1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA
2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any
3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-21609-2 SANS 61000-4-3:2008 Edition 3.1 IEC 61000-4-3:2008 Edition 3.1SOUTH AFRICAN NATIONAL STANDARD Electromagnetic compatibility (EMC)
4、Part 4-3: Testing and measurement techniques Radiated, radio-frequency, electromagnetic field immunity test This national standard is the identical implementation of IEC 61000-4-3:2008 and is adopted with the permission of the International Electrotechnical Commission. Published by Standards South A
5、frica 1 dr lategan road groenkloof private bag x191 pretoria 0001 tel: 012 428 7911 fax: 012 344 1568 international code + 27 12 www.stansa.co.za Standards South Africa This standard may only be used and printed by approved subscription and freemailing clients of the SABS.SANS 61000-4-3:2008 Edition
6、 3.1 IEC 61000-4-3:2008 Edition 3.1 Table of changes Change No. Date Scope IEC amdt 1 2007 Amended to add an informative annex on the calibration method for e-field probes. National foreword This South African standard was approved by National Committee StanSA TC 73, Electromagnetic compatibility, i
7、n accordance with procedures of Standards South Africa, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in May 2008. This SANS document supersedes SANS 61000-4-3:2006 (edition 3). This standard may only be used and printed by approved subscription and freemailin
8、g clients of the SABS. IEC 61000-4-3 Edition 3.1 2008-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-3: Testing and measurement techniques Radiated, radio-frequency, electromagnetic field immunity test Compatibilit lectromagntique (CEM) Partie 4-3: Techniqu
9、es dessai et de mesure Essai dimmunit aux champs lectromagntiques rayonns aux frquences radiolectriques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE CL ICS 33.100.20 PRICE CODE CODE PRIX ISBN 2-8318-9550-2 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM
10、SANS 61000-4-3:2008This standard may only be used and printed by approved subscription and freemailing clients of the SABS. 2 61000-4-3 IEC:2006+A1:2007 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope and object7 2 Normative references .7 3 Terms and definitions .8 4 General 11 5 Test levels11 5.1 Test l
11、evels related to general purposes .12 5.2 Test levels related to the protection against RF emissions from digital radio telephones and other RF emitting devices .12 6 Test equipment.13 6.1 Description of the test facility 13 6.2 Calibration of field .14 7 Test setup 19 7.1 Arrangement of table-top e
12、quipment19 7.2 Arrangement of floor-standing equipment 19 7.3 Arrangement of wiring .20 7.4 Arrangement of human body-mounted equipment20 8 Test procedure .20 8.1 Laboratory reference conditions 20 8.2 Execution of the test21 9 Evaluation of test results 22 10 Test report22 Annex A (informative) Rat
13、ionale for the choice of modulation for tests related to the protection against RF emissions from digital radio telephones 31 Annex B (informative) Field generating antennas .36 Annex C (informative) Use of anechoic chambers 37 Annex D (informative) Amplifier non-linearity and example for the calibr
14、ation procedure according to 6.2 .40 Annex E (informative) Guidance for product committees on the selection of test levels45 Annex F (informative) Selection of test methods 48 Annex G (informative) Description of the environment49 Annex H (normative) Alternative illumination method for frequencies a
15、bove 1 GHz (“independent windows method”) 54 Annex I (informative) Calibration method for E-field probes57 Figure 1 Definition of the test level and the waveshapes occurring at the output of the signal generator24 Figure 2 Example of suitable test facility25 Figure 3 Calibration of field26 Figure 4
16、Calibration of field, dimensions of the uniform field area 27 Figure 5 Example of test setup for floor-standing equipment 28 Figure 6 Example of test setup for table-top equipment29 Figure 7 Measuring setup 30 SANS 61000-4-3:2008This standard may only be used and printed by approved subscription and
17、 freemailing clients of the SABS.61000-4-3 IEC:2006+A1:2007 3 Figure C.1 Multiple reflections in an existing small anechoic chamber38 Figure C.2 Most of the reflected waves are eliminated .39 Figure D.1 Measuring positions of the uniform field area42 Figure H.1 Examples of division of the calibratio
18、n area into 0,5 m 0,5 m windows .55 Figure H.2 Example of illumination of successive windows.56 Figure I.1 Example of linearity for probe 60 Figure I.2 Setup for measuring net power to a transmitting device .62 Figure I.3 Test setup for chamber validation test64 Figure I.4 Detail for measurement pos
19、ition L64 Figure I.5 Example of data adjustment.65 Figure I.6 Example of the test layout for antenna and probe.66 Figure I.7 Test setup for chamber validation test67 Figure I.8 Example alternative chamber validation data .67 Figure I.9 Field probe calibration layout .68 Figure I.10 Field probe calib
20、ration layout (Top view) 68 Figure I.11 Cross-sectional view of a waveguide chamber .70 Table 1 Test levels related to general purpose, digital radio telephones and other RF emitting devices11 Table 2 Requirements for uniform field area for application of full illumination, partial illumination and
