1、BS EN13523-1:2009ICS 17.040.20; 25.220.60NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBRITISH STANDARDCoil coated metals Test methodsPart 1: Film thicknessCopyright European Committee for Standardization Provided by IHS under license with CENNot for ResaleNo reproduction or
2、networking permitted without license from IHS-,-,-This British Standardwas published under theauthority of the StandardsPolicy and StrategyCommittee on 31 May 2010 BSI 2010ISBN 978 0 580 60850 6Amendments/corrigenda issued since publicationDate CommentsBS EN 13523-1:2009National forewordThis British
3、 Standard is the UK implementation of EN 13523-1:2009. Itsupersedes BS EN 13523-1:2001 which is withdrawn.The UK participation in its preparation was entrusted to TechnicalCommittee STI/27, Paint systems for metallic substrates.A list of organizations represented on this committee can be obtained on
4、request to its secretary.This publication does not purport to include all the necessary provisionsof a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunityfrom legal obligations.Copyright European Committee for Standardization Provided
5、 by IHS under license with CENNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-BS EN 13523-1:2009EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 13523-1 December 2009 ICS 17.040.20; 25.220.60 Supersedes EN 13523-1:2001English Version Coil coated metals - Test m
6、ethods - Part 1: Film thickness Tles prlaques - Mthodes dessai - Partie 1: Epaisseur du revtement Bandbeschichtete Metalle - Prfverfahren - Teil 1: Schichtdicke This European Standard was approved by CEN on 7 November 2009. CEN members are bound to comply with the CEN/CENELEC Internal Regulations wh
7、ich stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN Management Centre or to any CEN member. This European
8、Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the CEN Management Centre has the same status as the official versions. CEN members are the nationa
9、l standards bodies of Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and Uni
10、ted Kingdom. EUROPEAN COMMITTEE FOR STANDARDIZATION COMIT EUROPEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG Management Centre: Avenue Marnix 17, B-1000 Brussels 2009 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national Members. Ref. No. EN 13523-1:200
11、9: ECopyright European Committee for Standardization Provided by IHS under license with CENNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-BS EN 13523-1:2009EN 13523-1:2009 (E) 2 Contents Page Foreword 31 Scope 42 Normative references 43 Terms and definitions .44 P
12、rinciple 54.1 Method A: Measurement on a magnetic substrate magnetic induction .54.2 Method B: Measurement on a non-magnetic substrate eddy current.54.3 Method C: Measurement on all substrates micrometer method .54.4 Method D: Measurement on all substrates optical method .55 Apparatus and materials
13、.56 Sampling .57 Test panels .58 Procedure .68.1 Calibration 68.1.1 General 68.1.2 Calibration standards 68.2 Scale rating .68.3 Measurement 68.3.1 Ambient conditions .68.3.2 Method A: Magnetic induction .68.3.3 Method B: Eddy current 78.3.4 Method C: Micrometer method .78.3.5 Method D: Optical meth
14、od 79 Expression of results 810 Accuracy .811 Test report 8Bibliography 9Copyright European Committee for Standardization Provided by IHS under license with CENNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-BS EN 13523-1:2009EN 13523-1:2009 (E) 3 Foreword This doc
15、ument (EN 13523-1:2009) has been prepared by Technical Committee CEN/TC 139 “Paints and varnishes”, the secretariat of which is held by DIN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by June 20
16、10, and conflicting national standards shall be withdrawn at the latest by June 2010. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights.
17、This document supersedes EN 13523-1:2001. The main technical change is: the Scope of the method has been changed to include micrometer and optical determination methods. According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bound to im
18、plement this European Standard: Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerla
19、nd and the United Kingdom. Copyright European Committee for Standardization Provided by IHS under license with CENNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-BS EN 13523-1:2009EN 13523-1:2009 (E) 4 1 Scope This European Standard specifies the procedures for det
20、ermining the dry film thickness of an organic coating on a metallic substrate (coil coating). Four appropriate methods are given in this European Standard: a) magnetic induction; b) eddy current; c) micrometer; d) optical. The methods are applicable only to products with smooth and flat substrates b
21、ut the coating itself may be textured. In that case, for methods a) and b) the average of a series of readings will represent an average of the thickness of the organic coating, while method c) will give the maximum thickness and method d) can provide the minimum, maximum and average thickness. Non-
22、destructive continuous-web methods on measurement of dry-film thickness (see EN ISO 2808) are not dealt with. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references
23、, the latest edition of the referenced document (including any amendments) applies. EN 13523-0:2001, Coil coated metals Test methods Part 0: General introduction and list of test methods EN 23270, Paints and varnishes and their raw materials Temperatures and humidities for conditioning and testing (
24、ISO 3270:1984) ISO 3611, Micrometer callipers for external measurement 3 Terms and definitions For the purposes of this document, the terms and definitions given in EN 13523-0:2001 and the following apply. 3.1 film thickness distance between the surface of the film and the surface of the substrate E
25、N ISO 2808:2007 Copyright European Committee for Standardization Provided by IHS under license with CENNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-BS EN 13523-1:2009EN 13523-1:2009 (E) 5 4 Principle 4.1 Method A: Measurement on a magnetic substrate magnetic ind
26、uction The film thickness on a magnetic substrate is determined by means of an electrical probe placed on the coating and developing an electromagnetic field in the substrate. The potential variation of this field is a function of the distance between the probe and the substrate. This signal is meas
27、ured and converted to the film thickness reading. 4.2 Method B: Measurement on a non-magnetic substrate eddy current The film thickness on a non-magnetic substrate is determined by means of an electrical probe placed on the coating and generating eddy currents in the substrate. The variation of the
