1、 KS C IEC 61988 5KSKSKSKSSKSKSKS KSKSKS SKSKS KSKS SKS KS 5:KS C IEC 61988 5: 2007 (2012 ) 2007 8 31 http:/www.kats.go.kr KS C IEC 61988 5: 2007 : ( ) ( ) ( ) : (http:/www.standard.go.kr) : :2007 8 31 :2012 12 31 2012-0857 : : ( 02-509-7294) (http:/www.kats.go.kr). 10 5 , . KS C IEC 61988 5: 2007 i
2、.1 1 1 2 1 2.1 1 2.2 2 2.3 , , .2 2.4 .2 2.5 .3 3 .3 3.1 3 4 .4 4.1 .4 4.2 .4 4.3 .4 4.4 8 4.5 9 4.6 .9 4.7 .10 5 .10 6 10 6.1 .10 6.2 11 6.3 .11 6.4 .11 6.5 .11 6.6 .11 A( ) (LTPD) .12 B( ) 17 .19 KS C IEC 61988 5: 2007 (2012 ) 5: Plasma display panelsPart 5:Generic specification 2005 3 , IEC ANW I
3、EC 61988 5, Plasma display panels Part 5: Generic specification , . 1 IECQ CECC , , . 2 2.1 . a) b) c) d) e) f) IECQ g) (: IEC) h) . IEC QC 001002 2, 1.4 , , , . , ( ) IEC (TC) . B IEC 102, 2.3 . KS C IEC 61988 5: 2007 2 2.2 . . ( ) . KS C IEC 61747 1: 2002, 1: KS C IEC 61988 1: 2003, 1: KS C IEC 61
4、988 2 1: 2003, 2 1: KS C IEC 61988 2 2: 2003, 2 2: KS C IEC 61988 3 1: 2005, 3 1: IEC 60027(all parts), Letter symbols to be used in electrical technology IEC 60050(all parts), International Electrotechnical Vocabulary IEC 60410: 1973, Sampling plans and procedures for inspection by attributes IEC 6
5、0617(all parts), Graphical symbols for diagrams IEC QC 001001, IEC Quality Assessment System for Electronic components(IECQ) Basic Rules IEC QC 001002 (all parts), IEC Quality Assessment System for Electronic components(IECQ) Rules of Procedure ISO 1000: 1992, SI units and recommendations for the us
6、e of their multiples and of certain other units ISO 1101: 1983, Technical drawings Geometrical tolerancing Tolerancing of form, orientation location and run-out Generate,definitions,symbols,indications on drawings ISO 2859 0: 1995, Sampling procedures for inspection by attributes Part 0: Introductio
7、n to the ISO 2859 attribute sampling system ISO 2859 1: 1999, Sampling procedures for inspection by attributes Part 1: Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection ISO 3534 2: 2006, Statistics Vocabulary and symbols ISO 8601: 1988, Data elements and interchange
8、 formats-information interchange Representation of dates and times 2.3 , , , KS C IEC 61988 1 IEC 60050 . , IEC 60027, IEC 60617, ISO 1000 . IEC QC 001001 ISO 3534 2 . , IEC ISO (2.2) . . AQL: (Acceptance Quality Level) (4.4.1 ) LTPD: (Lot Tolerance Percentage Defectives)(4.4.2 ) NSI: (National Supe
9、rvising Inspetorate) DMR: (Designated Management Representative) 2.4 , , (253) , (2585) %, 86 106 kPa . KS C IEC 61988 2 1 5.1 . KS C IEC 61988 5: 2007 3 2.5 2.5.1 . 2.5.2 (lot) (code), . 2.5.3 . a) b) c) d) . . 3 3.1 . a) b) c) d) (group) A, B, C . 4.3.1 . D . 3.1.1 / IEC QC 001002 3 3. / . (QA), .
10、 3.1.2 . 3.1.3 , . KS C IEC 61988 5: 2007 4 DMR IEC QC 001002 3 2.3.3.1 NSI . 3.1.4 IEC QC 001002 3 3.3.1 . 3.1.5 IEC QC 001002 3 3.3.2 . 3.1.6 . IEC QC 001002 3 3.1.2.33.1.2.7 . 3.1.7 IEC QC 001002 3 5.2.3 . 3.1.8 IEC QC 001002 3 3.2.2 . 4 4.1 IEC QC001002 3 3.1.4 a), b), c) . . . . / . NSI . 4.2 I
11、EC QC 001002 3 3.1.5 . 4.3 A, B, C, D . B, C . A, B . A . KS C IEC 61988 5: 2007 5 4.3.1 . 4.3.1.1 A ( ) , , . . A . A1 5.2.1 . A2 . A3 . A4 A5 , . . A4 A5 . 4.3.1.2 B ( ) . , , , , . 4.3.1.3 C ( ) . , 3 12 , / , , , . 4.3.1.4 B C (3.3.3 ) B C , . B1/C1 KS C IEC 61988 5: 2007 6 . B2/C2 . B3/C3 . B4/
12、C4 A , , / . B5/C5 . B6/C6 . B7/C7 . B8/C8 (stress), , . B9/C9 , , . B10/C10 . B11/C11 / , . B12/C12 . B13/C13 KS C IEC 61988 5: 2007 7 . B14/C14 . . . 4.3.1.5 D 12 . 4.3.2 4.4 . 4.3.2.1 A B . , , A B . , . 4.3.2.2 , ( A, B) . , . , A . 4.3.2.3 (NSI CRRL ) NSI . . . 4.3.2.4 B C . IEC QC00100 3 3.1.8
13、 . 4.3.3 4.3.3.1 B KS C IEC 61988 5: 2007 8 B 3 4 B . . 10 B . B . 4.3.3.2 C 3 3 3 6 . 3 . (3.3.2.4 ) 4.3.4 200 , A . (AQL , LTPD A A.3 .) a) 1) 100 % . , 2) A.2 LTPD , 3) LTPD . b) 1) A.2 LTPD . , 2) LTPD . 4.3.5 (CRRL) . IECQ QC 001002 2 B . 4.3.6 (D) . . A . 4.3.7 A B . 4.3.8 . 4.4 KS C IEC 61988
14、 5: 2007 9 A, B, C AQL LTPD . . 4.4.1 AQL IEC 60410 ISO 2859 1 . , , 3 . AQL , . 4.4.2 LTPD A . IEC 61933 2: Quality assessment systems Part 2: Selection and use of sampling plans for inspection of electronic components and packages is under discussion to be an alternative for LTPD sampling plan 4.5
15、 . 4.6 1 000 1 LTPD . 4.6.1 . . 4.6.2 ( A ) . 1 000 ( A.1 ), ( A.2 ) . . 4.6.3 (end-point) . . 4.6.4 1 000 . 1 000 , . 4.6.5 . KS C IEC 61988 5: 2007 10 a) . b) 4.6.5.1 . c) 1 000 4.6.5.2 1 000 . d) 4.3.2.2 . 4.6.5.1 . ( ) ( A.1) ( A.2) A.1 A.2 . . . . . . 4.6.5.2 1 000 , A.1 A.2 . COLUMN . 1 000 .
16、. 4.7 / . 5 6 6.1 6.1.1 , KS C IEC 61988 2 2 . (253) 2585 % 86106 kPa 25 4852 % KS C IEC 61988 5: 2007 11 . 6.1.2 . KS C IEC 61747 1 4. . 6.1.3 . . 6.2 6.2.1 , . . a) b) 6.2.2 . PDP KS C IEC 61988 3 1 . 6.3 6.1.1 KS C IEC 61988 2 . KS C IEC 61988 2 . . KS C IEC 61988 2 . 6.4 KS C IEC 61988 4 . . 4.3
17、.6 “ ” “ ” . , . KS C IEC 61988 4 . , KS C IEC 61988 4, 6 . 6.5 KS C IEC 61988 2 , KS C IEC 61988 4, . , IEC . 6.6 KS C IEC 61988 5: 2007 12 A ( ) (LTPD) A.1 . A.1.1 . . A.1.2 . A.2 ( ) . A.2.1 A.1 A.2 , LTPD . . A.1 A.2 . A.2 LTPD , , LTPD . A.2 LTPD LTPD , 100 % . A.2 LTPD LTPD . A.2.2 , , LTPD (5.9.2 ). , . , 5.9.2 . A.1 A.2