GEIA-STD-0001-2005 IBIS Interconnect Modeling Specification (Formerly TechAmerica GEIA-STD-0001)《IBIS互连建模规范》.pdf

上传人:boatfragile160 文档编号:754586 上传时间:2019-01-19 格式:PDF 页数:76 大小:2.83MB
下载 相关 举报
GEIA-STD-0001-2005 IBIS Interconnect Modeling Specification (Formerly TechAmerica GEIA-STD-0001)《IBIS互连建模规范》.pdf_第1页
第1页 / 共76页
GEIA-STD-0001-2005 IBIS Interconnect Modeling Specification (Formerly TechAmerica GEIA-STD-0001)《IBIS互连建模规范》.pdf_第2页
第2页 / 共76页
GEIA-STD-0001-2005 IBIS Interconnect Modeling Specification (Formerly TechAmerica GEIA-STD-0001)《IBIS互连建模规范》.pdf_第3页
第3页 / 共76页
GEIA-STD-0001-2005 IBIS Interconnect Modeling Specification (Formerly TechAmerica GEIA-STD-0001)《IBIS互连建模规范》.pdf_第4页
第4页 / 共76页
GEIA-STD-0001-2005 IBIS Interconnect Modeling Specification (Formerly TechAmerica GEIA-STD-0001)《IBIS互连建模规范》.pdf_第5页
第5页 / 共76页
点击查看更多>>
资源描述

1、GEIA-STD-000 1 Approved: 10/07/2005 GEIA STANDARD IBIS Interconnect Modeling Specification GEIA-STD-0001 October 2005 GOVERNMENT ELECTRONICS AND INFORMATION TECHNOLOGY ASSOCIATION A Sector of the Electronic Industries Alliunc Copyright Government Electronics therefore it is enough to use only the pr

2、efixes to scale the parameters. However, for clarity, it is allowed to use full abbreviations for the units, (e.g., pF, nH I mA, m0hm). In addition, scientific notation IS allowed (e.g., 1.2345e-12). 10) All temperatures are represented in degrees Celsius. 11) All lines that occur before the Begin H

3、eader keyword or after the End keyword shall be treated as comments and ignored by the parser. The intent of this rule is to facilitate the inclusion of HTML tags, revision control headers, etc. at the beginning of the ICM file. 12) The following words are reserved words and must not be used for any

4、 other purposes in the document: POWER - reserved model name, used with power supply pins, GND - reserved model name, used with ground pins, NC - reserved model name, used with no-connect pins, NA - used where data not available. 13) Unless explicitly overridden by the subparameter description, a si

5、ngle numeric argument is separated from its associated subparameter by an equals sign (=); white space around the equals sign is optional. A set of numeric values (such as typ, min and max values) is separated from its associated subparameter by white space, without an equals sign. Symbolic (text) a

6、rguments are separated from their associated subparameter by one or more white spaces. 14) Note that the text here, in many cases, assumes that the model data describes a connector. However, other types of interconnect can be modeled using the ICM format; in these cases, the words “pin“ and “port“ i

7、n the text below can be interpreted to refer to the locations where the interconnect is accessed for probing, measurement or analysis. 6 Copyright Government Electronics one stub matrix is re-used, and another stub is repeated Begin ICM Model MyModelExample4 ICM - model - type MLM Tree Path Descript

8、ion Model pinmap MyModelPinMapA Section Mult=l A Fork Section Mult=l stubl Section Mult=l stub2 Section Mult=l stubl Endfork Section Mult=l B Fork Endfork Section Mult=l C Model - pinmap MyModelPinMapB Section Mult=2 stub4 End ICM Model . Example 5: 2 ports per conductor, 3 stubs Begin ICM Model MyM

9、odel4 ICM model type MLM Tree-Path Description Model pinmap MyModelPinMapA Section Mult=l A Fork Endfork Fork Section Mult=l Stubl Section Mult=l B Section Mult=l Stub2 Section Mult=l Stub3 Section Mult=l Stub4 Endfork 26 Copyright Government Electronics & Information Technology Association Reproduced by IHS under license with GEIA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-

展开阅读全文
相关资源
猜你喜欢
  • EN 61290-4-1-2016 en Optical amplifiers - Test methods - Part 4-1 Gain transient parameters - Two-wavelength method.pdf EN 61290-4-1-2016 en Optical amplifiers - Test methods - Part 4-1 Gain transient parameters - Two-wavelength method.pdf
  • EN 61290-4-2-2011 en Optical amplifiers - Test methods - Part 4-2 Gain transient parameters - Broadband source method《光学放大器 试验方法 第4-2部分 瞬态增益参数 宽带源法》.pdf EN 61290-4-2-2011 en Optical amplifiers - Test methods - Part 4-2 Gain transient parameters - Broadband source method《光学放大器 试验方法 第4-2部分 瞬态增益参数 宽带源法》.pdf
  • EN 61290-4-3-2015 en Optical amplifiers - Test methods - Part 4-3 Power transient parameters - Single channel optical amplifiers in output power control.pdf EN 61290-4-3-2015 en Optical amplifiers - Test methods - Part 4-3 Power transient parameters - Single channel optical amplifiers in output power control.pdf
  • EN 61290-5-1-2006 en Optical amplifiers - Test methods Part 5-1 Reflectance parameters - Optical spectrum analyzer method《光学放大器的试验方法 第5-1部分 反射参数 光学频谱分析仪法 IEC 61290-5-1》.pdf EN 61290-5-1-2006 en Optical amplifiers - Test methods Part 5-1 Reflectance parameters - Optical spectrum analyzer method《光学放大器的试验方法 第5-1部分 反射参数 光学频谱分析仪法 IEC 61290-5-1》.pdf
  • EN 61290-5-2-2004 en Optical amplifiers Test methods Part 5-2 Reflectance parameters Electrical spectrum analyser method《光纤放大器 试验方法 第5-2部分 反射参数 电频谱分析仪法 IEC 61290-5-2-2003》.pdf EN 61290-5-2-2004 en Optical amplifiers Test methods Part 5-2 Reflectance parameters Electrical spectrum analyser method《光纤放大器 试验方法 第5-2部分 反射参数 电频谱分析仪法 IEC 61290-5-2-2003》.pdf
  • EN 61290-5-3-2002 en Optical Fibre Amplifiers - Basic Specification Part 5-3 Test Methods for Reflectance Parameters - Reflectance Tolerance Using an Electrical Spectrum Analyser《光.pdf EN 61290-5-3-2002 en Optical Fibre Amplifiers - Basic Specification Part 5-3 Test Methods for Reflectance Parameters - Reflectance Tolerance Using an Electrical Spectrum Analyser《光.pdf
  • EN 61290-6-1-1998 en Optical Fibre Amplifiers - Basic Specification Part 6-1 Test Methods for Pump Leakage Parameters Optical Demultiplexer《光纤放大器 基本规范 第6-1部分 泵漏参数的试验方法 光信号分离器 IEC 6.pdf EN 61290-6-1-1998 en Optical Fibre Amplifiers - Basic Specification Part 6-1 Test Methods for Pump Leakage Parameters Optical Demultiplexer《光纤放大器 基本规范 第6-1部分 泵漏参数的试验方法 光信号分离器 IEC 6.pdf
  • EN 61290-7-1-2007 en Optical amplifiers - Test methods - Part 7-1 Out-of-band insertion losses - Filtered optical power meter method《光学放大器 试验方法 第7-1部分 频带外介入损耗 滤波光功率表法》.pdf EN 61290-7-1-2007 en Optical amplifiers - Test methods - Part 7-1 Out-of-band insertion losses - Filtered optical power meter method《光学放大器 试验方法 第7-1部分 频带外介入损耗 滤波光功率表法》.pdf
  • EN 61291-1-2012 en Optical amplifiers - Part 1 Generic specification.pdf EN 61291-1-2012 en Optical amplifiers - Part 1 Generic specification.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1