1、BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06Measurement techniques of piezoelectric, dielectric and electrostatic oscillatorsPart 2: Phase jitter measurement methodBS EN 628842:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62884-2 December 2017 ICS 31.
2、140 English Version Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017) Techniques de mesure des oscillateurs pizolectriques, dilectriques et lectrostatiques - Partie 2 : mthode de mesure des gigues de phase (
3、IEC 62884-2:2017) Messverfahren fr piezoelektrische, dielektrische und elektrostatische Oszillatoren - Teil 2: Messverfahren fr Phasenjitter (IEC 62884-2:2017) This European Standard was approved by CENELEC on 2017-10-04. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations
4、which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
5、This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. C
6、ENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Nethe
7、rlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Manag
8、ement Centre: Rue de la Science 23, B-1040 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62884-2:2017 E National forewordThis British Standard is the UK implementation of EN 628842:2017. It is identical to IEC 628842
9、:2017.The UK participation in its preparation was entrusted to Technical Committee EPL/49, Piezoelectric devices for frequency control and selection.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the
10、necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 95345 3ICS 31.140Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard
11、was published under the authority of the Standards Policy and Strategy Committee on 31 December 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 628842:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62884-2 December 2017 ICS 31.140 English Version
12、Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017) Techniques de mesure des oscillateurs pizolectriques, dilectriques et lectrostatiques - Partie 2 : mthode de mesure des gigues de phase (IEC 62884-2:2017) Me
13、ssverfahren fr piezoelektrische, dielektrische und elektrostatische Oszillatoren - Teil 2: Messverfahren fr Phasenjitter (IEC 62884-2:2017) This European Standard was approved by CENELEC on 2017-10-04. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the
14、conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standa
15、rd exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are t
16、he national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Pola
17、nd, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Rue de
18、 la Science 23, B-1040 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62884-2:2017 E BS EN 628842:2017EN 62884-2:2017 (E) 2 European foreword The text of document 49/1212/CDV, future edition 1 of IEC 62884-2:2017, pre
19、pared by IEC/TC 49 “Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62884-2:2017. The following dates are fixed: latest date by which this documen
20、t has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-07-04 latest date by which the national standards conflicting with this document have to be withdrawn (dow) 2020-10-04 Attention is drawn to the possibility that some of the elemen
21、ts of this document may be the subject of patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62884-2:2017 was approved by CENELEC as a European Standard without any modification. BS EN 6288
22、42:2017EN 62884-2:2017 (E) 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated
23、 references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date
24、 information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 60027 series Letter symbols to be used in electrical technology EN 60027 series IEC 60050-561 - International electrotechnical vocabulary - Part
25、 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - - IEC 60469 - Transitions, pulses and related waveforms - Terms, definitions and algorithms EN 60469 - IEC 60617 - Standard data element types with associated classific
26、ation scheme for electric components - Part 4: IEC reference collection fo standard data element types and component classes - - IEC 60679-1 2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification EN 60679-1 2017 IEC 62884-1 2017 Measurement
27、techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement EN 62884-1 2017 ISO 80000-1 - Quantities and units - Part 1: General EN ISO 80000-1 - BS EN 628842:2017This page deliberately left blank 2 IEC 62884-2:2017 IEC 2017 CONTENTS FOREWORD . 4
