1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationFibre optic interconnectingdevices and passive components Basic test and measurement procedures Part 3-35: Examinations and measurements Fibre optic connector endface visual and
2、automated inspectionBS EN 61300-3-35:2010Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-National forewordThis British Standard is the UK implementation of E
3、N 61300-3-35:2010. It isidentical to IEC 61300-3-35:2009. It supersedes DD IEC/PAS 61300-3-35:2002which is withdrawn.The UK participation in its preparation was entrusted by Technical CommitteeGEL/86, Fibre optics, to Subcommittee GEL/86/2, Fibre optic interconnectingdevices and passive components.A
4、 list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2010ISBN 978 0 580 54743 0ICS 33.180.20Compliance with a Brit
5、ish Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 28 February 2010Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 61300-3-35:2010Copyright European Com
6、mittee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EUROPEAN STANDARD EN 61300-3-35 NORME EUROPENNE EUROPISCHE NORM January 2010 CENELEC European Committee for Electrotechnical Standa
7、rdization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61300-3-35:20
8、10 E ICS 33.180.20 English version Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-35: Examinations and measurements - Fibre optic connector endface visual and automated inspection (IEC 61300-3-35:2009) Dispositifs dinterconnexion et compos
9、antspassifs fibres optiques - Mthodes fondamentales dessais et de mesure - Partie 3-35 : Examens et mesures - Inspection automatique et visuelle de la face terminale des connecteurs fibres optiques (CEI 61300-3-35:2009) Lichtwellenleiter -Verbindungselemente und passive Bauteile - Grundlegende Prf-
10、und Messverfahren - Teil 3-35: Untersuchungen und Messungen - Visuelle und automatisierte Inspektion der Endflchen von zylindrischen Lichtwellenleiter-Steckverbindern (IEC 61300-3-35:2009) This European Standard was approved by CENELEC on 2009-12-01. CENELEC members are bound to comply with the CEN/
11、CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to a
12、ny CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official ve
13、rsions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portug
14、al, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 61300-3-35:2010Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EN 6
15、1300-3-35:2010 - 2 - Foreword The text of document 86B/2909/FDIS, future edition 1 of IEC 61300-3-35, prepared by SC 86B, Fibre optic interconnecting devices and passive components, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61300-3-3
16、5 on 2009-12-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2010-09-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2012
17、-12-01 _ Endorsement notice The text of the International Standard IEC 61300-3-35:2009 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated: ISO 14577-2 NOTE Harmonized as EN
18、ISO 14577-2 (not modified). _ BS EN 61300-3-35:2010Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 2 61300-3-35 IEC:2009(E) CONTENTS 1 Scope.5 2 Normative r
19、eferences5 3 Measurement5 3.1 General .5 3.2 Measurement conditions 6 3.3 Pre-conditioning 6 3.4 Recovery.6 4 Apparatus.6 4.1 Method A: direct view optical microscopy .6 4.2 Method B: video microscopy 6 4.3 Method C: automated analysis microscopy.7 4.4 Calibration requirements for low and high resol
20、ution systems .7 5 Procedure.8 5.1 Measurement regions 8 5.2 Calibration procedure 8 5.3 Inspection procedure .9 5.4 Visual requirements.10 Annex A (informative) Examples of inspected end-faces with defects12 Annex B (normative) Diagram of calibration artefact and method of manufacture 18 Bibliograp
21、hy21 Figure 1 Inspection procedure flow .9 Table 1 Measurement regions for single fibre connectors8 Table 2 Measurement regions for multiple fibre rectangular ferruled connectors8 Table 3 Visual requirements for PC polished connectors, single mode fibre, RL 45 dB .10 Table 4 Visual requirements for
22、angle polished connectors (APC), single mode fibre 10 Table 5 Visual requirements for PC polished connectors, single mode fibre, RL 26 dB .11 Table 6 Visual requirements for PC polished connectors, multimode fibres .11 BS EN 61300-3-35:2010Copyright European Committee for Electrotechnical Standardiz
23、ation Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-61300-3-35 IEC:2009(E) 5 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 3-35: Examinations and measurements Fibre
24、optic connector endface visual and automated inspection 1 Scope This part of IEC 61300 describes methods for quantitatively assessing the endface quality of a polished fibre optic connector. The information is intended for use with other standards which set requirements for allowable surface defects
25、 such as scratches, pits and debris which may affect optical performance. In general, the methods described in this standard apply to 125 m cladding fibres contained within a ferrule and intended for use with sources of 2 W of input power. However, portions are applicable to non-ferruled connectors
26、and other fibre types. Those portions are identified where appropriate. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced
27、 document (including any amendments) applies. None. 3 Measurement 3.1 General The objective of this standard is to prescribe methods for quantitatively inspecting fibre optic endfaces to determine if they are suitable for use. Three methods are described: A: direct view optical microscopy, B: video
28、microscopy, C: automated analysis microscopy. Within each method, there are hardware requirements and procedures for both low resolution and high resolution systems. High resolution systems are to be utilized for critical examination of the glass fibre after polishing and upon incoming quality assur
