1、UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULUNDERWRITERS LABORATORIES INC. CERTIFICATION REQUIREMENT DECISIONThis Certification Requirement Decision is prepared and published by Underwriters Laboratories Inc.(UL). It is normative for the a
2、pplicable UL Product Certification Program(s); however, it is currently notpart of the UL Standard(s) referenced below.Product Category (CCN): EMDVStandard Number: UL 498AEdition Date: January 23, 2008Edition Number: 2Section / Paragraph Reference: (New) Para. 7.10; 7.10.1; 8.2.5; Sections 39 throug
3、h42; (Revised) Table 18.1Subject: Current Tap with an integral thermal interruption feature.DECISION:In addition to the applicable requirements contained in UL 498A, the following requirements shall beapplied to evaluate a current tap with an integral thermal interruption feature.(New) 7.10 Current
4、Tap employing an Integral Thermal Interruption Feature(New) 7.10.1 A current tap employing an integral thermal interruption feature shall be marked on the facewhere visible during installation. ATTENTION” in letters at least 3/32 inch (2.4 mm) high- This deviceemploys a non-resettable thermal interr
5、uption feature. When tripped, replacement is required, orequivalent.(New) 8.2.5 A current tap employing an integral thermal interruption feature shall not be of the re-settabledesign. The current tap shall incorporate a visual means of conveying the tripped condition to the user.Table 18.1 (Revised)
6、Summary of tests Current taps and adaptersSection Test sequences No. of devicesaDetails19 Comparative Tracking Index 5 Materials to be evaluated in accordance withException No. 1 to 10.3.1.20 Glow Wire 3 Materials to be evaluated in accordance withException No. 1 to 10.3.2.21 High-Current Arc Resist
7、ance toIgnition3 Materials to be evaluated in accordance withException No. 2 to 10.3.224 Dielectric Voltage Withstand 6 All devices.22 Mold Stress Relief Devices employing thermoplastic materials.24 Dielectric Voltage Withstand(Repeated)Devices subjected to Mold Stress Relief Test.23 Moisture Absorp
8、tion Resistance 3 Conducted on vulcanized fibre, fuseholders andinsulating backplates. Use insulating materialportion of device only.25 Accelerated Aging 6 Materials to be evaluated in accordance withthe Exception to 10.4.1.27 Security of Blades Devices rated 15A or less and 250 V or less.UL COPYRIG
9、HTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULTable 18.1 (Revised) ContinuedSection Test sequences No. of devicesaDetails26 Insulation Resistance 6 Devices molded of rubber or similar materials,or any material containing enough free carbonto render th
10、e material grey or black.27 Security of Blades 6 Devices rated 15 A or less and 250 V or lessthat are not subjected to the Accelerated AgingTest.28 Contact Security 6 Devices having 1-15P configuration bladesonly.29 Retention of Plugs 6 Devices having a 1-15R, 5-15R, 5-20R, 6-15R,or 6-20R configurat
11、ion.30 Overload31 Temperature32 Retention of Plugs (Repeated) Devices having a 1-15R, 5-15R, 5-20R, 6-15R,or 6-20R configuration.33 Resistance to Arcing Required only for devices having 1-15R, 5-15R,5-20R, 6-15R, or 6-20R configurations notemploying phenolic, urea, or melamine in theoutlet face.34 F
12、useholder Temperature 6 Devices with fuseholders only.35 Improper Insertion 12 Devices having a1-15R or 5-15R outlet faceconfiguration only.36 Grounding Contact 6 Devices that can accommodate a 3-wiregrounding attachment plug have one of the5-15R, 5-20R, 6-15R, 6-20R, 7-15R, 14-15R, or15-15R configu
13、rations only.37 Supplementary OvercurrentProtector Temperature1 Devices employing supplementary overcurrentprotectors.38 Obstruction 1 All devices with a face or obstructions otherthan shown in Figures 11.3 or 11.4.39 (New) Abnormal Slow Heat Rise, NoCurrent Flow Test followed byDielectric Voltage W
14、ithstand testing.2 Current Tap employing an integral thermalinterruption feature40 (New) Abnormal Fast Heat Rise, NoCurrent Flow Test followed byDielectric Voltage Withstand testing.2 Current Tap employing an integral thermalinterruption feature41 (New) Slow Rise With Current Flow Testfollowed by Di
15、electric VoltageWithstand testing.2 Current Tap employing an integral thermalinterruption feature42 (New) Fast Rise With Current Flow Testfollowed by Dielectric VoltageWithstand testing.2 Current Tap employing an integral thermalinterruption featureaA set of representative devices is not prohibited
16、from being used for more than one group of tests when agreeable to allconcerned.(New) 39 Abnormal Slow Heat Rise, No Current Flow Test followed by Dielectric Voltage WithstandTestSTANDARD NUMBER: UL 498A -2-UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMIS
17、SION FROM UL39.1 At the conclusion of this test a current tap that employs an integral thermal interruption feature shallinterrupt current flow within the manufacturers temperature specification for each thermal interruptionlocation as identified in paragraph 39.5. Additionally, each device shall be
18、 subjected to the DielectricVoltageWithstand test described in Section 24. The current tap is not required to be subjected to thehumidity conditioning described in Section 24.3.39.2 A sample of a current tap employing an integral thermal interruption feature shall be rigidly supportedwith the outlet
19、 slots of the current tap facing upward. An individual solid copper alloy test blade, with adetent hole, complying with the Wiring Device-Dimensional Specifications, ANSI/WD6, is to be fullyinserted into each outlet slot of the current tap. The inserted test blade is to be positioned to permit thehe
20、ating element probe to contact and to transfer heat to each outlet slot contact under test.39.3 A new sample shall be used for each individual application of the heating element to each individuallocation as identified in paragraph 39.5.39.4 The heating element probe shall be pre-heated to a tip tem
21、perature of 55C and positioned to makecontact with the inserted test blade. The heating element probe temperature shall then be increasedslowly in increments of 10C at fifteen-minute intervals. Temperatures are to be monitored every fifteenseconds along with a means to detect device trip (thermal li
22、nk activation). During application of heatingelement both temperature and time of each measurement shall be recorded. If the device does not trip atthe maximum temperature limit as specified by the manufacturer, the heating probe is to be increased 10degrees above this maximum temperature and held a
23、t the temperature for 3 minutes. If the device doesnot trip within 3 minutes at applied temperature, the test is terminated and considered noncompliant.39.5 The following heating element probe locations and thermocouple locations are to be tested andmonitored:Heating Element Probe Locations:A. Test
24、Blade Inserted into Current Tap Line Contact (TBCT1)B. Test Blade Inserted into Current Tap Line/Neutral Contact (TBCT2 or Neutral)Thermocouple Locations:1. Current Tap Line Contact near Thermal Interruption Connection (CT1)2. Current Tap Line/Neutral near Thermal Interruption Connection (CT2 or Neu
25、tral)(New) 40 Abnormal Fast Heat Rise, No Current Flow Test followed by Dielectric Voltage WithstandTest40.1 At the conclusion of this test a current tap that employs an integral thermal interruption feature shallinterrupt current flow within the manufacturers temperature specification for each ther
26、mal interruptionlocation. Additionally, each device shall be subjected to the Dielectric Voltage-Withstand test described inSection 24. The current tap is not required to be subjected to the humidity conditioning described inSection 24.3.40.2 The same test method as described in Abnormal Slow Heat R
27、ise, No Current Flow Test, Section 39,shall be used except the heating element probe shall be rapidly increased from ambient to themanufacturers maximum temperature sensing specification temperature.STANDARD NUMBER: UL 498A -3-UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIB
28、UTION WITHOUT PERMISSION FROM UL40.3 Temperatures are to be monitored every fifteen seconds along with a means to detect devicetripping. During application of heating element both temperature and time of each measurement shall berecorded. If the device does not trip at the maximum temperature limit
29、as specified by the manufacturer,the heating probe is to be increased 10 degrees above this maximum temperature and held at thetemperature for 3 minutes. If the device does not trip within 3 minutes at applied temperature, the test isterminated and considered noncompliant.(New) 41 Slow Rise With Cur
30、rent Flow Test followed by Dielectric Voltage Withstand Test41.1 At the conclusion of this test a current that employs an integral thermal interruption feature shallinterrupt current flow within the manufacturers temperature specification for each thermal interruptionlocation. Additionally, each dev
31、ice shall be subjected to the Dielectric Voltage-Withstand test described inSection 24. The current tap is not required to be subjected to the humidity conditioning described inSection 24.3.41.2 The same thermocouple locations from the Abnormal Slow Heat Rise without current shall be usedfor this te