28、 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 Test and measurement procedures 8 4.1 General . 8 4.2 Test methods of phase jitter 8 4.2.1 General . 8 4.2.2 Measurement in the time domain . 8 4.2.3 Measurement in the data domain . 9 4.2.4 Measurement in the frequency
29、 domain 9 4.3 Input and output impedances of the measurement system 13 4.4 Measurement equipment . 13 4.4.1 General . 13 4.4.2 Jitter floor 13 4.4.3 Output wave form 13 4.4.4 Output voltage . 14 4.5 Test fixture 14 4.6 Cable, tools and instruments, and so on . 14 5 Measurement and the measurement en
30、vironment 14 5.1 Set-up before taking measurements 14 5.2 Points to be considered and noted at the time of measurement . 14 5.3 Treatment after the measurement . 14 6 Measurement . 15 6.1 Reference temperature . 15 6.2 Measurement of temperature characteristics . 15 6.3 Measurement under vibration 1
31、5 6.4 Measurement at the time of impact . 15 6.5 Measurement in accelerated ageing 15 7 Other points to be noted 15 8 Miscellaneous 15 Annex A (normative) Calculation method for the amount of phase jitter . 16 A.1 General . 16 A.2 Explanation . 16 A.3 Relations between phase noise and phase jitter 1
32、6 A.4 Commentary on theoretical positioning of phase jitter . 18 A.5 Description . 18 A.5.1 General . 18 A.5.2 RMS jitter 19 A.5.3 Peak-to-peak jitter . 19 A.5.4 Random jitter . 20 A.5.5 Deterministic jitter 20 A.5.6 Period (periodic) jitter 20 A.5.7 Data-dependent jitter . 20 A.5.8 Total jitter 21
33、2 IEC 62884-2:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 Test and measurement procedures 8 4.1 General . 8 4.2 Test methods of phase jitter 8 4.2.1 General . 8 4.2.2 Measurement in the time domain . 8 4.2.3 Measurement in the d
34、ata domain . 9 4.2.4 Measurement in the frequency domain 9 4.3 Input and output impedances of the measurement system 13 4.4 Measurement equipment . 13 4.4.1 General . 13 4.4.2 Jitter floor 13 4.4.3 Output wave form 13 4.4.4 Output voltage . 14 4.5 Test fixture 14 4.6 Cable, tools and instruments, an
35、d so on . 14 5 Measurement and the measurement environment 14 5.1 Set-up before taking measurements 14 5.2 Points to be considered and noted at the time of measurement . 14 5.3 Treatment after the measurement . 14 6 Measurement . 15 6.1 Reference temperature . 15 6.2 Measurement of temperature chara
36、cteristics . 15 6.3 Measurement under vibration 15 6.4 Measurement at the time of impact . 15 6.5 Measurement in accelerated ageing 15 7 Other points to be noted 15 8 Miscellaneous 15 Annex A (normative) Calculation method for the amount of phase jitter . 16 A.1 General . 16 A.2 Explanation . 16 A.3
37、 Relations between phase noise and phase jitter 16 A.4 Commentary on theoretical positioning of phase jitter . 18 A.5 Description . 18 A.5.1 General . 18 A.5.2 RMS jitter 19 A.5.3 Peak-to-peak jitter . 19 A.5.4 Random jitter . 20 A.5.5 Deterministic jitter 20 A.5.6 Period (periodic) jitter 20 A.5.7
38、Data-dependent jitter . 20 A.5.8 Total jitter 21 BS EN 628842:2017IEC 62884-2:2017 IEC 2017 3 A.6 Points to be considered for measurement . 21 A.6.1 Measurement equipment . 21 A.6.2 Factors of measurement errors 22 Bibliography 24 Figure 1 Phase jitter measurement with sampling oscilloscope 9 Figure
39、 2 Block diagram of a jitter and wander analyser according to ITU-T O.172 . 11 Figure 3 Equivalent block diagram . 13 Figure A.1 Concept diagram of SSB phase noise . 18 Figure A.2 Voltage versus time 19 Figure A.3 Explanatory diagram of the amount of jitter applied to RMS jitter 21 Figure A.4 Explan
40、atory diagrams of random jitter, deterministic jitter, and total jitter 22 Table 1 Fourier frequency range for phase noise test . 10 Table 2 Standard bit rates for various applications . 12 BS EN 628842:2017 4 IEC 62884-2:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT TECHNIQU
41、ES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS Part 2: Phase jitter measurement method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The obj
42、ect of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specificati
43、ons (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liais
44、ing with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express
45、, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committee
46、s in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National C
47、ommittees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not p
48、rovide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the
49、latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications
