GMKOREA EDS-T-4512-2008 TEST PROCEDURE OF TORSIONAL STRENGTH FOR SEAT BACK.pdf

上传人:inwarn120 文档编号:757041 上传时间:2019-01-19 格式:PDF 页数:3 大小:86.30KB
下载 相关 举报
GMKOREA EDS-T-4512-2008 TEST PROCEDURE OF TORSIONAL STRENGTH FOR SEAT BACK.pdf_第1页
第1页 / 共3页
GMKOREA EDS-T-4512-2008 TEST PROCEDURE OF TORSIONAL STRENGTH FOR SEAT BACK.pdf_第2页
第2页 / 共3页
GMKOREA EDS-T-4512-2008 TEST PROCEDURE OF TORSIONAL STRENGTH FOR SEAT BACK.pdf_第3页
第3页 / 共3页
亲,该文档总共3页,全部预览完了,如果喜欢就下载吧!
资源描述

1、GM DAEWOO Auto & Technology EDS Engineering, GM DAEWOO Auto & Technology Standards TEST PROCEDURE OF TORSIONAL STRENGTH FOR SEAT BACK Do Not Use on New Programs. Being Replaced by GMW14608 EDS-T-4512 ISSUED DATE: 1998. 02. 26 REVISED DATE: 2008. 10. 15 VERSION: 3 (Superceded) EDS-T-4512TEST PROCEDUR

2、E OF TORSIONAL STRENGTH FOR SEAT BACK PAGE: 1/2 ISSUED DATE: 1998. 02. 26 REVISED DATE: 2008. 10. 15 VERSION: 3 GM DAEWOO Auto & Technology Note: This standard may be applied only for current project (incl. T255 Program). It is Superceded for all future projects and replaced by GMW14608. 1. PURPOSE

3、This procedure verifies the torsional strength of the front seat back. 2. SCOPE All types of seats equipped with side recliners. 3. TEST SAMPLES Minimum three new seat frames or assembled seats 4. TEST EQUIPMENT AND JIG 4.1. Jig for fitting seats in actual field conditions 4.2. Leveling surface tabl

4、e 4.3. Measuring instruments for loads and length The measuring instruments shall measure the load and the length displacement with maximum resolution of 0.5 kgf and 0.5 mm respectively. 4.4. Weight loading equipment Equipment capable of loading weight greater than 200 kgf 4.5. Recorder A recorder c

5、apable of recording the load and the displacement in load vs. displacement graphs 4.6. Weight loading jig A steel sheet with diameter of 100 mm or a wire that is not subject to deformation upon the weight loading 5. METHODS AND SPECIFICATIONS OF TEST 5.1. Preparation 5.1.1. Fit the seat-fixing jig o

6、n the leveling surface table, and then mount a seat on the jig. 5.1.2. Set the angle of the seat back to the value specified in the design standard. If the position in the design standard is unknown, set the angle at 25 28 backward. 5.1.3. Set the adjuster systems of the seat as follows: (1) Guide r

7、ail: the center position EDS-T-4512TEST PROCEDURE OF TORSIONAL STRENGTH FOR SEAT BACK PAGE: 2/2 ISSUED DATE: 1998. 02. 26 REVISED DATE: 2008. 10. 15 VERSION: 3 GM DAEWOO Auto & Technology (2) Height adjuster system: the lowermost position 5.2. Test Method Load the weight of 120 kgf on the end point

8、R) (fig. 2) of the upper crossbar hinge on the back frame in the direction shown in fig. 1. Measure the displacement and the load data in the displacement vs. load graphs (Measure the displacement at the weight loading point in the loading direction). 5.3. Evaluation 5.3.1. The permanent transformation shall be smaller than 65 mm. 5.3.2. The transformation shall satisfy the conditions in fig. 3. Fig. 1 Fig. 2 Fig. 3

展开阅读全文
相关资源
猜你喜欢
  • DLA SMD-5962-97563 REV A-1998 MICROCIRCUIT HYBRID ANALOG TO DIGITAL CONVERTER 10-BIT 100 MSPS《100-BIT 100多相串行-并行-串行存贮器类似体对数字转换器混合微电路》.pdf DLA SMD-5962-97563 REV A-1998 MICROCIRCUIT HYBRID ANALOG TO DIGITAL CONVERTER 10-BIT 100 MSPS《100-BIT 100多相串行-并行-串行存贮器类似体对数字转换器混合微电路》.pdf
  • DLA SMD-5962-97564 REV C-2012 MICROCIRCUIT DIGITAL-LINEAR 16-BIT ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE MONOLITHIC SILICON.pdf DLA SMD-5962-97564 REV C-2012 MICROCIRCUIT DIGITAL-LINEAR 16-BIT ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE MONOLITHIC SILICON.pdf
  • DLA SMD-5962-97571 REV A-2009 MICROCIRCUIT DIGITAL ADVANCED HIGH-SPEED CMOS QUADRUPLE 2-INPUT POSITIVE-NOR GATE TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-97571 REV A-2009 MICROCIRCUIT DIGITAL ADVANCED HIGH-SPEED CMOS QUADRUPLE 2-INPUT POSITIVE-NOR GATE TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-97572 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES MONOLITHIC SILICON《四重2输入排外的硅单片电路数字双极微电路》.pdf DLA SMD-5962-97572 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES MONOLITHIC SILICON《四重2输入排外的硅单片电路数字双极微电路》.pdf
  • DLA SMD-5962-97574 REV D-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-97574 REV D-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-97575 REV C-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-97575 REV C-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-97576 REV C-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf DLA SMD-5962-97576 REV C-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf
  • DLA SMD-5962-97577 REV A-2006 MICROCIRCUITS DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL QUADRUPLE 2-INPUT POSITIVE-NAND GATES MONOLITHIC SILICON《四重2输入阳性与门硅单片电路数字双极微电路》.pdf DLA SMD-5962-97577 REV A-2006 MICROCIRCUITS DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL QUADRUPLE 2-INPUT POSITIVE-NAND GATES MONOLITHIC SILICON《四重2输入阳性与门硅单片电路数字双极微电路》.pdf
  • DLA SMD-5962-97578 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL QUADRUPLE 2-INPUT POSITIVE-NOR GATES MONOLITHIC SILICON《四重2输入阳性与门硅单片电路数字双极微电路》.pdf DLA SMD-5962-97578 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL QUADRUPLE 2-INPUT POSITIVE-NOR GATES MONOLITHIC SILICON《四重2输入阳性与门硅单片电路数字双极微电路》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1