1、 ETSI GS QKD 011 V1.1.1 (2016-05) Quantum Key Distribution (QKD); Component characterization: characterizing optical components for QKD systems Disclaimer The present document has been produced and approved by the Group Quantum Key Distribution (QKD) ETSI Industry Specification Group (ISG) and repre
2、sents the views of those members who participated in this ISG. It does not necessarily represent the views of the entire ETSI membership. GROUP SPECIFICATION ETSI ETSI GS QKD 011 V1.1.1 (2016-05) 2 Reference DGS/QKD-0011_OSWCRPSCKDU Keywords communications module, quantum cryptography, Quantum Key D
3、istribution ETSI 650 Route des Lucioles F-06921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N 348 623 562 00017 - NAF 742 C Association but non lucratif enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice The present document can be downloa
4、ded from: http:/www.etsi.org/standards-search The present document may be made available in electronic versions and/or in print. The content of any electronic and/or print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any existing
5、or perceived difference in contents between such versions and/or in print, the only prevailing document is the print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat. Users of the present document should be aware that the document may be subject
6、to revision or change of status. Information on the current status of this and other ETSI documents is available at https:/portal.etsi.org/TB/ETSIDeliverableStatus.aspx If you find errors in the present document, please send your comment to one of the following services: https:/portal.etsi.org/Peopl
7、e/CommiteeSupportStaff.aspx Copyright Notification No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm except as authorized by written permission of ETSI. The content of the PDF version shall not be modified without the wr
8、itten authorization of ETSI. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2016. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTMand the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GP
9、PTM and LTE are Trade Marks of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI GS QKD 011 V1.1.1 (2016-05) 3 Contents Intellectual Property Rights 12g3Foreword . 12g3Mo
10、dal verbs terminology 12g31 Scope 13g32 References 13g32.1 Normative references . 13g32.2 Informative references 14g33 Definitions, symbols and abbreviations . 15g33.1 Definitions 15g33.2 Symbols 17g33.3 Abbreviations . 19g34 QKD Systems and Components . 19g34.1 Overview 19g34.2 Generic Description
11、20g34.3 Weak Laser Pulse QKD . 21g34.4 One-Way Mach-Zehnder Implementation 21g34.5 Common electrical properties for which measurement procedures are prescribed 22g34.6 Single photon source (QKD transmitter) properties for which measurement procedures are prescribed . 23g34.7 Single-photon detector (
12、QKD receiver) properties for which measurement procedures are prescribed 27g35 Measurement conditions. 32g35.1 Overview 32g35.2 Electrical and optical inputs/outputs. 33g35.2.1 Standardization . 33g35.2.2 Diagrams in clauses 6 to 20 33g36 Measurement of clock frequency, and its variation 33g36.1 Def
13、initions, symbols and units . 33g36.2 Procedure scope 34g36.3 Measurement set-up . 34g36.4 Applicable methods 34g36.4.1 Measurement of clock frequency 34g36.4.2 Measurement of clock frequency variation . 34g36.5 Measurement of clock frequency . 34g36.5.1 Measurement with a frequency counter 34g36.5.
