1、 STD.BSI BS EN bL747-5-ENGL 3978 E Lb24bb7 0733073 787 m BRITISH STANDARD Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods * rn * The European Standard EN 617475: 1998 has the status of a British Standard ICS31.120 NO COPYING WITHOUT BSI P
2、ERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW BS EN 61 747-5: 1998 IEC 6 1747-5: 1998 STD-BSI BS EN b17q7-5-ENGL 1778 Lb29bb7 0731079 AL3 AmdNo. Date BS EN 61747-6:1998 Textaffected This British Standard, having been prepared under the direction of the Eectrotechnical sector Bd, was pubiishe under
3、the authority of the Standards Board and comes into effect on 16 November 1998 National foreword This British Standard is the English language version of EN 6174761998. It is identical with IEC 6174745 1998. The UK participation in its preparation was entrusted by Technical Committe EPi47, Semicondu
4、ctor devices, to Subcommittee EPi47/3, ptmlectronic display and imaging devices, which has the responsibility to: - aid enquirem to undexstand the te* - present to the responsible internaomVEuropean committee any enquiries on the interpretation, or proposais for change, and keep the UK interests - m
5、onitor related international and European developments and promuigate informed; themintheUK. A list of organizatons Epresented on this committee can be obtained on request to its secmkuy. From 1 Janw 1997, ai IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has
6、been renumbered as IEC 60027-1. For a period of time during the change over from one num- system to the other, publications may contain identifiem from both systems, Cross-references Attention is drawn to the fact that CEN and CENELEC standards normally include an annex which lists nonnative referen
7、ces to intedonal pubiications with their correspondllig European publications. The British Standarcis which implement these international or Europeani publications may be found in the BSI Standards Catalogue under the section entitied “Internaonai Standards Correspondence Index“, or by using the “Fn
8、d“ faciiity of the BSI Standards Electsonic Catalogue. A British Standard does not purport to include ail the necessary provisions of a conira (Excluding all active matrix liquid crystal display modules) . 6 visual inspection of contact pad area (see figure 14) plates of cells Annex A - Cross refere
9、nces index . Annex ZA Normative references to international publications with their corresponding European publications Pig0 4 4 4 5 5 7 7 8 8 8 9 9 11 12 12 14 14 17 18 18 18 19 19 24 24 24 24 25 25 25 25 25 30 30 30 33 34 36 37 38 O BSI 1998 - STD-BSI BS EN bl17q7-5-ENGL 1998 9 Lb24bb 0733098 4b7
10、9 Page 4 EN 61747-6:1998 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - Part 5: Environmental, endurance and mechanical test methods 1 General 1.1 Scope and object This part of IEC 61747 lists test methods applicable to liquid crystal display devices. It takes into account, wherever possible, the
11、environmental test methods outlined in IEC 60068. It also includes visual inspection for both liquid crystal display cells and modules. NOTE 1 - This standard is established separately from IEC 60749, because the technology of liquid crystal display devices is completely different from that of semic
12、onductor devices in such matters as - shape and size; - used materials and structure; - function; - measuring methods; - operation principles. NOTE 2 - Devices include cells and modules. The object of this standard is to establish uniform preferred test methods with preferred values for stress level
13、s for judging the environmental properties of liquid crystal display devices. In case of contradiction between this standard and a relevant specification, the latter shall govern. 1.2 Normative references The following normative documents contain provisions which, through reference in this text, con
14、stitute provisions of this part of IEC 61747. At the time of publication, the editions indicated were valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC 61747 are encouraged to investigate the possibility of applying the most recent editions o
15、f the normative documents indicated below. Members of IEC and IS0 maintain registers of currently valid International Standards. IEC 60068, Environmental testing IEC 60068-1 :1988, Environmental testing - Pari 7: General and guidance IEC 60068-2-1 :1990, Environmental testing - Pari 2: Tests - Test
16、A: Cold IEC 60068-2-2: 1974, Environmental testing - Part 2: Tests - Test 8: Dry heat IEC 60068-2-3: 1969, Environmental testing - Part 2: Tests - Test Ca: Damp heat, steady state IEC 60068-2-51 975, Environmental testing - Part 2: Tests - Test Sa: Simulated solar radiation at ground level U VI U ST
17、D.BS1 BS EN b1747-5-ENGL 1998 = Lb24bbS 0733099 3T5 W Page 5 EN 61747-5:998 IEC 60068-2-6:1995, Environmental testing - fart 2: Tests - Test Fc: Vibration (sinusoidal) IEC 60068-2-7:1983, Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state IEC 60068-2-1 31 983, Environmental
18、testing - Part 2: Tests - Test M: Low air pressure IEC 60068-2-14:1984, Environmental testing - Part 2: Tests - Test N: Change of temperature IEC 60068-2-20:1979, Environmental testing - Pari 2: Tests - Test T: Soldering IEC 60068-2-21:1983, Environmental testing - Part 2: Tests - Test U: Robustness
