IEC 60512-1-2-2002 Connectors for electronic equipment - Tests and measurements - Part 1-2 General examination Test 1b Examination of dimension and mass《电子设备连接器.试验和测量.第1-2部分 一般检查.试验1b 尺寸和质量检查》.pdf

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1、NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 60512-1-2 Premire dition First edition 2002-02 Connecteurs pour quipements lectroniques Essais et mesures Partie 1-2: Examen gnral Essai 1b: Examen de dimension et masse Connectors for electronic equipment Tests and measurements Part 1-2: General e

2、xamination Test 1b: Examination of dimension and mass Numro de rfrence Reference number CEI/IEC 60512-1-2:2002Numrotation des publications Depuis le 1er janvier 1997, les publications de la CEI sont numrotes partir de 60000. Ainsi, la CEI 34-1 devient la CEI 60034-1. Editions consolides Les versions

3、 consolides de certaines publications de la CEI incorporant les amendements sont disponibles. Par exemple, les numros dditi on 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et

4、 2. Informations supplmentaires sur les publications de la CEI Le contenu technique des publications de la CEI est constamment revu par la CEI afin quil reflte ltat actuel de la technique. Des renseignements relatifs cette publication, y compris sa validit, sont dispo- nibles dans le Catalogue des p

5、ublications de la CEI (voir ci-dessous) en plus des nouvelles ditions, amendements et corrigenda. Des informations sur les sujets ltude et lavancement des travaux entrepris par le comit dtudes qui a labor cette publication, ainsi que la liste des publications parues, sont galement disponibles par li

6、ntermdiaire de: Site web de la CEI (www.iec.ch) Catalogue des publications de la CEI Le catalogue en ligne sur le site web de la CEI (www.iec.ch/catlg-f.htm) vous permet de faire des recherches en utilisant de nombreux critres, comprenant des recherches textuelles, par comit dtudes ou date de public

7、ation. Des informations en ligne sont galement disponibles sur les nouvelles publications, les publications rempla- ces ou retires, ainsi que sur les corrigenda. IEC Just Published Ce rsum des dernires publications parues (www.iec.ch/JP.htm) est aussi disponible par courrier lectronique. Veuillez pr

8、endre contact avec le Service client (voir ci-dessous) pour plus dinformations. Service clients Si vous avez des questions au sujet de cette publication ou avez besoin de renseignements supplmentaires, prenez contact avec le Service clients: Email: custserviec.ch Tl: +41 22 919 02 11 Fax: +41 22 919

9、 03 00 Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers

10、 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus e

11、nsuring that the content reflects current technology. Information relating to this publication, including its validity, is available in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in pr

12、ogress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is also available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (www.iec.ch/catlg-e.htm) enables you t

13、o search by a variety of criteria including text searches, technical committees and date of publication. On- line information is also available on recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Published This summary of recently issued publications

14、 (www.iec.ch/JP.htm) is also available by email. Please contact the Customer Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch

15、Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 .NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 60512-1-2 Premire dition First edition 2002-02 Connecteurs pour quipements lectroniques Essais et mesures Partie 1-2: Examen gnral Essai 1b: Examen de dimension et masse Connectors for electronic equipme

16、nt Tests and measurements Part 1-2: General examination Test 1b: Examination of dimension and mass Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2002 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni

17、 utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and mi

18、crofilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRICE CODE D Commission Electrotechn

19、ique Internationale International Electrotechnical Commission 2 60512-1-2 CEI:2002 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 1-2: Examen gnral Essai 1b: Examen de dimension et masse AVANT-PROPOS 1) La CEI (Commission lectrotechnique

20、 Internationale) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llec

21、tronique. A cet effet, la CEI, entre autres activits, publie des Normes internationales. Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en

22、liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. 2) Les dcisions ou accords officiels de la CEI concernant les questions techniques reprsent

23、ent, dans la mesure du possible, un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit dtudes. 3) Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publis comme normes, spcifications tec

24、hniques, rapports techniques ou guides et agrs comme tels par les Comits nationaux. 4) Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normes n

25、ationales et rgionales. Toute divergence entre la norme de la CEI et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. 5) La CEI na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage quand un

