1、JEDEC STANDARD Cycled Temperature-Humidity-Bias Life Test JESD22-A100D (Revision of JESD22-A100-C,October 2007) JULY 2013 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Direct
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7、r alternative contact information. Published by JEDEC Solid State Technology Association 2013 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual
8、agrees not to charge for or resell the resulting material. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. For information, contact: JEDEC Solid State Technology Associati
9、on 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards-Documents/Copyright Information. JEDEC Standard No. 22-A100D Page 1 Test Method A100D (Revision of A100C) TEST METHOD A100D CYCLED TEMPERATURE-HUMIDITY-BIAS LIFE TEST (From JEDEC Board Ballot
10、 JCB-13-26, formulated under the cognizance of JC-14.1 Committee on Reliability Test Methods for Packaged Devices.) 1 Scope The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 o
11、r JESD22-A110. The Cycled Temperature-humidity Biased Life Test is performed for the purpose of evaluating the reliability of non-hermetic, packaged solid state devices in humidity environments when surface condensation is likely. It employs conditions of bias, temperature cycling and high humidity
12、that will cause condensation to occur on the device surface. It is useful to determine device surface susceptibility to corrosion and/or dendritic growth. For most applications test method JESD22-A110 “Highly Accelerated Temperature and Humidity Stress Test (HAST)” or JESD22-A101 “Steady State Tempe
13、rature, Humidity, Biased Life Test” is preferred. 2 Apparatus The test requires a temperature-humidity test chamber capable of maintaining a specified temperature and relative humidity profile continuously, while providing electrical connections to the devices under test in a specified biasing confi
14、guration. 2.1 Temperature and relative humidity The chamber must be capable of providing controlled conditions of temperature and relative humidity as described in clause 3, Test Conditions. 2.2 Recording device A recording device (e.g. a chart recorder or a computer) with an interface to suitable c
15、hamber monitoring instrumentation shall be provided for continuous recording of chamber temperature and relative humidity. 2.3 Devices under stress Devices under stress must be physically located to minimize temperature gradients. 2.4 Minimize release of contamination Care must be exercised in the c
16、hoice of board and socket materials, to minimize release of contamination, and to minimize degradation due to corrosion and other mechanisms. JEDEC Standard No. 22-A100C Page 2 Test Method A100D (Revision of A100C) 2 Apparatus (contd) 2.5 Ionic contamination Ionic contamination of the test apparatus
17、 (card cage, test boards, sockets, wiring, storage containers, etc.) shall be controlled to avoid test artifacts. 2.6 Deionized water Deionized water with a minimum resistivity of 1 Mcm at room temperature shall be used. 3 Test Conditions The test condition consists of a temperature, relative humidi
18、ty, and duration used in conjunction with an electrical bias configuration specific to the device. 3.1 Temperature and relative humidity The devices under test shall be subjected to the temperature and humidity conditions shown in Figure 1. Unless otherwise specified in an applicable procurement doc
19、ument or specification sheet, the test duration shall be 1008 (-24, +168) hours. Figure 1 Temperature Profile with 2h 200mW e) Frequency and duty cycle of bias if cycled bias is to be used JEDEC Standard No. 22-A100C Page 6 Test Method A100D (Revision of A100C) Annex A (informative) Differences betw
20、een JESD22-A100D and JESD22-A100C This table briefly describes most of the changes made to entries that appear in this standard, JESD22-A100D, compared to its predecessor, JESD22-A100C (October 2007). If the change to a concept involves any words added or deleted (excluding deletion of accidentally
21、repeated words), it is included. Some punctuation changes are not included. Clause Description of change 2.6 change to Mcm 3.1 Figure 1: shift specified values from figure to text 7 In 7 d); add “or power per DUT is 200mW” Standard Improvement Form JEDEC JESD22-A100D The purpose of this form is to p
22、rovide the Technical Committees of JEDEC with input from the industry regarding usage of the subject standard. Individuals or companies are invited to submit comments to JEDEC. All comments will be collected and dispersed to the appropriate committee(s). If you can provide input, please complete thi
23、s form and return to: JEDEC Attn: Publications Department 3103 North 10thStreet Suite 240 South Arlington, VA 22201-2107 Fax: 703.907.7583 1. I recommend changes to the following: Requirement, clause number Test method number Clause number The referenced clause number has proven to be: Unclear Too Rigid In Error Other 2. Recommendations for correction: 3. Other suggestions for document improvement: Submitted by Name: Phone: Company: E-mail: Address: City/State/Zip: Date:
