EN 61967-4-2002 en Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz Part 4 Measurement of conducted emissions - 1 ohm 150 ohm direct coupling method .pdf
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1、BRITISH STANDARDBS EN 61967-4:2002Incorporating amendment no. 1Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions 1 ohm/150 ohm direct coupling methodICS 31.200g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g
2、40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 61967-4:2002This British Standard, having been prepared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the a
3、uthority of the Standards Policy and Strategy Committee on 19 August 2002 BSI 2008ISBN 978 0 580 60803 2National forewordThis British Standard is the UK implementation of EN 61967-4:2002, incorporating amendment A1:2006 and corrigendum December 2006. It is identical with IEC 61967-4:2002, incorporat
4、ing amendment 1:2006. The start and finish of text introduced or altered by amendment is indicated in the text by tags. Tags indicating changes to IEC text carry the number of the IEC amendment. For example, text altered by IEC amendment 1 is indicated by !“.The UK participation in its preparation w
5、as entrusted to Technical Committee EPL/47, Semiconductors. A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Com
6、pliance with a British Standard cannot confer immunity from legal obligations.Amendments issued since publicationAmd. No. Date Comments16328 31 May 2006 See national foreword31 January 2008 Implementation of CENELEC corrigendum December 2006 (addition of references to Annex ZA)EUROPEAN STANDARD EN 6
7、1967-4NORME EUROPENNEEUROPISCHE NORMJune 2002CENELECEuropean Committee for Electrotechnical StandardizationComit Europen de Normalisation ElectrotechniqueEuropisches Komitee fr Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitati
8、on in any form and by any means reserved worldwide for CENELEC members.ICS 31.200 Incorporating corrigendum December 2006English versionIntegrated circuits -Measurement of electromagnetic emissions, 150 kHz to 1 GHzPart 4: Measurement of conducted emissions -1 ohm/150 ohm direct coupling method(IEC
9、61967-4:2002)Circuits intgrs -Mesure des missions lectromagntiques,150 kHz 1 GHzPartie 4: Mesure des missions conduites -Mthode par couplage direct1 ohm/150 ohm(CEI 61967-4:2002 + A1:2006)Integrierte Schaltungen -Messung von elektromagnetischenAussendungen im Frequenzbereichvon 150 kHz bis 1 GHzTeil
10、 4: Messung der leitungsgefhrtenAussendungen -Messung mit direkter1 Ohm/150 Ohm-Kopplung(IEC 61967-4:2002 + A1:2006)Up-to-date lists and bibliographical references concerning such national standards may be obtained onapplication to the Central Secretariat or to any CENELEC member.This European Stand
11、ard exists in three official versions (English, French, German). A version in any otherlanguage made by translation under the responsibility of a CENELEC member into its own language andnotified to the Central Secretariat has the same status as the official versions.+A1February 2006This European Sta
12、ndard was approved by CENELEC on 2002-06-01. comply with the CEN/CENELEC Internal Standard the status of a national standard without any alteration.CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany
13、, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Ref. No. EN 61967-4:2002 ECENELEC members are bound to Regulations which stipulate the conditio
14、ns for giving this European ForewordThe text of document 47A/636/FDIS, future edition 1 of IEC 61967-4, prepared by SC 47A, Integratedcircuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote andwas approved by CENELEC as EN 61967-4 on 2002-06-01.The following dat
15、es were fixed: latest date by which the EN has to be implementedat national level by publication of an identicalnational standard or by endorsement (dop) 2003-03-01 latest date by which the national standards conflictingwith the EN have to be withdrawn (dow) 2005-06-01Annexes designated “normative“
16、are part of the body of the standard.Annexes designated “informative“ are given for information only.In this standard, annexes A and ZA are normative and annexes B, C, D and E are informative.Annex ZA has been added by CENELEC._Endorsement noticeThe text of the International Standard IEC 61967-4:200
17、2 was approved by CENELEC as a EuropeanStandard without any modification._Page 2EN 619674:2002Foreword to amendment A1The text of document 47A/735/FDIS, future amendment 1 to IEC 61967-4:2002, prepared by SC 47A, Integrated circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENE
18、LEC parallel vote and was approved by CENELEC as amendment A1 to EN 61967-4:2002 on 2006-02-01. The following dates were fixed: latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2006-11-01 latest date b
19、y which the national standards conflicting with the amendment have to be withdrawn (dow) 2009-02-01 This European Standard makes reference to International Standards. Where the International Standard referred to has been endorsed as a European Standard or a home-grown European Standard exists, this
20、European Standard shall be applied instead. Pertinent information can be found on the CENELEC web site. _ Endorsement notice The text of amendment 1:2006 to the International Standard IEC 61967-4:2002 was approved by CENELEC as an amendment to the European Standard without any modification. _ CONTEN
21、TSPage 3EN 619674:20021 Scope 6 2 Normative references .6 3 Definitions6 4 General7 4.1 Measurement basics7 4.2 RF current measurement .9 4.3 RF voltage measurement at IC pins .9 4.4 Assessment of the measurement technique .9 5 Test conditions.10 6 Test equipment 10 6.1 Test receiver specification .
22、10 6.2 RF current probe specification .10 6.3 Test of the RF current probe capability 11 6.4 Matching network specification 11 7 Test set-up.11 7.1 General test configuration11 7.2 Printed circuit test board layout .12 8 Test procedure.13 9 Test report .13 Annex A (normative) Probe calibration proce
23、dure.14 Annex B (informative) Classification of conducted emission levels17 B.1 Introductory remark .17 B.2 General.17 B.3 Definition of emission levels 17 B.4 Presentation of results.18 Annex C (informative) Example of reference levels for automotive applications.21 C.1 Introductory remark .21 C.2
24、General.21 C.3 Reference levels .21 Annex D (informative) EMC requirements and how to use EMC IC measurement techniques.23 D.1 Introduction .23 D.2 Using EMC measurement procedures 23 D.3 Assessment of the IC influence to the EMC behaviour of the modules 24 Annex E (informative) Example of a test se
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