1、BSI Standards PublicationBS EN 16424:2014Characterization of waste Screening methods forthe element composition byportable X-ray fluorescenceinstrumentsBS EN 16424:2014Incorporating corrigendum November 2014Incorporating corrigenda November 2014 and November 2015BS EN 16424:2014 BRITISH STANDARDNati
2、onal forewordThis British Standard is the UK implementation of EN 16424:2014.The UK participation in its preparation was entrusted by Technical Committee B/508, Waste Management, to Subcommittee B/508/3, Characterization of waste.A list of organizations represented on this subcommittee can be obtain
3、ed on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2015. Published by BSI Standards Limited 2015ISBN 978 0 580 92632 7ICS 13.030.01Compliance with
4、 a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 October 2014.Amendments/corrigenda issued since publicationDate Text affected30 November 2014 Implementation of CEN Correctio
5、n Notice 22 October 2014: Figure 1 replaced30 November 2015 Implementation of CEN Correction Notice 17 December 2014: Tables in Annex D updatedEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 16424 October 2014 ICS 13.030.01 English Version Characterization of waste - Screening methods for the e
6、lement composition by portable X-ray fluorescence instruments Caractrisation des dchets - Mthode de dpistage pour la dtermination de la composition lmentaire au moyen danalyseurs portables de fluorescence X Charakterisierung von Abfllen - Screening-Verfahren zur Bestimmung der elementaren Zusammense
7、tzung mit tragbaren Rntgenfluoreszenzspektrometern This European Standard was approved by CEN on 16 August 2014. CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any al
8、teration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN member. This European Standard exists in three official versions (English, French, German). A version in any other language m
9、ade by translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Est
10、onia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom. EUROPEAN COMMITTEE FOR STA
11、NDARDIZATION COMIT EUROPEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2014 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national Members. Ref. No. EN 16424:2014 EEN 16424:2014 (E) 2 Conten
12、ts Page Foreword 4 1 Scope 5 2 Normative references 5 3 Terms and definitions .5 4 Principle 5 5 Safety remarks .6 6 Apparatus and equipment 6 6.1 X-ray fluorescence spectrometer .6 6.2 Direct measurement using a hand-held instrumentation in direct contact with the sample .7 6.3 Hand-held instrument
13、ation mounted on a stand using sample cups filled with the sample 7 6.4 Portable bench top XRF instrument 7 6.5 Spoon, stamp and/or hammer 7 6.6 Mortar and pestle .7 6.7 Thin-film support .7 6.8 Sample cups .7 7 Calibration 7 7.1 General 7 7.2 Interferences 8 7.3 Calibration procedure .8 7.4 Validat
14、ion of the calibration 9 8 Screening strategy 10 9 Sample preparation 12 9.1 General . 12 9.2 Sample preparation for direct measurement . 12 9.3 Sample preparation for filling cups 12 9.4 Sample preparation for heterogeneous samples 12 10 Analysis . 12 10.1 General . 12 10.2 Direct in situ measureme
15、nt (hand-held method) . 12 10.3 Measurement by using a mounted hand-held XRF instrument or a small portable closed XRF instrument . 13 11 Calculation of the result . 13 12 Assessment of the XRF screening measurement . 13 12.1 General . 13 12.2 Identification of the presence or absence of the element
16、s under investigation 13 12.3 Indication of the concentration range of the elements under investigation 14 13 Quality control . 14 13.1 Drift correction procedure . 14 13.2 Blank test . 14 13.3 Reference materials 14 14 Test report . 15 Annex A (informative) Examples of instrumentation 16 Annex B (i
17、nformative) List of analytical lines and spectral line overlaps 19 BS EN 16424:2014EN 16424:2014 (E) 2 Contents Page Foreword 4 1 Scope 5 2 Normative references 5 3 Terms and definitions .5 4 Principle 5 5 Safety remarks .6 6 Apparatus and equipment 6 6.1 X-ray fluorescence spectrometer .6 6.2 Direc
18、t measurement using a hand-held instrumentation in direct contact with the sample .7 6.3 Hand-held instrumentation mounted on a stand using sample cups filled with the sample 7 6.4 Portable bench top XRF instrument 7 6.5 Spoon, stamp and/or hammer 7 6.6 Mortar and pestle .7 6.7 Thin-film support .7
19、6.8 Sample cups .7 7 Calibration 7 7.1 General 7 7.2 Interferences 8 7.3 Calibration procedure .8 7.4 Validation of the calibration 9 8 Screening strategy 10 9 Sample preparation 12 9.1 General . 12 9.2 Sample preparation for direct measurement . 12 9.3 Sample preparation for filling cups 12 9.4 Sam
20、ple preparation for heterogeneous samples 12 10 Analysis . 12 10.1 General . 12 10.2 Direct in situ measurement (hand-held method) . 12 10.3 Measurement by using a mounted hand-held XRF instrument or a small portable closed XRF instrument . 13 11 Calculation of the result . 13 12 Assessment of the X
21、RF screening measurement . 13 12.1 General . 13 12.2 Identification of the presence or absence of the elements under investigation 13 12.3 Indication of the concentration range of the elements under investigation 14 13 Quality control . 14 13.1 Drift correction procedure . 14 13.2 Blank test . 14 13
22、.3 Reference materials 14 14 Test report . 15 Annex A (informative) Examples of instrumentation 16 Annex B (informative) List of analytical lines and spectral line overlaps 19 EN 16424:2014 (E) 3 Annex C (informative) Evaluation of the acceptance criteria . 20 C.1 Uncertainty . 20 C.2 Test of the ab
23、sence of an element . 20 C.3 Test of the documented concentration of an element . 20 C.4 Estimation of uncertainty . 21 Annex D (informative) Validation . 22 Bibliography 33 BS EN 16424:2014EN 16424:2014 (E) 4 Foreword This document (EN 16424:2014) has been prepared by Technical Committee CEN/TC 292
24、 “Characterization of waste”, the secretariat of which is held by NEN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by April 2015, and conflicting national standards shall be withdrawn at the late
25、st by April 2015. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights. X-ray fluorescence spectrometry (XRF) is a fast and reliable method