19、 of terminations and integral mounting devices IEC 60068-2-27:1987, Environmental testing - Part 2: Tests - Test Ea and guidance: Shock IEC 60068-2-30:1980, Environmental testing - Part 2: Tests - Test Db and guidance: Damp heat, cyclic (12 + 12-hour cycle) IEC 60068-2-38:1974, Environmental testing
20、 - fart 2: Tests - Test DAD: Composite tempera turehmidity cyclic test IEC 60068-2-451980, Environmental testing - fart 2: Tests - Test XA and guidance: immersion in cleaning solvents IEC 60747, Semiconductor devices IEC 60747-1 : 1983, Semiconductor devices - Discrete devices - Part 1 - General Ame
21、ndment 1 (1991) Amendment 2 (1993) Amendment 3 (1996) IEC 60747-51 984, Semiconductor devices - Part 5: Optoelctronic devices Amendment 1 (1994) Amendment 2 (1995) IEC 60748-1 :1984, Semiconductor devices - Integrated circuits - Part 7: General IEC 60749: 1996, Semiconductor devices - Mechanical and
22、 climatic test methods IEC 61 747: 1998, Liquid crystal and solid-state display devices 1.3 For the purpose of this standard, the definitions and letter symbols of IEC 60068, IEC 60747, IEC 60748 and IEC 61747-1 apply. Terms, definitions and letter symbols 1.4 Standard atmospheric conditions The atm
23、ospheric conditions specified in IEC 60068-1 apply. 1.4.1 Standard reference atmosphere Temperature: 25 OC Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar) STD-BSI BS EN bL7q7-5-ENGL 1978 Lb24bbS 0731100 747 W Tom poraturo “C 20 f 1 25 i 1 30 i 1 55 f 1 ! Rolativo humidity Air preaaure % RH
24、kPa 45 to 75 45 to 75 45 to 75 86 to 106 86 to 106 86 to 106 45 to 75 86 to 106 Page 6 EN 61747-6:1998 1.4.3 Standard atmospheric conditions for measurements and tests Unless otherwise specified, all tests and measurements shall be carried out under standard atmospheric conditions for testing. Tempe
25、rature: . 15 “C to 35 OC Relative humidity: 25 OJO to 85 % RH, where appropriate Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar) The absolute humidity of the atmosphere shall not exceed 22 g/m3. 1.4.4 Recovery conditions After the conditioning period and before making the final measurements
26、, the specimens should be allowed to stabilize at the ambient temperature, the temperature at which the measurements shall be made. The “controlled recovery conditions“ (see 1.4.4.1) shall be applied if the electrical parameters to be measured are affected by absorbed humidity or by the surface cond
27、itions of the specimens, and change rapidly, for example if the insulation resistance rises considerably within approximately 2 h after removal of the specimens from the humidity chamber. If the electrical parameters of the specimens affected by absorbed humidity or surface conditions do not vary ra
28、pidly, recovery may be carried out in the conditions specified in 1.4.3. 1.4.4.1 Controlled recovery conditions Unless otherwise specified, all recovery shall be carried out under controlled atmospheric conditions: Temperature: actual laboratory temperature 11 OC, provided that it is within the limi
29、ts fixed in 1.4.3, that is between 15 OC to 35 “C. Relative humidity: 73 % to 77 %, where appropriate Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar) Before the measurements are made, the devices shall be stored until temperature equilibrium is reached. The ambient temperature during the me
30、asurements shall be stated in the test report. * U rn STD.BSI BS EN bL747-5-ENGL 1998 Lb24bb9 D731101 883 D Page 7 EN 61747-5:1998 During measurements, the devices shall not be exposed to draught, illumination or other influences likely to cause error. The environment shall be controlled to avoid er
31、ror. If recovery and measurements are performed in separate chambers, the combination of temperature and humidity conditions shall be such that condensation on the surface of the devices does not occur when the device is transferred to the measurement chamber. 1.4.4.2 Recovery procedure The device s
32、hall be placed in the recovery chamber within 10 min of completing of conditioning. Where the relevant specification requires measurements to be made immediately after the recovery period, these measurements shall be completed within 30 min of the specimen being removed from the recovery chamber. Th
33、ose characteristics which are expected to change most rapidly after the device is removed from the recovery chamber shall be measured first. 1.4.5 Standard atmospheric conditions for assisted drying Where assisted drying is required before commencing a series of measurements, the conditions listed b
34、elow shall be used on the specimen for 6 h, unless otherwise prescribed by the relevant specification. Temperature: (55 f 2) “C Relative humidity: not exceeding 20 % Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar) When the specified temperature for the dry heat test is lower than 55 OC, ass
35、isted drying shall be carried out at that lower temperature. 1.5 Visual examination and verification of dimensions Clauses 5 and 6 are applicable. 1 S.1 Visual examination shall include a) the conformance and permanence of the marking; b) damage to the encapsulation, including terminals; c) workmans
36、hip of the encapsulation, including terminals. 1.5.2 Dimensions given in the relevant specification shall be verified. 1.5.3 Unless otherwise specified, visual inspection shall be performed under normal factory lighting and under normal visual conditions. 1.6 Electrical and optical measurements 1.6.
