1、 ETSI TS 103 241-3 V1.1.1 (2014-12) Integrated broadband cable telecommunication networks (CABLE); Testing; Conformance test specifications for DS-Lite technology; Part 3: Abstract Test Suite (ATS) and Protocol Implementation eXtra Information for Testing (PIXIT) floppy3TECHNICAL SPECIFICATION ETSI
2、ETSI TS 103 241-3 V1.1.1 (2014-12)2Reference DTS/CABLE-00013-3 Keywords AFTR, ATS, CPE, DS-Lite, IP, IPv6, transition ETSI 650 Route des Lucioles F-06921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N 348 623 562 00017 - NAF 742 C Association but non lucratif
3、enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice The present document can be downloaded from: http:/www.etsi.org The present document may be made available in electronic versions and/or in print. The content of any electronic and/or print versions of the present document shall
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6、end your comment to one of the following services: http:/portal.etsi.org/chaircor/ETSI_support.asp Copyright Notification No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm except as authorized by written permission of ET
7、SI. The content of the PDF version shall not be modified without the written authorization of ETSI. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2014. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTMand the ETSI logo
8、 are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM and LTE are Trade Marks of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI TS 103 241-3 V1.1.
9、1 (2014-12)3Contents Intellectual Property Rights 5g3Foreword . 5g3Modal verbs terminology 5g31 Scope 6g32 References 6g32.1 Normative references . 6g32.2 Informative references 7g33 Definitions and abbreviations . 7g33.1 Definitions 7g33.2 Abbreviations . 7g34 Abstract test method . 8g34.1 Abstract
10、 protocol tester 8g34.2 Test configurations . 9g34.2.1 CF01: B4 as IUT . 9g34.2.2 CF02: AFTR as IUT . 10g34.3 TTCN-3 Test architecture. 10g34.4 Ports and ASPs (Abstract Services Primitives) 13g34.4.1 TTCN-3 ports 13g34.4.2 Abstract Service Primitives 13g35 Implemented Test Purposes 13g36 ATS convent
11、ions 14g36.1 Naming conventions . 14g36.1.1 General guidelines 14g36.1.2 DS-LITE specific TTCN-3 naming conventions 15g36.1.3 Usage of Log statements . 16g36.1.4 Test Case (TC) identifier 16g36.2 On line documentation . 17g3Annex A (normative): Partial PIXIT proforma for DS-LITE . 18g3A.1 Identifica
12、tion summary. 18g3A.2 ATS summary 18g3A.3 Test laboratory 18g3A.4 Client identification 19g3A.5 SUT 19g3A.6 Protocol layer information 19g3A.6.1 Protocol identification 19g3A.6.2 IUT information . 20g3Annex B (normative): PCTR Proforma for DS-Lite 21g3B.1 Identification summary. 21g3B.1.1 Protocol c
13、onformance test report 21g3B.1.2 IUT identification . 21g3B.1.3 Testing environment . 21g3B.1.4 Limits and reservation 22g3B.1.5 Comments. 22g3B.2 IUT Conformance status 22g3B.3 Static conformance summary . 22g3ETSI ETSI TS 103 241-3 V1.1.1 (2014-12)4B.4 Dynamic conformance summary 23g3B.5 Static co
14、nformance review report . 23g3B.6 Test campaign report 24g3B.7 Observations . 25g3Annex C (normative): TTCN-3 library modules . 26g3C.1 Electronic annex, zip file with TTCN-3 code 26g3Annex D (informative): Bibliography . 27g3History 28g3ETSI ETSI TS 103 241-3 V1.1.1 (2014-12)5Intellectual Property
15、Rights IPRs essential or potentially essential to the present document may have been declared to ETSI. The information pertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be found in ETSI SR 000 314: “Intellectual Property Rights (IPRs); Essent
16、ial, or potentially Essential, IPRs notified to ETSI in respect of ETSI standards“, which is available from the ETSI Secretariat. Latest updates are available on the ETSI Web server (http:/ipr.etsi.org). Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out
17、by ETSI. No guarantee can be given as to the existence of other IPRs not referenced in ETSI SR 000 314 (or the updates on the ETSI Web server) which are, or may be, or may become, essential to the present document. Foreword This Technical Specification (TS) has been produced by ETSI Technical Commit
18、tee Integrated broadband cable telecommunication networks (CABLE). The present document is part 3 of a multi-part deliverable covering the conformance test specification for DS-Lite technology. Part 1: “Protocol Implementation Conformance Statement (PICS) proforma“; Part 2: “Test Suite Structure and
19、 Test Purposes (TSS Part 3: “Abstract Test Suite (ATS) and Protocol Implementation eXtra Information for Testing (PIXIT)“. The development of the present document follows the guidance provided in the ETSI EG 202 798 i.1. Therefore this ATS documentation is also based on the guidance provided in ETSI
20、 EG 202 798 i.1. Modal verbs terminology In the present document “shall“, “shall not“, “should“, “should not“, “may“, “may not“, “need“, “need not“, “will“, “will not“, “can“ and “cannot“ are to be interpreted as described in clause 3.2 of the ETSI Drafting Rules (Verbal forms for the expression of