14、1.1 Equipment required . 34g36.5.1.2 Equipment specifications 34g36.5.1.3 Measurement process 34g36.5.1.3.1 Measurement position . 34g36.5.1.3.2 Signal . 35g36.5.1.4 Environment 35g36.5.1.5 Operational settings . 35g36.5.1.6 Calculations . 35g36.5.1.7 Uncertainties . 35g36.5.2 Measurement with an os
15、cilloscope . 35g36.5.2.1 Equipment required . 35g36.5.2.2 Equipment specifications 35g36.5.2.3 Measurement process 35g36.5.2.3.1 Measurement position . 35g36.5.2.3.2 Signal . 35g36.5.2.4 Environment 36g36.5.2.5 Operational settings . 36g36.5.2.6 Calculations . 36g36.5.2.7 Uncertainties . 36g36.6 Mea
16、surement of clock frequency variation 36g3ETSI ETSI GS QKD 011 V1.1.1 (2016-05) 4 6.6.1 Calculation 36g36.6.2 Uncertainties . 36g36.7 Results 37g36.7.1 Reporting measurement on clock frequency . 37g36.7.2 Measurement of clock frequency variation . 37g36.7.3 Other information to be reported 37g37 Mea
17、surement of output optical pulse repetition rate 38g37.1 Definitions, symbols and units . 38g37.2 Procedure scope 38g37.3 Measurement set-up . 38g37.4 Applicable methods 38g37.4.1 Measurement before attenuation to the single-photon level . 38g37.4.2 Measurement at the single-photon level . 38g37.5 M
18、easurement before attenuation to the single-photon level . 39g37.5.1 Equipment required. 39g37.5.2 Equipment specifications 39g37.5.3 Measurement process 39g37.5.3.1 Measurement position . 39g37.5.3.2 Measurement signal 40g37.5.3.2.1 Measurement with a frequency counter . 40g37.5.3.2.2 Measurement w
19、ith a real-time oscilloscope. 40g37.5.3.2.3 Measurement with an event timer . 40g37.5.3.2.4 Measurement with a sampling oscilloscope 40g37.5.3.2.5 Measurement, with an oscilloscope or event timer, of a transmitter incorporating an AMZI . 41g37.5.4 Environment . 41g37.5.5 Operational settings 41g37.5
20、.6 Calculations 41g37.5.6.1 Calculation of pulse frequency 41g37.5.6.1.1 Measurement with frequency counter . 41g37.5.6.1.2 Measurement with a real-time oscilloscope or event timer . 41g37.5.6.1.2.1 Detected pulse sequences . 41g37.5.6.1.2.2 Simple emitter 41g37.5.6.1.2.3 Transmitter incorporating a
21、n AMZI 42g37.5.6.1.3 Measurement with a sampling oscilloscope 42g37.5.6.1.3.1 Averaging 42g37.5.6.1.3.2 Simple emitter 42g37.5.6.1.3.3 Transmitter incorporating an AMZI 42g37.5.6.2 Calculation of arrival time difference between the pulse-trains produced by the two arms of the AMZI 43g37.5.6.2.1 Meas
22、urement with real-time oscilloscope or event timer 43g37.5.6.2.2 Measurement with a sampling oscilloscope 43g37.5.7 Uncertainties . 44g37.5.7.1 Measurement equations . 44g37.5.7.2 Measurement of frequency 44g37.5.7.3 Measurement of arrival time difference between the pulse-trains produced by each ar
23、m of an AMZI 44g37.5.7.4 Uncertainty evaluation 45g37.6 Measurement at the single-photon level . 45g37.6.1 Equipment required. 45g37.6.2 Equipment specifications 45g37.6.3 Measurement process 45g37.6.3.1 Measurement position . 45g37.6.3.2 Measurement signal - a simple emitter 45g37.6.3.3 Measurement
24、 signal - a QKD transmitter incorporating an AMZI . 46g37.6.4 Environment . 47g37.6.5 Operational settings 47g37.6.6 Calculations 47g37.6.6.1 Method described in clauses 7.6.3.2 i) and 7.6.3.3 i) 47g37.6.6.2 Methods described in 7.6.3.2 ii) and 7.6.3.3 ii) . 48g37.6.6.3 Methods described in 7.6.3.2
25、iii) and 7.6.3.3.iii). 48g37.6.7 Uncertainties . 48g3ETSI ETSI GS QKD 011 V1.1.1 (2016-05) 5 7.6.7.1 Measurement equations . 48g37.6.7.2 Measurement of frequency 49g37.6.7.3 Measurement of arrival time difference between the pulse-trains produced by each arm of an AMZI 49g37.6.7.4 Uncertainty evalua
26、tion 49g37.7 Results 49g37.7.1 Reporting measurement on output optical pulse repetition rate: . 49g37.7.2 Other information to be reported: . 50g38 Measurement of mean photon number . 50g38.1 Definitions, symbols and units . 50g38.2 Procedure scope 50g38.3 Measurement set-up . 51g38.4 Applicable met
27、hods 51g38.4.1 Measurement with a power meter . 51g38.4.2 Measurement with a gated photon counter . 51g38.4.2.1 Method 1: Every detector gate is illuminated . 51g38.4.2.2 Method 2: Every Rth detector gate is illuminated . 51g38.5 Measurement with a power meter 51g38.5.1 Applicability . 51g38.5.2 Equ
28、ipment required. 52g38.5.3 Equipment specifications 52g38.5.4 Measurement process 52g38.5.4.1 Measurement position . 52g38.5.4.2 Spectrum . 52g38.5.4.3 Power 52g38.5.4.4 Pulse repetition rate . 52g38.5.5 Environment . 53g38.5.6 Operational settings 53g38.5.7 Calculations 53g38.5.8 Uncertainties . 54
29、g38.5.9 Results 54g38.5.9.1 Reporting measurement on mean photon number . 54g38.5.9.2 Other information to be reported . 54g38.6 Measurement with a gated photon counter . 55g38.6.1 Applicability . 55g38.6.2 Equipment required. 55g38.6.3 Equipment specifications 55g38.6.4 Measurement process 55g38.6.
