1、 IEC 60444-6 Edition 2.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) Mesure des paramtres des rsonateurs quartz Partie 6: Mesure de la dpendance du niveau dexcitation (DNE) IEC60444-6:2013 THIS
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16、INTERNATIONALE Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) Mesure des paramtres des rsonateurs quartz Partie 6: Mesure de la dpendance du niveau dexcitation (DNE) INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONAL
17、E R ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-83220-876-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vou
18、s assurer que vous avez obtenu cette publication via un distributeur agr. 2 60444-6 IEC:2013 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 DLD effects 6 3.1 Reversible changes in frequency and resistance . 6 3.2 Irreversible changes in frequency and resistance 6 3.3
19、 Causes of DLD effects . 7 4 Drive levels for DLD measurement . 7 5 Test methods 8 5.1 Method A (Fast standard measurement method) . 8 5.1.1 Testing at two drive levels . 8 5.1.2 Testing according to specification 8 5.2 Method B (Multi-level reference measurement method) . 9 Annex A (normative) Rela
20、tionship between electrical drive level and mechanical displacement of quartz crystal units 11 Annex B (normative) Method C: DLD measurement with oscillation circuit . 14 Bibliography 19 Figure 1 Maximum tolerable resistance ratio for the drive level dependence as a function of the resistances Rr2or
21、 Rr39 Figure B.1 Insertion of a quartz crystal unit in an oscillator 14 Figure B.2 Crystal unit loss resistance as a function of dissipated power . 15 Figure B.3 Behaviour of the Rrof a quartz crystal units 16 Figure B.4 Block diagram of circuit system . 16 Figure B.5 Installed Roscin scanned drive
22、level range . 17 Figure B.6 Drive level behavior of a quartz crystal unit if Rosc = 70 is used as test limit in the “Annex B” test . 17 Figure B.7 Principal schematic diagram of the go/no-go test circuit 18 60444-6 IEC:2013 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT OF QUARTZ CRYSTAL
23、UNIT PARAMETERS Part 6: Measurement of drive level dependence (DLD) FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote internati
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32、 costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct ap
33、plication of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60444-6 has been prepared by lEC
34、technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. This second edition cancels and replaces the first edition published in 1995. This edition constitutes a technical revision. This edition includes the
35、following significant technical changes with respect to the previous edition: a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B. b) High reliability crystal unit is needed
36、 to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification. 4 60444-6 IEC:2013 The text of this standard is based on the following documents: CDV Repo
37、rt on voting 49/1004/CDV 49/1038/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 60444 series, p
38、ublished under the general title Measurement of quartz crystal unit parameters, can be found on the IEC website. 60444-6 IEC:2013 5 INTRODUCTION The drive level (expressed as power/voltage across or current through the crystal unit) forces the resonator to produce mechanical oscillations by way of p
39、iezoelectric effect. In this process, the acceleration work is converted to kinetic and elastic energy and the power loss to heat. The latter conversion is due to the inner and outer friction of the quartz resonator. The frictional losses depend on the velocity of the vibrating masses and increase w
40、hen the oscillation is no longer linear or when critical velocities, elongations or strains, excursions or accelerations are attained in the quartz resonator or at its surfaces and mounting points (see Annex A). This causes changes in resistance and frequency, as well as further changes due to the t
41、emperature dependence of these parameters. At “high” drive levels (e.g. above 1 mW or 1 mA for AT-cut crystal units) changes are observed by all crystal units and these also can result in irreversible amplitude and frequency changes. Any further increase of the drive level may destroy the resonator.
42、 Apart from this effect, changes in frequency and resistance are observed at “low” drive levels in some crystal units, e.g. below 1 mW or 50 A for AT-cut crystal units). In this case, if the loop gain is not sufficient, the start-up of the oscillation is difficult. In crystal filters, the transducer
43、 attenuation and ripple will change. Furthermore, the coupling between a specified mode of vibration and other modes (e.g. of the resonator itself, the mounting and the back-fill gas) also depends on the level of drive. Due to the differing temperature response of these modes, these couplings give r
44、ise to changes of frequency and resistance of the specified mode within narrow temperature ranges. These changes increase with increasing drive level. However, this effect will not be considered further in this part of IEC 60444. The first edition of IEC 60444-6 was published in 1995. However, it ha
45、s not been revised until today. In the meantime the demand for tighter specification and measurement of DLD has increased. In this new edition, the concept of DLD in IEC 60444-6:1995 is maintained. However, the more suitable definition for the users severe requirements was introduced. Also, the spec
46、ifications based on the matters arranged in the Stanford meeting in June, 2011 are taken into consideration. 6 60444-6 IEC:2013 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 6: Measurement of drive level dependence (DLD) 1 Scope This part of IEC 60444 applies to the measurements of drive level
47、dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the -network according to IEC 60444-1, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the -network or
48、 reflection method according to IEC 60444-1, IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. 2 Normat
49、ive references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60444-1, Measurement of quartz crystal unit parameters by zero phase technique in a -network Part 1: Basic method for t