21、provisions). “must“ and “must not“ are NOT allowed in ETSI deliverables except when used in direct citation. ETSI ETSI TS 103 241-3 V1.1.1 (2014-12)61 Scope The present document contains the Abstract Test Suite (ATS) for DS-Lite technology as defined in RFC 6333 1 and addressing specific cable indus
22、try requirements as defined in ETSI TS 101 569-1 11 in compliance with the relevant requirements and in accordance with the relevant guidance given in ISO/IEC 9646-7 5. The objective of the present document is to provide a basis for conformance tests for DS-Lite technology equipment giving a high pr
23、obability of inter-operability between different manufacturers equipment. The ISO standard for the methodology of conformance testing (ISO/IEC 9646-1 2 and ISO/IEC 9646-2 3) as well as the ETSI rules for conformance testing (ETSI ETS 300 406 6) are used as a basis for the test methodology. 2 Referen
24、ces References are either specific (identified by date of publication and/or edition number or version number) or non-specific. For specific references, only the cited version applies. For non-specific references, the latest version of the reference document (including any amendments) applies. Refer
25、enced documents which are not found to be publicly available in the expected location might be found at http:/docbox.etsi.org/Reference. NOTE: While any hyperlinks included in this clause were valid at the time of publication, ETSI cannot guarantee their long term validity. 2.1 Normative references
26、The following referenced documents are necessary for the application of the present document. 1 IETF RFC 6333: “Dual-Stack Lite Broadband Deployments Following IPv4 Exhaustion“. 2 ISO/IEC 9646-1 (1994): “Information technology - Open Systems Interconnection - Conformance testing methodology and fram
27、ework - Part 1: General concepts“. 3 ISO/IEC 9646-2 (1994): “Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 2: Abstract Test Suite specification“. 4 ISO/IEC 9646-6 (1994): “Information technology - Open Systems Interconnection - Conforman
28、ce testing methodology and framework - Part 6: Protocol profile test specification“. 5 ISO/IEC 9646-7 (1995): “Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 7: Implementation Conformance Statements“. 6 ETSI ETS 300 406 (1995): “Methods f
29、or testing and Specification (MTS); Protocol and profile conformance testing specifications; Standardization methodology“. 7 ETSI ES 201 873-1: “Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 1: TTCN-3 Core Language“. 8 Void. 9 Void. 10 ETSI TS 103
30、 241-2: “Integrated broadband cable telecommunication networks (CABLE); Testing; Conformance test specifications for DS-Lite technology; Part 2: Test Suite Structure and Test Purposes (TSS Cable Network Transition to IPv6; Part 1: IPv6 Transition Requirements“. ETSI ETSI TS 103 241-3 V1.1.1 (2014-12
31、)72.2 Informative references The following referenced documents are not necessary for the application of the present document but they assist the user with regard to a particular subject area. i.1 ETSI EG 202 798: “Intelligent Transport Systems (ITS); Testing; Framework for conformance and interoper
32、ability testing“. 3 Definitions and abbreviations 3.1 Definitions For the purposes of the present document, the terms and definitions given in ETSI TS 101 569-1 11, ISO/IEC 9646-1 2 and ISO/IEC 9646-7 5 apply. 3.2 Abbreviations For the purposes of the present document, the following abbreviations ap
33、ply. 3GPP Third Generation Partnership Project AFTR Address Family Transition Router ASP Abstract Services Primitives ATM Abstract Test Method ATS Abstract Test Suite B4 (DS-Lite) Basic Bridging BroadBand element CPE Customer Premises Equipment DHCP Dynamic Host Configuration Protocol DNS Domain Nam
34、e System FTP File Transfer Protocol GRT Global Routing Table HTML HyperText Markup Language HTTP HyperText Transfer Protocol IP Internet Protocol IPv4 IP version 4 IPv6 IP version 6 IUT Implementation Under Test MSS Maximum Segment Size MTC Main Test Component MTS Methods for Testing and Specificati
35、on OSI Open System Interconnection PA Platform Adaptor PDU Protocol Data Unit PICS Protocol Implementation Conformance Statement PIXIT Protocol Implementation Extra Information for Testing PTC Parallel Test Component SUT System Under Test TA Test Adaptor TC Test CaseTCP Transmission Control Protocol
36、 TP Test Purpose TSS Test Suite Structure TTCN Testing and Test Control Notation VRF Virtual Routing and Forwarding ETSI ETSI TS 103 241-3 V1.1.1 (2014-12)84 Abstract test method This clause describes the ATM used to test the DS-Lite technology. 4.1 Abstract protocol tester An abstract protocol test
37、er presented in figure 1 is a process providing the test behaviour for testing an IUT. Thus it will emulate an entity which is capable of proving the IUT functionalities. This type of test architecture provides a situation of communication which is equivalent to real operation between real devices.
