1、Computation of waveform parameter uncertainties (IEC 62754:2017)BS EN 62754:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62754 September 2017 ICS 17.220.20 English Version Computation of waveform Parameter u
2、ncertainties (IEC 62754:2017) Calcul des incertitudes des paramtres des formes donde (IEC 62754:2017) Berechnung der Messunsicherheiten von Schwingungsabbildparametern (IEC 62754:2017) This European Standard was approved by CENELEC on 2017-06-28. CENELEC members are bound to comply with the CEN/CENE
3、LEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre o
4、r to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as
5、 the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Lux
6、embourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische
7、Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62754:2017 E National forewordThis British Standard is the UK implementation of EN 62754:2017. It is ident
8、ical to IEC 62754:2017.The UK participation in its preparation was entrusted to Technical Committee PEL/85, Measuring equipment for electrical and electromagnetic quantities.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not pu
9、rport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 91561 1ICS 17.220.20Compliance with a British Standard cannot confer immunity from legal obliga
10、tions.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 September 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62754:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62754 September 2017
11、ICS 17.220.20 English Version Computation of waveform Parameter uncertainties (IEC 62754:2017) Calcul des incertitudes des paramtres des formes donde (IEC 62754:2017) Berechnung der Messunsicherheiten von Schwingungsabbildparametern (IEC 62754:2017) This European Standard was approved by CENELEC on
12、2017-06-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may
13、be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and not
14、ified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
15、 Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normali
16、sation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62754:2017 E BS EN 62754:2017EN 62754:201
17、7 2 European foreword The text of document 85/585/FDIS, future edition 1 of IEC 62754, prepared by IEC/TC 85 “Measuring equipment for electrical and electromagnetic quantities“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62754:2017. The following dates are fixed: lat
18、est date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-03-28 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-06-28 Attention is drawn to the possibi
19、lity that some of the elements of this document may be the subject of patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62754:2017 was approved by CENELEC as a European Standard without an
20、y modification. In the official version, for Bibliography, the following notes have to be added for the standard indicated : IEC 60359:2001 NOTE Harmonized as EN 60359:2002. BS EN 62754:2017EN 62754:2017 2 European foreword The text of document 85/585/FDIS, future edition 1 of IEC 62754, prepared by
21、 IEC/TC 85 “Measuring equipment for electrical and electromagnetic quantities“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62754:2017. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identi
22、cal national standard or by endorsement (dop) 2018-03-28 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-06-28 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC shall
23、 not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62754:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added fo
24、r the standard indicated : IEC 60359:2001 NOTE Harmonized as EN 60359:2002. - EN 62754:2017 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this docume
25、nt and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated
26、by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 60469 2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
27、EN 60469 2013 BS EN 62754:2017This page deliberately left blank 2 IEC 62754:2017 IEC 2017 CONTENTS FOREWORD . 4 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Waveform measurement 16 4.1 General . 16 4.2 Waveform parameters . 17 4.3 Waveform measurement process 17 4.3.1 General . 17
28、4.3.2 General description of the measurement system 18 5 Waveform and waveform parameter corrections 19 5.1 General . 19 5.2 Waveform parameter corrections 19 5.3 Waveform corrections and waveform reconstruction 20 5.3.1 General . 20 5.3.2 Sample-by-sample correction 20 5.3.3 Entire waveform correct
29、ion 20 6 Uncertainties . 22 6.1 General . 22 6.2 Propagation of uncertainties . 22 6.2.1 General . 22 6.2.2 Uncorrelated input quantities . 23 6.2.3 Correlated input quantities . 23 6.3 Pooled data and its standard deviation 23 6.4 Expanded uncertainty and coverage factor 25 6.4.1 General . 25 6.4.2
30、 Effective degrees of freedom . 27 6.5 Entire waveform uncertainties . 28 7 Waveform parameter uncertainties 29 7.1 General . 29 7.2 Amplitude parameters . 30 7.2.1 State levels 30 7.2.2 State boundaries . 35 7.2.3 Waveform amplitude (state levels) . 36 7.2.4 Impulse amplitude (state levels) 37 7.2.
