1、BSI Standards PublicationReliability testing Compliance tests for constant failure rate and constant failure intensityBS EN 61124:2012BS EN 61124:2012Incorporating corrigendum January 2013BS EN 61124:2012 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of EN 61124:201
2、2. It is identical to IEC 61124:2012, incorporating corrigendum January 2013. It supersedes BS EN 61124:2006 which is withdrawn.The start and finish of text introduced or altered by corrigendum is indicated in the text by tags. Text altered by IEC corrigendum January 2013 is indicated in the text by
3、 .The UK participation in its preparation was entrusted to Technical Committee DS/1, Dependability.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are resp
4、onsible for its correct application. The British Standards Institution 2013 Published by BSI Standards Limited 2013ISBN 978 0 580 82334 3ICS 03.120.30; 21.020; 29.020Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authori
5、ty of the Standards Policy and Strategy Committee on 31 August 2012.Amendments/corrigenda issued since publicationDate Text affected31 July 2013 Implementation of IEC corrigendum January 2013EUROPEAN STANDARD EN 61124 NORME EUROPENNE EUROPISCHE NORM August 2012 CENELEC European Committee for Electro
6、technical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN
7、 61124:2012 E ICS 03.120.30; 19.020; 21.020 Supersedes EN 61124:2006English version Reliability testing - Compliance tests for constant failure rate and constant failure intensity (IEC 61124:2012) Essais de fiabilit - Plan dessais de conformit dun taux de dfaillance constant et dune intensit de dfai
8、llance constante (CEI 61124:2012) Prfungen der Funktionsfhigkeit - Prfplne fr konstante Ausfallrate und konstante Ausfalldichte (IEC 61124:2012) This European Standard was approved by CENELEC on 2012-06-27. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate
9、 the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European S
10、tandard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members
11、are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway,
12、 Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 61124:2012EN 61124:2012 - 2 - Foreword The text of document 56/1461/FDIS, future edition 3 of IEC 61124, prepared by IEC/TC 56 “Dependablility“ was submitted to the IEC-CENELEC parallel v
13、ote and approved by CENELEC as EN 61124:2012. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2013-03-27 latest date by which the national standards conflicting with the
14、document have to be withdrawn (dow) 2015-06-27 This document supersedes EN 61124:2006. EN 61124:2012 includes the following significant technical changes with respect to EN 61124:2006: - a number of new test plans have been added based on the Russian standard GOST R 27.402, and it is intended to ali
15、gn the new edition of MIL-HDBK-781 with this edition. Algorithms for optimizing test plans using a spreadsheet program are given and a number of optimized test plans are listed. Furthermore, emphasis is laid on the fact that the test should be repeated following design changes; - discrepancies in te
16、st plans A, B as well as Annexes A and B that originated in IEC 60605-7, now withdrawn, have been corrected so these test plans differ from those given in previous edition of EN 61124. As requested by the National committees, mathematical background material and spreadsheet program information has b
17、een moved to informative annexes. In addition, the symbol lists have been divided, so that some annexes have separate lists of symbols; - guidance on how to choose test plans has been added as well as guidance on how to use spreadsheet programs to create them. Test plans A.1 to A.9 and B.1 to B.13 h
18、ave been corrected; - Subclauses 8.1, 8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged, except for updated terminology and references; - corrections to the second edition proposed by National Committees have been implemented. Attention is drawn to the possibility that som
19、e of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61124:2012 was approved by CENELEC as a European Standard without any
20、modification. BS EN 61124:2012- 3 - EN 61124:2012 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application
