TCVN 7491-2005 Ergonomics Arrangement of desks and chairs in a classroom《人类工效学 教室桌椅的布置》.pdf

相关资源

IRS 70778-2-2018 Recommendations for determining the carrying capacity and fatigue risks of existing metallic railway bridges.pdf

IRS 70712-2018 Rail defects.pdf

IRS 50596-6-2018 Conditions for coding intermodal loading units in combined transport combined transport lines and wagons.pdf

IRS 50596-5-2018 Transport of road vehicles on wagons-Technical Organisation-Conveyance of semi-trailers with P coding or N coding on recess wagons.pdf

IESNA TM-23-2017 Lighting Control Protocols.pdf

IESNA RP-2-2017 Recommended Practice for Retail Lighting.pdf

ITU-R RAPPORT M 766-2 FRENCH-1990 Feasibility of frequency sharing between the GPS and other services《全球定位系统和其他服务之间的频率共享的可行性》.pdf

ITU-R RAPPORT M 763-3 FRENCH-1990 Signal level variation due to multipath effects and blockage by ship-s superstructure in maritime mobile-satellite service lin.pdf

ITU-R RAPPORT M 739-1 FRENCH-1986 Interference due to intermodulation products in the land mobile service between 25 and 100 MHz《由于互调产物在陆地移动服务25和100 MHz之间产生的干扰》.pdf

ITU-R RAPPORT M 319-7 FRENCH-1990 Characteristics of equipment and principles governing the assignment of frequency channels between 25 and 100 MHz for land mob.pdf

猜你喜欢

EN 60749-31-2003 en Semiconductor devices - Mechanical and climatic test methods Part 31 Flammability of plastic-encapsulated devices (internally induced)《半导体器件 机械和气候试验方法 第31部分 塑料密.pdf

EN 60749-32-2003 en Semiconductor devices - Mechanical and climatic test methods Part 32 Flammability of plastic-encapsulated devices (externally induced) (Incorporates Amendment A.pdf

EN 60749-33-2004 en Semiconductor devices Mechanical and climatic test methods Part 33 Accelerated moisture resistance Unbiased autoclave《半导体器件 机械和气候试验方法 第33部分 加速抗湿 无偏压热器 IEC 60749.pdf

EN 60749-34-2010 en Semiconductor devices - Mechanical and climatic test methods - Part 34 Power cycling《半导体器件 机械和气候试验方法 第34部分 动力循环》.pdf

EN 60749-35-2006 en Semiconductor devices Mechanical and climatic test methods Part 35 Acoustic microscopy for plastic encapsulated electronic components《半导体器件 机械和气候试验方法 第35部分 塑封电子.pdf

EN 60749-36-2003 en Semiconductor devices Mechanical and climatic test methods Part 36 Acceleration steady state《半导体器件 机械和气候试验方法 第36部分 稳态加速 IEC 60749-36-2003》.pdf

EN 60749-37-2008 en Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer《半导体器件 机械和气候试验方法 第37部分 使用加速计的板级跌落试验方法》.pdf

EN 60749-38-2008 en Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件 机械和气候试验方法 第38部分 带存储器的半.pdf

EN 60749-39-2006 en Semiconductor devices - Mechanical and climatic test methods Part 39 Measurement of moisture diffusivity and water solubility in organic materials used for semi.pdf