1、BRITISH STANDARD BS EN 61967-5:2003 Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method The European Standard EN 61967-5:2003 has the status of a British Standard ICS 31.200 BS EN 61967-5:2003 This Br
2、itish Standard was published under the authority of the Standards Policy and Strategy Committee on 17 June 2003 BSI 17 June 2003 ISBN 0 580 42058 2 National foreword This British Standard is the official English language version of EN 61967-5:2003. It is identical with IEC 61967-5:2003. The UK parti
3、cipation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international or Europea
4、n publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all
5、the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on
6、the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 24, an inside back cove
7、r and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 61967-5 NORME EUROPENNE EUROPISCHE NORM April 2003 CENELEC European Committee for Electrotechnical Standar
8、dization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61967-5:2003
9、 E ICS 31.200 English version Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method (IEC 61967-5:2003) Circuits intgrs - Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 5: Mesure des missions
10、 conduites - Mthode de la cage de Faraday sur banc de travail (CEI 61967-5:2003) Integrierte Schaltungen Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz Teil 5: Messung der leitungsgefhrten Aussendungen Verfahren mit Faradayschem Kfig fr Messtische (IEC 61967-5:
11、2003) This European Standard was approved by CENELEC on 2003-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliograp
12、hical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of
13、a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
14、Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. EN 61967-5:2003 - 2 - Foreword The text of document 47A/661/FDIS, future edition 1 of IEC 61967-5, prepared by SC 47A, Integrated circuits, of IEC TC 47, Semiconductor devices, was submitted to
15、 the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61967-5 on 2003-04-01. This part of EN 61967 is to be read in conjunction with EN 61967-1:2002. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national
16、 standard or by endorsement (dop) 2004-01-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2006-04-01 Annexes designated “normative“ are part of the body of the standard. Annexes designated “informative“ are given for information only. In this standar
17、d, annexes A and ZA are normative and annexes B, C and D are informative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 61967-5:2003 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliograph
18、y, the following notes have to be added for the standards indicated: IEC 61967-4 NOTE Harmonized as EN 61967-4:2002 (not modified). IEC 61967-6 NOTE Harmonized as EN 61967-6:2002 (not modified). _ Page2 EN619675:2003 CONTENTS INTRODUCTION.5 1 Scope.6 2 Normative references6 3 Definitions6 4 General6
19、 4.1 Measurement philosophy .7 4.2 Principle set-up8 4.3 Workbench concept.8 5 Test conditions .8 6 Test equipment.9 7 Test set-up.9 7.1 Shielding and ambient fields 9 7.2 Workbench set-up.10 7.3 Connections to the PCB.10 7.4 Common-mode points10 7.4.1 Comparison testing10 7.4.2 Definitive applicati
20、on11 7.5 Emission limits 11 7.6 Workbench Practical implementation 11 7.7 Test PCB.12 8 Test procedure.12 9 Test report12 9.1 Emission criteria12 9.2 Emission levels13 Annex A (normative) Detail specification of Workbench Faraday Cage (WBFC) 14 Annex B (informative) Common-mode impedances.19 Annex C
21、 (informative) Derivation of limits .20 Annex D (informative) Use of the Workbench .21 Annex ZA (normative) Normative references to international publications with their corresponding European publications 23 Bibliography24 Figure 1 Coupling/decoupling network (CDN) measurement method as indicated i
22、n IEC 61000-4-6.8 Figure 2 Set-up for emission testing using the Workbench Faraday Cage (WBFC) 9 Figure 3 Selection of common-mode test points10 Figure A.1 Mechanical drawing of Workbench Faraday Cage15 Figure A.2 Mechanical drawing of Workbench Cover16 Figure A.3 Low-pass feed-through filter 16 Fig
23、ure A.4 Construction of the 150- network (example) 17 Page3 EN619675:2003 Figure A.5 Example of the measured impedance of the 150- network .17 Figure A.6 Set-up for the 150- network calibration18 Figure C.1 Class B emission limit (dBV/m) adapted to the Workbench (dBV).20 Figure D.1 WBFC lumped eleme
24、nts model .21 Table B.1 Statistical values of radiation resistances measured on long cables 19 Table B.2 CDN common-mode impedance parameters .19 Page4 EN619675:2003 INTRODUCTION IEC 61967-1 provides general information and definitions on measurement of conducted and radiated electromagnetic emissio
25、ns from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Page5 EN619675:2003 INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 kHz TO 1 GHz Part 5: Measurement of c
26、onducted emissions Workbench Faraday Cage method 1 Scope This part of IEC 61967 describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on the standardised test-board or on a final printed circuit board (PCB). Furthermore, this standard defines meas
27、ures to maintain uniform requirements, describes the measurement method and gives guidance for the Workbench Faraday Cage measurement method. As the measurements take place on a table with the usage of a small Faraday cage, this method is called the Workbench Faraday Cage method or the Workbench met
28、hod. The method has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the editi
29、on cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050(131):2002, International Electrotechnical Vocabulary (IEV) Part 131: Circuit theory IEC 60050(161):1990, International Electrotechnical Vocabulary (IEV) Chapter 161:
30、Electromagnetic compatibility IEC 61967-1:2002, Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 1: General conditions and definitions IEC 61000-4-6:1996, Electromagnetic compatibility (EMC) Part 4-6: Testing and measure- ment techniques Immunity to conducted distu
31、rbances, induced by radio-frequency fields 3 Definitions For the purposes of this document, the definitions in IEC 61967-1, IEC 60050(131) and IEC 60050(161) apply. 4 General This part of IEC 61967 applies to integrated circuits (ICs) which can perform “stand-alone” functions when applied on a physi
32、cally small printed circuit board (PCB). Page6 EN619675:2003 The RF emission from these ICs can be measured under pre-defined conditions. In addition, the method allows measurements on PCBs that are equal to or closely related to realistic applications. This gives the user an indication of the expec
33、ted emission once the IC(s) is used in an application. This method makes it possible to classify ICs for dedicated functions where EMC constraints are applicable. 4.1 Measurement philosophy The Workbench method is derived from IEC 61000-4-6; see Figure 1. The method described in IEC 61000-4-6 assume
34、s that supply and signal cable(s) are attached to an electrically small PCB, with dimensions /2, i.e. 0,15 m at 1 GHz. The connected cables become the dominant antennas, so RF emission takes place via these “antennas”. The connected cables will have functions such as supply, communication and other
35、signal interfaces and these cables are commonly not geometrically oriented in the same plane as the other cables. The antennas (common-mode) impedance per port has been normalised to 150 with tolerances in the various frequency bands, see Annex B. By measuring either the voltage across or the curren
36、t through these common-mode impedances, the RF emission is characterised. Direct radiation from the IC package can be small see also IEC 61967-2 as an additional measurement method and often negligible compared to the radiation caused by the cable(s) connected to the IC in its application. Because t
37、he supply and signal currents will flow through the reference layer(s) of the PCB, indirect coupling between the voltages and currents through the IC package and PCB are also established. Because of the concept chosen, the Workbench method shows the effect of the PCB layout, the IC supply decoupling
38、, the RF performance of the used discrete components (capacitors, inductors) as well as the measures taken on the IC (e.g. on-chip decoupling, slope controlled output buffers, etc.). In addition, similar modes of operation (by software or function) shall be used between the various ICs to be tested
39、to allow comparison. Additionally, various modes of operation with one IC allow comparison, i.e. determination of contribution of individual blocks within the IC. Page7 EN619675:2003 Coupling/ decoupling network Equipment under test (EUT) Auxillary equipment Non-metal support Reference plane EMI rec
40、eiver/analyser 50 termination resistor Measuring height Coupling/ decoupling network IEC 288/03Emission: EMI receiver connected to one of the coupling/decoupling networks (CDNs). NOTE All other CDNs need to be terminated with 50 . Figure 1 Coupling/decoupling network (CDN) measurement method as indi
41、cated in IEC 61000-4-6 4.2 Principle set-up The measurements take place above a metallic reference plane. With common-mode impedances defined, relations between measured voltage (current) and the RF emission and, in case of RF immunity testing, between local E/H fields and the applied disturbance vo
42、ltage can be approximated. 4.3 Workbench concept With this Workbench method, a small Faraday cage is used. In principle, coupling and decoupling is similar to the method given in IEC 61000-4-6, but implemented by discrete resistors, connected to the several common-mode ports of the PCB, i.e. test bo
43、ard. The decoupling of supply and/or other I/O lines takes place via inductances built on ferrite cores, representing impedances 150 at the frequencies of interest, and feed-through filters installed through the wall of the cage. The Workbench basic set-up is shown in Figure 2. NOTE The decoupling i
44、mpedance requirements, 150 , only have to be met at the frequency range of interest, when restricted. 5 Test conditions The test conditions shall be as described in IEC 61967-1. No special conditions apply, other than those mentioned in this clause. The Workbench method can be used for either absolu
45、te or comparative testing of ICs, either on the pre-defined, standardised, test board, as well as for the measurement of definitive applications including ICs. When measurements are carried out using a test board other than defined in IEC 61967-1, that PCB shall be described in such a way that repet
46、ition of the measurement remains possible. When necessary, a copy of the layout and circuit diagram shall be added to the test report. Page8 EN619675:2003 6 Test equipment The test equipment shall meet the requirements as described in IEC 61967-1. The preferred physical sizes of the Workbench shall
47、be as described in this standard, see Annex A. 7 Test set-up The test board set-up shall conform to IEC 61967-1. Workbench Faraday Cage (WBFC) F Ferrite Ferrite Input Output Supply F Ferrite PCB under test (EUT) 50 *) *) shall be interchanged at each port Supply source Signal source DC EMI receiver
48、or spectrum analyzer*) Auxiliary load 50 *) 100 100 100 FF IEC 289/03Figure 2 Set-up for emission testing using the Workbench Faraday Cage (WBFC) 7.1 Shielding and ambient fields The Workbench Faraday Cage is a shielded set-up, see Figure 2. As such, no additional shielding will be necessary. The re
49、quired shielding effectiveness of the Workbench Faraday Cage is 40 dB, over a range of 10 MHz to 1 GHz 5 1which is considered to be sufficient to cover for the whole frequency range. NOTE 1 The size of the Workbench Faraday Cage makes it unpractical to carry out magnetic shielding measurements at frequencies below 10 MHz in relation to the size of the ant
