IEC 61094-8-2012 Measurement microphones - Part 8 Methods for determining the free-field sensitivity of working standard microphones by comparison《测量传声器.第8部分 利用比较法测定工作标准麦克风自由声场灵敏度》.pdf

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1、 IEC 61094-8 Edition 1.0 2012-09 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement microphones Part 8: Methods for determining the free-field sensitivity of working standard microphones by comparison Microphones de mesure Partie 8: Mthodes pour la dtermination de lefficacit en champ libre par

2、comparaison des microphones talons de travail IEC61094-8:2012 colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic

3、 or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contac

4、t the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compri

5、s la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit n

6、ational de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and pub

7、lishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published

8、. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.i

9、ec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30

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11、e, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A pr

12、opos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous

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14、de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglai

15、s et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez

16、-nous: csciec.ch. IEC 61094-8 Edition 1.0 2012-09 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement microphones Part 8: Methods for determining the free-field sensitivity of working standard microphones by comparison Microphones de mesure Partie 8: Mthodes pour la dtermination de lefficacit en

17、 champ libre par comparaison des microphones talons de travail INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE V ICS 17.140.50 PRICE CODE CODE PRIX ISBN 978-2-83220-380-4 Registered trademark of the International Electrotechnical Commission Marque dpose de la Com

18、mission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colourinside 2 61094-8 IEC:2012 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative

19、 references . 6 3 Terms and definitions . 7 4 Reference environmental conditions . 8 5 Principles of free-field calibration by comparison 8 5.1 General principle . 8 5.2 General principles using sequential excitation . 8 5.3 General principles using simultaneous excitation . 8 6 General requirements

20、 . 9 6.1 The test space . 9 6.2 Methods of establishing the free-field 9 6.2.1 General . 9 6.2.2 Using a test space with sound absorbing surfaces . 9 6.2.3 Time selective methods for obtaining the free-field sensitivity 10 6.3 The sound source 10 6.4 Reference microphone 11 6.5 Monitor microphone .

21、12 6.6 Test signals . 12 6.7 Configuration for the reference microphone and microphone under test 13 7 Factors influencing the free-field sensitivity 13 7.1 General . 13 7.2 Polarizing voltage 13 7.3 Acoustic centre of the microphone . 13 7.4 Angle of incidence and alignment with the sound source .

22、14 7.5 Mounting configuration 14 7.6 Dependence on environmental conditions 14 8 Calibration uncertainty components 14 8.1 General . 14 8.2 Sensitivity of the reference microphone . 15 8.3 Measurement of the microphone output . 15 8.4 Differences between the sound pressure applied to the reference m

23、icrophone and to the microphone under test . 15 8.5 Influence of indirect sound 15 8.6 Influence of signal processing . 16 8.7 Influence of microphone characteristics and measurement system performance 16 8.7.1 Microphone capacitance 16 8.7.2 Measurement system non-linearity 16 8.7.3 Validation of c

24、alibration system . 16 8.8 Uncertainty on free-field sensitivity level 16 Annex A (informative) Basic substitution calibration in a free-field chamber . 18 Annex B (informative) Time selective techniques . 22 Bibliography 30 61094-8 IEC:2012 3 Figure A.1 Illustration of source and receiver setup in

25、a free-field room, where the monitor microphone has been integrated into the loudspeaker 18 Figure A.2 Practical implementation in a hemi-anechoic room with a source flush-mounted in the floor 19 Figure A.3 Examples of loudspeaker sources . 21 Figure B.1 Illustration of set-up for measurement with t

26、ime selective techniques 23 Table 1 Calibration options for the reference microphone and associated typical measurement uncertainty 12 Table 2 Typical uncertainty components 17 4 61094-8 IEC:2012 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT MICROPHONES Part 8: Methods for determining the

27、free-field sensitivity of working standard microphones by comparison FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote internat

28、ional co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter r

29、eferred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate

30、 in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an inter

31、national consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reason

32、able efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC

33、Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conform

34、ity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publicatio

35、n. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or fo

36、r costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct a

37、pplication of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61094-8 has been prepared by IEC

38、 technical committee 29: Electroacoustics. The text of this standard is based on the following documents: CDV Report on voting 29/752/CDV 29/759/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication ha

39、s been drafted in accordance with the ISO/IEC Directives, Part 2. 61094-8 IEC:2012 5 A list of all the parts in the IEC 61094 series, published under the general title Measurement microphones can be found on the IEC website. The committee has decided that the contents of this publication will remain

40、 unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page

41、 of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 61094-8 IEC:2012 MEASUREMENT MICROPHONES Part 8: Methods for determining the free-field sensit

42、ivity of working standard microphones by comparison 1 Scope This part of the IEC 61094 series is applicable to working standard microphones meeting the requirements of IEC 61094-4. It describes methods of determining the free-field sensitivity by comparison with a laboratory standard microphone or w

43、orking standard microphone (where applicable) that has been calibrated according to either: IEC 61094-3, IEC 61094-2 or IEC 61094-5, and where factors given in IEC/TS 61094-7 have been applied, IEC 61094-6, this part of IEC 61094. Methods performed in an acoustical environment that is a good approxi

44、mation to an ideal free-field (e.g. a high quality free-field chamber), and methods that use post processing of results to minimise the effect of imperfections in the acoustical environment, to simulate free-field conditions, are both covered by this part of IEC 61094. Comparison methods based on th

45、e principles described in IEC 61094-3 are also possible but beyond the scope of this part of IEC 61094. NOTE 1 This part of IEC 61094 is also applicable to laboratory standard microphones meeting the requirements of IEC 61094-1, noting that these microphones also meet the electroacoustic specificati

46、ons for working standard microphones. NOTE 2 This part of IEC 61094 is also applicable to combinations of microphone and preamplifier where the determined sensitivity is referred to the unloaded output voltage of the preamplifier. NOTE 3 Other devices, for example, sound level meters can be calibrat

47、ed using the principles of this part of IEC 61094, but are not within the scope of this standard. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited a

48、pplies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61094-1, Measurement microphones Part 1: Specifications for laboratory standard microphones IEC 61094-2, Electroacoustics Measurement microphones Part 2: Primary method for pressure

49、calibration of laboratory standard microphones by the reciprocity technique IEC 61094-3, Measurement microphones Part 3: Primary method for free-field calibration of laboratory standard microphones by the reciprocity technique IEC 61094-4, Measurement microphones Part 4: Specifications for working standard microphones 61094-8 IEC:2012 7 IEC 61094-5, Measurement microphones Part 5: Methods for pressure calibra

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