21、independent windows method15 Table A.1 Comparison of modulation methods .32 Table A.2 Relative interference levels33 Table A.3 Relative immunity levels.34 Table D.1 Forward power values measured according to the constant field strength calibration method 43 Table D.2 Forward power values sorted acco
22、rding to rising value and evaluation of the measuring result .43 Table D.3 Forward power and field strength values measured according to the constant power calibration method44 Table D.4 Field strength values sorted according to rising value and evaluation of the measuring result .44 Table E.1 Examp
23、les of test levels, associated protection distances and suggested performance criteria47 Table G.1 Mobile and portable units.51 Table G.2 Base stations.52 Table G.3 Other RF devices.53 Table I.1 Calibration field strength level .58 Table I.2 Example for the probe linearity check59 SANS 61000-4-3:200
24、8This standard may only be used and printed by approved subscription and freemailing clients of the SABS. 4 61000-4-3 IEC:2006+A1:2007 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-3: Testing and measurement techniques Radiated, radio-frequency, electromagnet
25、ic field immunity test FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning
26、 standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their pre
27、paration is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closel
28、y with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant
29、 subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the tech
30、nical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum ext
31、ent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for a
32、ny equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committee
33、s and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
34、8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent ri
35、ghts. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-3 has been prepared by subcommittee 77B: High frequency phenomenon, of IEC technical committee 77: Electromagnetic compatibility. It forms part 4-3 of IEC 61000. It has the statu
36、s of a basic EMC publication in accordance with IEC Guide 107, Electromagnetic compatibility Guide to the drafting of electromagnetic compatibility publications. The test frequency range may be extended up to 6 GHz to take account of new services. The calibration of the field as well as the checking
37、 of power amplifier linearity of the immunity chain are specified. This consolidated version of IEC 61000-4-3 consists of the third edition (2006) documents 77B/485/FDIS and 77B/500/RVD and its amendment 1 (2007) documents 77B/546/FDIS and 77B/556/RVD. SANS 61000-4-3:2008This standard may only be us
38、ed and printed by approved subscription and freemailing clients of the SABS.61000-4-3 IEC:2006+A1:2007 5 The technical content is therefore identical to the base edition and its amendment and has been prepared for user convenience. It bears the edition number 3.1. A vertical line in the margin shows
39、 where the base publication has been modified by amendment 1. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of the base publication and its amendments will remain unchanged until the maintenance result date indicated
40、on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. SANS 61000-4-3:2008This standard may only be used and printed by approved subscription and freem
41、ailing clients of the SABS. 6 61000-4-3 IEC:2006+A1:2007 INTRODUCTION This standard is part of the IEC 61000 series, according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the env
42、ironment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation
43、and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as international standards or as technical specifications or technical reports, some of which have alr
44、eady been published as sections. Others will be published with the part number followed by a dash and a second number identifying the subdivision (example: 61000-6-1). This part is an International Standard which gives immunity requirements and test procedures related to radiated, radio-frequency, e
45、lectromagnetic fields. SANS 61000-4-3:2008This standard may only be used and printed by approved subscription and freemailing clients of the SABS.61000-4-3 IEC:2006+A1:2007 7 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-3: Testing and measurement techniques Radiated, radio-frequency, electromagnetic f
46、ield immunity test 1 Scope and object This part of IEC 61000 is applicable to the immunity requirements of electrical and electronic equipment to radiated electromagnetic energy. It establishes test levels and the required test procedures. The object of this standard is to establish a common referen
47、ce for evaluating the immunity of electrical and electronic equipment when subjected to radiated, radio-frequency electro- magnetic fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon
48、. NOTE 1 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible
49、 for determining the appropriate test levels and performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This part deals with immunity tests related to the protection against RF electromagnetic fields from any source. Particular considerations are devoted to the protection against radio-frequency emis
