ETSI TS 102 148-2-2-2004 Broadband Radio Access Networks (BRAN)《宽带无线接入网(BRAN)(版本1 2 1)》.pdf

上传人:李朗 文档编号:738753 上传时间:2019-01-12 格式:PDF 页数:10 大小:38.27KB
下载 相关 举报
ETSI TS 102 148-2-2-2004 Broadband Radio Access Networks (BRAN)《宽带无线接入网(BRAN)(版本1 2 1)》.pdf_第1页
第1页 / 共10页
ETSI TS 102 148-2-2-2004 Broadband Radio Access Networks (BRAN)《宽带无线接入网(BRAN)(版本1 2 1)》.pdf_第2页
第2页 / 共10页
ETSI TS 102 148-2-2-2004 Broadband Radio Access Networks (BRAN)《宽带无线接入网(BRAN)(版本1 2 1)》.pdf_第3页
第3页 / 共10页
ETSI TS 102 148-2-2-2004 Broadband Radio Access Networks (BRAN)《宽带无线接入网(BRAN)(版本1 2 1)》.pdf_第4页
第4页 / 共10页
ETSI TS 102 148-2-2-2004 Broadband Radio Access Networks (BRAN)《宽带无线接入网(BRAN)(版本1 2 1)》.pdf_第5页
第5页 / 共10页
点击查看更多>>
资源描述

1、 ETSI TS 102 148-2-2 V1.2.1 (2004-04)Technical Specification Broadband Radio Access Networks (BRAN);HIPERACCESS;Conformance testing for the Packet based Convergence Layer;Part 2: Ethernet Service SpecificConvergence Sublayer (SSCS);Sub-part 2: Test Suite Structure andTest Purposes (TSS Essential, or

2、 potentially Essential, IPRs notified to ETSI in respect of ETSI standards“, which is available from the ETSI Secretariat. Latest updates are available on the ETSI Web server (http:/webapp.etsi.org/IPR/home.asp). Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been car

3、ried out by ETSI. No guarantee can be given as to the existence of other IPRs not referenced in ETSI SR 000 314 (or the updates on the ETSI Web server) which are, or may be, or may become, essential to the present document. Foreword This Technical Specification (TS) has been produced by ETSI Project

4、 Broadband Radio Access Networks (BRAN). The present document is part 2, sub-part 2 of a multi-part covering the testing specification for Ethernet Service Specific Convergence Sublayer (SSCS), of the BRAN HIPERACCESS system, as identified below: Part 1: “Common part“; Part 2: “Ethernet Service Spec

5、ific Convergence Sublayer (SSCS)“; Sub-part 1: “Protocol Implementation Conformance Statement (PICS) proforma“; Sub-part 2: “Test Suite Structure and Test Purposes (TSS Sub-part 3: “Abstract Test Suite (ATS)“. ETSI ETSI TS 102 148-2-2 V1.2.1 (2004-04) 5 1 Scope The present document contains the Test

6、 Suite Structure (TSS) and Test Purposes (TP) to test the BRAN HIPERACCESS; Packet based Convergence Layer; Part 2: Ethernet Service Specific Convergence Sublayer (SSCS). The objective of the present document is to provide a basis for conformance tests for BRAN HIPERACCESS equipment giving a high pr

7、obability of air interface inter-operability between different manufacturers BRAN HIPERACCESS equipment. The ISO standard for the methodology of conformance testing (ISO/IEC 9646-1 4 and ISO/IEC 9646-2 5) as well as the ETSI rules for conformance testing (ETS 300 406 3) are used as a basis for the t

8、est methodology. 2 References The following documents contain provisions which, through reference in this text, constitute provisions of the present document. References are either specific (identified by date of publication and/or edition number or version number) or non-specific. For a specific re

9、ference, subsequent revisions do not apply. For a non-specific reference, the latest version applies. Referenced documents which are not found to be publicly available in the expected location might be found at http:/docbox.etsi.org/Reference. 1 ETSI TS 102 117-1: “Broadband Radio Access Networks (B

10、RAN); HIPERACCESS; Packet based Convergence Layer; Part 1: Common Part“. 2 ETSI TS 102 117-2: “Broadband Radio Access Networks (BRAN); HIPERACCESS; Packet based Convergence Layer; Part 2: Ethernet Service Specific Convergence Sublayer“. 3 ETSI ETS 300 406: “Methods for Testing and Specification (MTS

