1、ElectrostaticsPart 4-7: Standard test methods for specific applications - Ionization (IEC 61340-4-7:2017)BS EN 61340-4-7:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61340-4-7 March 2017 ICS 17.200.99; 29.02
2、0 English Version Electrostatics - Part 4-7: Standard test methods for specific applications - Ionization (IEC 61340-4-7:2017) lectrostatique - Partie 4-7: Mthodes dessai normalises pour des applications spcifiques - Ionisation (IEC 61340-4-7:2017) Elektrostatik - Teil 4-7: Standard-Prfverfahren fr
3、spezielle Anwendungen - Ionisation (IEC 61340-4-7:2017) This European Standard was approved by CENELEC on 2017-02-10. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard witho
4、ut any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any oth
5、er language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cypr
6、us, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turke
7、y and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and
8、by any means reserved worldwide for CENELEC Members. Ref. No. EN 61340-4-7:2017 E National forewordThis British Standard is the UK implementation of EN 61340-4-7:2017. It is identical to IEC 61340-4-7:2017.The UK participation in its preparation was entrusted to Technical Committee GEL/101, Electros
9、tatics.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI
10、 Standards Limited 2017ISBN 978 0 580 88101 5ICS 29.020; 17.200.99Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 October 2017.Amendments/corrigenda issued si
11、nce publicationDate Text affectedBRITISH STANDARDBS EN 6134047:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61340-4-7 March 2017 ICS 17.200.99; 29.020 English Version Electrostatics - Part 4-7: Standard test methods for specific applications - Ionization (IEC 61340-4-7:2017) lectrostatiq
12、ue - Partie 4-7: Mthodes dessai normalises pour des applications spcifiques - Ionisation (IEC 61340-4-7:2017) Elektrostatik - Teil 4-7: Standard-Prfverfahren fr spezielle Anwendungen - Ionisation (IEC 61340-4-7:2017) This European Standard was approved by CENELEC on 2017-02-10. CENELEC members are b
13、ound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the
14、 CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Manageme
15、nt Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Irelan
16、d, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisch
17、es Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 61340-4-7:2017 E BS EN 6134047:2017EN 61340-4-7:2017 2 European foreword T
18、he text of document 101/521/FDIS, future edition 2 of IEC 61340-4-7, prepared by IEC/TC 101 “Electrostatics“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61340-4-7:2017. The following dates are fixed: latest date by which the document has to be implemented at national
19、 level by publication of an identical national standard or by endorsement (dop) 2017-11-10 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-02-10 Attention is drawn to the possibility that some of the elements of this document may be the subje
20、ct of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61340-4-7:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibl
21、iography, the following note has to be added for the standard indicated : IEC/TR 61340-5-2 NOTE Harmonized as CLC/TR 61340-5-2 2 IEC 61340-4-7:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 Test fixture and instrumentation . 9 5 Sp
22、ecific requirements for equipment categories . 11 5.1 Specific requirements for all ionization equipment . 11 5.2 Room ionization 12 5.3 Laminar flow hood ionization . 14 5.4 Work surface ionization . 16 5.5 Compressed gas ionizers Guns and nozzles 19 Annex A (informative) Theoretical background and
23、 additional information on the standard test method for the performance of ionizers 21 A.1 Introductory remarks . 21 A.2 Air ions . 21 A.3 Mobility and ion current . 21 A.4 Neutralization current 21 A.5 Neutralization rate 22 A.6 Ion depletion and field suppression . 22 A.7 Charged plate monitor and
24、 charge neutralization 22 A.8 Relationship between charged plate monitor decay time and actual object 23 A.9 Offset voltage . 23 A.10 Preparation of test area 23 A.11 Ion transport in airflow 24 A.12 Obstruction of airflow around the charged plate monitor 24 A.13 Effect of “air blanket” 24 A.14 Sour
25、ces of measurement error 25 A.14.1 Typical decay time variability . 25 A.14.2 Plate isolation 25 A.14.3 Charging voltage . 25 A.14.4 Materials near the plate . 25 A.14.5 Other field-producing devices in test area 25 A.14.6 Effect of offset voltage on decay time 25 A.15 Importance of ionization equip
26、ment maintenance 26 Annex B (normative) Method of measuring the capacitance of an isolated conductive plate . 27 B.1 Method . 27 B.2 Equipment 27 B.3 Procedure . 27 B.4 Example 27 B.5 Sources of error 28 B.5.1 Measuring equipment 28 B.5.2 Poor plate isolation 28 B.5.3 Objects in the environment 29 B
27、.5.4 Stray capacitance 29 Annex C (informative) Safety considerations 30 BS EN 6134047:2017EN 61340-4-7:2017 2 European foreword The text of document 101/521/FDIS, future edition 2 of IEC 61340-4-7, prepared by IEC/TC 101 “Electrostatics“ was submitted to the IEC-CENELEC parallel vote and approved b
28、y CENELEC as EN 61340-4-7:2017. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2017-11-10 latest date by which the national standards conflicting with the document have
