1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI British StandardsWB9423_BSI_StandardColCov_noK_AW:BSI FRONT COVERS 5/9/08 12:55 Page 1Digital addressable lighting interface Part 102: General requirements Control gearBS EN 62386-102:2009National fo
2、rewordThis British Standard is the UK implementation of EN 62386-102:2009. It isidentical to IEC 62386-102:2009. Together with BS EN 62386-101:2009 andBS EN 62386-201:2009, it partially supersedes BS EN 60929:2006 whichremains current.The UK participation in its preparation was entrusted by Technica
3、l CommitteeCPL/34, Lamps and related equipment, to Subcommittee CPL/34/3, Auxiliariesfor lamps.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsibl
4、e for its correct application. BSI 2009ISBN 978 0 580 57535 8ICS 29.140.50; 29.140.99Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 31 October 2009Amendments issu
5、ed since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 62386-102:2009EUROPEAN STANDARD EN 62386-102 NORME EUROPENNE EUROPISCHE NORM August 2009 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektro
6、technische Normung Central Secretariat: Avenue Marnix 17, B - 1000 Brussels 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62386-102:2009 E ICS 29.140.50; 29.140.99 Partially supersedes EN 60929:2006English version Digital a
7、ddressable lighting interface - Part 102: General requirements - Control gear (IEC 62386-102:2009) Interface dclairage adressable numrique - Partie 102: Exigences gnrales - Appareillages de commande (CEI 62386-102:2009) Digital adressierbare Schnittstelle fr die Beleuchtung - Teil 102: Allgemeine An
8、forderungen - Betriebsgerte (IEC 62386-102:2009) This European Standard was approved by CENELEC on 2009-07-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any
9、alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made
10、by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Est
11、onia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 62386-102:2009EN 62386-102:2009 - 2 - Foreword The text of
12、document 34C/874/FDIS, future edition 1 of IEC 62386-102, prepared by SC 34C, Auxiliaries for lamps, of IEC TC 34, Lamps and related equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62386-102 on 2009-07-01. EN 62386-102:2009, together with EN 62386-101 and
13、EN 62386-201, replaces Clause E.4, “Control by digital signals”, and Annex G, “Test procedures for ballasts with digital control interface according to Clause E.4“ of EN 60929:2006. This Part 102 is intended to be used in conjunction with Part 101, which contains general requirements for the relevan
14、t product type (system), and with the appropriate part 2XX (particular requirements for control gear) containing clauses to supplement or modify the corresponding clauses in Parts 101 and 102 in order to provide the relevant requirements for each type of product. The following dates were fixed: late
15、st date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2010-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2012-07-01 Annex ZA has been added by CENELEC. _ Endorsem
16、ent notice The text of the International Standard IEC 62386-102:2009 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60598-1 NOTE Harmonized as EN 60598-1:2008 (m
17、odified). IEC 60669-2-1 NOTE Harmonized as EN 60669-2-1:2004 (modified). IEC 60921 NOTE Harmonized as EN 60921:2004 (not modified). IEC 60923 NOTE Harmonized as EN 60923:2005 (not modified). IEC 60925 NOTE Harmonized as EN 60925:1991 (not modified). IEC 61347-1 NOTE Harmonized as EN 61347-1:2007 (mo
18、dified). IEC 61547 NOTE Harmonized as EN 61547:2009 (not modified). CISPR 15 NOTE Harmonized as EN 55015:2006 (not modified). _ BS EN 62386-102:2009- 3 - EN 62386-102:2009 Annex ZA (normative) Normative references to international publications with their corresponding European publications The follo
19、wing referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified b
20、y common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60929 2006 AC-supplied electronic ballasts for tubular fluorescent lamps - Performance requirements EN 60929 + corr. December 2006 2006 IEC 61347-2-3 -1)Lamp controlgear - Part 2-3: Particul
