1、NEMA Standards PublicationNational Electrical Manufacturers AssociationNEMA VSP 1-2017Susceptibility of Electrical and Electronic Components to Surge DamageA NEMA Low Voltage Surge Protective Devices Section White Paper VSP 1-2017 Susceptibility of Electrical and Electronic Components to Surge Damag
2、e Published by National Electrical Manufacturers Association (NEMA) 1300 North 17th Street, Suite 900 Rosslyn, Virginia 22209 www.nema.org 2017 National Electrical Manufacturers Association. All rights including translation into other languages, reserved under the Universal Copyright Convention, the
3、 Berne Convention for the Protection of Literary and Artistic Works, and the International and Pan American Copyright Conventions. NEMA VSP 1-2017 Page 2 2017 National Electrical Manufacturers Association NOTICE AND DISCLAIMER The information in this publication was considered technically sound by t
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13、 NEMA VSP 1-2017 Page 3 2017 National Electrical Manufacturers Association Foreword This is a new NEMA white paper based on member-supported testing. To ensure that a meaningful publication was developed, draft copies were distributed to groups within NEMA that have an interest in this topic. Their
14、comments and suggestions provided vital input prior to final NEMA approval and resulted in a number of substantive changes in this publication. To remain up to date with advancing technology, this publication will be periodically reviewed by the Low Voltage Surge Protective Devices Group of the NEMA
15、 Commercial Products Division. Proposed or recommended revisions should be submitted to: Senior Technical Director, Operations National Electrical Manufacturers Association 1300 North 17thStreet, Suite 900 Rosslyn, Virginia 22209 This white paper was developed by the Low Voltage Surge Protective Dev
16、ices Group of the NEMA Commercial Products Division. Approval of this white paper does not necessarily imply that all members of the Product Group voted for its approval or participated in its development. ASCO Power Technologies Clearwater, FL CITEL Inc. Miramar, FL Eaton Corporation Pittsburgh, PA
17、 Emerson Automation Solutions Rosemont, IL GE Industrial Solutions Plano, TX Hubbell Inc. Shelton, CT Legrand/Pass they were not modified or altered in any way. The electrical products used were selected to represent a broad spectrum of common electrical components familiar to all users of electrica
18、l appliances. The results obtained by this testing can be used as a guide to the reaction of electrical devices under various conditions. Some devices might show malfunctions, and some may experience upset events caused by surge events in actual installations. Upset conditions will be a concern if a
19、ny other electronics are controlling a critical safety component. For example, a control transformer with an upset output could cause process failure for equipment being run by the transformer. Test Methodology A variety of waveforms were selected to represent surge conditions. These waveforms are b
20、ased on the standard waveforms found in the current edition of IEEE C62.41.2 with the addition of some intermediate waveforms from an earlier version of this standard. They are a representation of impulse events created by interruptions in the electrical system. Most equipment is designed to handle
21、minor variations in nominal operating voltages. However, surges can range in impact and adversity and may affect nearly all equipment under certain conditions. Here are some of the standard waveforms for equipment surge susceptibility. While most equipment has a nominal level of intrinsic resistibil
22、ity, based on environment, application, and installation, additional or redundant levels of surge protection may be recommended. The following standard waveforms were used in the testing protocol: a) Category C Low / Category B Combination Wave (6,000 V / 3,000 A) b) Category C Low / Category B Comb
23、ination Wave (4,000 V / 2,000 A) c) Category B Combination Wave (2,000 V / 1,000 A) d) Category B Ring Wave (6,000 V / 500 A) e) Category B Ring Wave (4,000 V / 333 A) f) Category B Ring Wave (2,000 V / 167 A) g) Category A Ring Wave (6,000 V / 200 A) h) Category A Ring Wave (4,000 V / 133 A) i) Cat
24、egory A Ring Wave (2,000 V / 67 A) Note: See IEEE Std. C62.41.2 TM-2002 especially Clause 6.2; Tables 2, 3 and 4; and the notes associated with those tables for further explanation of the surge test levels selected. The 6,000 V combination wave was developed to represent a variety of surge events. T
25、hese events may be externally or internally generated electrical surges, such as when a utility capacitor bank is switched into or out of an electrical system. Internal events can come from inductive load switching. This surge is not meant to be a replication of lightning impulses, but rather a repr
26、esentation of the energy produced from an impulse during normal electrical operating conditions. For additional information on lightning impulses, please see NFPA 780 Standard for the Installation of Lightning Protection Systems. These tests were designed to determine the number and magnitude of sur
27、ges some common electrical devices used in residential, commercial and industrial applications could withstand before failure. Each NEMA VSP 1-2017 Page 6 2017 National Electrical Manufacturers Association sample was tested starting with the highest magnitude IEEE C62.41.2 waveform from the list abo
28、ve, the 6,000 V / 3,000 A Category C Low Combination Wave. If the sample could withstand 300 surges, the test was stopped. If the sample failed before 300 surges in this category were applied, then the surge generator was re-calibrated to output the next lower surge waveform. This continued until th