30、4.1 Measurement position . 55g38.6.4.2 Pulse-pair considerations 56g38.6.4.3 Spectrum . 56g38.6.4.4 Pulse repetition rate . 56g38.6.4.5 Mean photon number 57g38.6.4.5.1 General considerations 57g38.6.4.5.2 Method 1: Every detector gate is illuminated 57g38.6.4.5.3 Method 2: Every Rth detector gate i
31、s illuminated . 57g38.6.4.5.4 Detector constraints . 58g38.6.5 Environment . 59g38.6.6 Operational settings 59g38.6.7 Calculations 59g38.6.7.1 General 59g38.6.7.2 Method 1: Every detector gate is illuminated . 60g38.6.7.3 Method 2: Every Rth detector gate is illuminated . 60g38.6.8 Uncertainties . 6
32、0g38.6.9 Results 61g38.6.9.1 Reporting measurement on mean photon number . 61g38.6.9.2 Other information to be reported . 61g39 Measurement of mean source power 61g39.1 Definitions, symbols and units . 61g39.2 Procedure scope 62g3ETSI ETSI GS QKD 011 V1.1.1 (2016-05) 6 9.3 Measurement set-up . 62g39
33、.4 Applicable methods 62g39.4.1 Measurement with a power meter . 62g39.4.2 Calculation from measurement of mean photon number(s) 62g39.5 Measurement with a power meter 62g39.6 Environment . 62g39.7 Operational settings 62g39.8 Calculations 63g39.8.1 Measurement with a power meter . 63g39.8.2 Measure
34、ment of mean photon number(s) . 63g39.8.3 Uncertainties . 63g39.9 Results 63g39.9.1 Reporting measurement on mean source power . 63g39.9.2 Other information to be recorded 64g310 Measurement of stability of mean optical power of emitted pulses . 64g310.1 Definitions, symbols and units . 64g310.2 Pro
35、cedure scope 64g310.3 Applicable methods 64g310.4 Calculation . 65g310.5 Uncertainties . 65g310.6 Environment . 65g310.7 Results 65g310.7.1 Reporting measurement on stability of mean optical power of emitted pulses . 65g310.7.2 Other information to be reported 65g311 Confirmation of Poissonian natur
36、e of emitted pulses . 65g311.1 Definitions, symbols and units . 65g311.2 Procedure scope 66g311.3 Measurement set-up . 67g311.4 Applicable methods 67g311.4.1 Measurement with an HBT interferometer operating at the single-photon level 67g311.5 Measurement with an HBT interferometer operating at the s
37、ingle-photon level 67g311.5.1 Equipment required. 67g311.5.2 Equipment specifications 67g311.5.3 Measurement process 68g311.5.3.1 Pulse-pair considerations 68g311.5.3.2 Measurement position . 68g311.5.3.3 Pulse repetition rate . 68g311.5.3.4 Measurement of emitted pulses . 68g311.6 Environment . 69g
38、311.7 Operational settings 69g311.8 Calculations 69g311.9 Uncertainties . 70g311.10 Results 70g311.10.1 Reporting on Poissonian nature of emitted pulses 70g311.10.2 Other information to be recorded 71g312 Measurement of source emission temporal profile, source temporal profile, and source timing jit
39、ter 71g312.1 Definitions, symbols and units . 71g312.2 Procedure scope 71g312.2.1 Measurement of source emission temporal profile of an optical pulse . 71g312.2.2 Measurement at high flux level - enables source temporal profile and source timing jitter to be measured. 71g312.2.3 Measurement at singl
40、e-photon level - only source emission temporal profile can be measured 72g312.3 Applicable methods 72g312.3.1 Measurement before attenuation to the single-photon level . 72g312.3.2 Measurement at the single-photon level . 72g312.4 Measurement before attenuation to the single-photon level . 73g312.4.