21、ar requirements for a.c. supplied electronic ballasts for fluorescent lamps EN 61347-2-3 + corr. July 20012)2003 IEC 62386-101 2009 Digital addressable lighting interface - Part 101: General requirements - System EN 62386-101 2009 1)Undated reference. 2)Valid edition at date of issue. BS EN 62386-10
22、2:2009 2 62386-102 IEC:2009 CONTENTS FOREWORD.7 INTRODUCTION.9 1 Scope.10 2 Normative references .10 3 Terms and definitions .10 4 General 12 5 Electrical specification12 6 Interface power supply .12 7 Transmission protocol structure12 7.1 General .12 7.2 Forward frame.12 7.2.1 Address byte YAAA AAA
23、S .12 7.2.2 Data byte XXXX XXXX.13 7.3 Backward frame 13 8 Timing 13 8.1 Information bit timing.13 8.2 Forward frame timing 14 8.3 Backward frame timing 15 8.4 Frame sequence timing .15 9 Method of operation .16 9.1 Logarithmic dimming curve, arc power levels and accuracy .16 9.2 Power-on.19 9.3 Int
24、erface-failure.19 9.4 Min and max level .19 9.5 Fade time and fade rate 20 9.6 Reaction to commands during error state 20 9.7 Behaviour during lamp preheating and lamp ignition time 21 9.8 Memory access and memory map .21 9.8.1 Memory access commands21 9.8.2 Memory map21 10 Declaration of variables2
25、4 11 Definition of commands 25 11.1 Arc power control commands.25 11.1.1 Direct arc power control command:25 11.1.2 Indirect arc power control commands 26 11.2 Configuration commands:28 11.2.1 General configuration commands: .28 11.2.2 Arc power parameters settings: .28 11.2.3 System parameters sett
26、ings 30 11.3 Query commands 30 11.3.1 Queries related to status information .30 11.3.2 Queries related to arc power parameter settings32 11.3.3 Queries related to system parameter settings 32 11.3.4 Application extended commands .33 11.4 Special Commands .33 BS EN 62386-102:200962386-102 IEC:2009 3
27、11.4.1 Terminate special processes .33 11.4.2 Download information to the DTR 34 11.4.3 Addressing commands 34 11.4.4 Extended special commands .35 11.5 Summary of the command set .38 12 Test procedures .40 12.0 General .40 12.1 Test sequences Physical operational parameters.44 12.1.1 Test sequences
28、 Waveform.44 12.1.2 Test sequence Frame structure timing .53 12.1.3 Insulation test54 12.1.4 Optional test sequences 54 12.1.5 Test sequence Response time .56 12.2 Test sequences Configuration commands 57 12.2.1 Test sequences General configuration commands57 12.2.2 Test sequences Arc power paramete
29、r settings .70 12.2.3 Test sequences System parameter settings .80 12.2.4 Test sequences Memory Access 84 12.3 Test sequences Arc power control commands88 12.3.1 Test sequences Timing 88 12.3.2 Test sequences Dimming curve90 12.3.3 Test sequences Arc power commands .95 12.4 Test sequence Physical ad
30、dress allocation 105 12.5 Test sequences Random address allocation 106 12.5.1 Test sequences INITIALISE / TERMINATE.106 12.5.2 Test sequences RANDOMISE 112 12.5.3 Test sequences COMPARE / WITHDRAW .115 12.5.4 Test sequences PROGRAM / VERIFY / QUERY SHORT ADDRESS 118 12.6 Test sequences Queries and r
31、eserved commands .124 12.6.1 Test sequences Queries 124 12.6.2 Test sequences Reserved commands 131 Annex A (informative) Examples of algorithms .136 Annex B (normative) List of device types .138 Bibliography139 Figure 1 Bi-phase coded “1“.14 Figure 2 Symbols for bi-phase levels: “1”;”0”14 Figure 3
32、Forward frame14 Figure 4 Forward frame timing .15 Figure 5 Backward frame .15 Figure 6 Backward frame timing.15 Figure 7 Example of frame sequence timing.16 Figure 8 Transition from forward to backward frames.16 Figure 9 Transition from backward to forward and from forward to forward frames .16 Figu
33、re 10 The logarithmic dimming curve with a minimum arc power of 0,1 %17 Figure 11 Configuration commands timing .28 Figure 12 General test structure.40 BS EN 62386-102:2009 4 62386-102 IEC:2009 Figure 13 Activation state and test state 41 Figure 14 Test sequence Current rating45 Figure 15 Test seque
34、nce Voltage rating .46 Figure 16 Test sequence Back channel rise time / fall time.47 Figure 17 Test sequence Transmission rate .48 Figure 18 Test sequence Pulse width .50 Figure 19 Code violation.51 Figure 20 Waveforms for test Code violation: .52 Figure 21 Test sequence Frame structure timing 53 Fi
