut bottom line angle between the horizontal and a line touching the bottoms of the left and right wheel paths defined by three measurement points 2.11 design crossfall represents the cros
33、sfall of the desired transverse profile 2.12 constructed crossfall represents the best straight line through the new constructed transverse profile 2.13 actual crossfall represented by one of the three definitions (see 2.8, 2.9 or 2.10) NOTE It should be specified in the report which definition has
34、been used. 2.14 test track road section or special track where the tests are carried out, identified by a code EXAMPLE Section P 2.15 test section part of a pavement surface containing lane(s) with known geometrical data 2.16 calibration section test section with known surface geometry 2.17 referenc
35、e profile digitised geometric description of a longitudinal or transversal road profile obtained by means of a profiling method with well-known reliability accuracy better than the one requested for the corresponding class of dynamic profilometers 2.18 accuracy closeness of the agreement between the
36、 result of a measurement and a true value of the measured 2.19 travelled distance accuracy maximum relative error in percent on the measurement of the distance travelled by the measuring vehicle BS EN 13036-6:2008EN 13036-6:2008 (E) 7 2.20 transverse gradient measurement accuracy maximum absolute er
37、ror on the determination of the transverse slope of the agreed gradient reference system 2.21 vertical resolution (longitudinal and transversal) smallest difference in elevation that can be detected 2.22 horizontal resolution (longitudinal and transversal) smallest horizontal distance over which a c
38、hange in elevation can be detected 2.23 longitudinal acquisition sampling interval distance between two consecutive data points in a discrete longitudinal profile measurement 2.24 transversal acquisition sampling interval distance between two consecutive data points in a discrete transversal profile
39、 measurement in transverse direction (sensor spacing) NOTE If the distances between the sensors are not equal, the mean value is calculated. 2.25 reporting sampling interval (longitudinal and transversal) distance corresponding to the interval between two consecutive reported measurement results 2.2
40、6 acquisition repetition interval (transversal) travelled distance between two consecutive transverse profile measurements 2.27 reporting repetition interval (transversal) distance corresponding to the longitudinal interval between two consecutive reported measurement results of transverse profiles
41、2.28 operator person responsible for the execution of the measurement 3 Equipment performance classification 3.1 General The classification of equipment is expressed as a code (see Table 1). BS EN 13036-6:2008EN 13036-6:2008 (E) 8 Table 1 Classification of equipment Character position Description Ex
42、ample 1 Class of travelled distance accuracy 1 2 Longitudinal profiling L 3 Class of longitudinal vertical resolution 1 4 Class of longitudinal acquisition sampling interval 1 5 Class of longitudinal reporting sampling interval 2 6 Class of large wavelength cut-off 1 7 Transverse profiling T 8 Class
43、 of transversal vertical resolution 2 9 Class of transversal acquisition sampling interval 1 10 Class of acquisition repetition interval 2 11 Class of transversal reporting repetition interval 1 12 Class of transverse gradient measurement accuracy 2 The Code of the example would be: 1L1121T21212 If
44、the device is measuring the longitudinal or the transversal profile then only that part of the classification is used. The examples are: 1L1121 or 1T21212 3.2 Travelled distance accuracy of longitudinal and/or transverse profiling Class 1 0,05 %; Class 2 0,2 mm and 0,5 mm; Class 3 0,5 mm and 1,5 mm.
45、 3.4 Acquisition sampling interval of longitudinal profiling Class 1 50 mm; Class 2 50 mm and 125 mm; Class 3 125 mm and 250 mm. BS EN 13036-6:2008EN 13036-6:2008 (E) 9 3.5 Reporting sampling interval of longitudinal profiling Class 1 100 mm; Class 2 100 mm but 250 mm; Class 3 250 mm but 500 mm. 3.6
46、 Large wavelength cut-off (-3dB) of longitudinal profiling Class 1 100 m; Class 2 0,2 mm but 0,5 mm; Class 3 0,5 mm but 1,5 mm. 3.8 Acquisition sampling interval of transverse profiling Class 1 75 mm; Class 2 75 mm but 150 mm; Class 3 150 mm but 350 mm. 3.9 Acquisition repetition interval of transve
47、rse profiling Class 1 1 m; Class 2 1 m but 5 m; Class 3 5 m but 10 m. 3.10 Reporting repetition interval of transverse profiling Class 1 5 m; Class 2 5 m but 10 m; Class 3 10 m but 20 m. 3.11 Transverse gradient measurement accuracy of transverse profiling Class 1 0,15 %; Class 2 0,15 % but 0,30 %,
48、BS EN 13036-6:2008EN 13036-6:2008 (E) 10 Class 3 0,30 % but 0,60 %. 4 Procedures of measurement 4.1 Methods for measurement of profiles 4.1.1 Methods of profiling Any device able to obtain a real profile is valid for profiling if it satisfies the objective of the measurements. 4.1.2 Selection accord
49、ing to the objective of the measurements The selection of the valid method and requirements for the measurement shall be in accordance with the intended result of the surface evaluation. The minimum profile accuracy required with respect to the objective of the measurement shall be included in specifications for the measurement. 4.2 Operational guidelines 4.2.1 Field operations 4.2.1.1 Some devices require a certain measurement speed and that speed shall be kept constant for the entire test section. Most
