1、BRITISH STANDARDBS EN 61000-4-17:1999Electromagnetic compatibility (EMC) Part 4-17: Testing and measurement techniques Ripple on d.c. input power port immunity testICS 33.100.20g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54
2、g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58+A 2002: 9BS EN 61000-4-17:1999This British Standard, having been prepared under the direction of the Electrotechnical Sector Committee, was published under the authority of the Standards Committee and comes into effect on
3、15 November 1999 BSI 2010National forewordThe UK participation in its preparation was entrusted by Technical Committee GEL/210, Electromagnetic compatibility, to Subcommittee GEL/210/8, EMC Low frequency disturbances. A list of organizations represented on this subcommittee can be obtained on reques
4、t to its secretary.Amendments/corrigenda issued since publicationThis British Standard is the UK implementation of EN 61000-4-17:1999+A2:2009. It is identical with IEC 61000-4-17:1999, incorporating amendments 1:2001 and 2:2008. It supersedes BS EN 61000-4-17:1999, including amendment A1:2004, which
5、 will be withdrawn on 1 February 2012.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.The start and finish of text introduced or altered by amendment is indicated in the text by tags. Tags indicating changes t
6、o IEC text carry the number of the IEC amendment. For example, text altered by IEC amendment 1 is indicated in the text by .a bAmd. No. Date Comments 15274 26 July 2004Implementation of IEC amendment 1:2001 with CENELEC endorsement A1:2004Implementation of IEC amendment 2:2008 with CENELEC endorseme
7、nt A2:2009ISBN 978 0 580 61449 1 +A2:2009Compliance with a British Standard does not of itself confer immunity from legal obligations.3 20101 MayEUROPEAN STANDARDNORME EUROPENNEEUROPISCHE NORMEN 61000-4-17:1999+A2ICS 33.100.20English versionElectromagnetic compatibility (EMC) Part 4-17: Testing and
8、measurement techniques Ripple on d.c. input power port immunity test(IEC 61000-4-17:1999)Compatibilit lectromagntique (CEM) Partie 4-17: Techniques dessai et de mesure Essai dimmunit londulation rsiduelle sur entre de puissance courant continu(CEI 61000-4-17:1999)Elektromagnetische Vertrglichkeit (E
9、MV) Teil 4-17: Prf- und Meverfahren Prfung der Strfestigkeit gegen Wechselanteile der Spannung an Gleichstrom-Netzanschlssen(IEC 61000-4-17:1999)This European Standard was approved by CENELEC on 1999-08-01. CENELECmembers are bound to comply with the CEN/CENELEC Internal Regulationswhich stipulate t
10、he conditions for giving this European Standard the status of anational standard without any alteration.Up-to-date lists and bibliographical references concerning such nationalstandards may be obtained on application to the Central Secretariat or to anyCENELEC member.This European Standard exists in
11、 three official versions (English, French,German). A version in any other language made by translation under theresponsibility of a CENELEC member into its own language and notified to theCentral Secretariat has the same status as the official versions.CENELEC members are the national electrotechnic
12、al committees of Austria,Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France,Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia,Slovenia, Spain, Sweden, Switzerland and United Kingdom.CENELECEuropean
13、Committee for Electrotechnical StandardizationComit Europen de Normalisation ElectrotechniqueEuropisches Komitee fr Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B-1050 Brussels 1999 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC me
14、mbers.Ref. No. EN 61000-4-17:1999 EFebruary 2009 BSI 26 July 20042ForewordThe text of document 77A/271/FDIS, future edition 1 of IEC 61000-4-17, prepared by SC 77A, Low-frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved b
15、y CENELEC as EN 61000-4-17 on 1999-08-01.The following dates were fixed:Annexes designated “normative” are part of the body of the standard. Annexes designated “informative” are given for information only. In this standard, Annex ZA is normative and Annex A is informative. Annex ZA has been added by
16、 CENELEC.Endorsement noticeThe text of the International Standard IEC 61000-4-17:1999 was approved by CENELEC as a European Standard without any modification.Foreword to amendment A1The text of amendment 1:2001 to the International Standard IEC 61000-4-17:1999, prepared by SC 77B, High frequency phe
17、nomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the Unique Acceptance Procedure and was approved by CENELEC as amendment A1 to EN 61000-4-17:1999 on 2004-05-01 without any modification.The following dates were fixed:Endorsement noticeThe text of the amendment 1:2001 to the Inte
