FORD FLTM BJ 012-04-2001 VEHICLE CYCLING TEST《车辆循环负荷试验》.pdf

上传人:deputyduring120 文档编号:747090 上传时间:2019-01-14 格式:PDF 页数:2 大小:29.74KB
下载 相关 举报
FORD FLTM BJ 012-04-2001 VEHICLE CYCLING TEST《车辆循环负荷试验》.pdf_第1页
第1页 / 共2页
FORD FLTM BJ 012-04-2001 VEHICLE CYCLING TEST《车辆循环负荷试验》.pdf_第2页
第2页 / 共2页
亲,该文档总共2页,全部预览完了,如果喜欢就下载吧!
资源描述

1、 FORD LABORATORY TEST METHOD BJ 012-04 Date Action Revisions 2001 07 24 Revised Editorial no technical change A. Cockman 1992 05 12 Printed copies are uncontrolled Page 1 of 2 Copyright 2001, Ford Global Technologies, Inc. VEHICLE CYCLING TEST Application This cycling procedure is established to pro

2、vide a uniform method of accelerated transmission endurance testing for evaluation of candidate automatic transmission fluids using a 3-speed Ford-built automatic transmission. The particular model and series transmission will be specified by Ford Motor Company, Transmission the transmission must sh

3、ift to second gear. Decelerate in second until an automatic 2-1 zero-throttle downshift occurs. 4. Move the selector lever to D1 position and repeat 2 and 3. The sequence 2, 3, 4 constitutes a cycle. 5. Succeeding cycles must not occur more frequently than every .85 miles, as indicated by the test v

4、ehicle odometer. 6. Once every ten miles (approximately) stop the vehicle, move the selector lever to reverse position and back up 75 ft in not more than 5 s, stop, then continue forward cycling. 7. Transmission front pump oil temperature must not exceed 250 F at any time during the test operation.

5、8. Transmission oil must not be added during the test. If sufficient oil is lost, due to any cause during the test that prevents normal operation of the transmission, the test data obtained is not acceptable. Do not add oil. Band Adjustment Procedure 1. Cruise-O-Matic front band: Adjust only at comp

6、letion of 4000 cycles. Use band adjustment procedure specified in the appropriate vehicle service manual except if adjustment required is less than one full turn, reset to maintain the factory setting. If adjustment required is more than one turn, set to one turn. Cruise-O-Matic rear band: Adjust to

7、 one and one-half turns or to factory setting, whichever is smaller. 2. C-4 COM forward band: Adjust only at completion of 4,000 cycles, using procedure specified in service manual, adjust to one and one-half turns or to setting, whichever is smaller. C-4 COM low-reverse band: Adjust to three turns or to factory setting, whichever is smaller. Chemicals, materials, parts, and equipment referenced in this document must be used and handled properly. Each party is responsible for determining proper use and handling in its facilities.