21、. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publicat
22、ion Year Title EN/HD Year IEC 60050-191 - International Electrotechnical Vocabulary (IEV) - Chapter 191: Dependability and quality of service - - IEC 60300-3-5 2001 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles - - IEC 60605-2 -
23、Equipment reliability testing - Part 2: Design of test cycles - - IEC 60605-4 2001 Equipment reliability testing - Part 4: Statistical procedures for exponential distribution - Point estimates, confidence intervals, prediction intervals and tolerance intervals - - IEC 60605-6 - Equipment reliability
24、 testing - Part 6: Tests for the validity and estimation of the constant failure rate and constant failure intensity - - IEC 61123 1991 Reliability testing - Compliance test plans for success ratio - - BS EN 61124:2012 2 61124 IEC:2012 CONTENTS 1 Scope . 10 2 Normative references . 10 3 Terms, defin
25、itions, abbreviations and symbols 11 3.1 Terms and definitions 11 3.2 Abbreviations and symbols 11 3.2.1 Abbreviations 11 3.2.2 Symbols 11 4 General requirements and area of application 13 4.1 Requirements 13 4.2 Applicability to replaced and repaired items . 13 4.3 Types of test plans 13 4.3.1 Gene
26、ral . 13 4.3.2 Advantages and disadvantages of the different test plan types 14 5 General test procedure . 14 5.1 Test conditions 14 5.2 General characteristics of the test plans 15 5.3 Data to be recorded . 15 5.4 Calculation of accumulated test time, *T 15 5.5 Number of failures . 16 6 Sequential
27、test plans 17 6.1 General . 17 6.2 Common test procedure 17 6.3 Decision criteria 17 6.4 Overview of test plans . 17 7 Fixed time/failure terminated test plans Fixed duration test plans 18 7.1 General . 18 7.2 Common test procedure 18 7.3 Decision criteria 19 7.4 Test plans . 19 8 Design of alternat
28、ive time/failure terminated test plans . 20 8.1 General . 20 8.2 Design procedures 20 8.3 Common test procedure 20 8.4 Decision criteria 21 9 Calendar time/failure terminated test plans for non-replaced items . 21 9.1 General . 21 9.2 Common test procedure 21 9.3 Decision criteria 21 9.4 Use of Tabl
29、e 2 of IEC 61123:1991 for fixed calendar time tests . 22 9.4.1 General . 22 9.4.2 Procedure when the test time is given . 22 9.4.3 Procedure when the number of items is given 22 10 Combined test plans . 23 BS EN 61124:2012 2 61124 IEC:2012 CONTENTS 1 Scope . 10 2 Normative references . 10 3 Terms, d
30、efinitions, abbreviations and symbols 11 3.1 Terms and definitions 11 3.2 Abbreviations and symbols 11 3.2.1 Abbreviations 11 3.2.2 Symbols 11 4 General requirements and area of application 13 4.1 Requirements 13 4.2 Applicability to replaced and repaired items . 13 4.3 Types of test plans 13 4.3.1
31、General . 13 4.3.2 Advantages and disadvantages of the different test plan types 14 5 General test procedure . 14 5.1 Test conditions 14 5.2 General characteristics of the test plans 15 5.3 Data to be recorded . 15 5.4 Calculation of accumulated test time, *T 15 5.5 Number of failures . 16 6 Sequent
32、ial test plans 17 6.1 General . 17 6.2 Common test procedure 17 6.3 Decision criteria 17 6.4 Overview of test plans . 17 7 Fixed time/failure terminated test plans Fixed duration test plans 18 7.1 General . 18 7.2 Common test procedure 18 7.3 Decision criteria 19 7.4 Test plans . 19 8 Design of alte
33、rnative time/failure terminated test plans . 20 8.1 General . 20 8.2 Design procedures 20 8.3 Common test procedure 20 8.4 Decision criteria 21 9 Calendar time/failure terminated test plans for non-replaced items . 21 9.1 General . 21 9.2 Common test procedure 21 9.3 Decision criteria 21 9.4 Use of
34、Table 2 of IEC 61123:1991 for fixed calendar time tests . 22 9.4.1 General . 22 9.4.2 Procedure when the test time is given . 22 9.4.3 Procedure when the number of items is given 22 10 Combined test plans . 23 BS EN 61124:201261124 IEC:2012 3 10.1 General . 23 10.2 Common test procedure 23 10.3 Deci
35、sion criteria 23 10.4 Test plans . 24 11 Performing the test . 24 12 Presentation of results 24 Annex A (normative) Tables and graphs for sequential test plans 25 Annex B (normative) Graphs for fixed time/failure terminated test plans . 44 Annex C (normative) Graphs for alternative time/failure term