29、to be withdrawn (dow) 2020-02-10 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Stan
30、dard IEC 61340-4-7:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated : IEC/TR 61340-5-2 NOTE Harmonized as CLC/TR 61340-5-2 2 IEC 61340-4-7:2017 IEC 2017 CONTENTS FORE
31、WORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 Test fixture and instrumentation . 9 5 Specific requirements for equipment categories . 11 5.1 Specific requirements for all ionization equipment . 11 5.2 Room ionization 12 5.3 Laminar flow hood ionization . 14
32、 5.4 Work surface ionization . 16 5.5 Compressed gas ionizers Guns and nozzles 19 Annex A (informative) Theoretical background and additional information on the standard test method for the performance of ionizers 21 A.1 Introductory remarks . 21 A.2 Air ions . 21 A.3 Mobility and ion current . 21 A
33、.4 Neutralization current 21 A.5 Neutralization rate 22 A.6 Ion depletion and field suppression . 22 A.7 Charged plate monitor and charge neutralization 22 A.8 Relationship between charged plate monitor decay time and actual object 23 A.9 Offset voltage . 23 A.10 Preparation of test area 23 A.11 Ion
34、 transport in airflow 24 A.12 Obstruction of airflow around the charged plate monitor 24 A.13 Effect of “air blanket” 24 A.14 Sources of measurement error 25 A.14.1 Typical decay time variability . 25 A.14.2 Plate isolation 25 A.14.3 Charging voltage . 25 A.14.4 Materials near the plate . 25 A.14.5
35、Other field-producing devices in test area 25 A.14.6 Effect of offset voltage on decay time 25 A.15 Importance of ionization equipment maintenance 26 Annex B (normative) Method of measuring the capacitance of an isolated conductive plate . 27 B.1 Method . 27 B.2 Equipment 27 B.3 Procedure . 27 B.4 E
36、xample 27 B.5 Sources of error 28 B.5.1 Measuring equipment 28 B.5.2 Poor plate isolation 28 B.5.3 Objects in the environment 29 B.5.4 Stray capacitance 29 Annex C (informative) Safety considerations 30 BS EN 6134047:2017IEC 61340-4-7:2017 IEC 2017 3 C.1 General . 30 C.2 Electrical . 30 C.3 Ozone .
37、30 C.4 Radioactive . 30 C.5 X-ray . 30 C.6 Installation 30 Bibliography 31 Figure 1 Charged plate monitor components for non-contacting plate measurement 10 Figure 2 Charged plate monitor components for contacting plate measurement . 10 Figure 3 Conductive plate detail for the non-contacting CPM . 1
38、1 Figure 4 Conductive plate detail for the voltage follower CPM 11 Figure 5 Test locations for room ionization AC grids and DC bar systems . 13 Figure 6 Test locations for room ionization Single polarity emitter systems . 13 Figure 7 Test locations for room ionization Dual DC line systems 14 Figure
39、8 Test locations for room ionization Pulsed DC emitter systems . 14 Figure 9 Test locations for vertical laminar flow hood Top view . 15 Figure 10 Test locations for vertical laminar flow hood Side view 15 Figure 11 Test locations for horizontal laminar flow hood Top view . 16 Figure 12 Test locatio
40、ns for horizontal laminar flow hood Side view 16 Figure 13 Test locations for benchtop ionizer Top view . 17 Figure 14 Test locations for benchtop ionizer Side view 18 Figure 15 Test locations for overhead ionizer Top view . 18 Figure 16 Test locations for overhead ionizer Side view 19 Figure 17 Tes
41、t locations for compressed gas ionizer (gun or nozzle) Side view . 20 Table 1 Test set-ups and test locations/points (TP) 12 Table B.1 Example measurement data . 28 BS EN 6134047:2017IEC 61340-4-7:2017 IEC 2017 3 C.1 General . 30 C.2 Electrical . 30 C.3 Ozone . 30 C.4 Radioactive . 30 C.5 X-ray . 30
42、 C.6 Installation 30 Bibliography 31 Figure 1 Charged plate monitor components for non-contacting plate measurement 10 Figure 2 Charged plate monitor components for contacting plate measurement . 10 Figure 3 Conductive plate detail for the non-contacting CPM . 11 Figure 4 Conductive plate detail for
43、 the voltage follower CPM 11 Figure 5 Test locations for room ionization AC grids and DC bar systems . 13 Figure 6 Test locations for room ionization Single polarity emitter systems . 13 Figure 7 Test locations for room ionization Dual DC line systems 14 Figure 8 Test locations for room ionization P
44、ulsed DC emitter systems . 14 Figure 9 Test locations for vertical laminar flow hood Top view . 15 Figure 10 Test locations for vertical laminar flow hood Side view 15 Figure 11 Test locations for horizontal laminar flow hood Top view . 16 Figure 12 Test locations for horizontal laminar flow hood Si
45、de view 16 Figure 13 Test locations for benchtop ionizer Top view . 17 Figure 14 Test locations for benchtop ionizer Side view 18 Figure 15 Test locations for overhead ionizer Top view . 18 Figure 16 Test locations for overhead ionizer Side view 19 Figure 17 Test locations for compressed gas ionizer
46、 (gun or nozzle) Side view . 20 Table 1 Test set-ups and test locations/points (TP) 12 Table B.1 Example measurement data . 28 4 IEC 61340-4-7:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROSTATICS Part 4-7: Standard test methods for specific applications Ionization FOREWORD 1) The
47、 International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and
48、 electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical com
49、mittees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determine