38、The test system will simulate valid and invalid behaviours, and will analyse the reaction of the IUT. Then the test verdict, e.g. pass or fail, will depend on the result of this analysis. Thus this type of test architecture enables to focus the test objective on the IUT behaviour only. In order to a
39、ccess an IUT, the corresponding abstract protocol tester needs to use lower layers to establish a proper connection to the system under test (SUT) over a physical link (Lower layers link). Figure 1: Generic abstract protocol tester The “Protocol Data Units“ (PDUs) are the messages exchanged between
40、the IUT and the abstract protocol tester which permits to trigger the IUT and to analyse its reactionThe result of the analysis allows to assign the test verdict. Further control actions on the IUT may be necessary from inside the SUT, for instance to simulate a primitive from the upper layer or the
41、 management/security entity. Further details on such control actions are provided by means of an upper tester presented in clause 4.3. The above “Abstract Test Method“ (ATM) is well defined in ISO/IEC 9646-1 2 and supports a wide range of approaches for testing including the TTCN-3 abstract test lan
42、guage 7. The abstract protocol tester used for DS-Lite test suite is described in figure 2. The test system will send and receive IP packets, by using other upper layer protocols such as DHCP, DNS and FTP, in order to analyse DS-Lite functionality. ETSI ETSI TS 103 241-3 V1.1.1 (2014-12)9NOTE: * Tho
43、se protocols are used to prove certain DS-Lite functionalities. Figure 2: Abstract Protocol Tester - DS-Lite 4.2 Test configurations The test suite for DS-Lite uses two test configurations in order to cover the different test scenarios. Distinction between the two configurations is given by the two
44、main components in DS-Lite, which are B4 and AFTR. 4.2.1 CF01: B4 as IUT In this configuration, the B4 is the IUT and the test system simulates an AFTR in one side and a IPv4 host in the other side. Figure 3: CF01, B4 equipment is the IUT B4 - IUT Test system (TTCN-3) Host - Simulated AFTR - Simulat
45、ed Test System IPv4/IPv6 Ethernet System Under Test DS-Lite Functionality IPv4/IPv6 Ethernet Lower Layers Link IP packets DNS/DHCP/ FTP/HTTP/etc* ETSI ETSI TS 103 241-3 V1.1.1 (2014-12)104.2.2 CF02: AFTR as IUT In this configuration, the AFTR is the IUT and the test system simulates a B4 equipment i
46、n one side and an IPv4 host in the other side. Figure 4: CF02, AFTR equipment is the IUT 4.3 TTCN-3 Test architecture In general, a conformance test system architecture based on TTCN-3 is as figure 5 shows. Figure 5: Global test architecture The “System Under Test“ (SUT) contains: The “Implementatio
47、n Under Test“ (IUT), i.e. the object of the test. The “Upper tester application“ enables to trigger or capture some actions (i.e. higher layer service primitives) on the IUT. The “DS-Lite lower layers“ enable to establish a proper connection to the system under test (SUT) over a physical link (Lower
48、 layer transport link). DS-Lite Test System Test control DS-Lite Abstract Test Suite Codec Test adaptor Upper tester transport DS-Lite lower Layers SUT Upper tester application DS-Lite IUT DS-Lite lower Layers Upper tester transport Upper tester transport link Lower layer transport link AFTR - IUT T
49、est system (TTCN-3) Host - Simulated B4/Host - Simulated ETSI ETSI TS 103 241-3 V1.1.1 (2014-12)11 The “Upper tester transport“ is a functionality, which enables the test system to communicate with the upper tester application. Then the upper tester can be controlled by a TTCN-3 test component as part of the test process. The “DS-Lite test system“ contains: The “TTCN-3 test components“ are processes providing the test behaviour. The test behaviour may be provided as one single process or may require several
