1、 IEC 60393-1 Edition 3.0 2008-05 INTERNATIONAL STANDARD Potentiometers for use in electronic equipment Part 1: Generic specification IEC 60393-1:2008(E) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this pu
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8、wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60393-1 Edition 3.0 2008-05 INTERNATIONAL STANDARD Potentiometers for use in electronic equipmen
9、t Part 1: Generic specification INTERNATIONAL ELECTROTECHNICAL COMMISSION XD ICS 31.040.20 PRICE CODE ISBN 2-8318-9748-3 2 60393-1 IEC:2008(E) CONTENTS FOREWORD.6 1 General 8 1.1 Scope8 1.2 Normative references 8 2 Technical data10 2.1 Units and symbols.10 2.2 Terms and definitions 10 2.3 Preferred
10、values28 2.4 Marking .28 3 Assessment procedures .28 4 Test and measurement procedures.28 4.1 General .28 4.2 Standard atmospheric conditions.29 4.3 Drying .30 4.4 Visual examination and check of dimensions.30 4.5 Continuity (except for continuously rotating potentiometers)32 4.6 Element resistance3
11、2 4.7 Terminal resistance.33 4.8 Maximum attenuation 33 4.9 Resistance law (conformity) 33 4.10 Matching of the resistance law (for ganged potentiometers only).34 4.11 Switch contact resistance (when appropriate)34 4.12 Voltage proof (insulated styles only)38 4.13 Insulation resistance (insulated st
12、yles only).39 4.14 Variation of resistance with temperature40 4.15 Rotational noise 42 4.16 Contact resistance at low-voltage levels44 4.17 Setting ability (adjustability) and setting stability45 4.18 Starting torque 49 4.19 Switch torque 49 4.20 End stop torque.50 4.21 Locking torque.50 4.22 Thrust
13、 and pull on shaft.51 4.23 Shaft run-out .52 4.24 Lateral run-out.53 4.25 Pilot (or spigot) diameter run-out .53 4.26 Shaft end play .54 4.27 Backlash .55 4.28 Dither 57 4.29 Output smoothness .58 4.30 Robustness of terminals 59 4.31 Sealing60 4.32 Solderability 61 4.33 Resistance to soldering heat
14、.61 4.34 Change of temperature62 60393-1 IEC:2008(E) 3 4.35 Vibration63 4.36 Bump 64 4.37 Shock64 4.38 Climatic sequence.65 4.39 Damp heat, steady state67 4.40 Mechanical endurance (potentiometers) 68 4.41 AC endurance testing of mains switches on capacitive loads.71 4.42 DC endurance testing of swi
15、tches .73 4.43 Electrical endurance74 4.44 Component solvent resistance.78 4.45 Solvent resistance of the marking78 4.46 Microlinearity.79 4.47 Mounting (for surface mount potentiometers).81 4.48 Shear (adhesion) test 83 4.49 Substrate bending test (formerly bond strength of the end face plating).83
16、 4.50 Solderability (for surface mount potentiometers)83 4.51 Resistance to soldering heat (for surface mount potentiometers).83 Annex A (normative) Rules for the preparation of detail specifications for capacitors and resistors for electronic equipment 84 Annex B (normative) Interpretation of sampl
17、ing plans and procedures as described in IEC 60410 for use within the IEC Quality Assessment System for Electronic Components .85 Annex C (normative) Measuring methods for rotational noise.86 Annex D (normative) Apparatus for measuring mechanical accuracy .89 Annex E (normative) Measuring method for
18、 microlinearity90 Annex F (normative) Preferred dimensions of shaft ends, bushes and for the mounting hole, bush-mounted, shaft-operated electronic components92 Annex G (informative) Example of common potentiometers law 93 Annex H (normative) Quality assessment procedures 95 Figure 1 Shaft-sealed po
19、tentiometer 14 Figure 2 Shaft- and panel-sealed potentiometer.14 Figure 3 Fully sealed potentiometer .14 Figure 4 Linear law 16 Figure 5 Logarithmic law16 Figure 6 Inverse logarithmic law.16 Figure 7 Output ratio17 Figure 8 Loading error .18 Figure 9 Total mechanical travel (or angle of rotation) .1
20、8 Figure 10 Conformity .20 Figure 11 Absolute conformity20 Figure 12 Linearity.21 Figure 13 Independent linearity22 Figure 14 Zero-based linearity .23 Figure 15 Absolute linearity .24 4 60393-1 IEC:2008(E) Figure 16 Terminal based linearity .25 Figure 17 Effective tap width25 Figure 18 Backlash 27 F
21、igure 19 Example of insulation resistance and voltage proof test jig for surface mount potentiometers .39 Figure 20 Test circuit contact resistance45 Figure 21 Measuring circuit for setting ability (as divider).46 Figure 22 Measuring circuit for setting ability (as current controller).47 Figure 23 S
22、haft run-out52 Figure 24 Lateral run-out .53 Figure 25 Pilot (spigot) diameter run-out54 Figure 26 Shaft end play55 Figure 27 Test circuit for measurement of backlash .56 Figure 28 Measurement of backlash.57 Figure 29 Test circuit for measurement of output smoothness58 Figure 30 The circuit for cont
