ONORM M 5351-1978 Slotted countersunk (flat) head wood screws《半沉（扁平）头木螺丝》.pdf

相关资源

IRS 70778-2-2018 Recommendations for determining the carrying capacity and fatigue risks of existing metallic railway bridges.pdf

IRS 70712-2018 Rail defects.pdf

IRS 50596-6-2018 Conditions for coding intermodal loading units in combined transport combined transport lines and wagons.pdf

IRS 50596-5-2018 Transport of road vehicles on wagons-Technical Organisation-Conveyance of semi-trailers with P coding or N coding on recess wagons.pdf

IESNA TM-23-2017 Lighting Control Protocols.pdf

IESNA RP-2-2017 Recommended Practice for Retail Lighting.pdf

ITU-R RAPPORT M 766-2 FRENCH-1990 Feasibility of frequency sharing between the GPS and other services《全球定位系统和其他服务之间的频率共享的可行性》.pdf

ITU-R RAPPORT M 763-3 FRENCH-1990 Signal level variation due to multipath effects and blockage by ship-s superstructure in maritime mobile-satellite service lin.pdf

ITU-R RAPPORT M 739-1 FRENCH-1986 Interference due to intermodulation products in the land mobile service between 25 and 100 MHz《由于互调产物在陆地移动服务25和100 MHz之间产生的干扰》.pdf

ITU-R RAPPORT M 319-7 FRENCH-1990 Characteristics of equipment and principles governing the assignment of frequency channels between 25 and 100 MHz for land mob.pdf

猜你喜欢

NF C96-022-30-2005 Semiconductor devices - Mechanical and climatic test methods - Part 30 preconditioning of non-hermetic surface mount devices prior to reliability testing 《半导体器件.pdf

NF C96-022-33-2005 Semiconductor devices - Mechanical and climatic test methods - Part 33 accelerated moisture resistance - unbiased autoclave 《半导体器件 机械和气候试验方法 第33部分 加速抗湿 无偏压热器》.pdf

NF C96-022-35-2006 Semiconductor devices - Mechanical and climatic test methods - Part 35 acoustic microscopy for plastic encapsulated electronic components 《半导体装置 机械和气候试验方法 第35部分.pdf

NF C96-022-36-2003 Semiconductor devices - Mechanical and climatic test methods - Part 36 acceleration steady state 《半导体装置 机械和气候试验方法 第36部分 稳态加速》.pdf

NF C96-022-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 board level drop test method using an accelerometer 《半导体装置 机械和气候试验方法 第37部分 使用加速计的板级跌落试验方法.pdf

NF C96-022-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 soft error test method for semiconductor devices with memory 《半导体装置 机械和气候试验方法 第38部分 带存储的半.pdf

NF C96-022-39-2006 Semiconductor devices - Mechanical and climatic test methods - Part 39 measurement of moisture diffusivity and water solubility in organic materials used for se.pdf

NF C96-031 1-1990 IEC Bus 821 VME nMicroprocessor system bus for 1 to 4 byte data - Part 1 《IEC 总线 821 VME 1至4字节数据微处理机系统总线 第1部分》.pdf

NF C96-031 2-1990 IEC Bus 821 VME nMicroprocessor system bus for 1 to 4 byte data - Part 2 《IEC 总线 821 VME 1至4字节数据微处理机系统总线 第2部分》.pdf