1、 IEC 60512-25-9 Edition 1.0 2008-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 25-9: Signal integrity tests Test 25i: Alien crosstalk Connecteurs pour quipements lectroniques Essais et mesures Partie 25-9: Essais dintgrit des signaux E
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16、z des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-25-9 Edition 1.0 2008-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 25-9: Signal integrity tes
17、ts Test 25i: Alien crosstalk Connecteurs pour quipements lectroniques Essais et mesures Partie 25-9: Essais dintgrit des signaux Essai 25i: Diaphonie exogne INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE R ICS 31.220.10 PRICE CODE CODE PRIX ISBN 2-8318-9971-0 Re
18、gistered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-25-9 IEC:2008 CONTENTS FOREWORD.3 1 Scope and object5 2 Normative references5 3 Terms and definitions .5 4 Overview 6 4.1 Procedure6 4.2 Resources.7 5 Overall tes
19、t arrangement.7 5.1 General .7 5.2 Terminations .8 5.3 Pairs of connectors to test .8 6 Procedure to test alien crosstalk from one connector to another connector10 6.1 Calibration.10 6.2 Measurement (noise) floor .10 6.3 Alien crosstalk measurement .10 7 Procedure for determining significance11 8 De
20、tails to be specified in the detail specification12 9 Power sum calculation, report and documentation.12 Annex A (informative) Flow chart for obtaining alien crosstalk performance data.13 Annex B (informative) Illustrations of alien crosstalk testing using coaxial switching14 Bibliography18 Figure 1
21、 Schematic for testing without a switch.8 Figure 2 Schematic for terminations .8 Figure 3 Connector array9 Figure 4 Test directions11 Figure A.1 Flowchart for the test procedure 13 Figure B.1 Schematic for testing with a switch 14 Figure B.2 Example network analyzer, switch, and fixture with 8 balun
22、s in 2 clusters.15 Figure B.3 Example of fixture, in which balun clusters can slide left and right16 Figure B.4 Post can rotate three different directions17 60512-25-9 IEC:2008 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 25-9: Signal
23、integrity tests Test 25i: Alien crosstalk FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all q
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32、 IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the s
33、ubject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-25-9 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equi
34、pment. The text of this standard is based on the following documents: FDIS Report on voting 48B/1915/FDIS 48B/1930/RVD This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of IEC 60512 series, under the general title Connectors for electronic equip
35、ment Tests and measurements, can be found on the IEC website. 4 60512-25-9 IEC:2008 The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific
36、publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 60512-25-9 IEC:2008 5 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 25-9: Signal integrity tests Test 25i: Alien crosstalk 1 Scope and object This part of IEC 60512
37、 defines a test method which is intended to assess the near-end alien crosstalk (ANEXT) and the far-end alien crosstalk (AFEXT) between connectors in close proximity, when mounted in their mounting systems. Both discrete modular connectors and multi-port panel connectors may be tested using this met
38、hod. This method provides a means to test the alien (exogenous) crosstalk between any two ports, as well as a means to assess the overall alien crosstalk from all other ports. This test procedure is generally applicable to any electrical connector, and is particularly suitable to connectors describe
39、d in IEC 60603-7 series, IEC 61076-3-104, and other types of connectors for data transmission. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest ed
40、ition of the referenced document (including any amendments) applies. IEC 60050-581, International Electrotechnical Vocabulary (IEV) Chapter 581: Electromechanical components for electronic equipment IEC 60512-26-100, Connectors for electronic equipment Tests and measurement Part 26-100: Measurement
41、setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 (tests 26a to 26g) IEC 60603-7-4:2005, Connectors for electronic equipment Part 7-4: Detail specification for 8- way, unshielded, free and fixed connectors, for data transmissions with frequencies up to 2
42、50 MHz IEC 60603-7 (all parts), Connectors for electronic equipment Part 7: Detail specifications for 8-way, (un)shielded, free and fixed connectors, for data transmissions IEC 61076-3-104:2006, Connectors for electronic equipment Part 3-104: Detail specification for 8-way, shielded, free and fixed
43、connectors, for data transmissions with frequencies up to 1000 MHz IEC 61156, Multicore and symmetrical pair/quad cable for digital communications 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 60050-581 apply as well as the following. 3.1 alien (ex
44、ogenous) crosstalk (AXT) signal coupling from disturbing conductor pairs into a disturbed pair of another connector 6 60512-25-9 IEC:2008 3.2 alien (exogenous) near-end crosstalk (ANEXT) loss signal coupling from a near-end disturbing conductor pair into a disturbed pair of another connector, measur
45、ed at the near-end 3.3 alien (exogenous) far-end crosstalk (AFEXT) loss signal coupling from a near-end disturbing conductor pair into a disturbed pair of another connector, measured at the far-end 3.4 power sum alien (exogenous) near-end crosstalk (PSANEXT) loss a computation of signal coupling fro
46、m multiple near-end disturbing conductor pairs, in one or more connectors, into a disturbed pair of another connector, measured at the near-end 3.5 power sum alien (exogenous) far-end crosstalk (PSAFEXT) loss a computation of signal coupling from multiple near-end disturbing conductor pairs, in one
47、or more connectors, into a disturbed pair of another connector, measured at the far-end 4 Overview 4.1 Procedure Alien crosstalk is a property that exists between connectors. It is affected by the properties of the connectors themselves, as well as the arrangement of the connectors in their mounting
48、 system, and the mounting systems themselves. Examples of mounting systems include faceplates, mounting boxes, frame-mounted panels, frames containing multiple panels, etc. Where necessary, connectors in other frame-mounted panels, etc., in close proximity shall be included as disturbing connectors.
49、 Alien crosstalk of the connector should be tested for all mounting systems in which the connector is intended to be mounted, or a sub-set thereof, as defined by the detail specification. Manufacturers may define a worst case mounting system, and test in either or both. This procedure may also be applied to multi-port connector panels, in which case each port of the panel s
