1、JEDEC STANDARD Salt Atmosphere JESD22-A107C (Revision of JESD22A-107B, January 2004) APRIL 2013 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently
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8、r resell the resulting material. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street
9、Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards-Documents/Copyright Information. JEDEC Standard No. 22-A107C Page 1 Test method A107C Revision of A107B TEST METHOD A107C SALT ATMOSPHERE (From JEDEC Board Ballot JCB-13-20, formulated under the cognizance of JC-14.1
10、Subcommittee on Reliability Test Methods for Packaged Devices.) 1 Scope Salt atmosphere is a destructive, accelerated stress that simulates the effects of severe seacoast atmosphere on all exposed surfaces. Such stressing and post-stress testing determine the resistance of solid-state devices to cor
11、rosion and may be performed on commercial and industrial product in molded or hermetic packages. The stress conditions and test criteria are specified in the military standards listed below. The stresses and tests within these standards are similar and can be used for all package types. 2 Normative
12、references The following normative documents contain provisions that, through reference in this text, constitute provisions of this standard. MIL-STD-705-1, Environmental Test Methods for Semiconductor Devices. MIL-STD-883, Test Method Standard: Microcircuits. 3 Methods to be used for salt atmospher
13、e testing The latest revision of Method 1041 of MIL-STD-750-1 shall be used for discrete solid-state devices. The latest revision of Method 1009 of MIL-STD-883 shall be used for solid-state microcircuits, integrated circuits, hybrids, and modules. JEDEC Standard No. 31D.01 Page 2 Test method A107C R
14、evision of A107B Annex A (informative) Differences between JESD22-A107C and JESD22-A107B The entire stand-alone content of JESD22-A107B has been replaced by references to Military test methods. Standard Improvement Form JEDEC JESD22A107C The purpose of this form is to provide the Technical Committee
15、s of JEDEC with input from the industry regarding usage of the subject standard. Individuals or companies are invited to submit comments to JEDEC. All comments will be collected and dispersed to the appropriate committee(s). If you can provide input, please complete this form and return to: JEDEC At
16、tn: Publications Department 3103 North 10thStreet Suite 240 South Arlington, VA 22201-2107 Fax: 703.907.7583 1. I recommend changes to the following: Requirement, clause number Test method number Clause number The referenced clause number has proven to be: Unclear Too Rigid In Error Other 2. Recommendations for correction: 3. Other suggestions for document improvement: Submitted by Name: Phone: Company: E-mail: Address: City/State/Zip: Date:
