1、BRITISH STANDARD BS EN 60747-5-2:2001 Incorporating Amendments Nos. 1 to BS IEC 60747-5-2:1997 (renumbers the BS IEC as BS EN 60747-5-2:2001) and 2 Discrete semiconductor devices and integrated circuits Part 5-2: Optoelectronic devices Essential ratings and characteristics The European Standard EN 6
2、0747-5-2:2001, with the incorporation of amendment A1:2002, has the status of a British Standard ICS 31.260 BS EN 60747-5-2:2001 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes in
3、to effect on 15 January 1998 BSI 17 January 2003 ISBN 0 580 29144 8 National foreword This British Standard is the official English language version of EN 60747-5-2:2001, including amendment A1:2002. It is identical with IEC 60747-5-2:1997, including amendment 1:2002. The start and finish of text in
4、troduced or altered by IEC amendment 1 is indicated in the text by tags . The UK participation in its preparation was entrusted by Technical Committee EPL/47, Semiconductors, to Subcommittee EPL/47/3, Performance of optoelectronic semiconductor devices and liquid crystal displays, which has the resp
5、onsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A
6、list of organizations represented on this subcommittee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International S
7、tandards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Stan
8、dard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, the EN foreword page, the IEC title page, pages ii to iv, pages 1 to 24, an inside back cover and a back cover. The BSI copyright notice d
9、isplayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date Comments 13433 08 January 2002 Implementation of the European Standard. Other corrections indicated by a sideline. 14089 17 January 2003 See national forewordEUROPEAN STANDARD NOR
10、ME EUROPENNE EUROPISCHE NORM EN 60747-5-2 July 2001 + A1 May 2002 ICS 31.260 English version Discrete semiconductor devices and integrated circuits Part 5-2: Optoelectronic devices Essential ratings and characteristics (includes amendment A1:2002) (IEC 60747-5-2:1997 + A1:2002) Dispositifs discrets
11、semiconducteurs et circuits intgrs Partie 5-2: Dispositifs optolectroniques Valeurs limites et caractristiques essentielles (inclut lamendement A1:2002) (CEI 60747-5-2:1997 + A1:2002) Einzel-Halbleiterbauelemente und integrierte Schaltungen Teil 5-2: Optoelektronische Bauelemente Wesentliche Grenz-
12、und Kennwerte (enthlt nderung A1:2002) (IEC 60747-5-2:1997 + A1:2002) This European Standard was approved by CENELEC on 2000-12-01 and amendment A1 was approved by CENELEC on 2002-05-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for
13、giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three offici
14、al versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical commit
15、tees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Elect
16、rotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 2001 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60747-5-2:2001 + A1:2002 EEN 60747-5-2:2001 BSI 17 January 20
17、03 Foreword The text of the International Standard IEC 60747-5-2:1997, prepared by SC 47C, Flat panel display devices, of IEC TC 47, Semiconductor devices, was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN 60747-5-2 on 2000-12-01 without any modification. This standa
18、rd should be read jointly with IEC 60747-1, EN 62007-1 and EN 62007-2. The following dates were fixed: Annexes designated normative are part of the body of the standard. Annexes designated informative are given for information only. In this standard, Annex B and Annex ZA are normative and Annex A is
19、 informative. Annex ZA has been added by CENELEC. Foreword to amendment A1 The text of document 47E/209/FDIS, future amendment 1 to IEC 60747-5-2:1997, prepared by SC 47E, Discrete semiconductor devices, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was appr
20、oved by CENELEC as amendment A1 to EN 60747-5-2:2001 on 2002-05-01. The following dates were fixed: Annexes designated “normative” are part of the body of the standard. In this standard, Annex B and Annex ZA are normative. Annex ZA has been added by CENELEC. latest date by which the EN has to be imp
21、lemented at national level by publication of an identical national standard or by endorsement (dop) 2002-01-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2004-01-01 latest date by which the amendment has to be implemented at national level by publi
22、cation of an identical national standard or by endorsement (dop) 2003-02-01 latest date by which the national standards conflicting with the amendment have to be withdrawn (dow) 2005-05-01 Incorporating amendment 12002-03EN 60747-5-2:2001 ii BSI 17 January 2003 Contents Page Foreword iv 1S c o p e 1
23、 2 Normative references 1 3 Light-emitting diodes (excluding devices for fibre optic systems or subsystems) 2 3.1 Type 2 3.2 Semiconductor material 2 3.3 Colour 2 3.4 Details of outline and encapsulation 2 3.5 Limiting values (absolute maximum system) 2 3.6 Electrical characteristics 2 3.7 Supplemen
24、tary information 3 4 Infrared-emitting diodes (excluding devices for fibre optic systems or subsystems) 3 4.1 Type 3 4.2 Semiconductor material 3 4.3 Details of outline and encapsulation 3 4.4 Limiting values (absolute maximum system) 3 4.5 Electrical characteristics 4 4.6 Supplementary information
25、4 5 Photodiodes (excluding devices for fibre optic systems or subsystems) 4 5.1 Type 4 5.2 Semiconductor material 4 5.3 Details of outline and encapsulation 4 5.4 Limiting values (absolute maximum system) 4 5.5 Electrical characteristics 5 5.6 Supplementary information 5 6 Phototransistors (excludin
26、g devices for fibre optic systems or subsystems 5 6.1 Type 5 6.2 Semiconductor material 5 6.3 Polarity 5 6.4 Details of outline and encapsulation 6 6.5 Limiting values (absolute maximum system) 6 6.6 Electrical characteristics 7 6.7 Supplementary information 8 7 Photocouplers, optocouplers (with out
27、put transistor) 8 7.1 Type 8 7.2 Semiconductor material 8 7.3 26Polarity of the output resistor 8 7.4 Details of outline and encapsulation 8 7.5 Limiting values (absolute maximum system) 8 7.6 Electrical characteristics 10EN 60747-5-2:2001 BSI 17 January 2003 iii Page 7.7 Supplementary information 1
28、0 8 Photocouplers (optocouplers) providing protection against electrical shock 11 8.1 Type 11 8.2 Semiconductor material 11 8.3 Details of outline and encapsulation 11 8.4 Ratings (have to be mentioned in a special section in the manufacturers data sheet) 11 8.5 Electrical safety requirements 12 8.6
29、 Electrical, environmental and/or endurance test information (supplementary information) 12 9 Laser diodes 19 9.1 Type 19 9.2 Semiconductor 19 9.3 Details of outline and encapsulation 19 9.4 Limiting values (absolute maximum system) 19 9.5 Electrical and optical characteristics 20 9.6 Supplementary
30、information 21 Annex A (informative) Cross references table 22 Annex B (normative) Input/output safety test 23 Figure 1 Test voltage 9 Figure B.1 Circuit diagram 23 Table 1 Datasheet characteristics 12 Table 2 Tests and test sequence for photocouplers providing protection against electrical shock 17
31、 Table 3 Test conditions 18EN 60747-5-2:2001 iv BSI 17 January 2003 Foreword 1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote inter
32、national co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the
33、subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with condit
34、ions determined by agreement between the two organizations. 2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested Natio
35、nal Committees. 3) The documents produced have the form of recommendations for international use and are published in the form of standards, technical reports or guides and they are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Comm
36、ittees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no ma
37、rking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall n
38、ot be held responsible for identifying any or all such patent rights. International Standard IEC 60747-5-2 has been prepared by subcommittee 47C: Optoelectronic, display and imaging devices, of IEC technical committee 47: Semiconductor devices. This first edition replaces partially the second editio
39、n of IEC 60747-5 (1992) and constitutes a technical revision (see also Annex A: Cross references index). It should be read jointly with IEC 60747-1, IEC 62007-1 and IEC 62007-2. The text of this standard is based partially on IEC 60747-5 (1992) and partially on the following documents: Full informat
40、ion on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Annex A is for information only. Annex B forms an integral part of this standard. FDIS Report on voting 47C/173/FDIS 47C/186/RVDEN 60747-5-2:2001 BSI 17 January 2003 1 Introduction
41、This part of IEC 60747 provides basic information on semiconductors: terminology; letter symbols; essential ratings and characteristics; measuring methods; acceptance and reliability. 1 Scope This part of IEC 60747 gives the essential ratings and characteristics of the following categories or subcat
42、egories of optoelectronic devices which are not intended to be used in the field of fibre optic systems or subsystems: Semiconductor photoemitters, including: light-emitting diodes (LEDs); infrared-emitting diodes (IREDs); laser diodes. Semiconductor photoelectric detectors, including: photodiodes;
43、phototransistors. Semiconductor photosensitive devices. Semiconductor devices utilizing the optical radiation for internal operation, including: photocouplers, optocouplers. 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute
44、provisions of this part of IEC 60747. At the time of publication, the editions indicated were valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC 60747 are encouraged to investigate the possibility of applying the most recent editions of the no
45、rmative documents indicated below. Members of IEC and ISO maintain registers of currently valid International Standards. IEC 60065:1985, Safety requirements for mains operated electronic and related apparatus for household and similar general use. IEC 60068-2-1:1990, Environmental testing Part 2: Te
46、sts Tests A: Cold. IEC 60068-2-2:1974, Environmental testing Part 2: Tests Tests B: Dry heat. IEC 60068-2-3:1969, Environmental testing Part 2: Tests Test Ca: Damp heat, steady state. IEC 60068-2-6:1995, Environmental testing Part 2: Tests Test Fc: Vibration (sinusoidal). IEC 60068-2-14:1984, Enviro
47、nmental testing Part 2: Tests Test N: Change of temperature. IEC 60068-2-17: 1994, Environmental testing Part 2: Tests Test Q: Sealing. IEC 60068-2-27:1987, Environmental testing Part 2: Tests Test Ea and guidance: Shock. IEC 60068-2-30:1980, Environmental testing Part 2: Tests Test Db and guidance:
48、 Damp heat, cyclic (12 + 12-hour cycle). IEC 60112:1979, Method for determining the comparative and the proof tracking indices of solid insulating materials under moist conditions. IEC 60216-1:1990, Guide for the determination of thermal endurance properties of electrical insulating materials Part 1
49、: General guidelines for ageing procedures and evaluation of test results. IEC 60216-2:1990, Guide for the determination of thermal endurance properties of electrical insulating materials Part 2: Choice of test criteria. IEC 60306-1:1969, Measurement of photosensitive devices Part 1: Basic recommendations.