41、1 Measurement set-up 73g312.4.2 Equipment . 73g312.4.2.1 Equipment required . 73g3ETSI ETSI GS QKD 011 V1.1.1 (2016-05) 7 12.4.2.2 Equipment specifications 73g312.4.3 Measurement of jitter 73g312.4.3.1 Measurement . 73g312.4.3.1.1 Measurement position . 73g312.4.3.1.2 Signal measurement with an osci
42、lloscope . 73g312.4.3.1.3 Signal measurement with an event timer . 74g312.4.3.2 Environment 74g312.4.3.3 Operational settings . 74g312.4.3.4 Calculation 74g312.4.3.4.1 Measurement with an oscilloscope 74g312.4.3.4.2 Measurement with an event timer . 75g312.4.4. Measurement of temporal profile 75g312
43、.4.4.1 Measurement . 75g312.4.4.1.1 Measurement position . 75g312.4.4.1.2 Signal measurement with an oscilloscope . 75g312.4.4.1.3 Signal measurement with an event timer . 75g312.4.4.2 Environment 75g312.4.4.3 Operational settings . 75g312.4.4.4 Calculation 75g312.4.5 Uncertainties . 76g312.5 Measur
44、ement at the single-photon level . 76g312.5.1 Measurement approach . 76g312.5.2 Measurement considerations - detection gate is wider than the source emission temporal profile . 76g312.5.3 Measurement considerations - detection gate is narrower than the source emission temporal profile . 76g312.5.4 C
45、alculations 76g312.5.5 Uncertainties . 77g312.6 Results 77g312.6.1 Reporting measurement on source emission profile, source temporal profile, and source timing jitter . 77g312.6.2 Other information to be reported 77g313 Measurement of source wavelength (source frequency) and source linewidth 78g313.
46、1 Definitions, symbols and units . 78g313.2 Procedure scope 78g313.3 Measurement set-up . 78g313.4 Applicable methods 78g313.5 Equipment 78g313.5.1 Equipment required. 78g313.5.2 Equipment specifications 79g313.6 Measurement 79g313.6.1 Measurement position . 79g313.6.2 Signal 79g313.7 Environment .
47、79g313.8 Operational settings 80g313.9 Calculations 80g313.9.1 Wavelength / frequency 80g313.9.2 Linewidth 81g313.10 Uncertainties . 81g313.11 Results 81g313.11.1 Reporting measurement on source wavelength (source frequency) and source linewidth 81g313.11.2 Other information to be reported 81g314 Me
48、asurement of detector gate repetition rate . 82g314.1 Definitions, symbols and units . 82g314.2 Procedure scope 82g314.3 Measurement set-up . 82g314.4 Applicable methods 82g314.5 Measurement 83g314.5.1 Equipment required. 83g314.5.2 Equipment specifications 83g314.5.3 Measurement process 83g314.5.3.
49、1 Measurement position . 83g314.5.3.2 Signal 83g3ETSI ETSI GS QKD 011 V1.1.1 (2016-05) 8 14.6 Environment . 84g314.7 Operational settings 84g314.8 Calculations 84g314.9 Uncertainties . 84g314.10 Results 84g314.10.1 Reporting measurement on detector gate repetition rate . 84g314.10.2 Other information to be reported 85g315 Measurement of dark count probability, after-pulse probability and detection efficiency . 85g315.1 Definitions, symbols and units . 85g315.2 Procedure scope 86g315.3 Applicable methods 86g315.3.1 Method 1: Measure counts from the non-illuminated detect
