1、MIL-C-288CA 57 9979906 0053441 3 MILITARY SPECIFICATION COUPLER GROUP, ANTENNA OA-9123/SRC -13-0s -04 MIL -C- 28858A( EC) 2 December 1985- SUPtRSE DING MIL-C-28858( EC) 4 October 1979 This specif ication is approved for use by the Space and Naval Warfare Systems Command, Department of the Navy, and
2、is available for use by all Departments and Agencies of he Department of Defense. 1. SCOPE 1.1 Scope. This specif ication covers a shipboard tuned antenna coupler group (multicoupler) hereinaftexerred to as the multicoupler, used to couple a group of transmitters, receivers, transceivers, or combina
3、tions thereof, to a comn antenna for operation in the frequency range of 225.000 megahertz (MHz) to 399.975 MHz. 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this specification
4、to the extent specified herein. Unless otherwise spec- ified, the issues of these documents shall be those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the sol citation. SPECIFICATIONS MILITARY MIL-S-901 Shock Tests,
5、 H.I. (High Impact); Shipboard Machinery, Equipment MIL-E-15090 Enamel, Equipment, Light-Gray (Formula No. 111) MIL-E-16400 MIL-E-17555 Electronic And Electrical Equipment, Accessories, And Prov- MIL-R -24182 MI L-C-24219 MIL-C -28838 And Systems, Requirements For Electronic, Inter or Comnun cat ion
6、 And Navigat ion Equ ipment, Naval Ship And Shore: General Specif cat ion For isioned Items (Repair Parts), Packaging Of Radio Sets AN/SRC-ZOA And ANISRC-21A (Including Radio Set AN/URC-gA And Radio Set Control C-3866/SRC) Coupler, Antenna, AN/SRA-33, Four-channel, Automat Ica1 ly Tuned Comnunicatio
7、ns Sets, UHF AN/WSC-3(V) Satell te And LOS Versions STANDARDS MILITARY MIL-STD-12 Abbreviations For Use On Drawings, Specif cations, Standards, And MIL-STD-105 MIL-STD-108 MIL -STD- 109 MIL-STD-129 In Technical Documents Sampling Procedures And Tables For Inspection By Attributes Definitions Of And
8、Basic Requirements For Enclosures For Electric And Electronic Equipment Qual i ty Assurance Terms And Def in it ions Marking For Shipment And Storage cia1 comnents (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Na
9、val Warfare Systems Comnand (SPAWAR-8111), Washington, DC 20363-5100, by using the self -addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document, or by letter. Conmander, Space and . THIS DOCUMENT CONTAINS PAGES. FSC 5985 DISTRIBUTION STATEMENT A.
10、 Approved for pub1 ic release; distribution is un1 imited. . . - Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I MIL-C-28858A. (EC) t-11 L-STD- 167-1 MIL-STD-415 MIL-STD-461 MIL -STD-462 MIL-STD-471 MI L-STD-781 MIL-STD-965 MI L-STD- 1364 DOO-STD-1
11、399, MIL-STD-1472 OoD-STD-1686 Section 300 Mechanical Vibrations Of Shipboard Equipment (Type I - Environ- mental And Type I I - Internal ly Excited) Test Provisions For Electronic Systems And Associated Equipment, Des ign Cri ter ia For Electromagnetic Emission And Susceptibility Requirements For T
12、he Control Of Electromagnetic Interference Electromagnetic Interference Character ist ics , Measurement Of Maintainabi 1 ity Verif cat ion/Demonstrat ion/Evaluat ion Reliability Design Qualification And Production Acceptance Tests: Exponential Distribution Parts Control Program Standard General Purp
13、ose Electronic Test Equipment Interface Standard For Shipboard Systems, Electric Power, Alternating Current (Metric) Human Engineering Design Criteria For Military Systems, Equip- ment And Facilities Electrostatic Discharge Control Program For Protection Of Electrical And Electronic Parts, Assembl e
14、s And Equipment (Excluding Electrically Initiated Explosive Devices) (Metric) HANDBOOKS MI LI TARY MIL-HDBK-241 Design Gu ide For Electromagnetic Interference (EMI) Reduct ion In Power Supplies 2.1.2 Other Government publ icat ions. part of this specification to the extent specified herein. shall be
15、 those in effect on the date of the solicitation. The fol lowing other Government publ icat ions form a Unless otherwise specified, the issues PUBLICATIONS CODE OF FEDERAL REGULATIONS Title 29, Part 1910, Subpart 2 Toxic And Hazardous Substances (Copies of this Federal Regulation required by contrac
16、tors in connection with specific procurement functions may be obtained from the Superintendent of Documents, U. S. Government Printing Office, Washington, OC 20402.) NAVAL AIR SYSTEMS COMMAND (NAVAIR) WS-65360 Process Specification Procedures And Requirements For Prepara- tion And Soldering Of Elect
17、rical Connections (Copies of specif cat ions, standards, handbooks, and publ ications required by contractors in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) The following document forms a part of this sp