展开阅读全文
相关资源
猜你喜欢
  • DLA SMD-5962-91726 REV A-2008 MICROCIRCUIT DIGITAL BIPOLAR CMOS SCAN TEST DEVICE WITH OCTAL BUFFER THREE-STATE OUTPUTS MONOLITHIC SILICON《配备三态输出单片八进制的缓冲器的微电路数字式双极CMOS扫描试验设备》.pdf DLA SMD-5962-91726 REV A-2008 MICROCIRCUIT DIGITAL BIPOLAR CMOS SCAN TEST DEVICE WITH OCTAL BUFFER THREE-STATE OUTPUTS MONOLITHIC SILICON《配备三态输出单片八进制的缓冲器的微电路数字式双极CMOS扫描试验设备》.pdf
  • DLA SMD-5962-91729 REV B-2005 MICROCIRCUIT LINEAR DUAL RS-232 TRANSCEIVER MONOLITHIC SILICON《硅单块 双RS-232接收器 直线式微型电路》.pdf DLA SMD-5962-91729 REV B-2005 MICROCIRCUIT LINEAR DUAL RS-232 TRANSCEIVER MONOLITHIC SILICON《硅单块 双RS-232接收器 直线式微型电路》.pdf
  • DLA SMD-5962-91732-1993 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS 3-TO-8 LINE DECODER DEMULTIPLEXOR TTL COMPATIBLE MONOLITHIC SILICON《硅单块 晶体管-晶体管逻辑电路兼容 3到8线译码器或光学多路分解器 高速互补金属氧化物半导体 数字微型.pdf DLA SMD-5962-91732-1993 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS 3-TO-8 LINE DECODER DEMULTIPLEXOR TTL COMPATIBLE MONOLITHIC SILICON《硅单块 晶体管-晶体管逻辑电路兼容 3到8线译码器或光学多路分解器 高速互补金属氧化物半导体 数字微型.pdf
  • DLA SMD-5962-91734 REV B-1995 MICROCIRCUIT LINEAR MIL-STD-1553 AND MIL-STD-1760 BC RTU MT MULTIPLEXED TERMINAL HYBRID《混合多路复用终端 深度导电仪或远程终端设备或主定时器 MIL-STD-1553和MIL-STD-1760 直线式微型电路》.pdf DLA SMD-5962-91734 REV B-1995 MICROCIRCUIT LINEAR MIL-STD-1553 AND MIL-STD-1760 BC RTU MT MULTIPLEXED TERMINAL HYBRID《混合多路复用终端 深度导电仪或远程终端设备或主定时器 MIL-STD-1553和MIL-STD-1760 直线式微型电路》.pdf
  • DLA SMD-5962-91736 REV D-2012 MICROCIRCUIT HYBRID LINEAR 11 8-VOLT SYNCHRO AND RESOLVER TO DIGITAL CONVERTER.pdf DLA SMD-5962-91736 REV D-2012 MICROCIRCUIT HYBRID LINEAR 11 8-VOLT SYNCHRO AND RESOLVER TO DIGITAL CONVERTER.pdf
  • DLA SMD-5962-91738 REV A-2005 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL D-TYPE MONOLITHIC SILICON《硅单块 八进制D型改进型肖特基晶体管晶体管逻辑电路 双极数字微型电路》.pdf DLA SMD-5962-91738 REV A-2005 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL D-TYPE MONOLITHIC SILICON《硅单块 八进制D型改进型肖特基晶体管晶体管逻辑电路 双极数字微型电路》.pdf
  • DLA SMD-5962-91740 REV A-2009 MICROCIRCUIT CMOS 16 BIT DIGITAL-TO-ANALOG MULTIPLYING CONVERTER MONOLITHIC SILICON.pdf DLA SMD-5962-91740 REV A-2009 MICROCIRCUIT CMOS 16 BIT DIGITAL-TO-ANALOG MULTIPLYING CONVERTER MONOLITHIC SILICON.pdf
  • DLA SMD-5962-91744 REV B-2006 MICROCIRCUIT MEMORY DIGITAL CMOS REGISTERED 32K X 8-BIT UVEPROM MONOLITHIC SILICON《硅单块 互补金属氧化物半导体记名32K X 8比特紫外线消除式可程序化只读存储器 数字主储存器微型电路》.pdf DLA SMD-5962-91744 REV B-2006 MICROCIRCUIT MEMORY DIGITAL CMOS REGISTERED 32K X 8-BIT UVEPROM MONOLITHIC SILICON《硅单块 互补金属氧化物半导体记名32K X 8比特紫外线消除式可程序化只读存储器 数字主储存器微型电路》.pdf
  • DLA SMD-5962-91746 REV A-2008 MICROCIRCUIT DIGITAL BIPOLAR CMOS SCAN TEST DEVICE WITH OCTAL BUFFER INVERTING THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-91746 REV A-2008 MICROCIRCUIT DIGITAL BIPOLAR CMOS SCAN TEST DEVICE WITH OCTAL BUFFER INVERTING THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1