26、matriel est dclar conforme lune de ses normes. 6) Lattention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pour responsable de ne pas avoir identifi de tel

27、s droits de proprit et de ne pas avoir signal leur existence La Norme internationale CEI 60512-1-2 a t tablie par le sous-comit 48B: Connecteurs, du comit dtudes 48 de la CEI: Composants lectromcaniques et structures mcaniques pour quipements lectroniques. Cette norme annule et remplace lessai 1b de

28、 la CEI 60512-2, parue en 1985, dont elle constitue une rvision technique. Le texte de cette norme est issu des documents suivants: FDIS Rapport de vote 48B/1129/FDIS 48B/1180/RVD Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cet

29、te norme. Cette publication a t rdige selon les Directives ISO/CEI, Partie 3. Le comit a dcid que le contenu de cette publication ne sera pas modifi avant 2007. A cette date, la publication sera reconduite; supprime; remplace par une dition rvise, ou amende.60512-1-2 IEC:2002 3 INTERNATIONAL ELECTRO

30、TECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 1-2: General examination Test 1b: Examination of dimension and mass FOREWORD 1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrote

31、chnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparat

32、ion is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely

33、with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the releva

34、nt subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recommendations for international use and are published in the form of standards, technical specifications, technical reports or guides and they are accep

35、ted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and th

36、e corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibil

37、ity that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-1-2 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48

38、: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces test 1b of IEC 60512-2, issued in 1985, and constitutes a technical revision. The text of this standard is based on the following documents: FDIS Report on voting 48B/1129/FDIS 48B/1

39、180/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 3. The committee has decided that the contents of this publication will remain

40、 unchanged until 2007. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. 4 60512-1-2 CEI:2002 CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 1-2: Examen gnral Essai 1b: Examen de dimension et masse 1 Domaine dapplication et ob

41、jet La prsente partie de la CEI 60512 est utilise, lorsque la spcification particulire le prescrit, pour essayer des composants lectromcaniques du domaine dapplication du comit dtudes 48 de la CEI. Cet essai peut aussi tre effectu sur des dispositifs similaires, lorsquune spcification particulire le

42、 prescrit. Lobjet de cet essai est de dfinir une mthode dessai normalise pour lexamen de dimension et masse des composants lectromcaniques. 2 Gnralits Lexamen dimensionnel et la vrification de masse sont des mesures effectues sur les composants, pour vrifier leur conformit la spcification correspond

43、ante, en utilisant des montages de mesure et des appareils de mesure appropris. 3 Caractristiques vrifier 3.1 Dimensions dencombrement Les dimensions doivent tre vrifies et tre conformes aux dessins dencombrement de la spcification particulire. 3.2 Masse La masse doit tre vrifie et tre conforme la s

44、pcification particulire. 3.3 Lignes de fuite et distances disolement Les lignes de fuite et les distances disolement doivent tre vrifies, si la spcification particulire le prcise. Les distances doivent tre conformes aux exigences qui se trouvent dans les documents de prescriptions gnrales appropris.

45、 3.4 Dimensions dtailles Si la spcification particulire le prcise, des dimensions dtailles des composants soumis doivent tre vrifies et tre conformes aux dessins correspondants. 3.5 Utilisation de calibres Si lutilisation de calibres est indique dans la spcification particulire, les spcimens corresp

46、ondants doivent tre accepts ou refuss par ces calibres, selon le cas.60512-1-2 IEC:2002 5 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 1-2: General examination Test 1b: Examination of dimension and mass 1 Scope and object This part of IEC 60512, when required by the detail specifi

47、cation, is used for testing electromechanical components within the scope of IEC technical committee 48. This test may also be used for similar devices when specified in a detail specification. The object of this test is to define a standard test method for the examination of dimension and mass of e

48、lectromechanical components. 2 General The dimensional examination and checking of mass are measurements made on the actual parts with the aid of suitable measuring tools and measuring equipment in compliance with the relevant specification. 3 Features to be checked 3.1 Outline dimensions Dimensions shall be checked and shall comply with the outline drawings of the detail specification. 3.2 Mass The mass shall be checked and sh

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