1、JEDEC STANDARD Method of Diode “Q” Measurement JESD381A (Reaffirmation of ANSI/EIA-381-A-1992) NOVEMBER 1981 (Reaffirmed and Revised: JULY 1992) (Reaffirmed: APRIL 1999, APRIL 2002) JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepar
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3、 interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are ado
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5、ncluded in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inqu
6、iries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or call (703) 907-7559 or www.jedec.org Published by JEDEC Solid State Technology Association 2002 2500 Wilson Boulevard Arlington, VA 22201-3834 This doc
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9、ber of copies through entering into a license agreement. For information, contact: JEDEC Solid State Technology Association 2500 Wilson Boulevard Arlington, Virginia 22201-3834 or call (703) 907-7559 Rev. 9/02 Standard Improvement Form JEDEC JESD381AThe purpose of this form is to provide the Technic
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11、edited in Acrobat Exchange) and return to: JEDEC Attn: Publications Department 2500 Wilson Blvd. Suite 220 Arlington, VA 22201-3834 Fax: 703.907.7583 1. I recommend changes to the following: Requirement, paragraph number Test method number Paragraph number The referenced paragraph number has proven to be: Unclear Too Rigid In Error Other 2. Recommendations for correction: 3. Other suggestions for document improvement: Submitted by Name: Phone: Company: E-mail: Address: City/State/Zip: Date:
