JUS Z M5 112-1980 Glass containers for food industny Bottle screwed neck Cap P T《食品行业用玻璃容器 旋转瓶颈 P T瓶盖》.pdf

相关资源

SN T 3021.2-2016 进口食品行业成套设备检验技术要求 第2部分：油脂加工设备.pdf

SN T 3021.1-2011 进出口食品行业成套设备检验技术要求 第1部分 食品生产设备.pdf

SN T 3021.2-2016 进口食品行业成套设备检验技术要求 第2部分：油脂加工设备.pdf

STAS SR 13423-1999 Enzyme preparations for food industry -Peroxidase - Enzyme activity determination《用于食品行业的酶制剂过氧化物酶 酶的活性测定 》.pdf

STAS SR 13424-1999 Enzyme preparations for food industry Papain - Enzyme activity determination《用于食品行业的酶制剂 木瓜蛋白酶 酶的活性测定 》.pdf

ASTM D7246-2006(2015) 2156 Standard Test Method for Detection of Holes in Polyethylene Food Service Gloves《检测食品行业用聚乙烯手套漏孔的标准试验方法》.pdf

ASTM D7246-2006(2011)e1 3819 Standard Test Method for Detection of Holes in Polyethylene Food Service Gloves《检测食品行业用聚乙烯手套上破洞的标准试验方法》.pdf

ICONTEC 1055-1981 《食品行业，营养面食》.pdf

ICONTEC 1103-1983 《食品行业，餐用型西红柿》.pdf

ICONTEC 1363-1982 《食品行业，普通面包，一般要求》.pdf

猜你喜欢

DIN EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory (IEC 60749-38 2008) German .pdf

DIN EN 60749-39-2007 Semiconductor devices - Mechanical and climatic test methods - Part 39 Measurement of moisture diffusivity and water solubility in organic materials used for s.pdf

DIN EN 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST) (IEC 60749-4 2017) German ver.pdf

DIN EN 60749-40-2012 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge (IEC 60749-40 2011) German version EN .pdf

DIN EN 60749-42-2015 Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage (IEC 60749-42 2014) German version EN 60749-42 2014《半导体.pdf

DIN EN 60749-44-2017 Semiconductor devices - Mechanical and climatic test methods - Part 44 Neutron beam irradiated single event effect (SEE) test method for semiconductor devices .pdf

DIN EN 60749-6-2017 Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature (IEC 60749-6 2017) German version EN 60749-6 2017《半导体器件 机械和气候试.pdf

DIN EN 60749-7-2012 Semiconductor devices - Mechanical and climatic test methods - Part 7 Internal moisture content measurement and the analysis of other residual gases (IEC 60749-.pdf

DIN EN 60749-8-2003 Semiconductor devices - Mechanical and climatic test methods - Part 8 Sealing (IEC 60749-8 2002 + Corr 1 2003 + Corr 2 2003) German version EN 60749-8 2003《半导体器.pdf