35、gure 22 Test sequence Polarity .54 Figure 23 Test sequence Overvoltage protection55 Figure 24 Test sequence Response time56 Figure 25 Test sequence RESET57 Figure 26 Test sequence RESET: timeout / command in-between 59 Figure 27 Test sequence 100 ms-timeout .60 Figure 28 Test sequence Commands in-be
36、tween62 Figure 29 Test sequence QUERY VERSION NUMBER.64 Figure 30 Test sequence STORE ACTUAL LEVEL IN THE DTR .65 Figure 31 Test sequence Persistent memory 66 Figure 32 Test sequence DTR1 68 Figure 33 Test sequence DTR2 69 Figure 34 Test sequence STORE THE DTR AS MAX LEVEL 70 Figure 35 Test sequence
37、 STORE THE DTR AS MIN LEVEL .71 Figure 36 Test sequence STORE THE DTR AS SYSTEM FAILURE LEVEL73 Figure 37 Test sequence STORE THE DTR AS POWER ON LEVEL 75 Figure 38 Test sequence STORE THE DTR AS FADE TIME.77 Figure 39 Test sequence STORE THE DTR AS FADE RATE78 Figure 40 Test sequence STORE THE DTR
38、AS SCENE / GO TO SCENE .79 Figure 41 Test sequence REMOVE FROM SCENE.80 Figure 42 Test sequence ADD TO GROUP / REMOVE FROM GROUP .81 Figure 43 Test sequence STORE THE DTR AS SHORT ADDRESS83 Figure 44 Test sequence Memory Bank 0.84 Figure 45 Test sequence Memory Bank 1.85 Figure 46 Test sequence Othe
39、r Memory Banks 86 Figure 47 Test sequence ENABLE WRITE MEMORY .87 Figure 48 Test sequence FADE TIME.88 Figure 49 Test sequence FADE RATE89 Figure 50 Test sequence Logarithmic dimming curve .90 Figure 51 Test sequence Dimming curve: DIRECT ARC POWER CONTROL91 Figure 52 Test sequence Dimming curve: UP
40、 / DOWN .92 Figure 53 Test sequence Dimming curve: STEP UP / STEP DOWN93 Figure 54 Test sequence Dimming curve: DAPC SEQUENCE 94 Figure 55 Test sequence OFF 95 BS EN 62386-102:200962386-102 IEC:2009 5 Figure 56 Test sequence DIRECT ARC POWER CONTROL.96 Figure 57 Test sequence UP 97 Figure 58 Test se
41、quence DOWN 98 Figure 59 Test sequence STEP UP 99 Figure 60 Test sequence STEP DOWN 100 Figure 61 Test sequence RECALL MAX LEVEL101 Figure 62 Test sequence RECALL MIN LEVEL.102 Figure 63 Test sequence ON AND STEP UP 103 Figure 64 Test sequence STEP DOWN AND OFF 104 Figure 65 Test sequence Physical a
42、ddress allocation.105 Figure 66 Test sequence INITIALISE: 15 minutes timer106 Figure 67 Test sequence TERMINATE .107 Figure 68 Test sequence INITIALISE: short address.108 Figure 69 Test sequence INITIALISE: no short address109 Figure 70 Test sequence INITIALISE: 100 ms timeout110 Figure 71 Test sequ
43、ence INITIALISE: command in-between.111 Figure 72 Test sequence RANDOMISE: reset values112 Figure 73 Test sequence RANDOMISE: 100 ms timeout.113 Figure 74 Test sequence RANDOMISE: command in-between .114 Figure 75 Test sequence COMPARE115 Figure 76 Test sequence WITHDRAW117 Figure 77 Test sequence P
44、ROGRAM SHORT ADDRESS .119 Figure 78 Test sequence VERIFY SHORT ADDRESS 120 Figure 79 Test sequence QUERY SHORT ADDRESS.122 Figure 80 Test sequence SEARCH ADDRESS: reset value 123 Figure 81 Test sequence QUERY DEVICE TYPE .124 Figure 82 Test sequence QUERY LAMP FAILURE .125 Figure 83 Test sequence QU
45、ERY LAMP POWER ON.126 Figure 84 Test sequence QUERY LIMIT ERROR127 Figure 85 Test sequence QUERY POWER FAILURE128 Figure 86 Test sequence QUERY STATUS: control gear ok .129 Figure 87 Test sequence QUERY STATUS: fade running .130 Figure 88 Test sequence RESERVED: standard commands .131 Figure 89 Test
46、 sequence Application extended commands .132 Figure 90 Test sequence RESERVED: special commands 1.133 Figure 91 Test sequence RESERVED: special commands 2.134 Figure 92 Test sequence Not supported device types.135 Table 1 The logarithmic dimming curve with a minimum arc power of 0,1 %.18 Table 2 Fad
47、e times and fade rates.20 Table 3 Memory map of memory bank 0.22 Table 4 Memory map of memory bank 1.23 Table 5 Memory map of other memory banks.24 BS EN 62386-102:2009 6 62386-102 IEC:2009 Table 6 Declaration of variables.25 Table 7 Summary of the command set .38 Table 8 Timing combinations for tes
48、t sequence Pulse width .49 Table 9 Parameters for test sequence RESET58 Table 10 Parameters for test sequence 100 ms-timeout .61 Table 11 Parameters for test sequence Commands in-between63 Table 12 Parameters for test sequence Persistent memory 67 Table 13 Parameters for test sequence DTR1 68 Table 14 Parameters for test sequence DTR2 69 Table 15 Parameters for te