18、rnational Standard IEC 61000-4-17:1999 was approved by CENELEC as an amendment to the European Standard without any modification. latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2000-05-01latest date by whic
19、h national standards conflicting with the EN have to be withdrawn (dow) 2002-08-01 latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2005-05-01 latest date by which national standards conflicting with t
20、he amendment have to be withdrawn (dow) 2007-05-01Foreword to amendment A2The text of document 77A/632/CDV, future amendment 2 to IEC 61000-4-17:1999, prepared by SC 77A, Low frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was appr
21、oved by CENELEC as amendment A2 to EN 61000-4-17:1999 on 2009-02-01.The following dates were fixed: latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2009-11-01 latest date by which the national standar
22、ds conflicting with the amendment have to be withdrawn (dow) 2012-02-01Annex ZA has been added by CENELEC.Endorsement noticeThe text of amendment 2:2008 to the International Standard IEC 61000-4-17:1999 was approved byCENELEC as an amendment to the European Standard without any modification.BS EN 61
23、000-4-17:1999+A2:2009EN 61000-4-17:1999+A2:2009 (E)CONTENTSINTRODUCTION 41 Scope 52 Normative references. 63 General 64 Definitions 65 Test levels and waveform 76 Test generator . 86.1 Characteristics and performance of the generator . 86.2 Verification of the characteristics of the generator . 87 T
24、est set-up 98 Test procedure. 98.1 Laboratory reference conditions 98.1.1 Climatic conditions 98.1.2 Electromagnetic conditions 98.2 Execution of the test . 99 Evaluation of test results .1010 Test report 11Annex A (informative) Information on the phenomenon .13FiugrE 1 examselp fo riegatlov elpp we
25、vaforms.21FiugrE 1.A examfo elp enegrrota absa no de rectifrei systme 41FiugrE 2.A examfo elp enegrrota absp no dergorammni elbastrumoitatnen41T 1 elba Tesel tvesl 7TNOCENTSNITROCUDTION 41 Scepo 52 Normaitve ref rneces. 63 General 64 Defnoitinis 65 Tesslevel t dna waevform 76 Teseneg trrota . 81.6 C
26、ahracetrisitc ep dnarformnacfo e eneg ehtrrota . 82.6 Verificfo noita eht cahracetristics fo eneg ehtrrota . 87 Test set-pu 98 Tesp trocudere. 91.8 obaLrotary refernece csnoitidno 91.1.8 Cilmcita cnoitidnos . 92.1.8 Eelctromcitenga cnoitidnos 92.8 Execufo noit et ehtst . 99 Evafo noitaul etst resutl
27、s 1.001 Test ropert 11xennA A (inform)evita nIformonehp eht no noitamnone .31FiugrE 1 examselp fo riegatlov elpp wevaforms.21FiugrE 1.A examfo elp enegrrota absa no de rectifrei systme 41FiugrE 2.A examfo elp enegrrota absp no dergorammni elbastrumoitatnen41T 1 elba Tesel tvesl 73 egaP9991:71400016
28、NEAnnex ZA (normative) Normative references to international publications with theircorresponding European publications . 15TNOCENTSNITROCUDTION 41 Scepo 52 Normaitve referneces. 63 General 64 Defnoitinis 65 Tesslevel t dna waevform 76 Teseneg trrota . 81.6 Cahracetrisitcs ep dnarformnacfo e eneg eh
29、trrota . 82.6 Verificfo noita eht cahracetristics fo eneg ehtrrota . 87 Test set-pu 98 Tesp trocudere. 91.8 obaLrotary refernece csnoitidno 91.1.8 Cilmcita cnoitidnos 92.1.8 Eelctromcitenga cnoitidnos 92.8 Execufo noit et ehtst . 99 Evafo noitaul etst resutls 1.001 Test ropert 11xennA A (inform)evit
30、a nIformonehp eht no noitamnone .31Figure 1 Examples of ripple voltage waveforms.12Figure A.1 Example of generator based on a rectifier system 14Figure A.2 Example of generator based on programmable instrumentation14Table 1 Test levels 73 egaP9991:71400016 NECONTENTSINTRODUCTION 41 Scope 52 Normativ
31、e ref rences.3 General 64 Definitions 65 Test levels and waveform 76 Test generator . . 86.1 Characteristic and performance of the generator . 86.2 Verification of the characteristics of the generator . 87 Test set-up 8 Test procedure. .8.1 Laboratory reference conditions 8.1.1 Climatic conditions 8
32、.1.2 Electromagnetic conditions 98.2 Execution of the test . 99 Evaluation of test results .1010 Test report 11Annex A (informative) Information on the phenomenon .13Figure 1 Examples of ripple voltage waveforms.12Figure A.1 Example of generator based on a rectifier system 14Figure A.2 Example of ge
33、nerator based on programmable instrumentation14Table 1 Test levels 7Page 3EN 61000417:1999nnAex ZA (nroma)evit roNmevita refercnese ot tniertannoial bupcilatoisn wit htriehcorresdnopiuE gnroepap nublicatsnoi . 41BS EN 61000-4-17:1999+A2:2009EN 61000-4-17:1999+A2:2009 (E)Page 3INTRODUCTIONThis standa
34、rd is part of the IEC 61000 series, according to the following structure:Part 1: GeneralGeneral considerations (introduction, fundamental principles)Definitions, terminologyPart 2: EnvironmentDescription of the environmentClassification of the environmentCompatibility levelsPart 3: LimitsEmission li