36、inated test plans 53 Annex D (normative) Tables and graphs for combined test plans and additional sequential test plans . 60 Annex E (informative) Examples and mathematical references for sequential test plans 78 Annex F (informative) Design of sequential test plans using a common spreadsheet progra
37、m 86 Annex G (informative) Examples and mathematical references for fixed time/failure terminated test plans Fixed duration test plans 97 Annex H (informative) Design of fixed duration time/failure terminated test plans using a spreadsheet program . 99 Annex I (informative) Examples and mathematical
38、 references for the design of alternative time/failure terminated test plans . 105 Annex J (informative) Examples and mathematical references for the calendar time terminated test plans 112 Annex K (informative) Derivation and mathematical reference for the optimized test plans of GOST R 27 402 . 11
39、4 Bibliography 122 Figure A.1 Accept and reject lines for test plan A.1 25 Figure A.2 Test plan A.1 Operating characteristic curve 26 Figure A.3 Test plan A.1 Expected accumulated test time to decision . 27 Figure A.4 Accept and reject lines for test plan A.2 27 Figure A.5 Test plan A.2 Operating ch
40、aracteristic curve 28 Figure A.6 Test plan A.2 Expected accumulated test time to decision . 29 Figure A.7 Accept and reject lines for test plan A.3 29 Figure A.8 Test plan A.3 Operating characteristic curve 30 Figure A.9 Test plan A.3 Expected accumulated test time to decision . 31 Figure A.10 Accep
41、t and reject lines for test plan A.4 31 Figure A.11 Test plan A.4 Operating characteristic curve 32 Figure A.12 Test plan A.4 Expected accumulated test time to decision . 33 Figure A.13 Accept and reject lines for test plan A.5 33 Figure A.14 Test plan A.5 Operating characteristic curve 34 Figure A.
42、15 Test plan A.5 Expected accumulated test time to decision . 35 Figure A.16 Accept and reject lines for test plan A.6 35 Figure A.17 Test plan A.6 Operating characteristic curve 36 Figure A.18 Test plan A.6 Expected accumulated test time to decision . 37 Figure A.19 Accept and reject lines for test
43、 plan A.7 37 BS EN 61124:2012 4 61124 IEC:2012 Figure A.20 Test plan A.7 Operating characteristic curve 38 Figure A.21 Test plan A.7 Expected accumulated test time to decision . 39 Figure A.22 Accept and reject lines for test plan A.8 40 Figure A.23 Test plan A.8 Operating characteristic curve 41 Fi
44、gure A.24 Test plan A.8 Expected accumulated test time to decision . 41 Figure A.25 Accept and reject lines for test plan A.9 42 Figure A.26 Test plan A.9 Operating characteristic curve 43 Figure A.27 Test plan A.9 Expected accumulated test time to decision . 43 Figure B.1 Operating characteristic c
45、urves for test plans B.1, B.2, B.3 and B.4 44 Figure B.2 Test plan B.1 Expected test time to decision 45 Figure B.3 Test plan B.2 Expected test time to decision 45 Figure B.4 Test plan B.3 Expected test time to decision 46 Figure B.5 Test plan B.4 Expected test time to decision 46 Figure B.6 Operati
46、ng characteristic curves for test plans B.5, B.6, B.7 and B.8 47 Figure B.7 Test plan B.5 Expected test time to decision 47 Figure B.8 Test plan B.6 Expected test time to decision 48 Figure B.9 Test plan B.7 Expected test time to decision 48 Figure B.10 Test plan B.8 Expected test time to decision 4
47、9 Figure B.11 Operating characteristic curves for test plans B.9, B.10 and B.11 . 49 Figure B.12 Test plan B.9 Expected test time to decision 50 Figure B.13 Test plan B.10 Expected test time to decision 50 Figure B.14 Test plan B.11 Expected test time to decision . 51 Figure B.15 Operating character
48、istic curves for test plans B.12 and B.13. 51 Figure B.16 Test plan B.12 Expected test time to decision 52 Figure B.17 Test plan B.13 Expected test time to decision 52 Figure C.1 Discrimination ratio, D, and the acceptable number of failures, c = 0 to 8, as a function of the expected number of failu
49、res, 0, for recommended values, 2,5 %, 5 %, 10 %, 20 %, and 30 % of = 56 Figure C.2 Operation characteristic curves for c = 0 to 8; probability of acceptance Pa as a function of the (unknown) true expected number of failures, 057 Figure C.3 Discrimination ratio, D, as a function of the expected number of failures, 0, for recommended values, 2,5 %, 5 %, 10 %, 15 %, 20 % and
