1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS EN 61747-5-2:2011Liquid crystal display devices Part 5-2: Environmental, endurance and mechanical test methods Visual inspection of active matrix colour liquid crystal display
2、 modulesBS EN 61747-5-2:2011 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of EN 61747-5-2:2011. It is identical to IEC 61747-5-2:2011The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represen
3、ted on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. BSI 2011 ISBN 978 0 580 59355 0 ICS 31.120 Compliance with a British Standard cannot confer im
4、munity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 August 2011.Amendments issued since publicationDate T e x t a f f e c t e dBS EN 61747-5-2:2011EUROPEAN STANDARD EN 61747-5-2 NORME EUROPENNE EUROPISCHE NORM Aug
5、ust 2011 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means rese
6、rved worldwide for CENELEC members. Ref. No. EN 61747-5-2:2011 E ICS 31.120 English version Liquid crystal display devices - Part 5-2: Environmental, endurance and mechanical test methods - Visual inspection of active matrix colour liquid crystal display modules (IEC 61747-5-2:2011) Dispositifs daff
7、ichage cristaux liquides - Partie 5-2: Mthodes dessais denvironnement, dendurance et mcaniques - Inspection visuelle des modules daffichage cristaux liquides couleurs matrice active (CEI 61747-5-2:2011) Flssigkristall-Anzeige-Bauelemente - Teil 5-2: Umwelt-, Lebensdauer- und mechanische Prfverfahren
8、 - Sichtprfung von Flssigkristall-Anzeigemodulen mit Aktiv-Matrix Adressierung (Aktiv-Matrix LCDs) (IEC 61747-5-2:2011) This European Standard was approved by CENELEC on 2011-07-21. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for givin
9、g this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official ve
10、rsions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees
11、of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the U
12、nited Kingdom. BS EN 61747-5-2:2011EN 61747-5-2:2011 - 2 - Foreword The text of document 110/287/FDIS, future edition 1 of IEC 61747-5-2, prepared by IEC TC 110, Flat panel display devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61747-5-2 on 2011-07-21. Atte
13、ntion is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be implemented at national
14、 level by publication of an identical national standard or by endorsement (dop) 2012-04-21 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2014-07-21 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 617
15、47-5-2:2011 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 61747-6:2004 NOTE Harmonized as EN 61747-6:2004 (not modified). ISO 13406-2:2001 NOTE Harmonized as EN
16、 ISO 13406-2:2001 (not modified). _ BS EN 61747-5-2:2011- 3 - EN 61747-5-2:2011 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated
17、references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Tit
18、le EN/HD Year IEC 61747-1 + A1 1998 2003 Liquid crystal and solid-state display devices - Part 1: Generic specification EN 61747-1 + A1 1999 2003 IEC 61747-5 1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods EN 61747-5 1998 2 61747-5-2
19、 IEC:2011 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Visual inspection method and criteria . 12 4.1 Standard inspection conditions 12 4.1.1 Ambient conditions 12 4.1.2 Visual inspection conditions . 12 4.1.3 Electrical driving conditio
20、ns . 12 4.2 Standard inspection method 12 4.2.1 Setup of inspection equipment and liquid crystal display modules 12 4.2.2 Inspector and limit sample for visual inspection . 13 4.2.3 Inspection and record of result 13 4.3 Criteria 13 4.3.1 Bright subpixel defects 13 4.3.2 Dark subpixel defects 13 4.3
21、.3 Intermediate subpixel defects 13 4.3.4 Cluster subpixel defects 13 4.3.5 Bright line defect . 13 4.3.6 Dark line defect . 13 4.3.7 Scratch and dent defect . 14 4.3.8 Foreign material and bubble defect 14 4.3.9 Light leakage defect 14 Bibliography 15 Figure 1 Classification of defect by visual ins
22、pection 7 Figure 2 Example of bright subpixel and adjacent subpixel defects in case of RGB primary colour display . 8 Figure 3 Example of dark subpixel and adjacent subpixel defects in case of RGB primary colour display . 9 Figure 4 Examples of minimum distance between subpixel defects 10 Figure 5 E
23、xample of light leakage between top case and outer black matrix 11 Figure 6 Shape of scratch and dent defect . 14 Figure 7 Shape of foreign material and bubble defect 14 Table 1 Criteria of scratch and dent defects . 14 Table 2 Criteria for foreign material and bubble defect . 14 61747-5-2 IEC:2011