37、1 relevant part of IEC 61747. For environmental testing, the characteristics to be checked shall be selected from the 1.6.2 Measurement conditions shall comply with the table “Conditions for the endurance tests“ in the relevant part of IEC 61747. STD-BSI BS EN bL747-5-ENGL 1998 Lb2LibbS 073LL02 7LT
38、Page 8 EN 6174741998 1.6.3 Initial measurements If only upper specification limit and/or lower specification limit criteria are required, it is left to the discretion of the manufacturer whether initial measurements are made or not. Initial measurements shall be made where individual values for an i
39、ndividual device are a criterion. 1.6.4 Measurements monitored during environmental testing To be stated, where appropriate. 1.6.5 Final measurements When the test is called for in the relevant specification as part of a sequence (subgroup) of tests, measurements are required only at the end of the
40、sequence. For certain tests, such as solderability or lead fatigue, electrically or optically defective devices may be used. 1.7 Electrical operating conditions Electrical operating conditions shall be defined in the relevant specifications. 2 Mechanical test methods Choice of the appropriate tests
41、depends on the type of devices. The relevant specification shall state which tests are applicable. 2.1 Robustness of terminations 2.1.1 Test U, specified in IEC 60068-2-21, is applicable. Wire terminations, pins or connectors with pins 2.1.1.1 Tensile This test shall be in accordance with test Ual,
42、with the following specific requirements. After test, examine under 3x to lox magnification. The device shall be rejected if there is breakage, loosening or relative motion between the lead or termination and the device body. 2.1.1.2 Bending This test shall be in accordance with test Ub. 2.1.1.3 Tor
43、sion See IEC 60749, chapter II, subclauee 1.3. Applied only for cells with pin. 2.1.1.4 Torque See IEC 60749, chapter II, subclause 1.4.2. Applied only for cells with pin. STD-BSI BS EN b17q7-5-ENGL 1778 lb24bb7 0732103 b5b Page 9 EN 61747- b) preconditioning; c) conditions of test: - speed of pull;
44、 - maximum value of pull force; - method of data recording; - minimum value of pull force; - category of separation. d) test results: flexible flat Pull gauge Figure 1 - Example of bond strength - STD-BSI BS EN b1747-5-ENGL 1778 Lb2Libb 0731108 138 -50 3 45t3 403 -35 3 Page 14 EN 61747-6:1998 -30 t
45、3 -10 * 3 -25 3 -5 f 3 -20 t 3 013 -15 3 3 Environmental and endurance teet methods +loot2 +Q5 t 2 +QO t 2 +05 t 2 +80 f 2 The choice of the appropriate tests depends on the type of devices. The relevant specification shall state which tests are applicable. +75+2 +50 2 +70 t 2 +45t2 + - the lower te
46、mperature TA shall be specified in the relevant specification and shall be chosen from the test temperature of table 7; - the higher temperature TB shall be specified in the relevant specification and shall be chosen from the test temperature of table 8; Rapid change of temperature: two-chamber meth
47、od Tableau 8 - High test temperature - the exposure time t, of each of the two temperatures depends upon the thermal capacity of the device. It shall be 3 h, 2 h, 1 h, 30 min or 10 min as specified in the relevant specification. Where no exposure period is prescribed in the relevant specification it
48、 is understood to be 3 h; - the choice of transition time t2 depende on the thermal time constant of the test specimen. The transition time should be: 2 min to 3 min; 20 s to 30 s; less than 10 s; * * u Page 15 EN 61747-51448 - the first cycle comprises the two exposure times ti and the two transiti
49、on times t2 (see figure 2); - the number of cycles shall be 5 or 10, unless otherwise specified in the relevant specification; - initial measurements: an external visual examination; mechanical, electrical and optical tests: as given in the relevant specification; an external visual examination; mechanical, electrical, and optical tests: as specified at the initial measurements and in the relevant specification. - final measurements: A I IB C I Time f 4 4- 5 42- ti I i m IEC 693g8 A = start of first cycle B = end of first cycle and start