18、ecification to the extent specified herein. Unless otherwise specified, the issues of the documents which are DoD adopted shall be those listed in the issue of the DoDISS specified in the solicitation. Unless otherwise specified, the issues of documents not listed in the DoDISS shall be the issue of
19、 the nongovernment documents which is current on the date of the solicitation. 2.2 Other publications. ELECTRONIC INDUSTRIES ASSOCIATION (EIA) RS 310-C-1977 Racks, Panels, And Associated Equipment (Application for copies should be addressed to the Electronic Industries Association, Engineering Depar
20、tment, 2001 Eye Street, NW, Washington, DC 20006.) 2 I 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-(Nongovernment standards and other pub1 cat ions are normally available from the organizations which prepare or which distribute the documents, t
21、hrough 1 ibrar ies or other informat ional serv ices. ) and the references cited herein (except for associated detail specif cations, specif cat ion sheets, or MS standards), the text of this specification shall take precedence. Nothing in this specification, however, shall supersede appl icable law
22、s and regulations unless a specific exemp- t ion has been obtained. These documents also may be available in or 2.3 Order of precedence. In the event of a conflict between the text of this specification 3. REQUIREMENTS 3.1 General requirements. The multicoupler shall conform to the requirements of M
23、IL-E-16400, to the extent specified herein. The multicoupler shall be capable of replacing the AN/SRA-33 antenna coupler group specified in MIL-C-24219; and as a minimum the multicoupler shall be control interface compatible and interoperable with the AN/SRC-20( )/21 specified in MIL-R-24182, and AN
24、/WSC-3(V) family radio equipment specified in MIL-C-28838. method of approach in the design of the OA-9123/SRC( ) antenna coupler group are specified in APPENDIX A. The functional description and the 3.2 First article. When specified in the contract or purchase order, a sample shall be 3.3 Equipment
25、 composition. subjected to first article inspection (see 4.3 and 6.3). combiner, equipment rack or cabinet, cable assemblies, mating connectors, and all other related components, to allow the multicoupler to perform as specified herein. alignment, maintenance, and so forth, shall be inc!uded as part
26、 of the equipment (see 6.7). The multicoupler shall consist of bandpass filters, power supply, Special tools necessary for 3.3.1 Filter combining and interchangeability. The mult,icoupler shall be designed so that each filter is two-way interchangeable with other filters within the multicoupler, and
27、 filters may be inserted in the multicoupler to proride any number of channels from one to four, inclusive. Filter interchangeability shall be accomplished within the limits of maintainability requirements specified in 3.13. If any one, two, or three filter sections are removed, the multicoupler sha
28、ll st ill be capable of operat ion without degradation of performance specified herein. 3.3.2 Test measurement and diagnostic equipment (TMDE). of detecting, displaying, and isolating failures (see 6.4.5). The multicoupler shall be capable 3.3.2.1 Test provisions. The multicoupler shall contain the
29、test provisions specified in a through c: a. Class A test provisions. Class A test provisions shall provide a means to Class A provisions shall be verify that the on-line equipment (see 6.4.2) is operating properly. accomplished by the use of built-in test (BIT) (see 6.4.4), built-in test equipment
30、(BITE) (see 6.4.3), or both, and shall have the capability to detect at least 96 percent of all equipment f ai lures. isolate at least 94 percent of the equipment failures to the subassembly (see 6.4.6) level as specified in 1 and 2: su bas semb 1 y. failures) shall be isolated to three or fewer sub
31、assemblies. accomplished when the equipment is off-line (see 6.4.1), on-line, or both, through the use of BIT and BITE. c. Class C test provisions shall provide a means to fault locate to electrical functions (that is, integrated circuit (IC), filter, mixer, voltage controlled oscillator (VCO), and
32、so forth) and to align the system (see 6.4.9), unit (see 6.4.8), assembly (see 6.4.7), or subassembly (see 6.4.6). Class C provisions may be accomplished by the use of test points in conjunct ion with automatic test equipment or germa1 purpose electronic test equipment (GPETE) and shall have the cap
33、ability to isolate all the failures to the electrical functional items on a subassembly. b. Class B test provisions. 1. 2, Clasc B test provisions shall provide a means to At least 84.6 percent of the equipment failures shall be isolated to a single The remaining equipment failures (no more than 11.
34、4 percent of total Class B test provisions shall be Class C test provisions. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-C-28858A( EC) 3.3.2.2 BIT and BITE criteria. BIT and BITE criteria shall be as specified in a through c: The prime equip
35、ment function shall not a. be impaired by the malfunction of BIT and BITE. b. BIT and BITE indicator. BIT and BITE indicators shall be lights, meters, or other indicating devices installed in the equipment. It shall provide a GO or NO-GO indication at the level which it is intended and shall be made
36、 visible by removal of no more than one cover plate if it is covered. BIT and BITE indicators shall be located as specified in 1 through 3: Class A test provision: On the control panel of the multicoupler group Protection from BIT and BITE failures. 1. 2. Class B test provision: On the multicoupler
37、group control panel 3. Class C test provision: On the subassembly 1. 2. c. BIT and BITE activation. BIT and BITE activation shall be as specified in 1 and 2: BIT and BITE used in Class A and 8 test provisions shall be energized auto- matically without operators initiation. BIT and BITE used in Class
38、 C test provisions may be energized automatically or manually. When a manually energized test mode is to be employed, a pushbutton switch shall be incorporated. 3.3.2.3 Test point criteria. Test points shall provide the requirements specified in a through d: a. Signal quality and circuit performance
39、: Test points, test jacks, or both, shall be provided to permit the injection of signals and the monitoring of signals at the input/output (I/O) terminals of the subassembly. b. Fault isolation: Test points, test jacks, or both, shall be provided to permit the injection or measurement of signals at
40、1/0 terminals of the subassembly to isolate all faults to the electrical functions (that is, IC, filter, mixer, VCO, and so forth). Test points and test jacks shall provide mans for performing fault isolation on the subassembly with the subassembly removed from the prime equipment. c. Al ignment: Te
41、st points, test jacks, or both, shall be provided to permit align- ment of the equipment and equipment assembl es and subassembl es. d. Calibration: points, test jacks, or both, to permit calibration of the BIT and BITE functions of the equipment. Cal ibration of the Class A, B, and C BIT and BITE f
42、unctions shall not exceed 2 hours. 3.2.2.4 GPETE, GPETE to be used at all levels of maintenance shall be selected from the standard and sEZSrd replacement equ ipments 1 isted in MIL-STU-1364. Class A, 8, and C test provisions shall be provided with test 3.3.3 Power supply requirements. Design for lo
43、w voltage supplies delivering up to 5 kilo- watts (kW) at 300 volts direct current (VDC), or less, shall comply with the requirements in a through j: a. b. c. The power density shall be output power divided by power supply envelope volume, including electromagnetic interference (EMI) filtering where
44、 required. 2 watts per cubic inch shall require the approval of the procuring activity, Junction temperature of semiconductor and microelectronic devices (diodes, transistors, hybrid ICs, and so forth) shall not exceed +110 Celsius (C) under worst-case condi- t ions. Case/hot spot temperatures shall
45、 not exceed 40C rise above ambient temperature with a maximum temperature of +llOC for parts less than or equal to 3 watts (W) of dissipation; 55C rise above ambient with a maximum temperature of +125C for parts greater than 3 W of dis- sipation; 30C rise above part ambient with a maximum temperatur
46、e of +lOOC for transformers; and 1OC rise above ambient, due to self-heating, with a maximum temperature of 85C for capacitors. d. Power supplies shall be designed to be maintainable at the piece part level; power supplies shall not be limited by design to repair by the manufacturer. e. Power suppli
47、es shall not be encapsulated or embedded (potted) unless it can be shown by test to be necessary for heat removal or dissipation. This requirement shall not exclude conformal coating. f. Power supply manufacturing shall include random vibration and temperature cycl ing of every unit under full elect
48、rical load; this may be done in the end item but shall be performed on a unit basls for spares. Power density exceeding 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C-28858A( EC) g. EM1 requirements shall be tailored for the power supply whi
49、ch will enable the end equipments to conform to the class of MIL-STD-461 required by its specification. EM1 specifica- tions shall be developed for the power supply which will permit the power supply to be purchased separately from the end equipment, The specif ication mean-t me-beween-failures (MTBF) requirement shall be not less than 40,000 hours for Naval sheltered equipment at 55C. Power supplies shall be designed to withstand, and shall not be damaged by, load between an open c