11、); Protocol and profile conformance testing specifications; Standardization methodology“. 4 ISO/IEC 9646-1: “Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 1: General concepts“. 5 ISO/IEC 9646-2: “Information technology - Open Systems Int

12、erconnection - Conformance testing methodology and framework - Part 2: Abstract test suite specification“. 6 ISO/IEC 9646-6: “Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 6: Protocol profile test specification“. 7 ISO/IEC 9646-7: “Infor

13、mation technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 7: Implementation conformance statement“. 3 Definitions and abbreviations 3.1 Definitions For the purposes of the present document, the terms and definitions given in TS 102 117-2 2 and ISO/IEC 96

14、46-7 7 apply. ETSI ETSI TS 102 148-2-2 V1.2.1 (2004-04) 6 3.2 Abbreviations For the purposes of the present document, the abbreviations given in ISO/IEC 9646-1 4, ISO/IEC 9646-6 6, ISO/IEC 9646-7 7, TS 102 117-2 2 and the following apply: AP Access Point ATM Asynchronous Transfer Mode BI Invalid Beh

15、aviour BO Inopportune Behaviour BRAN Broadband Radio Access Networks (Project) BV Valid Behaviour CA CApability tests CL Convergence Layer ESS-AP Ethernet SSCS to AP ESS-AT Ethernet SSCS to AT IUT Implementation Under Test PBCL Packet Based CL PDU Protocol Data Unit PICS Protocol Implementation Conf

16、ormance Statement SSCS Service Specific Convergence Sublayer TP Test Purposes TS Technical Specification TSS Test Suite Structure ESP Ethernet Service specific Procedures 4 Test suite structure 4.1 Structure Figure 1 shows the Ethernet SSCS Test Suite Structure (TSS) including its subgroups defined

17、for the conformance testing. Test Suite Protocol group Protocol subgroup Test group CA BV BI BO ESS-AP/ ESS-AT Ethernet SSCS procedures RFC 2684 x Figure 1: TSS for HIPERACCESS Ethernet SSCS The test suite is structured as a tree with a first level defined as ESS-AP or ESS-AT representing the protoc

18、ol group “Ethernet SSCS for AP and Ethernet SSCS for AT“. 4.2 Test groups The test groups are organized in three levels. The first level creates one protocol group representing the protocol services. The second level separates the protocol services in functional modules. The last level in each branc

19、h contains one or more of the standard ISO subgroups CA, BV, BI and BO. 4.2.1 Protocol groups The protocol groups identify the Ethernet Service Specific PBCL procedures as defined in TS 102 117-2 2. 4.2.1.1 Ethernet SSCS procedures The Ethernet SSCS procedures group is divided in one functional modu

20、le. The functional module identifies the RFC 2684 procedures. ETSI ETSI TS 102 148-2-2 V1.2.1 (2004-04) 7 4.2.2 Main test groups The main test groups are the capability group, the valid behaviour group, the invalid behaviour group and the inopportune behaviour group. 4.2.2.1 Capability (CA) tests Th

21、is test sub group shall provide limited testing of the major IUT capabilities aiming to insure that the claimed capabilities are correctly supported, according to the PICS. 4.2.2.2 Valid Behaviour (BV) tests This test sub group shall verify that the IUT reacts in conformity with the TS, after receip

22、t or exchange of valid Protocol Data Units (PDUs). Valid PDUs means that the exchange of messages and the content of the exchanged messages are considered as valid. 4.2.2.3 Invalid Behaviour (BI) tests This test sub group shall verify that the IUT reacts in conformity with the TS, after receipt of a

23、 syntactically invalid PDU. 4.2.2.4 Inopportune Behaviour (BO) tests This test sub group shall verify that the IUT reacts in conformity with the TS, after receipt of a syntactically correct PDU not expected in the actual message exchange. 5 Test Purposes (TP) 5.1 Introduction 5.1.1 TP definition con

24、ventions The TPs are defined following particular rules as shown in table 1. Table 1: TP definition rules TP Id according to the TP naming conventions Reference. Initial condition. Stimulus. Expected behaviour. TP Id The TP Id is a unique identifier it shall be specified according to the TP naming c

25、onventions defined in clause 5.1.2. Reference The reference should contain the references of the subject to be validated by the actual TP (specification reference, clause, and paragraph). Condition The condition defines in which initial state the IUT has to be to apply the actual TP. Stimulus The st