31、5 Percent reference levels (state levels, waveform amplitude) 37 7.2.6 Transition settling error (state levels, waveform amplitude) 38 7.2.7 Overshoot aberration (state levels, waveform amplitude) . 38 7.2.8 Undershoot aberration (state levels, waveform amplitude) . 39 7.3 Temporal parameters 39 7.3
32、.1 Initial instant 39 7.3.2 Waveform epoch 40 7.3.3 Reference level instants (percent reference levels, waveform epoch, initial instant) . 41 7.3.4 Impulse centre instant (impulse amplitude, reference level instants) 42 7.3.5 Transition duration (reference level instants) . 42 2 IEC 62754:2017 IEC 2
33、017 CONTENTS FOREWORD . 4 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Waveform measurement 16 4.1 General . 16 4.2 Waveform parameters . 17 4.3 Waveform measurement process 17 4.3.1 General . 17 4.3.2 General description of the measurement system 18 5 Waveform and waveform paramet
34、er corrections 19 5.1 General . 19 5.2 Waveform parameter corrections 19 5.3 Waveform corrections and waveform reconstruction 20 5.3.1 General . 20 5.3.2 Sample-by-sample correction 20 5.3.3 Entire waveform correction 20 6 Uncertainties . 22 6.1 General . 22 6.2 Propagation of uncertainties . 22 6.2
35、.1 General . 22 6.2.2 Uncorrelated input quantities . 23 6.2.3 Correlated input quantities . 23 6.3 Pooled data and its standard deviation 23 6.4 Expanded uncertainty and coverage factor 25 6.4.1 General . 25 6.4.2 Effective degrees of freedom . 27 6.5 Entire waveform uncertainties . 28 7 Waveform p
36、arameter uncertainties 29 7.1 General . 29 7.2 Amplitude parameters . 30 7.2.1 State levels 30 7.2.2 State boundaries . 35 7.2.3 Waveform amplitude (state levels) . 36 7.2.4 Impulse amplitude (state levels) 37 7.2.5 Percent reference levels (state levels, waveform amplitude) 37 7.2.6 Transition sett
37、ling error (state levels, waveform amplitude) 38 7.2.7 Overshoot aberration (state levels, waveform amplitude) . 38 7.2.8 Undershoot aberration (state levels, waveform amplitude) . 39 7.3 Temporal parameters 39 7.3.1 Initial instant 39 7.3.2 Waveform epoch 40 7.3.3 Reference level instants (percent
38、reference levels, waveform epoch, initial instant) . 41 7.3.4 Impulse centre instant (impulse amplitude, reference level instants) 42 7.3.5 Transition duration (reference level instants) . 42 BS EN 62754:2017IEC 62754:2017 IEC 2017 3 7.3.6 Transition settling duration (reference level instants) . 43
39、 7.3.7 Pulse duration (reference level instants) 43 7.3.8 Pulse separation (reference level instants) 43 7.3.9 Waveform delay (advance) (reference level instants) . 44 8 Monte Carlo method for waveform parameter uncertainty estimates 44 8.1 General guidance and considerations . 44 8.2 Example: state
40、 level 44 Annex A (informative) Demonstration example for the calculation of the uncertainty of state levels using the histogram mode according to 7.2.1.2. 46 A.1 Waveform measurement . 46 A.2 Splitting the bimodal histogram and determining the state levels . 46 A.3 Uncertainty of state levels . 47
41、Annex B (informative) Computation of L andY for estimating the uncertainty of state levels using the shorth method according to 7.2.1.3 . 49 Bibliography 52 Figure 1 Reference levels, reference level instants, waveform amplitude, and transition duration for a single positive-going transition . 7 Fig
42、ure 2 Overshoot, undershoot, state levels, and state boundaries for a single positive-going transition 11 Figure 3 Creation of measured, corrected, and reconstructed waveforms and the final estimate of the input signal 17 Figure 4 Example of waveform bounds focusing on the trajectories that impact p
43、ulse parameter measurements . 28 Figure 5 Relationship between selected waveform parameters 30 Figure A.1 Waveform obtained from the measurement of a step-like signal from which the state levels and uncertainties are calculated . 46 Figure A.2 Histograms of state s1 (a) and state s2 (b) of the step-
44、like waveform plotted in Figure A.1 . 47 Figure B.1 Diagram showing location of waveform elements, ()()y , in Y1and Y2, and the construction of Y from Y1and Y2. 49 Table 1 Value of the coverage factor kpthat encompasses the fraction p of the t -distribution for different degrees of freedom (from ISO
45、/IEC Guide 98-3) . 26 Table 2 Different methods for determining state levels, as given in IEC 60469, and their uncertainty type and method of computation . 31 Table 3 Different methods for determining state boundaries and their uncertainty type and method of computation . 36 Table 4 Variables contri
46、buting to the uncertainty in overshoot 39 Table 5 Variables contributing to the uncertainty in the reference level instant . 42 Table A.1 Uncertainty contributions and total uncertainty for level(si) determined from histogram modes 48 BS EN 62754:2017IEC 62754:2017 IEC 2017 3 7.3.6 Transition settli
47、ng duration (reference level instants) . 43 7.3.7 Pulse duration (reference level instants) 43 7.3.8 Pulse separation (reference level instants) 43 7.3.9 Waveform delay (advance) (reference level instants) . 44 8 Monte Carlo method for waveform parameter uncertainty estimates 44 8.1 General guidance
48、 and considerations . 44 8.2 Example: state level 44 Annex A (informative) Demonstration example for the calculation of the uncertainty of state levels using the histogram mode according to 7.2.1.2. 46 A.1 Waveform measurement . 46 A.2 Splitting the bimodal histogram and determining the state levels
49、 . 46 A.3 Uncertainty of state levels . 47 Annex B (informative) Computation of L andY for estimating the uncertainty of state levels using the shorth method according to 7.2.1.3 . 49 Bibliography 52 Figure 1 Reference levels, reference level instants, waveform amplitude, and transition duration for a single positive-going transition . 7 Figure 2 Overshoot, undershoot, state levels, and state boundaries for a single positive-going transition 11 Figure 3 Creation of measured, corrected, and reconst