32、st.41.3 Each current tap sample shall be rigidly supported with the outlet slots of the current tap under testfacing upward. A No 12 AWG solid copper conductor shall be connected to the line blade correspondingto the outlet slot contact under test. The free end of the conductor shall be connected to
33、 a low voltage DCsupply capable of delivering 20 amperes.41.4 The series circuit shall be completed by the insertion of a solid test blade, with a detent hole,complying with the Wiring Device-Dimensional Specifications, ANSI/WD6, into the current tap outlet slotunder test. The test blade shall be co
34、nnected with No. 12 AWG stranded copper wire.41.5 With the 20 Amp current flowing, the heating source, such as a probe or heat gun, shall bepre-heated to a temperature of 55C and positioned to apply the heat to the test blade The heatingsource temperature is to be increased slowly in increments of 1
35、0C in fifteen-minute intervals.41.6 Temperatures and times during the application of the heating source were monitored and recorded.Temperatures are to be monitored every fifteen seconds along with a means to detect device trip.41.7 During application of heating source both temperature and time of m
36、easurement shall be recorded.If the device does not trip at the maximum temperature limit as specified by the manufacturer the heatingsource is to be increased 10 degrees above this maximum temperature and held at the temperature for3 minutes. If the device does not trip within 3 minutes at applied
37、temperature, the test is terminated andconsidered noncompliant.(New) 42 Fast Rise With Current Flow Test followed by Dielectric Voltage Withstand Test42.1 At the conclusion of this test a receptacle that employs an integral thermal interruption feature shallinterrupt current flow within the manufact
38、urers temperature specification for each thermal interruptionlocation. Additionally, each device shall be subjected to the Dielectric Voltage-Withstand test described inSection 24. The current tap is not required to be subjected to the humidity conditioning described inSection 24.3.42.2 The same tes
39、t method as described in Slow Rise With Current Flow Test, Section 41, shall be usedexcept the heating source shall be rapidly increased from ambient to the manufacturers maximumtemperature sensing specification temperature.STANDARD NUMBER: UL 498A -4-UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTH
40、ER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM UL42.3 Temperatures are to be monitored every fifteen seconds along with a means to detect device trip.During application of heating source both temperature and time of measurement shall be recorded. If thedevice does not trip at the maximum tem
41、perature limit as specified by the manufacturer the heating sourceis to be increased 10 degrees above this maximum temperature and held at the temperature up to 8minutes. If the device does not trip within 3 minutes at applied temperature, the test is terminated andconsidered noncompliant.RATIONALE
42、FOR DECISION:This CRD provides a method of evaluating a current tap with an integral thermal interruption feature.The proposed requirements are intended to address the potential safety hazards associated a current tapemploying an integral thermal interruption feature. A current tap employing an inte
43、gral thermal interruptionmechanism has not been investigated for its ability to reduce the safety hazards caused by overheatingand overloaded circuits. A current tap employing an integral thermal interruption mechanism has beeninvestigated to confirm the manufacturers stated thermal interruption tem
44、perature range.Copyright 2011 Underwriters Laboratories Inc.UL, in performing its functions in accordance with its objectives, does not guarantee or warrant thecorrectness of Certification Requirement Decisions it may issue or that they will be recognized or adoptedby anyone. Certification Requireme
45、nt Decisions are the opinion of Underwriters Laboratories Inc. inpractically applying the requirements of the standard. They do not represent formal interpretations of thestandard under American National Standards Institute (ANSI) processes. UL shall not be responsible toanyone for the use of or rel
46、iance upon Certification Requirement Decisions by anyone. UL shall not incurany obligation or liability for damages, including consequential damages, arising out of or in connectionwith the use or reliance upon Certification Requirement Decisions. The electronic version of theCertification Requireme
47、nt Decision is the current version and previously printed copies may be outdated.This document is published as a service to ULs certification customersSTANDARD NUMBER: UL 498A -5-UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULSTANDARD NUMBER: UL 498A -6-No Text on This Page