26、imulus defines the test event to which the TP is related. Expected behaviour Definition of the events that are expected from the IUT to conform to the base specification. ETSI ETSI TS 102 148-2-2 V1.2.1 (2004-04) 8 5.1.2 TP naming conventions The identifier of the TP is built according to table 2. T

27、able 2: TP naming convention Identifier: TP/- = side type AP Access Point AT Access Terminal = protocol group ESP Ethernet Service Specific Procedures = functional module RF RFC 2684 x = Type of testing CA CApability tests BV Valid Behaviour tests BI Invalid Behaviour tests BO Inopportune Behaviour

28、tests = sequential number (000-999) Test Purpose number EXAMPLE: TP/AT/ESP/RF/BV-010 is the tenth purpose for the valid behaviour testing of the RFC 2684 procedures of the Ethernet SSCS implemented at AT side. 5.1.3 Sources of TP definitions All TPs are specified according to TS 102 117-2 2. 5.2 Tes

29、t purposes for AP TP/AP/ESP/RF/BV-000 Reference: TS 102 117-2 2, clause 7.1.4 Initial condition: AT and AP initialized. Check that: when the IUT (AP) wishes to establish a PBCL connection, it sends the RlcConnectionAdditionSetup message, which includes the MultiplexingMethod parameter as part of the

30、 ConnectionCIParameters field. 5.3 Test purposes for AT TP/AT/ESP/RF/BV-000 Reference: TS 102 117-2 2, clause 7.1.4 Initial condition: AT and AP initialized. Check that: when the IUT (AT) wishes to establish a PBCL connection, it sends the RlcConnectionAdditionInit message, which includes the Multip

31、lexingMethod parameter as part of the ConnectionCIParameters field. ETSI ETSI TS 102 148-2-2 V1.2.1 (2004-04) 9 Annex A (informative): Bibliography ITU-T Recommendation X.290: “OSI conformance testing methodology and framework for protocol Recommendations for ITU-T applications - General concepts“.

32、ITU-T Recommendation X.291: “OSI conformance testing methodology and framework for protocol Recommendations for ITU-T applications - Abstract test suite specification“. IETF/RFC 2684: “ Multiprotocol Encapsulation over ATM Adaptation Layer 5“. ETSI ETSI TS 102 148-2-2 V1.2.1 (2004-04) 10History Document history V1.1.1 November 2002 Publication V1.2.1 April 2004 Publication

展开阅读全文
相关资源
猜你喜欢
  • DLA SMD-5962-96850 REV B-2008 MICROCIRCUIT DIGITAL ADVANCED HIGHSPEED CMOS OCTAL BUFFER DRIVER WITH THREE-STATE OUTPUTS MONOLITHIC SILICON《数字微电路 具有三态输出的高级高速CMOS型八路缓冲器 驱动器和单片硅》.pdf DLA SMD-5962-96850 REV B-2008 MICROCIRCUIT DIGITAL ADVANCED HIGHSPEED CMOS OCTAL BUFFER DRIVER WITH THREE-STATE OUTPUTS MONOLITHIC SILICON《数字微电路 具有三态输出的高级高速CMOS型八路缓冲器 驱动器和单片硅》.pdf
  • DLA SMD-5962-96851 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL BUFFER DRIVER WITH OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-96851 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL BUFFER DRIVER WITH OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-96852 REV B-2007 MICROCIRCUIT HYBRID LINEAR SINGLE CHANNEL OPTICALLY COUPLED POWER TRANSISTOR INTERFACE《单通道功率耦联晶体管接口混合线型微电路》.pdf DLA SMD-5962-96852 REV B-2007 MICROCIRCUIT HYBRID LINEAR SINGLE CHANNEL OPTICALLY COUPLED POWER TRANSISTOR INTERFACE《单通道功率耦联晶体管接口混合线型微电路》.pdf
  • DLA SMD-5962-96853 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-96853 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-96854 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-96854 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-96855 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-96855 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-96856 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-96856 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-96858 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL BUFFER DRIVER WITH THREE STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-96858 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS OCTAL BUFFER DRIVER WITH THREE STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-96860 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET MONOLITHIC SILICON.pdf DLA SMD-5962-96860 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET MONOLITHIC SILICON.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1