ETSI PRI-ETS 300 041-1991 European Digital Cellular Telecommunications System (Phase 1) General on Terminal Adaptation Functions for Mobile Stations《欧洲数字蜂窝通信系统(第1阶段) 移动台的终端适配功能总则》.pdf

相关资源

IRS 70778-2-2018 Recommendations for determining the carrying capacity and fatigue risks of existing metallic railway bridges.pdf

IRS 70712-2018 Rail defects.pdf

IRS 50596-6-2018 Conditions for coding intermodal loading units in combined transport combined transport lines and wagons.pdf

IRS 50596-5-2018 Transport of road vehicles on wagons-Technical Organisation-Conveyance of semi-trailers with P coding or N coding on recess wagons.pdf

IESNA TM-23-2017 Lighting Control Protocols.pdf

IESNA RP-2-2017 Recommended Practice for Retail Lighting.pdf

ITU-R RAPPORT M 766-2 FRENCH-1990 Feasibility of frequency sharing between the GPS and other services《全球定位系统和其他服务之间的频率共享的可行性》.pdf

ITU-R RAPPORT M 763-3 FRENCH-1990 Signal level variation due to multipath effects and blockage by ship-s superstructure in maritime mobile-satellite service lin.pdf

ITU-R RAPPORT M 739-1 FRENCH-1986 Interference due to intermodulation products in the land mobile service between 25 and 100 MHz《由于互调产物在陆地移动服务25和100 MHz之间产生的干扰》.pdf

ITU-R RAPPORT M 319-7 FRENCH-1990 Characteristics of equipment and principles governing the assignment of frequency channels between 25 and 100 MHz for land mob.pdf

猜你喜欢

CNS 5067-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Soft Solders for Heat Endurance)《单件半导体装置之环境检验法及耐久性检验法–焊锡耐热性试验》.pdf

CNS 5068-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Solderability Testing for Adhesion)《单件半导体装置之环境检验法及耐久性检验法–焊锡附着性试验》.pdf

CNS 5069-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Thermal Shock)《单件半导体装置之环境检验法及耐久性检验法–热冲击试验》.pdf

CNS 5070-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Cycle Test for Temperature)《单件半导体装置之环境检验法及耐久性检验法–温度循环试验》.pdf

CNS 5071-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Cycle Test for Temperature & Humidity)《单件半导体装置之环境检验法及耐久性检验法–温湿度循环试验》.pdf

CNS 5072-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Sealing Test)《单件半导体装置之环境检验法及耐久性检验法–气密性试验》.pdf

CNS 5073-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Shock Test)《单件半导体装置之环境检验法及耐久性检验法–冲击试验》.pdf

CNS 5074-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Free Fall)《单件半导体装置之环境检验法及耐久性检验法–自然落下试验》.pdf

CNS 5075-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Constant Acceleration)《单件半导体装置之环境检验法及耐久性检验法–等加速度试验》.pdf