JUS F B1 023-1984 Cotton fibres Classification《棉纤维 分类》.pdf

相关资源

IRS 70778-2-2018 Recommendations for determining the carrying capacity and fatigue risks of existing metallic railway bridges.pdf

IRS 70712-2018 Rail defects.pdf

IRS 50596-6-2018 Conditions for coding intermodal loading units in combined transport combined transport lines and wagons.pdf

IRS 50596-5-2018 Transport of road vehicles on wagons-Technical Organisation-Conveyance of semi-trailers with P coding or N coding on recess wagons.pdf

IESNA TM-23-2017 Lighting Control Protocols.pdf

IESNA RP-2-2017 Recommended Practice for Retail Lighting.pdf

ITU-R RAPPORT M 766-2 FRENCH-1990 Feasibility of frequency sharing between the GPS and other services《全球定位系统和其他服务之间的频率共享的可行性》.pdf

ITU-R RAPPORT M 763-3 FRENCH-1990 Signal level variation due to multipath effects and blockage by ship-s superstructure in maritime mobile-satellite service lin.pdf

ITU-R RAPPORT M 739-1 FRENCH-1986 Interference due to intermodulation products in the land mobile service between 25 and 100 MHz《由于互调产物在陆地移动服务25和100 MHz之间产生的干扰》.pdf

ITU-R RAPPORT M 319-7 FRENCH-1990 Characteristics of equipment and principles governing the assignment of frequency channels between 25 and 100 MHz for land mob.pdf

猜你喜欢

DIN EN 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST) (IEC 60749-4 2017) German ver.pdf

DIN EN 60749-40-2012 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge (IEC 60749-40 2011) German version EN .pdf

DIN EN 60749-42-2015 Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage (IEC 60749-42 2014) German version EN 60749-42 2014《半导体.pdf

DIN EN 60749-44-2017 Semiconductor devices - Mechanical and climatic test methods - Part 44 Neutron beam irradiated single event effect (SEE) test method for semiconductor devices .pdf

DIN EN 60749-6-2017 Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature (IEC 60749-6 2017) German version EN 60749-6 2017《半导体器件 机械和气候试.pdf

DIN EN 60749-7-2012 Semiconductor devices - Mechanical and climatic test methods - Part 7 Internal moisture content measurement and the analysis of other residual gases (IEC 60749-.pdf

DIN EN 60749-8-2003 Semiconductor devices - Mechanical and climatic test methods - Part 8 Sealing (IEC 60749-8 2002 + Corr 1 2003 + Corr 2 2003) German version EN 60749-8 2003《半导体器.pdf

DIN EN 60749-9-2017 Semiconductor devices - Mechanical and climatic test methods - Part 9 Permanence of marking (IEC 60749-9 2017) German version EN 60749-9 2017《半导体器件 机械和气候试验方法 第9.pdf

DIN EN 60751-2009 Industrial platinum resistance thermometers and platinum temperature sensors (IEC 60751 2008) German version EN 60751 2008《工业铂电阻温度计和铂温度传感器》.pdf