29、e sample withstood 300 surges. The following common electrical and electronic devices were tested: a) Incandescent Bulb o Common 120 V, 60 W screw-base bulb b) Compact Fluorescent Bulb o Common 120 V, 60 W (equivalent) screw-base bulb c) Electronic Ballast & Fluorescent Bulb o Common 120 V electroni
30、c ballast with two 25 W, 36 inch fluorescent tubes d) LED Bulb o Common 120 V, 60 W (equivalent) screw-base bulb e) Control Transformer o Industrial 50 VA, 120 V to 24 V transformer f) Variable Frequency Drive (VFD) o Industrial 120 V single-phase, 0.33 HP VFD g) Uninterruptable Power Supply (UPS) o
31、 Common 120 V, 500 VA, off-line UPS The test procedure was designed to subject the test samples to a range of surges of different types and magnitudes representing real-world applications. The testing started with IEEE Category C and then proceeded to Categories B and A (decreasing in severity). If
32、the sample failed during the first series of test surges, a new sample was tested with surges of the next lower level until the test sample passed 300 surges without issue. Note: that the test samples were not directly connected to the surge generator. The samples were connected through a 10 meters
33、(30 feet) length of cable. This is a better representation of a practical and actual electrical installation. The following steps were taken to conduct the test on each device: a) The open circuit voltage waveform and short circuit current waveform were measured to verify the test waveform. b) The s
34、ample to be tested was attached to the output of the generator using a 10 meters cable (12-2 non-metallic sheathed cable). c) Apply the highest combination surges from Table 1 to the first test sample. Perform up to 300 strikes unless the sample fails. The impulses are injected at 60 second interval
35、s and are applied at the peak of the AC sine wave (90 degrees of the power frequency). d) If the sample fails, apply the surge waveform in the next column to the right in Table 1 in 60 second intervals at 90 degrees of the power frequency for up to 300 strikes or until the device fails and record re
36、sults. e) Continue testing with the test waveform in the next column to the right in Table 1 until one sample passes the test of 300 surges. NEMA VSP 1-2017 Page 7 2017 National Electrical Manufacturers Association Test Results Table 1 contains the compiled results of the surge susceptibility testin
37、g. The first column describes the device being tested. The devices tested were all commercially available products manufactured by a variety of companies. The second column lists the number of the sample being tested. This is followed by the nine different surge waveforms used in the testing, starti
38、ng with the highest voltage and current waveforms on the left and working to the lowest magnitude waveforms on the right. The number in the columns under the different test waveforms are the number of surges of that surge type when the sample failed. None of the samples survived more than one of Cat
39、egory C Low Combination Wave (6,000 V / 3,000 A) waveform. When a number “1” appears in a column, then the test sample failed on the first surge in that category. When there is a “300” in a column under one of the test waveforms, then the test sample survived 300 of those waveforms without damage. A
40、t that point, the testing was stopped, as the sample would have passed all the surge waveforms to the next lowest value (to the right in Table 1). NEMA VSP 1-2017 Page 8 2017 National Electrical Manufacturers Association Table 1: Test Results Sample Sample Number Category C Low / Category B Combinat
41、ion Wave Category B Ring Wave Category A Ring Wave 6 kV 3,000 A 4 kV 2,000 A 2 kV 1,000 A 6 kV 500 A 4 kV 333 A 2 kV 167 A 6 kV 200 A 4 kV 133 A 2 kV 67 A Incandescent Bulb 1 1 2 1 3 1 4 1 5 1 6 1 7 44 8 300 Compact Fluorescent Bulb 1 1 2 1 3 1 4 300 Electronic Ballast & Fluorescent Bulb 1 1 2 1 3 1
42、 4 300 LED Bulb 1 1 2 1 3 1 4 300 50 VA Control Transformer 1 53 VFD 0.33 HP 1 1 2 300 3* 20, L-G 500 VA UPS 1 300 Note: All VFD surges were performed Line to Neutral in positive polarity except for VFD sample number 3 which was tested Line to Ground. NEMA VSP 1-2017 Page 9 2017 National Electrical
43、Manufacturers Association Conclusions Table 1 in this document shows the surge test results for some common products. They cover a range of products from an incandescent light bulb to an uninterruptible power supply. These are common devices that are connected to an electrical supply and are exposed
44、 to everyday electrical surges that can be damaged by these events. The surges applied in this testing are at the same levels to be expected in common electrical installations. As documented in the test results, the surge environment can produce a variety of effects. Surge damage can be experienced
45、in a single event or as the result of an accumulation of surges. For example, in the case of an incandescent light bulb, the damage can be immediate or from repeated surges as shown by the quantity of the 44 surges in the Category A environment (i.e., test sample 7 in the table above). The applicati
46、on of a quality surge protective device can prevent damage to common electrical or electronic products. Surge protection is just as effective when used in commercial and industrial environments. Electrical equipment is subject to surge damage, and these results show conclusively that everyday electr
47、ical devices are damaged by surges of the level expected in a normal electrical distribution system. The application of a surge protective device within a home or facility can alleviate the effects and save the cost or replacement for many electrical or electronic devices. For additional information on surge protection and its applications, visit www.NEMASurge.org. NATIONAL ELECTRICAL MANUFACTURERS ASSOCIATION 1300 NORTH 17TH STREET, SUITE 900 ROSSLYN. VA 22209www.NEMA.orgTO ORDER ADDITIONAL NEMA STANDARDS VISITWWW.GLOBAL.IHS.COM OR CALL 1-800-854-7179/1-303-397-79565612_0514TB
