1、BSI Standards PublicationMethods for product accelerated testingBS EN 62506:2013National forewordThis British Standard is the UK implementation of EN 62506:2013. It is identical to IEC 62506:2013.The UK participation in its preparation was entrusted to TechnicalCommittee DS/1, Dependability.A list o
2、f organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2013.Published by BSI Standards Limite
3、d 2013ISBN 978 0 580 73836 4ICS 03.120.01; 21.020Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 30 September 2013.Amendments/corrigenda issued since publicationDa
4、te Text affectedBRITISH STANDARDBS EN 62506:2013EUROPEAN STANDARD EN 62506 NORME EUROPENNE EUROPISCHE NORM August 2013 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Manageme
5、nt Centre: Avenue Marnix 17, B - 1000 Brussels 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62506:2013 E ICS 03.120.01; 21.020 English version Methods for product accelerated testing (IEC 62506:2013) Mthodes dessais acclrs
6、 de produits (CEI 62506:2013) Verfahren fr beschleunigte Produktprfungen (IEC 62506:2013) This European Standard was approved by CENELEC on 2013-06-21. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the s
7、tatus of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, Fre
8、nch, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria
9、, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
10、Sweden, Switzerland, Turkey and the United Kingdom. BS EN 62506:2013EN 62506:2013 - 2 - Foreword The text of document 56/1503/FDIS, future edition 1 of IEC 62506, prepared by IEC/TC 56 “Dependability“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62506:2013. The follow
11、ing dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2014-03-21 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2016-06-21 Attention
12、 is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62506:2013 was approved by CENELE
13、C as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60812 NOTE Harmonized as EN 60812:2006 IEC 61125:1992 NOTE Harmonized as EN 61125:1993 (not modified). BS EN 62506:2013- 3 - EN 62506:20
14、13 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited
15、applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068 Series Envi
16、ronmental testing - - IEC 60300-3-1 2003 Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology EN 60300-3-1 2004 IEC 60300-3-5 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test pri
17、nciples - - IEC 60605-2 Equipment reliability testing - Part 2: Design of test cycles - - IEC 60721 Series Classification of environmental testing - - IEC 61014 2003 Programmes for reliability growth EN 61014 2003 IEC 61124 + corr. January 2012 2013 Reliability testing - Compliance tests for constan
18、t failure rate and constant failure intensity EN 61124 2012 IEC 61163-2 Reliability stress screening - Part 2: Electronic components - - IEC 61164 2004 Reliability growth - Statistical test and estimation methods EN 61164 2004 IEC 61649 2008 Weibull analysis EN 61649 2008 IEC 61709 2011 Electric com
19、ponents - Reliability - Reference conditions for failure rates and stress models for conversion EN 61709 2011 IEC 61710 Power law model - Goodness-of-fit tests and estimation methods EN 61710 IEC 62303 Radiation protection instrumentation - Equipment for monitoring airborne tritium - - IEC/TR 62380
20、Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment - - IEC 62429 Reliability growth - Stress testing for early failures in unique complex systems EN 62429 BS EN 62506:2013 2 62506 IEC:2013 CONTENTS INTRODUCTION . 7 1 Scope . 8 2 Norma
21、tive references . 8 3 Terms, definitions, symbols and abbreviations 9 3.1 Terms and definitions 9 3.2 Symbols and abbreviated terms . 11 4 General description of the accelerated test methods. 12 4.1 Cumulative damage model 12 4.2 Classification, methods and types of test acceleration . 14 4.2.1 Gene
22、ral . 14 4.2.2 Type A: qualitative accelerated tests . 15 4.2.3 Type B: quantitative accelerated tests . 15 4.2.4 Type C: quantitative time and event compressed tests 16 5 Accelerated test models . 17 5.1 Type A, qualitative accelerated tests . 17 5.1.1 Highly accelerated limit tests (HALT) . 17 5.1
23、.2 Highly accelerated stress test (HAST) . 21 5.1.3 Highly accelerated stress screening/audit (HASS/HASA) . 21 5.1.4 Engineering aspects of HALT and HASS . 22 5.2 Type B and C Quantitative accelerated test methods 23 5.2.1 Purpose of quantitative accelerated testing . 23 5.2.2 Physical basis for the
24、 quantitative accelerated Type B test methods 23 5.2.3 Type C tests, time (C1) and event (C2) compression . 24 5.3 Failure mechanisms and test design 26 5.4 Determination of stress levels, profiles and combinations in use and test stress modelling 27 5.4.1 General . 27 5.4.2 Step-by-step procedure .
25、 27 5.5 Multiple stress acceleration methodology Type B tests . 27 5.6 Single and multiple stress acceleration for Type B tests 30 5.6.1 Single stress acceleration methodology . 30 5.6.2 Stress models with stress varying as a function of time Type B tests 37 5.6.3 Stress models that depend on repeti
26、tion of stress applications Fatigue models 38 5.6.4 Other acceleration models Time and event compression. 40 5.7 Acceleration of quantitative reliability tests 40 5.7.1 Reliability requirements, goals, and use profile 40 5.7.2 Reliability demonstration or life tests . 42 5.7.3 Testing of components
27、for a reliability measure . 47 5.7.4 Reliability measures for components and systems/items 48 5.8 Accelerated reliability compliance or evaluation tests 48 5.9 Accelerated reliability growth testing . 50 5.10 Guidelines for accelerated testing . 50 5.10.1 Accelerated testing for multiple stresses an
28、d the known use profile . 50 5.10.2 Level of accelerated stresses 51 BS EN 62506:201362506 IEC:2013 3 5.10.3 Accelerated reliability and verification tests . 51 6 Accelerated testing strategy in product development 51 6.1 Accelerated testing sampling plan . 51 6.2 General discussion about test stres
29、ses and durations . 52 6.3 Testing components for multiple stresses 53 6.4 Accelerated testing of assemblies . 53 6.5 Accelerated testing of systems 53 6.6 Analysis of test results 53 7 Limitations of accelerated testing methodology . 53 Annex A (informative) Highly accelerated limit test (HALT) 55
30、Annex B (informative) Accelerated reliability compliance and growth test design . 59 Annex C (informative) Comparison between HALT and conventional accelerated testing 74 Annex D (informative) Estimating the activation energy, Ea75 Annex E (informative) Calibrated accelerated life testing (CALT) . 7
31、7 Annex F (informative) Example on how to estimate empirical factors . 79 Annex G (informative) Determination of acceleration factors by testing to failure . 84 Bibliography 87 Figure 1 Probability density functions (PDF) for cumulative damage, degradation, and test types . 13 Figure 2 Relationship
32、of PDFs of the product strength vs. load in use 18 Figure 3 How uncertainty of load and strength affects the test policy . 19 Figure 4 PDFs of operating and destruct limits as a function of applied stress . 20 Figure 5 Line plot for Arrhenius reaction model 34 Figure 6 Plot for determination of the
33、activation energy 35 Figure 7 Multiplier of the test stress duration for demonstration of required reliability for compliance or reliability growth testing 45 Figure 8 Multiplier of the duration of the load application for the desired reliability 46 Figure B.1 Reliability as a function of multiplier
34、 k and for combinations of parameters a and b 61 Figure B.2 Determination of the multiplier k 64 Figure B.3 Determination of the growth rate . 73 Figure D.1 Plotting failures to estimate the activation energy Ea76 Figure F.1 Weibull graphical data analysis . 81 Figure F.2 Scale parameter as a functi
35、on of the temperature range . 82 Figure F.3 Probability of failure as a function of number of cycles T = 50 C 83 Figure G.1 Weibull plot of the three data sets 85 Figure G.2 Scale parameters values fitted with a power line 86 Table 1 Test types mapped to the product development cycle 14 Table A.1 Su
36、mmary of HALT test results for a DC/DC converter 56 Table A.2 Summary of HALT results from a medical system . 57 Table A.3 Summary of HALT results for a Hi-Fi equipment . 58 Table B.1 Environmental stress conditions of an automotive electronic device . 63 BS EN 62506:2013 4 62506 IEC:2013 Table B.2
37、Product use parameters . 67 Table B.3 Assumed product use profile 71 Table B.4 Worksheet for determination of use times to failures 72 Table B.5 Data for reliability growth plotting . 73 Table C.1 Comparison between HALT and conventional accelerated testing 74 Table F.1 Probability of failure of tes
38、t samples A and B . 80 Table F.2 Data transformation for Weibull plotting 80 Table G.1 Voltage test failure data for Weibull distribution . 84 BS EN 62506:201362506 IEC:2013 7 INTRODUCTION Many reliability or failure investigation test methods have been developed and most of them are currently in us
39、e. These methods are used to either determine product reliability or to identify potential product failure modes, and have been considered effective as demonstrations of reliability: fixed duration, sequential probability ratio, reliability growth tests, tests to failure, etc. Such tests, although v
40、ery useful, are usually lengthy, especially when the product reliability that has to be demonstrated was high. The reduction in time-to-market periods as well as competitive product cost, increase the need for efficient and effective accelerated testing. Here, the tests are shortened through the app
41、lication of increased stress levels or by increasing the speed of application of repetitive stresses, thus facilitating a quicker assessment and growth of product reliability through failure mode discovery and mitigation. There are two distinctly different approaches to reliability activities: the f
42、irst approach verifies, through analysis and testing, that there are no potential failure modes in the product that are likely to be activated during the expected life time of the product under the expected operating conditions; the second approach estimates how many failures can be expected after a
43、 given time under the expected operating conditions. Accelerated testing is a method appropriate for both cases, but used quite differently. The first approach is associated with qualitative accelerated testing, where the goal is identification of potential faults that eventually might result in pro
44、duct field failures. The second approach is associated with quantitative accelerated testing where the product reliability may be estimated based on the results of accelerated simulation testing that can be related back to the use of the environment and usage profile. Accelerated testing can be appl
45、ied to multiple levels of items containing hardware or software. Different types of reliability testing, such as fixed duration, sequential test-to-failure, success test, reliability demonstration, or reliability growth/improvement tests can be candidates for accelerated methods. This standard provi
46、des guidance on selected, commonly used accelerated test types. This standard should be used in conjunction with statistical test plan standards such as IEC 61123, IEC 61124, IEC 61649 and IEC 61710. The relative merits of various methods and their individual or combined applicability in evaluating
47、a given system or item, should be reviewed by the product design team (including dependability engineering) prior to selection of a specific test method or a combination of methods. For each method, consideration should also be given to the test time, results produced, credibility of the results, da
48、ta required to perform meaningful analysis, life cycle cost impact, complexity of analysis and other identified factors. BS EN 62506:2013 8 62506 IEC:2013 METHODS FOR PRODUCT ACCELERATED TESTING 1 Scope This International Standard provides guidance on the application of various accelerated test tech
49、niques for measurement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product/item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item dependability, or to achieve necessary reliability/availability improvement, all within a compressed or accelera