28、amplitude and phase is a function of the distance between the probe and the substrate. This signal is measured and converted to the film thickness reading. 4.3 Method C: Measurement on all substrates micrometer method The film thickness is determined by measuring the coated sample and then removing
29、the organic coating and re-measuring the sample minus the coating, or by measuring a film of organic coating that has been removed from the sample. 4.4 Method D: Measurement on all substrates optical method The film thickness is determined by microscopical measurement of a section cut through the fi
30、lm. The defined cut may be made in the coating using a special blade (symmetrical cut), a special paint borer (conical bore) or a milling tool (sloping cut). 5 Apparatus and materials 5.1 Instruments for measuring film thickness, using the principles described in Clause 4. 5.2 Solvent, suitable for
31、removing organic coatings, for example methyl ethyl ketone (2-butanone). 5.3 Suitable abrasive and/or blunt knife, or other means of removing softened organic coatings that do not damage the substrate. 5.4 Cutting tool, for Method D. 5.4.1 Blade, for making a symmetrical cut in the coating. 5.4.2 Pa
32、int borer, for making a conical bore in the coating. 5.4.3 Milling tool, for making a sloping cut in the coating. 6 Sampling Shall be according to EN 13523-0. 7 Test panels Shall be according to EN 13523-0. Copyright European Committee for Standardization Provided by IHS under license with CENNot fo
33、r ResaleNo reproduction or networking permitted without license from IHS-,-,-BS EN 13523-1:2009EN 13523-1:2009 (E) 6 8 Procedure 8.1 Calibration 8.1.1 General For the measurement the instructions of the manufacturer of the instrument shall be taken into account, in particular regarding the calibrati
34、on and/or setting up procedure. Before use, calibrate each instrument in accordance with the manufacturers instructions using calibration standards. For instruments that cannot be calibrated, determine the deviation from the nominal value by comparison with calibration standards and take this into c
35、onsideration for all measurements. During use, check the calibration of the instrument as specified by the instruments manufacturer. 8.1.2 Calibration standards Calibration standards of known and uniform thickness are available either as foils or shims, or as coated standards with assigned values tr
36、aceable to nationally recognized standards. Calibration foils are generally made of plastics materials. They are subject to indentation and shall, therefore, be replaced frequently. For methods A and B the surface and magnetic properties of the metallic substrate of the coated calibration standards
37、shall be similar to those of the test specimen. For methods C and D the substrate of the test specimen and of the calibration standards shall be the same, provided the critical thickness (see Note below) is not exceeded. NOTE For each instrument, there is a critical thickness of metallic substrate a
38、bove which instruments will not be affected by an increase in thickness. 8.2 Scale rating For methods A and B, and if necessary, select the scale with a maximum above the estimated thickness of the coating and adjust the instrument to the thickness of a known non-metallic standard measured on the re
39、ference plate. The readings at several positions shall not vary by more than 5 %. The thickness of the standard shall be greater than half the measuring scale used. 8.3 Measurement 8.3.1 Ambient conditions Measure the film thickness at ambient temperature. For more accurate measurements, as required
40、 for instance in case of dispute, the temperature shall be (23 2) C and the relative humidity (50 5) %, in accordance with EN 23270. 8.3.2 Method A: Magnetic induction The samples shall be measured on a non-metallic and non-conductive table. Place the probe perpendicular to and in contact with the c
41、oated panel and read the film thickness on the standard scale. Take at least five measurements on smooth surfaces, and at least ten measurements on textured coatings. Copyright European Committee for Standardization Provided by IHS under license with CENNot for ResaleNo reproduction or networking pe
42、rmitted without license from IHS-,-,-BS EN 13523-1:2009EN 13523-1:2009 (E) 7 In the case of metallic coated steel (e.g. galvanized steel), the electric probe cannot measure simultaneously the metallic and the organic coating. Therefore, determine first the total thickness of the metallic coating and
43、 organic coating and, after having removed the organic coating, measure the thickness of the metallic coating on the same place. The difference gives the thickness of the organic coating. Remove the organic coating with a solvent (5.2). After an adequate period of contact with the solvent, remove th
44、e softened organic coating by abrasive action using an abrasive and/or blunt knife (5.3). This stripping process shall not remove any metallic coating. 8.3.3 Method B: Eddy current The samples shall be measured on a non-metallic and non-conductive table. Place the probe perpendicular to and in conta
45、ct with the coated panel and read the film thickness on the standard scale. Take at least five measurements on smooth surfaces, and at least ten measurements on textured coatings. 8.3.4 Method C: Micrometer method Operate all instruments so that the coated specimen side is facing the spindle. With t
46、he hand-held type, press the specimen against the fixed measuring tip. Carry out each measurement such that the spindle of the micrometer is pressed against the surface to be tested. Turn the spindle until the ratchet is activated. Remove the organic coating with a solvent (5.2). After an adequate p
47、eriod of contact with the solvent, remove the softened organic coating by abrasive action using an abrasive and/or blunt knife (5.3). This stripping process shall not remove any metallic coating. Repeat the second measurement after removing the film. Calculate the film thickness from the difference
48、in the readings for the total thickness and the substrate thickness. For measuring free films, remove a filmstrip and measure the thickness according to above. The external micrometer gauge design shall conform to the requirements of ISO 3611. An example is shown in Figure 1. Both jaws shall be in the same plane. Figure 1 Micrometer screw gauge 8.3.5 Method D: Optical method Use the instrument (5.4) to make a cut in the organic coating down to the substrate, according to Figure 2. Examine using a microscope. The cut is made with a specified angle in the