23、inuous monitoring of the contact resistance.71 Figure 31 Test circuit a.c. endurance testing72 Figure 32 Test circuit d.c. endurance testing73 Figure 33 Example of microlinearity measurement .79 Figure 34 Block diagram of a circuit for evaluation of microlinearity .80 Figure 35 Example of simultaneo
24、us evaluation of linearity and microlinearity.80 Figure 36 Suitable substrate for mechanical and electrical tests (may not be suitable for impedance measurements)82 Figure 37 Suitable substrate for electrical tests82 Figure C.1 Measuring circuit for method A, rotational noise .87 Figure C.2 Measurin
25、g circuit for CRV.87 Figure C.3 Measuring circuit for ENR.88 Figure E.1 Block diagram of a digital reference unit (synthetic high-precision master).90 Figure G.1 Definition of rotation (shaft-end view) .93 Figure G.2 Linear law, without centre tap.94 Figure G.3 Linear law, with centre tap94 Figure G
26、.4 Logarithmic law, without tap .94 Figure G.5 Logarithmic law, with tap 94 Figure G.6 Inverse logarithmic law without tap.94 Figure G.7 Inverse logarithmic law with tap94 Figure H.1 General scheme for capability approval 98 Table 1 Standard atmospheric conditions.30 Table 2 Measuring voltages .32 T
27、able 3 Calculation of resistance value(R) and change in resistance ( R) .41 Table 4 Calculation of temperature differences ( T).41 Table 5 Current values (IB b ) 43 Table 6 Moving contact current 48 Table 7 End stop torque.50 60393-1 IEC:2008(E) 5 Table 8 Locking torque 50 Table 9 Shaft torque 51 Ta
28、ble 10 Thrust and pull 51 Table 11 Thrust and pull 52 Table 12 Backlash .57 Table 13 Dither for non-wire wound types 57 Table 14 Dither for wire wound types (under consideration) .58 Table 15 Tensile force .59 Table 16 Number of cycles.66 Table 17 Number of cycles.69 Table 18 Number of operations73
29、Table 19 Panel size .75 Table G.1 Resistance law and code letter 93 6 60393-1 IEC:2008(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT Part 1: Generic specification FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organizati
30、on for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC p
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32、ay participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agre
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36、responding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the
37、 latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever,
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39、is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IE
40、C 60393-1 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. This third edition cancels and replaces the second edition published in 1989 and constitutes a technical revision, including minor revisions related to tables, figures and references. This e
41、dition contains the following significant technical changes with respect to the previous edition: implementation of Annex H which replaces Section 3 of the previous edition. The text of this standard is based on the following documents: FDIS Report on voting 40/1897/FDIS 40/1914/RVD Full information
42、 on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 60393-1 IEC:2008(E) 7 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts of the IEC 60393 series, under the general title Pote
43、ntiometers for use in electronic equipment, can be found on the IEC web site. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific public
44、ation. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. 8 60393-1 IEC:2008(E) POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT Part 1: Generic specification 1 General 1.1 Scop
45、e This part of IEC 60393 is applicable to all types of resistive potentiometers, including lead- screw actuated types, presets, multi-turn units, etc. to be used in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specific
46、ations of electronic components for quality assessment or any other purpose. It has been mainly written, and the test methods described, to conform to the widely used single-turn rotary potentiometer with an operating shaft. For other types of potentiometers: the angle of rotation may be several tur
47、ns; the reference to an operating shaft shall apply to any other actuating device; the angular rotation shall be taken to mean mechanical travel of the actuating device; a value for force shall be prescribed instead of a value for torque if the actuating device moves in a linear instead of a rotary
48、manner. These alternative prescriptions will be found in the sectional or detail specification. When a component is constructed as a variable resistor, i.e. as a two-terminal device, the detail specification shall prescribe the modifications required in the standard tests. 1.2 Normative references T
49、he following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027-1, Letter symbols to be used in electrical technology Part 1: General IEC 60050 (all parts), Inte
