EN 61967-8-2011 en Integrated circuits - Measurement of electromagnetic emissions - Part 8 Measurement of radiated emissions - IC stripline method《集成电路 电磁辐射的测量 第8部分 辐射发射的测量 IC带状线法》.pdf
《EN 61967-8-2011 en Integrated circuits - Measurement of electromagnetic emissions - Part 8 Measurement of radiated emissions - IC stripline method《集成电路 电磁辐射的测量 第8部分 辐射发射的测量 IC带状线法》.pdf》由会员分享,可在线阅读,更多相关《EN 61967-8-2011 en Integrated circuits - Measurement of electromagnetic emissions - Part 8 Measurement of radiated emissions - IC stripline method《集成电路 电磁辐射的测量 第8部分 辐射发射的测量 IC带状线法》.pdf(22页珍藏版)》请在麦多课文档分享上搜索。
1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationIntegrated circuits Measurement of electromagnetic emissionsPart 8: Measurement of radiated emissions IC stripline methodBS EN 61967-8:2011National forewordThis British Standard
2、is the UK implementation of EN 61967-8:2011. It isidentical to IEC 61967-8:2011.The UK participation in its preparation was entrusted to Technical CommitteeEPL/47, Semiconductors.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does no
3、t purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2011ISBN 978 0 580 64867 0ICS 31.200Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of the St
4、andardsPolicy and Strategy Committee on 30 November 2011.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 61967-8:2011EUROPEAN STANDARD EN 61967-8 NORME EUROPENNE EUROPISCHE NORM October 2011 CENELEC European Committee for Electrotechnical Standardization Comit Eur
5、open de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61967-8:2011 E ICS 31.200 English
6、version Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011) Circuits intgrs - Mesure des missions lectromagntiques - Partie 8: Mesure des missions rayonnes - Mthode de la ligne TEM plaques (stripline) pou
7、r CI (CEI 61967-8:2011) Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen - Teil 8: Messung der abgestrahlten Aussendungen - IC-Streifenleiterverfahren (IEC 61967-8:2011) This European Standard was approved by CENELEC on 2011-09-15. CENELEC members are bound to comply with the C
8、EN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management C
9、entre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same st
10、atus as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands,
11、 Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 61967-8:2011EN 61967-8:2011 - 2 - Foreword The text of document 47A/868/FDIS, future edition 1 of IEC 61967-8, prepared by SC 47A, “Integrated circuits“, of IEC TC 47, “Semiconductor devi
12、ces“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61967-8:2011. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-06-15 latest date by
13、which the national standards conflicting with the document have to be withdrawn (dow) 2014-09-15 This standard is to be used in conjunction with EN 61967-1. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall
14、not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61967-8:2011 was approved by CENELEC as a European Standard without any modification. BS EN 61967-8:2011- 3 - EN 61967-8:2011 Annex ZA (normative) Normative references
15、 to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (includ
16、ing any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60050-131 - International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory - - IEC 60050-16
17、1 - International Electrotechnical Vocabulary (IEV) - Chapter 161: Electromagnetic compatibility - - IEC 61000-4-20 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides EN 61000-4-20 - IEC
18、 61967-1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions EN 61967-1 - IEC 61967-2 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell
19、and wideband TEM cell method EN 61967-2 - BS EN 61967-8:2011 2 61967-8 IEC:2011 CONTENTS 1 Scope . 5 2 Normative references . 5 3 Terms and definitions . 5 4 General 6 5 Test conditions . 6 5.1 General . 6 5.2 Supply voltage. 6 5.3 Frequency range . 6 6 Test equipment . 7 6.1 General . 7 6.2 RF meas
20、uring instrument 7 6.3 Preamplifier . 7 6.4 IC stripline . 7 6.5 50 termination 7 6.6 System gain 7 7 Test set-up . 8 7.1 General . 8 7.2 Test configuration 8 7.3 EMC test board (PCB) . 8 8 Test procedure . 9 8.1 General . 9 8.2 Ambient conditions 9 8.3 Operational check . 9 8.4 Verification of IC s
21、tripline RF characteristic . 9 8.5 Test technique. 9 9 Test report 10 9.1 General . 10 9.2 Measurement conditions 10 10 IC Emissions reference levels. 10 Annex A (normative) IC stripline description. 11 Annex B (informative) Specification of emission levels . 15 Bibliography 17 Figure 1 IC stripline
22、 test set-up 8 Figure A.1 Cross section view of an example of an unshielded IC stripline . 11 Figure A.2 Cross section view of an example of an IC stripline with housing 12 Figure A.3 Example of IC stripline with housing . 14 Figure B.1 Emission characterization levels . 16 Table A.1 Maximum DUT dim
23、ensions for 6,7 mm IC stripline open version 12 Table A.2 Maximum DUT dimensions for 6,7 mm IC stripline closed version 12 BS EN 61967-8:201161967-8 IEC:2011 5 INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS Part 8: Measurement of radiated emissions IC stripline method 1 Scope The measu
24、rement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conduct
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