29、ance. High resolution systems are typically not used during field polishing or in conjunction with multimode connectors. Low resolution systems are to be utilized prior to mating connectors for any purpose. All methods require a means for measuring and quantifying defects. There are many types of de
30、fects. Commonly used terminology would include: particles, pits, chips, scratches, embedded debris, loose debris, cracks, etc. For practical purposes, all defects will be categorized in one of two groups. They are defined as follows: scratches: permanent linear surface features; defects: all non-lin
31、ear features detectable on the fibre. This includes particulates, other debris, pits, chips, edge chipping, etc. All defects and scratches are surface anomalies. Sub-surface cracks and fractures are not reliably detectable with a light microscope in all situations and are therefore not covered withi
32、n this standard. Cracks and fractures to the fibre may be detected with a light microscope and are generally considered a catastrophic failure. BS EN 61300-3-35:2010Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproducti
33、on or networking permitted without license from IHS-,-,- 6 61300-3-35 IEC:2009(E) Differentiating between a scratch and all other defects is generally intuitive to a human being. However, to provide clarity, and for automated systems, scratches are defined as being less than 4 m wide, linear in natu
34、re, and with a length that is at least 30 times their width. As the width dimension is not practical to visually measure below 3 m, these figures can be grossly estimated. Defects size is defined for methods A and B as the diameter of the smallest circle that can encompass the entire defect. Defect
35、size for method C can be either the actual measured surface area or the diameter of the smallest circle than can encompass the entire defect. Some fibre types have structural features potentially visible on the fibre endface. Fibres that use microstructures to contain the light signal, such as photo
36、nic band-gap and hole-assisted fibres, can have an engineered or random pattern of structures surrounding the core. These features are not defects. For methods A and B below, it is recommended that visual gauge tools be developed to facilitate the measurement procedure. For method A, an eyepiece ret
37、icule is recommended. For method B, an overlay is recommended. 3.2 Measurement conditions No restrictions are placed on the range of atmospheric conditions under which the test can be conducted. It may be performed in controlled or uncontrolled environments 3.3 Pre-conditioning No minimum pre-condit
38、ioning time is required. 3.4 Recovery Since measurements are to be made at standard test conditions, no minimum recovery time is required. 4 Apparatus 4.1 Method A: direct view optical microscopy This method utilizes a light microscope in which a primary objective lens forms a first image that is th
39、en magnified by an eyepiece that projects the image directly to the users eye. It shall have the following features and capabilities: a suitable ferrule or connector adapter; a light source and focusing mechanism; a means to measure defects observed in the image. 4.2 Method B: video microscopy This
40、method utilizes a light microscope in which a lens system forms an image on a sensor that, in turn, transfers the image to a display. The user views the image on the display. It shall have the following features and capabilities: a suitable ferrule or connector adapter; a light source and focusing m
41、echanism; a means to measure defects observed in the image. BS EN 61300-3-35:2010Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-61300-3-35 IEC:2009(E) 7 4.3
42、 Method C: automated analysis microscopy This method utilizes a light microscope in which a digital image is acquired or created and subsequently analyzed via an algorithmic process. The purpose of such a system is to reduce the effects of human subjectivity in the analysis process and, in some case
43、s, to improve cycle times. It shall have the following features and capabilities: a suitable ferrule or connector adapter; a means for acquiring or creating a digital image; algorithmic analysis of the digital image. A means to compare the analyzed image to programmable acceptance criteria in such a
44、 manner that a result of “pass” or “fail” is provided. 4.4 Calibration requirements for low and high resolution systems 4.4.1 General Microscope systems for any of the methods above shall be calibrated for use in either low or high resolution applications. It is suggested that this calibration be co
45、nducted with a purpose-built calibration artefact that can serve to validate a systems ability to detect defects of relevant size. Such an artefact shall be provided with instructions on its use and shall be manufactured in a method such that it can be measured in a traceable manner. Details on the
46、manufacture of such artefacts can be found in Annex B. For reference, a systems optical resolution may be calculated using the formula below. Optical resolution is not equivalent to the systems detection capability. In most cases, the system will be able to detect defects smaller than its optical re
47、solution. Optical resolution = (0,61 wavelength of illumination source) / systems numerical aperture 4.4.2 Requirements for low resolution microscope systems Minimum total magnification offering a field of view of at least 250 m (for methods B and C, this dimension is to be measured in the vertical,
48、 or most constrained, axis) capable of detecting low-contrast defects of 2 m in diameter or width. 4.4.3 Requirements for high resolution microscope systems Minimum total magnification offering a field of view of at least 120 m (for methods B and C, this dimension shall be measured in the vertical, or most constrained, axis) capable of detecting low contrast scratches of 0,2 m in width and 0,003 m in depth. BS EN 61300-3-35:2010Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for Resale