35、mitsImmunity limits (in so far as they do not fall under the responsibility of the product committees)Part 4: Testing and measurement techniquesMeasurement techniquesTesting techniquesPart 5: Installation and mitigation guidelinesInstallation guidelinesMitigation methods and devicesPart 6: Generic s
36、tandardsPart 9: MiscellaneousEach part is further subdivided into several parts, published either as International Standardsor technical reports, some of which have already been published as sections. Others will bepublished with the part number followed by a dash and a second number identifying the
37、subdivision.This part is an International Standard which gives test procedures related to ripple on d.c. inputpower port.BS EN 61000-4-17:1999+A2:2009EN 61000-4-17:1999+A2:2009 (E)Page 4ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-17: Testing and measurement techniques Ripple on d.c. input power port
38、immunity test1 ScopeThis part of IEC 61000 defines test methods for immunity to ripple at the d.c. input power portof electrical or electronic equipment.This standard is applicable to low-voltage d.c. power ports of equipment supplied by externalrectifier systems, or batteries which are being charge
39、d.The object of this standard is to establish a common and reproducible basis for testing, in alaboratory, electrical and electronic equipment when subjected to ripple voltages such as thosegenerated by rectifier systems and/or auxiliary service battery chargers overlaying on d.c.power supply source
40、s.This standard defines test voltage waveform; range of test levels; test generator; test set-up; test procedure.The test described hereafter applies to electrical or electronic equipment and systems. It alsoapplies to modules or subsystems whenever the equipment under test (EUT) rated power isgreat
41、er than the test generator capacity specified in clause 6.This test does not apply to equipment connected to battery charger systems incorporatingswitch mode converters.This standard does not specify the tests to be applied to particular apparatus or systems. Itsmain aim is to give a general basic r
42、eference to IEC product committees. These productcommittees (or users or manufacturers of equipment) remain responsible for the appropriatechoice of the test and the severity level to be applied to their equipment.Dedicated test procedures are in use for testing specific categories of electrical or
43、electronicequipment, e.g. equipment connected to d.c. supply network of telephone switching centres;the related product committees should evaluate the relevance and applicability of the testprocedure specified in this basic standard.BS EN 61000-4-17:1999+A2:2009EN 61000-4-17:1999+A2:2009 (E)Page 52
44、Normative referencesThe following referenced documents are indispensable for the application of this document. Fordated references, only the edition cited applies. For undated references, the latest edition ofthe referenced document (including any amendments) applies.IEC 60050(161), International El
45、ectrotechnical Vocabulary (IEV) Chapter 161:Electromagnetic compatibilityIEC 60068-1, Environmental testing Part 1: General and guidance3 GeneralRipple may influence the reliable operation of equipment and systems, powered by d.c.supplies, installed in industrial plants as well in residential and co
46、mmercial installations.The ripple disturbance is represented by the voltage derived from a pulsating quantity fromwhich the direct component has been removed.The main sources of ripple disturbance are rectifier systems used in the external d.c. powernetworks and battery chargers.Ripple is therefore
47、a phenomenon continuously present in this type of d.c. power source, andmay be accentuated when the battery is recharging after a recovery of the a.c. power lineservice.Ripple components may also be produced by equipment absorbing a pulsating current; this isnot covered in this standard.4 Definition
48、sFor the purpose of this part of IEC 61000 the following definitions apply, together with thedefinitions of IEC 60050(161) IEV.4.1ripple content, alternating componentquantity derived by removing the direct component from a pulsating quantity (see figure 1),IEV 161-02-254.2EUTequipment under testAA2
49、2Text deletedBS EN 61000-4-17:1999+A2:2009EN 61000-4-17:1999+A2:2009 (E)Page 65 Test levels and waveformThe preferred range of test levels, applicable to the d.c. power supply port of the equipment,are given in table 1.Table 1 Test levelsLevel Percentageof the nominal d.c. voltage1234x251015xNOTE “x“ is an open level. This level can be given in theproduct specification. For the duration of the test, see 8.2.The test levels are a peak-to-peak voltage expressed as a percentage of th