24、3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ LIQUID CRYSTAL DISPLAY DEVICES Part 5-2: Environmental, endurance and mechanical test methods Visual inspection of active matrix colour liquid crystal display modules FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organiza
25、tion for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC
26、 publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
27、 may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agr
28、eement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC
29、 Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are use
30、d or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the co
31、rresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible f
32、or any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees
33、and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8)
34、 Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent righ
35、ts. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61747-5-2 has been prepared by IEC technical committee 110: Flat panel display devices. The text of this standard is based on the following documents: FDIS Report on voting 110/287/FDIS 11
36、0/306/RVD Full information on the voting for the approval on this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 61747-5-2 IEC:2011 A list of all parts of the IEC 61747 series, under t
37、he general title Liquid crystal display devices, can be found on the IEC website. Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents
38、of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colou
39、r inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 61747-5-2 IEC:2011 5 INTRODUCTION IEC 61747-5-2 facilitates subje
40、ctive visual inspection of image defects of LCD modules by the human eye. Visual inspection is performed under specified conditions and criteria, and the objective measurement method of visual image defect by instrument will be studied and standardized. 6 61747-5-2 IEC:2011 LIQUID CRYSTAL DISPLAY DE
41、VICES Part 5-2: Environmental, endurance and mechanical test methods Visual inspection of active matrix colour liquid crystal display modules 1 Scope This part of IEC 61747 gives the details of the quality assessment procedures and provides general rules for visual inspection of the active area of t
42、ransmissive type active matrix colour liquid crystal display modules by the human eye. Furthermore, this standard includes defect definitions and the method for visual defect inspection. NOTE 1 Mura is excluded from this standard because it was not clearly specified at the time this standard was dev
43、eloped. NOTE 2 Restrictions on defect types, number, and sizes are specified in the quality contract (customer acceptance specification and incoming inspection specification) between panel and set makers. 2 Normative references The following referenced documents are indispensable for the application
44、 of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61747-1:2003, Liquid crystal and solid-state display devices Part 1: Generic specification IEC 61747-5:1998, Liquid c
45、rystal and solid-state display devices Part 5: Environmental, endurance and mechanical test methods 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 61747-1, as well as the following, apply. 3.1 visual inspection method by human eye for checking displ
46、ay defects that are difficult to objectively measure and characterize with an instrument NOTE The limitation on display defects depends on supplier and customer. Therefore a limit sample, with well defined observation and operational conditions, can be used as a reference for the defect level. 3.2 d
47、efect defined as any observable abnormal phenomena appearing in the active display area NOTE It includes all kinds of defects such as one / more subpixel (dot) defect, line defect, scratch, foreign material and stain with unclear boundary larger than a pixel. Figure 1 shows a classification of defec
48、ts into two categories. The first category is classified as defects with a clear boundary, and the second category is classified as defects with an 61747-5-2 IEC:2011 7 unclear boundary. The latter category is not yet well defined, and hence difficult to evaluate. For this reason, defects in the sec
49、ond category are excluded from this standard. Figure 1 Classification of defect by visual inspection 3.2.1 subpixel defect defect in the smallest pixel element when it appears in a different than the intended state, for instance bright subpixels appear on the dark pattern, and dark subpixels appear on a bright pattern 3.2.1.1 bright subpixel defects defects which appear bright on the screen when a dark pattern is displayed Figure 2a) shows a single su
