FORD FLTM EU-BJ 002-01-2001 STEAM EMULSIFICATION TEST ON OILS《油的蒸汽乳化试验》.pdf

上传人:feelhesitate105 文档编号:747805 上传时间:2019-01-14 格式:PDF 页数:3 大小:89.82KB
下载 相关 举报
FORD FLTM EU-BJ 002-01-2001 STEAM EMULSIFICATION TEST ON OILS《油的蒸汽乳化试验》.pdf_第1页
第1页 / 共3页
FORD FLTM EU-BJ 002-01-2001 STEAM EMULSIFICATION TEST ON OILS《油的蒸汽乳化试验》.pdf_第2页
第2页 / 共3页
FORD FLTM EU-BJ 002-01-2001 STEAM EMULSIFICATION TEST ON OILS《油的蒸汽乳化试验》.pdf_第3页
第3页 / 共3页
亲,该文档总共3页,全部预览完了,如果喜欢就下载吧!
资源描述

1、FORD LABORATORY TEST METHOD EU-BJ 002-01 Date Action 2001 0723 Revised 1994 02 28 STEAM EMULSIFICATION TEST ON OILS Revisions Editorial - no technical change A. Cockman Application This method is used to determine the resistance to emulsification with water of turbine, hydraulic and quenching oils.

2、Apparatus and Materials Required (See Sketch) Graduated Measuring Cylinder 250 mL, approx 40 mm dia, heat resistant, tall form, with round bottom (A). Delivery Tube Glass, 7 mm inner dia (B) 60“ angle on the immersed end (H). Distillation Flask 1 O00 mL, coppedpyrex (C) or equivalent. Column 7 mm in

3、ner dia, approx 1 m in length (D). Retort Stands and Clamps (F) Bunsen Burner (G) Demineralised Water Chromic Acid Acetone Stop Watch Conditioning and Test Conditions All test values indicated herein are based on material conditioned in a controlled atmosphere of 23 +/- 2 “C and 50 +/- 5 % relative

4、humidity for not less than 24 h prior to testing and tested under the same conditions unless otherwise specified. Copynght02001, Ford Global Technologies, Inc FORD LABORATORY TEST METHOD EU-BJ 002-01 Procedure 1. Clean the measuring cylinder and glass tubing first with acetone and then with chromic

5、acid and rinse free of acid with demineralised water. 2. Pour 50 mL of demineralised water and 1 O0 mL of the oil under test into the measuring cylinder and heat in a water bath at a temperature of 1 O0 OC for 1 O minutes. 3. After removing, clamp the measuring cylinder on the retort stand and immer

6、se the glass tubing (B) into the water and pass steam for a period of 1 O minutes. 4. Remove the glass tubing and again heat the measuring cylinder in the water bath at a temperature of 100 OC for another 10 minutes. Evaluation Immediately after removal from the water bath, examine and record as fol

7、lows: No emulsification Light emulsification Heavy emulsification A clear separation line between non-emulsified oil and water. A fine foamy oil emulsion layer of maximum 2 mm thickness between oil and water. The oil emulsion layer exceeds the thickness of 2 mm. or the total oil is emulsified with w

8、ater. Note: A coarse foamy layer is not considered to be an emulsification of the oil with water and as such is not reported. Chemicals, materials, parts, and equipment referenced in this document must be used and handled properly. Each party is responsible for determining proper use and handling in

9、 its facilities. Page 2 of 3 Copynght02001, Ford Global Technologies, Inc FORD LABORATORY TEST METHOD EU-BJ 002-01 cl F i STEAM EMULSIFICATION TEST ON OILS D B A = ml Graduated Measuring Cylinder B = Glass Tubing C = Steam Distillation D = Ascending Tube F = Support Stand G = Bunsen Burner H = 60“ angle on Glass Tubing Page 3 of 3 Copynght02001, Ford Global Technologies, Inc

展开阅读全文
相关资源
猜你喜欢
  • DLA SMD-5962-95766 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS DUAL 4-INPUT AND GATE TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体双重4输入晶体管兼容输入硅单片电.pdf DLA SMD-5962-95766 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS DUAL 4-INPUT AND GATE TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体双重4输入晶体管兼容输入硅单片电.pdf
  • DLA SMD-5962-95767 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS DUAL 2-BIT BISTABLE TRANSPARENT LATCH TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体.pdf DLA SMD-5962-95767 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS DUAL 2-BIT BISTABLE TRANSPARENT LATCH TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体.pdf
  • DLA SMD-5962-95768 REV C-2009 MICROCIRCUIT DIGITAL HIGH SPEED CMOS RADIATION HARDENED 4-BIT MAGNITUDE COMPARATOR TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-95768 REV C-2009 MICROCIRCUIT DIGITAL HIGH SPEED CMOS RADIATION HARDENED 4-BIT MAGNITUDE COMPARATOR TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-95769 REV C-1999 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS DUAL J-K FLIP-FLOP WITH SET AND RESET TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体.pdf DLA SMD-5962-95769 REV C-1999 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS DUAL J-K FLIP-FLOP WITH SET AND RESET TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体.pdf
  • DLA SMD-5962-95770 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS 4-BIT BINARY SYNCHRONOUS COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体 4-BI.pdf DLA SMD-5962-95770 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS 4-BIT BINARY SYNCHRONOUS COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导体 4-BI.pdf
  • DLA SMD-5962-95771 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS SYNCHRONOUS BCD DECADE UP DOWN COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导.pdf DLA SMD-5962-95771 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS SYNCHRONOUS BCD DECADE UP DOWN COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半导.pdf
  • DLA SMD-5962-95772 REV B-2004 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS INVERTING OCTAL BUFFER LINE DRIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC S.pdf DLA SMD-5962-95772 REV B-2004 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS INVERTING OCTAL BUFFER LINE DRIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC S.pdf
  • DLA SMD-5962-95774 REV B-2004 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS 4-BIT BINARY FULL ADDER WITH FAST CARRY TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半.pdf DLA SMD-5962-95774 REV B-2004 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS 4-BIT BINARY FULL ADDER WITH FAST CARRY TTL COMPATIBLE INPUTS MONOLITHIC SILICON《高速抗辐射互补金属氧化物半.pdf
  • DLA SMD-5962-95775 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS NON-INVERTING HEX BUFFER LINE DRIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC.pdf DLA SMD-5962-95775 REV A-1998 MICROCIRCUIT DIGITAL RADIATION HARDENED HIGH SPEED CMOS NON-INVERTING HEX BUFFER LINE DRIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1