26、for the determination of the total content of certain elements within different matrices. Quantitative analysis using XRF is described in EN 15309 2. For screening purposes, portable instruments are often used, especially when only the absence or presence of elements is under investigation or qualit
27、ative results with an indication of the concentration level are requested. This standard is applicable for on-site verification at landfills (see CEN/TR 16130 4) and it is an exemplification of EN 16123 3. According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
28、 following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherla
29、nds, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 16424:2014EN 16424:2014 (E) 4 Foreword This document (EN 16424:2014) has been prepared by Technical Committee CEN/TC 292 “Characterization of waste”, the secretariat of which
30、is held by NEN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by April 2015, and conflicting national standards shall be withdrawn at the latest by April 2015. Attention is drawn to the possibility
31、 that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights. X-ray fluorescence spectrometry (XRF) is a fast and reliable method for the determination of the total content of certain e
32、lements within different matrices. Quantitative analysis using XRF is described in EN 15309 2. For screening purposes, portable instruments are often used, especially when only the absence or presence of elements is under investigation or qualitative results with an indication of the concentration l
33、evel are requested. This standard is applicable for on-site verification at landfills (see CEN/TR 16130 4) and it is an exemplification of EN 16123 3. According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this Europe
34、an Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slove
35、nia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. EN 16424:2014 (E) 5 1 Scope This European Standard is dedicated to field portable X-ray fluorescence (XRF) equipment (hand-held or portable bench top) and specifies a screening method for the determination of the elemental composition o
36、f waste materials for on-site verification. Portable XRF spectrometers are used for a rapid and exploratory analysis of paste-like or solid materials. The absence or presence of specific elements is displayed qualitatively with an indication of the concentration level. 2 Normative references The fol
37、lowing documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. EN 15002, Char
38、acterization of waste Preparation of test portions from the laboratory sample 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 field portable XRF spectrometer XRF spectrometer for analyzing samples in the field, namely hand-held or portable be
39、nch top XRF spectrometers 3.2 hand-held XRF spectrometer XRF spectrometer which can be used for in-situ analysis by direct probing or mounted on a stand 3.3 on-site verification third level of inspection according to the Landfill Directive and the Landfill Decision to ensure that the waste accepted
40、at a landfill is the same as described in the accompanying documents and that it is in accordance with the basic characterization and/or compliance testing 3.4 portable bench top spectrometer compact bench top XRF spectrometer which can easily be carried into the field 3.5 screening application of a
41、ny analytical method for exploratory analysis 4 Principle The sample can be measured directly or after a suitable sample preparation. In principle two different methods are used for probing the sample, either a pistol-like instrument is placed directly on the sample or a sufficient test portion is t
42、aken and put into a sample cup for measurement with the XRF instrument. The presence of a specific element is verified if a significant intensity for that element is measured. The intensities of the lines can be evaluated to indicate the concentration range. BS EN 16424:2014EN 16424:2014 (E) 6 5 Saf
43、ety remarks The X-ray fluorescence spectrometers on the market are generally fully protected apparatus which are subjected to specific official approval and acceptance conditions. This means that the user is not exposed to radiation when operating the apparatus correctly. Nevertheless while measurin
44、g in the field, scattering radiation can be produced when probing directly on the sample. Providing a protective radiation shield around the sample when measuring avoids these risks. The person responsible for managing or supervising the operation of X-ray equipment shall provide evidence of his kno
45、wledge of radiation protection according to national regulations. Proper safety precautions shall be considered when conducting field XRF measurements. The operator should always be aware that X-rays are produced during measurements. The operator should never point the open source at anyone and be a
46、ware that X-rays can penetrate through light atomic mass matrices. Proper training regarding handling of XRF instruments is an obligation. Take care when handling samples that may contain sharps or are of a dusty nature. Handling of samples should be performed with gloves and in the case of dusty ma
47、terials with respiratory mask and gloves. Take special precautions with samples from potentially hazardous waste. Avoid any contact with the skin and/or inhaling of dust. 6 Apparatus and equipment 6.1 X-ray fluorescence spectrometer The X-ray fluorescence spectrometer shall comply with European and
48、national regulations relevant to radiation protection. The X-ray fluorescence spectrometer shall be able to analyse the relevant elements. The following types of X-ray fluorescence spectrometers are applicable: energy dispersive X-ray fluorescence spectrometer (EDXRF) which gains the dispersion of t
49、he emitted X-ray fluorescence radiation by an energy dispersive detector; wavelength dispersive X-ray fluorescence spectrometer (WDXRF) which gains the dispersion of the emitted X-ray fluorescence radiation by diffraction by a crystal. For screening analysis generally EDXRF instruments are applied. Portable spectrometers comprise mainly the following components: a primary X-ray source, a miniaturised X-ray tube with a low voltage generator; a detector unit including electronic equipment; a power supply including rechargeable batteries; a radiat
