JEDEC JESD8-28-2015 300 mV Interface.pdf

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1、JEDEC STANDARD 300 mV Interface JESD8-28 JUNE 2015 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal cou

2、nsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the prop

3、er product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. By such action JEDEC

4、 does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from

5、the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard. No claims to be in conformance with this standard may be made unless all requirements stated in t

6、he standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under Standards and Documents for alternative contact information. Published by JEDEC Solid State Techn

7、ology Association 2015 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual agrees not to charge for or resell the resulting material. PRICE: Conta

8、ct JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or r

9、efer to www.jedec.org under Standards-Documents/Copyright Information. JEDEC Standard No. 8-28 Page 1 300mV Interface Standard (From JEDEC Board Ballot JCB-15-11, formulated under the cognizance of the JC-16 Committee on Interface Technology.) 1 Scope This standard is to define and interface with a

10、CMOS rail to rail signal that uses a 300 mV signal swing. This specification defines the maximum signaling rate, the signal levels, overshoot and undershoot limits, and the maximum input capacitance. This interface is useful in short distance applications, typically of less than 5 mm. An important a

11、pplication of this interface is for in-package, die-to-die interconnection. In-package applications may also take advantage of reduced ESD (Electro-Static Discharge) tolerance requirements. This interface may be used in both logic to memory and logic to logic applications. The memory used may be eit

12、her volatile or non-volatile. This specification only defines interface parameters. The function and interconnection of other parts of the devices is to be defined elsewhere. JEDEC Standard No. 8-28 Page 2 2 Standard specifications 2.1 RECOMMENDED DC operation conditions Table 1 Recommended DC opera

13、tion conditions 2.2 VDDQ tracking with internal logic voltage VDDAt any time, the internal logic voltage VDDshould be equal or larger than VDDQ. 2.3 Input capacitance definitions Table 2 Input capacitance definitions 2.4 Signal levels for input signals1. Table 3 Recommended operational signal voltag

14、e level specification 1Input signals include both Uni and BiDi signals. Parameter Symbol Min Typ Max Unit Supply Voltage for Driver / Receiver VDDQ0.285 0.3 0.315 V Receiver Reference Voltage VREF0.45* VDDQ0.5* VDDQ0.55* VDDQV Symbol Parameter Up to 2 Gbps Units NotesMin Max CinPad Capacitance for a

15、ll Input pins - 0.4 pF CioPad Capacitance for BiDi pins - 0.4 pF Parameter Symbol Min Max Unit* Input High Voltage VIH0.70 * VDDQVDDQ+ 0.2 V Input Low Voltage VIL-0.2 0.30 * VDDQV * ALL SIGNAL LEVELS ARE REFERENCED TO VSSQ. JEDEC Standard No. 8-28 Page 3 2 Standard specifications (contd) 2.5 Receive

16、r mask for input signals Maximum input receiver mask will be a rectangular box shape between VIHand VILand 45% of UI. NOTE A UI is Unit Interval of time needed to send one data bit, as 1 / (data rate) or 1 / (data frequency *2 for DDR signal). 2.6 Slew rate for input signals Minimum Input Slew rate

17、when operating up to 2 Gbps will be 1 V/ns. 2.7 Overshoot/Undershoot conditions for input signals Table 4 Overshoot/Undershoot conditions for input signals Parameter Up to 2 Gbps Units Max Maximum peak amplitude allowed for overshoot area (see Figure 1) 0.3 V Maximum peak amplitude allowed for under

18、shoot area (see Figure 1) 0.3 V Maximum area above VDDQ(see Figure 1)* 0.1 V-ns Maximum area below VSSQ(see Figure 1)* 0.1 V-ns * Max/Min area is only for 2 Gbps Figure 1 Overshoot and Undershoot Definition 1 UI VDDQMaximum Amplitude Overshoot Area VSSQVolts (V) Maximum Amplitude Undershoot Area Tim

19、eJEDEC Standard No. 8-28 Page 4 Standard Improvement Form JEDEC JESD8-28 The purpose of this form is to provide the Technical Committees of JEDEC with input from the industry regarding usage of the subject standard. Individuals or companies are invited to submit comments to JEDEC. All comments will

20、be collected and dispersed to the appropriate committee(s). If you can provide input, please complete this form and return to: JEDEC Attn: Publications Department 3103 North 10thStreet Suite 240 South Arlington, VA 22201-2107 Fax: 703.907.7583 1. I recommend changes to the following: Requirement, clause number The referenced clause number has proven to be: Unclear Too Rigid In Error Other 2. Recommendations for correction: 3. Other suggestions for document improvement: Submitted by Name: Phone: Company: E-mail: Address: City/State/Zip: Date:

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